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@article{DBLP:journals/mr/AbbateBFI06,
  author       = {Carmine Abbate and
                  Giovanni Busatto and
                  Luigi Fratelli and
                  Francesco Iannuzzo},
  title        = {The high frequency behaviour of high voltage and current {IGBT} modules},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {9-11},
  pages        = {1848--1853},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2006.07.068},
  doi          = {10.1016/J.MICROREL.2006.07.068},
  timestamp    = {Sat, 30 Sep 2023 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/AbbateBFI06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/AgostinelliLPMMJ06,
  author       = {Marty Agostinelli and
                  Shing Lau and
                  Sangwoo Pae and
                  Phil Marzolf and
                  Harish Muthali and
                  Steve Jacobs},
  title        = {{PMOS} NBTI-induced circuit mismatch in advanced technologies},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {1},
  pages        = {63--68},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2005.05.004},
  doi          = {10.1016/J.MICROREL.2005.05.004},
  timestamp    = {Thu, 23 Sep 2021 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/AgostinelliLPMMJ06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/AlbadriSGW06,
  author       = {A. M. Albadri and
                  Ronald D. Schrimpf and
                  Kenneth F. Galloway and
                  D. Greg Walker},
  title        = {Single event burnout in power diodes: Mechanisms and models},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {2-4},
  pages        = {317--325},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2005.06.015},
  doi          = {10.1016/J.MICROREL.2005.06.015},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/AlbadriSGW06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/AltesTW06,
  author       = {Andreas Altes and
                  Rainer Tilgner and
                  W. Walter},
  title        = {Numerical evaluation of miniaturized resistive probe for quantitative
                  thermal near-field microscopy of thermal conductivity},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {9-11},
  pages        = {1525--1529},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2006.07.030},
  doi          = {10.1016/J.MICROREL.2006.07.030},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/AltesTW06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/AlvarezARCGKLSH06,
  author       = {David Alvarez and
                  Michel J. Abou{-}Khalil and
                  Christian Russ and
                  Kiran V. Chatty and
                  Robert Gauthier and
                  D. Kontos and
                  Junjun Li and
                  Christopher Seguin and
                  Ralph Halbach},
  title        = {Analysis of {ESD} failure mechanism in 65nm bulk {CMOS} {ESD} NMOSFETs
                  with {ESD} implant},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {9-11},
  pages        = {1597--1602},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2006.07.041},
  doi          = {10.1016/J.MICROREL.2006.07.041},
  timestamp    = {Thu, 02 Feb 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/AlvarezARCGKLSH06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ArshadAJO06,
  author       = {Mohd Khairuddin Md Arshad and
                  Ibrahim Ahmad and
                  Azman Jalar and
                  Ghazali Omar},
  title        = {The surface characteristics of under bump metallurgy {(UBM)} in electroless
                  nickel immersion gold {(ENIG)} deposition},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {2-4},
  pages        = {367--379},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2005.01.018},
  doi          = {10.1016/J.MICROREL.2005.01.018},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/ArshadAJO06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ArulvananZS06,
  author       = {Periannan Arulvanan and
                  Zhaowei Zhong and
                  Xunqing Shi},
  title        = {Effects of process conditions on reliability, microstructure evolution
                  and failure modes of SnAgCu solder joints},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {2-4},
  pages        = {432--439},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2005.05.005},
  doi          = {10.1016/J.MICROREL.2005.05.005},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/ArulvananZS06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/AubelBKHH06,
  author       = {Oliver Aubel and
                  Eberhard Bugiel and
                  Dietmar Kr{\"{u}}ger and
                  Wolfgang Hasse and
                  Martina Hommel},
  title        = {Investigation of the influence of thermal treatment on interconnect-barrier
                  interfaces in copper metallization systems},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {5-6},
  pages        = {768--773},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2005.10.010},
  doi          = {10.1016/J.MICROREL.2005.10.010},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/AubelBKHH06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/AugereauOLB06,
  author       = {Jean Augereau and
                  Yves Ousten and
                  Bruno Levrier and
                  Laurent B{\'{e}}chou},
  title        = {Use of signal processing imaging for the study of a 3D package in
                  harsh environment},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {9-11},
  pages        = {1922--1925},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2006.07.081},
  doi          = {10.1016/J.MICROREL.2006.07.081},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/AugereauOLB06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BalkGW06,
  author       = {L. J. Balk and
                  W. H. Gerling and
                  E. Wolfgang},
  title        = {Editorial},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {9-11},
  pages        = {1401--1402},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2006.07.004},
  doi          = {10.1016/J.MICROREL.2006.07.004},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/BalkGW06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BarliniCCMF06,
  author       = {Davide Barlini and
                  Mauro Ciappa and
                  Alberto Castellazzi and
                  Michel Mermet{-}Guyennet and
                  Wolfgang Fichtner},
  title        = {New technique for the measurement of the static and of the transient
                  junction temperature in {IGBT} devices under operating conditions},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {9-11},
  pages        = {1772--1777},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2006.07.058},
  doi          = {10.1016/J.MICROREL.2006.07.058},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/BarliniCCMF06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BelaidKMGMM06,
  author       = {Mohamed Ali Bela{\"{\i}}d and
                  K. Ketata and
                  Mohamed Masmoudi and
                  M. Gares and
                  Hichame Maanane and
                  J{\'{e}}r{\^{o}}me Marcon},
  title        = {Electrical parameters degradation of power {RF} {LDMOS} device after
                  accelerated ageing tests},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {9-11},
