default search action
"An efficient built-in self test method for robust path delay fault testing."
Ioannis Voyiatzis et al. (1996)
- Ioannis Voyiatzis, Antonis M. Paschalis, Dimitris Nikolos, Constantin Halatsis:
An efficient built-in self test method for robust path delay fault testing. J. Electron. Test. 8(2): 219-222 (1996)
manage site settings
To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.