"Test compaction for at-speed testing of scan circuits based onnonscan ..."

Irith Pomeranz, Sudhakar M. Reddy (2002)

Details and statistics

DOI: 10.1109/TCAD.2002.1004314

access: closed

type: Journal Article

metadata version: 2020-09-24

a service of  Schloss Dagstuhl - Leibniz Center for Informatics