  pages        = {1800--1805},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2006.07.073},
  doi          = {10.1016/J.MICROREL.2006.07.073},
  timestamp    = {Sun, 02 Oct 2022 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/BelaidKMGMM06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BenmansourAMW06,
  author       = {Adel Benmansour and
                  Stephane Azzopardi and
                  Jean{-}Christophe Martin and
                  Eric Woirgard},
  title        = {Failure mechanism of trench {IGBT} under short-circuit after turn-off},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {9-11},
  pages        = {1778--1783},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2006.07.059},
  doi          = {10.1016/J.MICROREL.2006.07.059},
  timestamp    = {Wed, 03 Aug 2022 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/BenmansourAMW06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BergbauerLFB06,
  author       = {Werner Bergbauer and
                  Thomas Lutz and
                  Werner Frammelsberger and
                  Guenther Benstetter},
  title        = {Kelvin probe force microscopy - An appropriate tool for the electrical
                  characterisation of {LED} heterostructures},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {9-11},
  pages        = {1736--1740},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2006.07.064},
  doi          = {10.1016/J.MICROREL.2006.07.064},
  timestamp    = {Wed, 27 Sep 2023 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/BergbauerLFB06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BernsteinGLWST06,
  author       = {Joseph B. Bernstein and
                  Moshe Gurfinkel and
                  Xiaojun Li and
                  J{\"{o}}rg Walters and
                  Yoram Shapira and
                  Michael Talmor},
  title        = {Electronic circuit reliability modeling},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {12},
  pages        = {1957--1979},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2005.12.004},
  doi          = {10.1016/J.MICROREL.2005.12.004},
  timestamp    = {Sat, 30 Sep 2023 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/BernsteinGLWST06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BlankeT06,
  author       = {Mogens Blanke and
                  Jesper Sandberg Thomsen},
  title        = {Electrical steering of vehicles - fault-tolerant analysis and design},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {9-11},
  pages        = {1421--1432},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2006.07.005},
  doi          = {10.1016/J.MICROREL.2006.07.005},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/BlankeT06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BonfertGWFKS06,
  author       = {Detlef Bonfert and
                  Horst A. Gieser and
                  Heinrich Wolf and
                  M. Frank and
                  A. Konrad and
                  J. Schulz},
  title        = {Transient-induced latch-up test setup for wafer-level and package-level},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {9-11},
  pages        = {1629--1633},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2006.08.002},
  doi          = {10.1016/J.MICROREL.2006.08.002},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/BonfertGWFKS06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BoutillierGBLVKG06,
  author       = {Mathieu Boutillier and
                  Olivier Gauthier{-}Lafaye and
                  S. Bonnefont and
                  F. Lozes{-}Dupuy and
                  F.{-}J. Vermersch and
                  M. Krakowski and
                  Olivier Gilard},
  title        = {Strong electron irradiation hardness of 852 nm Al-free laser diodes},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {9-11},
  pages        = {1715--1719},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2006.07.049},
  doi          = {10.1016/J.MICROREL.2006.07.049},
  timestamp    = {Thu, 06 May 2021 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/BoutillierGBLVKG06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BraunBKBAR06,
  author       = {Tanja Braun and
                  Karl{-}Friedrich Becker and
                  Mathias Koch and
                  Volker Bader and
                  Rolf Aschenbrenner and
                  Herbert Reichl},
  title        = {High-temperature reliability of Flip Chip assemblies},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {1},
  pages        = {144--154},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2005.06.004},
  doi          = {10.1016/J.MICROREL.2005.06.004},
  timestamp    = {Thu, 02 Sep 2021 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/BraunBKBAR06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BreachW06,
  author       = {C. D. Breach and
                  F. Wulff},
  title        = {Oxidation of Au\({}_{\mbox{4}}\)Al in un-moulded gold ballbonds after
                  high temperature storage {(HTS)} in air at 175degreeC},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {12},
  pages        = {2112--2121},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2005.12.009},
  doi          = {10.1016/J.MICROREL.2005.12.009},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/BreachW06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BreachWT06,
  author       = {C. D. Breach and
                  F. Wulff and
                  C. W. Tok},
  title        = {An unusual mechanical failure mode in gold ballbonds at 50mum pitch
                  due to degradation at the Au-Au\({}_{\mbox{4}}\)Al interface during
                  ageing in air at 175degreeC},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {2-4},
  pages        = {543--557},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2005.05.019},
  doi          = {10.1016/J.MICROREL.2005.05.019},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/BreachWT06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BreitensteinARKG06,
  author       = {O. Breitenstein and
                  Frank Altmann and
                  Thorsten Riediger and
                  D. Karg and
                  V. Gottschalk},
  title        = {Lock-in thermal {IR} imaging using a solid immersion lens},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {9-11},
  pages        = {1508--1513},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2006.07.027},
  doi          = {10.1016/J.MICROREL.2006.07.027},
  timestamp    = {Thu, 24 Nov 2022 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/BreitensteinARKG06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BriatLVW06,
  author       = {Olivier Briat and
                  Walid Lajnef and
                  Jean{-}Michel Vinassa and
                  Eric Woirgard},
  title        = {Power cycling tests for accelerated ageing of ultracapacitors},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {9-11},
  pages        = {1445--1450},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2006.07.008},
  doi          = {10.1016/J.MICROREL.2006.07.008},
  timestamp    = {Mon, 26 Oct 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/BriatLVW06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BurmerG06,
  author       = {Christian Burmer and
                  Siegfried G{\"{o}}rlich},
  title        = {Failure analyses for debug and ramp-up of modern IC's},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {9-11},
  pages        = {1486--1497},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2006.07.024},
