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"Strong higher order mutation-based test data generation."

Mark Harman, Yue Jia, William B. Langdon (2011)

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DOI: 10.1145/2025113.2025144

access: closed

type: Conference or Workshop Paper

metadata version: 2019-06-02

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  dblp key:
  - conf/sigsoft/HarmanJL11
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  - https://dblp.org/rec/conf/sigsoft/HarmanJL11
Mark Harman, Yue Jia, William B. Langdon:
Strong higher order mutation-based test data generation. SIGSOFT FSE 2011: 212-222

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