"Model-Based Mutation Testing of an Industrial Measurement Device."

Bernhard K. Aichernig et al. (2014)

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DOI: 10.1007/978-3-319-09099-3_1

access: closed

type: Conference or Workshop Paper

metadata version: 2021-07-25

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  - conf/tap/AichernigAJKKSS14
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Bernhard K. Aichernig, Jakob Auer, Elisabeth Jöbstl, Robert Korosec, Willibald Krenn, Rupert Schlick, Birgit Vera Schmidt:
Model-Based Mutation Testing of an Industrial Measurement Device. TAP@STAF 2014: 1-19

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