  doi          = {10.1016/J.MICROREL.2006.07.024},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/BurmerG06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BusattoIPSVC06,
  author       = {Giovanni Busatto and
                  Francesco Iannuzzo and
                  Alberto Porzio and
                  Annunziata Sanseverino and
                  Francesco Velardi and
                  Giuseppe Curr{\`{o}}},
  title        = {Experimental study of power MOSFET's gate damage in radiation environment},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {9-11},
  pages        = {1854--1857},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2006.07.069},
  doi          = {10.1016/J.MICROREL.2006.07.069},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/BusattoIPSVC06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BuzzoCF06,
  author       = {Marco Buzzo and
                  Mauro Ciappa and
                  Wolfgang Fichtner},
  title        = {Characterization of photonic devices by secondary electron potential
                  contrast},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {9-11},
  pages        = {1536--1541},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2006.07.016},
  doi          = {10.1016/J.MICROREL.2006.07.016},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/BuzzoCF06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/CaddemiCD06,
  author       = {Alina Caddemi and
                  Giovanni Crupi and
                  Nicola Donato},
  title        = {Temperature effects on {DC} and small signal {RF} performance of AlGaAs/GaAs
                  HEMTs},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {1},
  pages        = {169--173},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2005.05.003},
  doi          = {10.1016/J.MICROREL.2005.05.003},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/CaddemiCD06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/CassanelliMFVP06,
  author       = {G. Cassanelli and
                  Giovanna Mura and
                  Fausto Fantini and
                  Massimo Vanzi and
                  Bernard Plano},
  title        = {Failure Analysis-assisted {FMEA}},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {9-11},
  pages        = {1795--1799},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2006.07.072},
  doi          = {10.1016/J.MICROREL.2006.07.072},
  timestamp    = {Tue, 21 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/CassanelliMFVP06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/CastellazziCFLM06,
  author       = {Alberto Castellazzi and
                  Mauro Ciappa and
                  Wolfgang Fichtner and
                  G. Lourdel and
                  Michel Mermet{-}Guyennet},
  title        = {Compact modelling and analysis of power-sharing unbalances in IGBT-modules
                  used in traction applications},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {9-11},
  pages        = {1754--1759},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2006.07.055},
  doi          = {10.1016/J.MICROREL.2006.07.055},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/CastellazziCFLM06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ChangH06,
  author       = {Yang{-}Hua Chang and
                  Hui{-}Fen Hsu},
  title        = {Determination of thermal resistance using Gummel measurement for InGaP/GaAs
                  HBTs},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {12},
  pages        = {2074--2078},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2005.12.008},
  doi          = {10.1016/J.MICROREL.2005.12.008},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/ChangH06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/CharruauGDB06,
  author       = {St{\'{e}}phane Charruau and
                  Fabrice Gu{\'{e}}rin and
                  Jesus Hern{\'{a}}ndez Dominguez and
                  Julie Berthon},
  title        = {Reliability estimation of aeronautic component by accelerated tests},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {9-11},
  pages        = {1451--1457},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2006.07.009},
  doi          = {10.1016/J.MICROREL.2006.07.009},
  timestamp    = {Mon, 06 Apr 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/CharruauGDB06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ChatterjeeKLTM06,
  author       = {S. Chatterjee and
                  Yue Kuo and
                  J. Lu and
                  J.{-}Y. Tewg and
                  P. Majhi},
  title        = {Electrical reliability aspects of HfO\({}_{\mbox{2}}\) high-k gate
                  dielectrics with TaN metal gate electrodes under constant voltage
                  stress},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {1},
  pages        = {69--76},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2005.02.004},
  doi          = {10.1016/J.MICROREL.2005.02.004},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/ChatterjeeKLTM06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ChenCLZ06,
  author       = {Ching{-}Yang Chen and
                  Yung{-}Ching Chao and
                  De{-}Shin Liu and
                  Zhen{-}Wei Zhuang},
  title        = {Design of a novel chip on glass package solution for {CMOS} image
                  sensor device},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {8},
  pages        = {1326--1334},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2005.12.003},
  doi          = {10.1016/J.MICROREL.2005.12.003},
  timestamp    = {Thu, 14 Oct 2021 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/ChenCLZ06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ChenE06,
  author       = {Li Chen and
                  M. M. El{-}Gomati},
  title        = {Stabilized emission from micro-field emitter for electron microscopy},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {7},
  pages        = {1209--1213},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2005.10.005},
  doi          = {10.1016/J.MICROREL.2005.10.005},
  timestamp    = {Thu, 09 Jul 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/ChenE06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ChenGDBWMBT06,
  author       = {Li Chen and
                  O. J. Guy and
                  D. Doneddu and
                  S. G. J. Batcup and
                  S. P. Wilks and
                  P. A. Mawby and
                  T. Bouchet and
                  F. Torregrosa},
  title        = {Report on 4H-SiC {JTE} Schottky diodes},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {2-4},
  pages        = {637--640},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2005.07.006},
  doi          = {10.1016/J.MICROREL.2005.07.006},
  timestamp    = {Thu, 09 Jul 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/ChenGDBWMBT06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ChenGHSSLRE06,
  author       = {Fen Chen and
                  J. Gill and
                  Dave Harmon and
                  T. Sullivan and
                  A. Strong and
                  B. Li and
                  H. Rathore and
                  Daniel C. Edelstein},
  title        = {Determination of the thermal conductivity of composite low-k dielectrics
                  for advanced interconnect structures},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {2-4},
  pages        = {232--243},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2005.05.016},
