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"A New Scan Architecture for Both Low Power Testing and Test Volume ..."

Hong-Sik Kim, Sungho Kang, Michael S. Hsiao (2008)

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DOI: 10.1007/S10836-008-5062-6

access: closed

type: Journal Article

metadata version: 2024-02-27

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Hong-Sik Kim, Sungho Kang, Michael S. Hsiao:
A New Scan Architecture for Both Low Power Testing and Test Volume Compression Under SOC Test Environment. J. Electron. Test. 24(4): 365-378 (2008)

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