"A New IEEE 1149.1 Boundary Scan Design for the Detection of Delay Defects."

Sungju Park, Taehyung Kim (2000)

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DOI: 10.1109/DATE.2000.840311

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Sungju Park, Taehyung Kim:
A New IEEE 1149.1 Boundary Scan Design for the Detection of Delay Defects. DATE 2000: 458-462

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