  doi          = {10.1016/J.MICROREL.2005.05.016},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/ChenGHSSLRE06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ChenHC06,
  author       = {Kuo{-}Ming Chen and
                  Kuo{-}Hsiung Houng and
                  Kuo{-}Ning Chiang},
  title        = {Thermal resistance analysis and validation of flip chip {PBGA} packages},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {2-4},
  pages        = {440--448},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2005.06.001},
  doi          = {10.1016/J.MICROREL.2005.06.001},
  timestamp    = {Sun, 02 Oct 2022 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/ChenHC06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ChenILD06,
  author       = {Tze Wee Chen and
                  Choshu Ito and
                  William Loh and
                  Robert W. Dutton},
  title        = {Post-breakdown leakage resistance and its dependence on device area},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {9-11},
  pages        = {1612--1616},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2006.07.044},
  doi          = {10.1016/J.MICROREL.2006.07.044},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/ChenILD06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ChenJKL06,
  author       = {K. M. Chen and
                  D. S. Jiang and
                  N. H. Kao and
                  J. Y. Lai},
  title        = {Effects of underfill materials on the reliability of low-K flip-chip
                  packaging},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {1},
  pages        = {155--163},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2005.05.001},
  doi          = {10.1016/J.MICROREL.2005.05.001},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/ChenJKL06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ChenK06,
  author       = {Shih{-}Hung Chen and
                  Ming{-}Dou Ker},
  title        = {Failure analysis and solutions to overcome latchup failure event of
                  a power controller {IC} in bulk {CMOS} technology},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {7},
  pages        = {1042--1049},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2005.09.009},
  doi          = {10.1016/J.MICROREL.2005.09.009},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/ChenK06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ChenMO06,
  author       = {W.{-}M. Chen and
                  Paul McCloskey and
                  S. Cian O'Mathuna},
  title        = {Isothermal aging effects on the microstructure and solder bump shear
                  strength of eutectic Sn37Pb and Sn3.5Ag solders},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {5-6},
  pages        = {896--904},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2005.06.006},
  doi          = {10.1016/J.MICROREL.2005.06.006},
  timestamp    = {Thu, 14 Oct 2021 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/ChenMO06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ChenWC06,
  author       = {Kuen{-}Suan Chen and
                  Chin{-}Hsin Wang and
                  H. T. Chen},
  title        = {A {MAIC} approach to {TFT-LCD} panel quality improvement},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {7},
  pages        = {1189--1198},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2005.10.003},
  doi          = {10.1016/J.MICROREL.2005.10.003},
  timestamp    = {Thu, 23 Dec 2021 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/ChenWC06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ChenWC06a,
  author       = {Kuo{-}Ming Chen and
                  J. D. Wu and
                  Kuo{-}Ning Chiang},
  title        = {Effects of pre-bump probing and bumping processes on eutectic solder
                  bump electromigration},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {12},
  pages        = {2104--2111},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2006.01.005},
  doi          = {10.1016/J.MICROREL.2006.01.005},
  timestamp    = {Sun, 02 Oct 2022 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/ChenWC06a.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ChenWL06,
  author       = {Hongtao Chen and
                  C. Q. Wang and
                  M. Y. Li},
  title        = {Numerical and experimental analysis of the Sn3.5Ag0.75Cu solder joint
                  reliability under thermal cycling},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {8},
  pages        = {1348--1356},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2005.12.001},
  doi          = {10.1016/J.MICROREL.2005.12.001},
  timestamp    = {Wed, 21 Jun 2023 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/ChenWL06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ChenWTCKL06,
  author       = {K. M. Chen and
                  B. C. Wu and
                  K. H. Tang and
                  F. Y. Cheng and
                  N. H. Kao and
                  J. Y. Lai},
  title        = {An investigation into the effects of probing and wire bonding stress
                  on the reliability of {BOAC}},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {2-4},
  pages        = {335--342},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2005.02.016},
  doi          = {10.1016/J.MICROREL.2005.02.016},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/ChenWTCKL06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ChenZJL06,
  author       = {Xu Chen and
                  Jun Zhang and
                  Chunlei Jiao and
                  Yanmin Liu},
  title        = {Effects of different bonding parameters on the electrical performance
                  and peeling strengths of {ACF} interconnection},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {5-6},
  pages        = {774--785},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2005.07.115},
  doi          = {10.1016/J.MICROREL.2005.07.115},
  timestamp    = {Sat, 30 Sep 2023 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/ChenZJL06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ChienCCCHW06,
  author       = {Chi{-}Hui Chien and
                  Thaiping Chen and
                  Yung{-}Chang Chen and
                  Yii{-}Tay Chiou and
                  Chi{-}Chang Hsieh and
                  Yii{-}Der Wu},
  title        = {Stability of the warpage in a {PBGA} package subjected to hygro-thermal
                  loading},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {7},
  pages        = {1139--1147},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2005.03.012},
  doi          = {10.1016/J.MICROREL.2005.03.012},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/ChienCCCHW06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ChimentonIO06,
  author       = {Andrea Chimenton and
                  Fernanda Irrera and
                  Piero Olivo},
  title        = {Improving performance and reliability of NOR-Flash arrays by using
                  pulsed operation},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {9-11},
  pages        = {1478--1481},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2006.07.014},
  doi          = {10.1016/J.MICROREL.2006.07.014},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/ChimentonIO06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ChongCPNTL06,
  author       = {Desmond Y. R. Chong and
                  F. X. Che and
                  John H. L. Pang and
                  Kellin Ng and
                  Jane Y. N. Tan and
                  Patrick T. H. Low},
