"An Extended LLRP Model for RFID System Test and Diagnosis."

Rafik Kheddam, Oum-El-Kheir Aktouf, Ioannis Parissis (2012)

Details and statistics

DOI: 10.1109/ICST.2012.138

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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