"Interactive presentation: BIST method for die-level process parameter ..."

Amir Zjajo, Manuel J. Barragan Asian, José Pineda de Gyvez (2007)

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type: Conference or Workshop Paper

metadata version: 2018-11-28

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Amir Zjajo, Manuel J. Barragan Asian, José Pineda de Gyvez:
Interactive presentation: BIST method for die-level process parameter variation monitoring in analog/mixed-signal integrated circuits. DATE 2007: 1301-1306

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