  title        = {Drop impact reliability testing for lead-free and lead-based soldered
                  {IC} packages},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {7},
  pages        = {1160--1171},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2005.10.011},
  doi          = {10.1016/J.MICROREL.2005.10.011},
  timestamp    = {Sat, 30 Sep 2023 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/ChongCPNTL06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ChouLGLKLEBO06,
  author       = {Yeong{-}Chang Chou and
                  Denise Leung and
                  Ronald Grundbacher and
                  Richard Lai and
                  Quin Kan and
                  P. H. Liu and
                  David Eng and
                  Thomas R. Block and
                  Aaron K. Oki},
  title        = {Gate metal interdiffusion induced degradation in space-qualified GaAs
                  PHEMTs},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {1},
  pages        = {24--40},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2005.02.012},
  doi          = {10.1016/J.MICROREL.2005.02.012},
  timestamp    = {Wed, 20 Jul 2022 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/ChouLGLKLEBO06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ChuangAD06,
  author       = {Cheng{-}Li Chuang and
                  Jong{-}Ning Aoh and
                  Rong{-}Fong Din},
  title        = {Oxidation of copper pads and its influence on the quality of Au/Cu
                  bonds during thermosonic wire bonding process},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {2-4},
  pages        = {449--458},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2005.01.010},
  doi          = {10.1016/J.MICROREL.2005.01.010},
  timestamp    = {Thu, 14 Oct 2021 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/ChuangAD06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/CourtasGFBW06,
  author       = {S. Courtas and
                  M. Gr{\'{e}}goire and
                  X. Federspiel and
                  N. Bica{\"{\i}}s{-}L{\'{e}}pinay and
                  C. Wyon},
  title        = {Electron BackScattered Diffraction {(EBSD)} use and applications in
                  newest technologies development},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {9-11},
  pages        = {1530--1535},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2006.07.031},
  doi          = {10.1016/J.MICROREL.2006.07.031},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/CourtasGFBW06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/CovaDM06,
  author       = {Paolo Cova and
                  Nicola Delmonte and
                  Roberto Menozzi},
  title        = {Thermal characterization and modeling of power hybrid converters for
                  distributed power systems},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {9-11},
  pages        = {1760--1765},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2006.07.056},
  doi          = {10.1016/J.MICROREL.2006.07.056},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/CovaDM06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/CrunteanuPBDCCTVDC06,
  author       = {Aurelian Crunteanu and
                  Arnaud Pothier and
                  Pierre Blondy and
                  Frederic Dumas{-}Bouchiat and
                  C. Champeaux and
                  A. Catherinot and
                  P. Tristant and
                  Olivier Vendier and
                  Claude Drevon and
                  Jean Louis Cazaux},
  title        = {Gamma radiation effects on {RF} {MEMS} capacitive switches},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {9-11},
  pages        = {1741--1746},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2006.07.065},
  doi          = {10.1016/J.MICROREL.2006.07.065},
  timestamp    = {Sun, 12 Nov 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/CrunteanuPBDCCTVDC06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/DabrowskiDP06,
  author       = {Adam Dabrowski and
                  Rafal Dlugosz and
                  Pawel Pawlowski},
  title        = {Integrated {CMOS} {GSM} baseband channel selecting filters realized
                  using switched capacitor finite impulse response technique},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {5-6},
  pages        = {949--958},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2005.04.002},
  doi          = {10.1016/J.MICROREL.2005.04.002},
  timestamp    = {Fri, 09 Apr 2021 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/DabrowskiDP06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Dakhel06,
  author       = {A. A. Dakhel},
  title        = {Study of dc conduction mechanisms in dysprosium-manganese oxide insulator
                  thin films grown on Si substrates},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {8},
  pages        = {1303--1308},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2005.11.001},
  doi          = {10.1016/J.MICROREL.2005.11.001},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/Dakhel06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/DanesinZGRMZP06,
  author       = {Francesca Danesin and
                  Franco Zanon and
                  Simone Gerardin and
                  Fabiana Rampazzo and
                  Gaudenzio Meneghesso and
                  Enrico Zanoni and
                  Alessandro Paccagnella},
  title        = {Degradation induced by 2-MeV alpha particles on AlGaN/GaN high electron
                  mobility transistors},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {9-11},
  pages        = {1750--1753},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2006.07.066},
  doi          = {10.1016/J.MICROREL.2006.07.066},
  timestamp    = {Sun, 02 Oct 2022 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/DanesinZGRMZP06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/DankovicMDDGS06,
  author       = {Danijel Dankovic and
                  Ivica Manic and
                  Snezana Djoric{-}Veljkovic and
                  Vojkan Davidovic and
                  Snezana Golubovic and
                  Ninoslav Stojadinovic},
  title        = {{NBT} stress-induced degradation and lifetime estimation in p-channel
                  power VDMOSFETs},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {9-11},
  pages        = {1828--1833},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2006.07.077},
  doi          = {10.1016/J.MICROREL.2006.07.077},
  timestamp    = {Mon, 05 Feb 2024 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/DankovicMDDGS06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/DauksherMC06,
  author       = {W. Dauksher and
                  P. Marcoux and
                  G. Castleman},
  title        = {A methodology for the calculation of stress migration in die-level
                  interconnects},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {2-4},
  pages        = {616--625},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2005.05.021},
  doi          = {10.1016/J.MICROREL.2005.05.021},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/DauksherMC06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/DeNardiDPGG06,
  author       = {Christophe De Nardi and
                  Romain Desplats and
                  Philippe Perdu and
                  Jean{-}Luc Gauffier and
                  Christophe Gu{\'{e}}rin},
  title        = {Descrambling and data reading techniques for flash-EEPROM memories.
