"Learning from Corrupted Binary Labels via Class-Probability Estimation."

Aditya Krishna Menon et al. (2015)

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DOI: —

access: open

type: Conference or Workshop Paper

metadata version: 2019-05-29

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Aditya Krishna Menon, Brendan van Rooyen, Cheng Soon Ong, Bob Williamson:
Learning from Corrupted Binary Labels via Class-Probability Estimation. ICML 2015: 125-134

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