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"Metric forensics: a multi-level approach for mining volatile graphs."
Keith Henderson et al. (2010)
- Keith Henderson, Tina Eliassi-Rad, Christos Faloutsos

, Leman Akoglu, Lei Li, Koji Maruhashi, B. Aditya Prakash, Hanghang Tong
:
Metric forensics: a multi-level approach for mining volatile graphs. KDD 2010: 163-172

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