                  Application to smart cards},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {9-11},
  pages        = {1569--1574},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2006.07.022},
  doi          = {10.1016/J.MICROREL.2006.07.022},
  timestamp    = {Tue, 14 Sep 2021 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/DeNardiDPGG06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/DengK06,
  author       = {Chih{-}Kang Deng and
                  Ming{-}Dou Ker},
  title        = {{ESD} robustness of thin-film devices with different layout structures
                  in {LTPS} technology},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {12},
  pages        = {2067--2073},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2006.01.008},
  doi          = {10.1016/J.MICROREL.2006.01.008},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/DengK06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/DingKT06,
  author       = {Yong Ding and
                  Jang{-}Kyo Kim and
                  Pin Tong},
  title        = {Effects of bonding force on contact pressure and frictional energy
                  in wire bonding},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {7},
  pages        = {1101--1112},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2005.09.010},
  doi          = {10.1016/J.MICROREL.2005.09.010},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/DingKT06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/DomanskiPBSB06,
  author       = {Krzysztof Domanski and
                  B. P{\'{o}}ltorak and
                  S. Bargst{\"{a}}dt{-}Franke and
                  Wolfgang Stadler and
                  Waclaw Bala},
  title        = {Physical fundamentals of external transient latch-up and corrective
                  actions},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {5-6},
  pages        = {689--701},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2005.10.007},
  doi          = {10.1016/J.MICROREL.2005.10.007},
  timestamp    = {Fri, 16 Apr 2021 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/DomanskiPBSB06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/DonahoePLG06,
  author       = {Daniel N. Donahoe and
                  Michael G. Pecht and
                  Isabel K. Lloyd and
                  Sanka Ganesan},
  title        = {Moisture induced degradation of multilayer ceramic capacitors},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {2-4},
  pages        = {400--408},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2005.05.008},
  doi          = {10.1016/J.MICROREL.2005.05.008},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/DonahoePLG06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/DouinPMLPF06,
  author       = {Alexandre Douin and
                  Vincent Pouget and
                  M. De Matos and
                  Dean Lewis and
                  Philippe Perdu and
                  Pascal Fouillat},
  title        = {Time resolved imaging using synchronous picosecond Photoelectric Laser
                  Stimulation},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {9-11},
  pages        = {1514--1519},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2006.07.028},
  doi          = {10.1016/J.MICROREL.2006.07.028},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/DouinPMLPF06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/DreyerDEJ06,
  author       = {W. Dreyer and
                  F. Duderstadt and
                  S. Eichler and
                  M. Jurisch},
  title        = {Stress analysis and bending tests for GaAs wafers},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {5-6},
  pages        = {822--835},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2005.09.005},
  doi          = {10.1016/J.MICROREL.2005.09.005},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/DreyerDEJ06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/DrielSYUZAZ06,
  author       = {W. D. van Driel and
                  Olaf van der Sluis and
                  Dao{-}Guo Yang and
                  R. L. J. M. Ubachs and
                  C. Zenz and
                  G. Aflenzer and
                  G. Q. Zhang},
  title        = {Reliability modelling for packages in flexible end-products},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {9-11},
  pages        = {1880--1885},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2006.07.085},
  doi          = {10.1016/J.MICROREL.2006.07.085},
  timestamp    = {Sat, 30 Sep 2023 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/DrielSYUZAZ06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/DupontKLB06,
  author       = {Laurent Dupont and
                  Zoubir Khatir and
                  St{\'{e}}phane Lefebvre and
                  S. Bontemps},
  title        = {Effects of metallization thickness of ceramic substrates on the reliability
                  of power assemblies under high temperature cycling},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {9-11},
  pages        = {1766--1771},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2006.07.057},
  doi          = {10.1016/J.MICROREL.2006.07.057},
  timestamp    = {Thu, 25 Jan 2024 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/DupontKLB06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/DuvvurySBRKMC06,
  author       = {Charvaka Duvvury and
                  Robert Steinhoff and
                  Gianluca Boselli and
                  Vijay Reddy and
                  Hans Kunz and
                  Steve Marum and
                  Roger Cline},
  title        = {Gate oxide failures due to anomalous stress from {HBM} {ESD} testers},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {5-6},
  pages        = {656--665},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2005.07.120},
  doi          = {10.1016/J.MICROREL.2005.07.120},
  timestamp    = {Sat, 30 Sep 2023 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/DuvvurySBRKMC06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/DziedzicKET06,
  author       = {Andrzej Dziedzic and
                  Andrzej Kolek and
                  Waleed Ehrhardt and
                  Heiko Thust},
  title        = {Advanced electrical and stability characterization of untrimmed and
                  variously trimmed thick-film and {LTCC} resistors},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {2-4},
  pages        = {352--359},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2004.12.014},
