"Dynamic critical resistance: a timing-based critical resistance model for ..."

José Luis Rosselló et al. (2007)

> Home

Details and statistics

DOI: —

access: closed

type: Conference or Workshop Paper

metadata version: 2019-03-20

- view
  - electronic edition @ acm.org
- export record
  dblp key:
  - conf/date/RosselloBBS07
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/date/RosselloBBS07
José Luis Rosselló, Carol de Benito, Sebastià A. Bota, Jaume Segura:
Dynamic critical resistance: a timing-based critical resistance model for statistical delay testing of nanometer ICs. DATE 2007: 1271-1276

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.