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"Reformatting Test Patterns for Testing Embedded Core Based System Using ..."

Subhayu Basu et al. (2002)

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DOI: 10.1109/ASPDAC.2002.995001

access: closed

type: Conference or Workshop Paper

metadata version: 2022-11-14

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Subhayu Basu, Debdeep Mukhopadhyay, Dipanwita Roy Chowdhury, Indranil Sengupta, Sudipta Bhawmik:
Reformatting Test Patterns for Testing Embedded Core Based System Using Test Access Mechanism (TAM) Switch. ASP-DAC/VLSI Design 2002: 598-603

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