  doi          = {10.1016/J.MICROREL.2004.12.014},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/DziedzicKET06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/EntringerFGAN06,
  author       = {Christophe Entringer and
                  Philippe Flatresse and
                  Philippe Galy and
                  Florence Aza{\"{\i}}s and
                  Pascal Nouet},
  title        = {Electro-thermal short pulsed simulation for {SOI} technology},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {9-11},
  pages        = {1482--1485},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2006.07.015},
  doi          = {10.1016/J.MICROREL.2006.07.015},
  timestamp    = {Thu, 14 Oct 2021 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/EntringerFGAN06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ErslandM06,
  author       = {Peter Ersland and
                  Roberto Menozzi},
  title        = {Editorial},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {8},
  pages        = {1217},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2006.02.003},
  doi          = {10.1016/J.MICROREL.2006.02.003},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/ErslandM06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/EsselyDPRBGBPTL06,
  author       = {Fabien Essely and
                  Fr{\'{e}}d{\'{e}}ric Darracq and
                  Vincent Pouget and
                  Mustapha Remmach and
                  Felix Beaudoin and
                  Nicolas Guitard and
                  Marise Bafleur and
                  Philippe Perdu and
                  Andr{\'{e}} Touboul and
                  Dean Lewis},
  title        = {Application of various optical techniques for {ESD} defect localization},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {9-11},
  pages        = {1563--1568},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2006.07.021},
  doi          = {10.1016/J.MICROREL.2006.07.021},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/EsselyDPRBGBPTL06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/EthertonQWWMDSZAG06,
  author       = {M. Etherton and
                  Ning Qu and
                  J. Willemen and
                  Wolfgang Wilkening and
                  S. Mettler and
                  Mariano Dissegna and
                  R. Stella and
                  L. Zullino and
                  A. Andreini and
                  Horst A. Gieser},
  title        = {Study of {CDM} specific effects for a smart power input protection
                  structure},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {5-6},
  pages        = {666--676},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2005.10.008},
  doi          = {10.1016/J.MICROREL.2005.10.008},
  timestamp    = {Fri, 27 Mar 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/EthertonQWWMDSZAG06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ExarchosPPLPP06,
  author       = {M. A. Exarchos and
                  E. Papandreou and
                  Patrick Pons and
                  Mohamed Lamhamdi and
                  George J. Papaioannou and
                  Robert Plana},
  title        = {Charging of radiation induced defects in {RF} {MEMS} dielectric films},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {9-11},
  pages        = {1695--1699},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2006.07.045},
  doi          = {10.1016/J.MICROREL.2006.07.045},
  timestamp    = {Sun, 02 Oct 2022 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/ExarchosPPLPP06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/FangOP06,
  author       = {Tong Fang and
                  Michael D. Osterman and
                  Michael G. Pecht},
  title        = {Statistical analysis of tin whisker growth},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {5-6},
  pages        = {846--849},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2005.06.002},
  doi          = {10.1016/J.MICROREL.2005.06.002},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/FangOP06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/FernandezRNAKG06,
  author       = {Raul Fern{\'{a}}ndez and
                  Rosana Rodr{\'{\i}}guez and
                  Montserrat Nafr{\'{\i}}a and
                  Xavier Aymerich and
                  Ben Kaczer and
                  Guido Groeseneken},
  title        = {FinFET and {MOSFET} preliminary comparison of gate oxide reliability},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {9-11},
  pages        = {1608--1611},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2006.07.043},
  doi          = {10.1016/J.MICROREL.2006.07.043},
  timestamp    = {Wed, 14 Jul 2021 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/FernandezRNAKG06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/FilhoBFD06,
  author       = {W. C. Maia Filho and
                  M. Brizoux and
                  H{\'{e}}l{\`{e}}ne Fr{\'{e}}mont and
                  Yves Danto},
  title        = {Improved physical understanding of intermittent failure in continuous
                  monitoring method},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {9-11},
  pages        = {1886--1891},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2006.07.086},
  doi          = {10.1016/J.MICROREL.2006.07.086},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/FilhoBFD06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/FilipWN06,
  author       = {Valeriu Filip and
                  Hei Wong and
                  D. Nicolaescu},
  title        = {Definition of curve fitting parameter to study tunneling and trapping
                  of electrons in Si/ultra-thin SiO\({}_{\mbox{2}}\)/metal structures},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {7},
  pages        = {1027--1034},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2005.10.014},
  doi          = {10.1016/J.MICROREL.2005.10.014},
  timestamp    = {Sat, 11 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/FilipWN06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/FleischerCJ06,
  author       = {Amy S. Fleischer and
                  Li{-}Hsin Chang and
                  Barry C. Johnson},
  title        = {The effect of die attach voiding on the thermal resistance of chip
                  level packages},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {5-6},
  pages        = {794--804},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2005.01.019},
  doi          = {10.1016/J.MICROREL.2005.01.019},
  timestamp    = {Thu, 09 Feb 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/FleischerCJ06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/FleischerTHJ06,
