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"Testing Address Decoder Faults in Two-Port Memories: Fault Models, Tests, ..."

Said Hamdioui, Ad J. van de Goor (2000)

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DOI: 10.1023/A:1008320716847

access: closed

type: Journal Article

metadata version: 2020-09-11

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Said Hamdioui, Ad J. van de Goor:
Testing Address Decoder Faults in Two-Port Memories: Fault Models, Tests, Consequences of Port Restrictions, and Test Strategy. J. Electron. Test. 16(5): 487-498 (2000)

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