  author       = {Amy S. Fleischer and
                  Ute Troppenz and
                  Michael Hamacher and
                  Werner John},
  title        = {Thermal analysis of bond layer influence on performance of an all-active
                  vertically coupled, microring resonating laser},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {2-4},
  pages        = {421--431},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2005.04.010},
  doi          = {10.1016/J.MICROREL.2005.04.010},
  timestamp    = {Wed, 31 May 2023 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/FleischerTHJ06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/FoucherTMJ06,
  author       = {Bruno Foucher and
                  J. Tomas and
                  F. Mounsi and
                  M. Jeremias},
  title        = {Life margin assessment with Physics of Failure Tools application to
                  {BGA} packages},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {5-6},
  pages        = {1013--1018},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2005.08.005},
  doi          = {10.1016/J.MICROREL.2005.08.005},
  timestamp    = {Tue, 06 Jul 2021 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/FoucherTMJ06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Fukuda06,
  author       = {Mitsuo Fukuda},
  title        = {Optical source reliability in recent optical fiber transmission systems
                  and consumer electronics},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {2-4},
  pages        = {263--269},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2005.04.003},
  doi          = {10.1016/J.MICROREL.2005.04.003},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/Fukuda06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/GanesanPL06,
  author       = {Sanka Ganesan and
                  Michael G. Pecht and
                  Sharon Ling},
  title        = {Use of high temperature operating life data to mitigate risks in long-duration
                  space applications that deploy commercial-grade plastic encapsulated
                  semiconductor devices},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {2-4},
  pages        = {360--366},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2004.12.019},
  doi          = {10.1016/J.MICROREL.2004.12.019},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/GanesanPL06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/GaoBS06,
  author       = {Liming Gao and
                  Christian Burmer and
                  Frank Siegelin},
  title        = {{ATPG} scan logic failure analysis: a case study of logic ICs - fault
                  isolation, defect mechanism identification and yield improvement},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {9-11},
  pages        = {1458--1463},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2006.07.010},
  doi          = {10.1016/J.MICROREL.2006.07.010},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/GaoBS06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/GaresMMBMBMTE06,
  author       = {M. Gares and
                  Hichame Maanane and
                  Mohamed Masmoudi and
                  Pierre Bertram and
                  J{\'{e}}r{\^{o}}me Marcon and
                  Mohamed Ali Bela{\"{\i}}d and
                  Karine Mourgues and
                  C. Tolant and
                  Philippe Eudeline},
  title        = {Hot carrier reliability of {RF} {N-} {LDMOS} for {S} Band radar application},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {9-11},
  pages        = {1806--1811},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2006.07.074},
  doi          = {10.1016/J.MICROREL.2006.07.074},
  timestamp    = {Sun, 02 Oct 2022 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/GaresMMBMBMTE06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/GawAMZZ06,
  author       = {Craig A. Gaw and
                  Thomas Arnold and
                  Robert Martin and
                  Lisa Zhang and
                  Dragan Zupac},
  title        = {Evaluation of SiGe: {C} {HBT} intrinsic reliability using conventional
                  and step stress methodologies},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {8},
  pages        = {1272--1278},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2006.02.012},
  doi          = {10.1016/J.MICROREL.2006.02.012},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/GawAMZZ06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/GerardinGCPG06,
  author       = {Simone Gerardin and
                  Alessio Griffoni and
                  Andrea Cester and
                  Alessandro Paccagnella and
                  G. Ghidini},
  title        = {Degradation of static and dynamic behavior of {CMOS} inverters during
                  constant and pulsed voltage stress},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {9-11},
  pages        = {1669--1672},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2006.07.052},
  doi          = {10.1016/J.MICROREL.2006.07.052},
  timestamp    = {Sun, 02 Oct 2022 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/GerardinGCPG06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Ghaffarian06,
  author       = {Reza Ghaffarian},
  title        = {{CCGA} packages for space applications},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {12},
  pages        = {2006--2024},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2006.07.094},
  doi          = {10.1016/J.MICROREL.2006.07.094},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/Ghaffarian06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/GhorbaniS06,
  author       = {Hamid R. Ghorbani and
                  Jan K. Spelt},
  title        = {Interfacial thermal stresses in solder joints of leadless chip resistors},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {5-6},
  pages        = {873--884},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2005.05.022},
  doi          = {10.1016/J.MICROREL.2005.05.022},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/GhorbaniS06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/GorollKP06,
  author       = {Michael Goroll and
                  Werner Kanert and
                  Reinhard Pufall},
  title        = {{ESD} protection structure qualification - a new approach for release
                  for automotive applications},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {9-11},
  pages        = {1648--1651},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2006.07.035},
  doi          = {10.1016/J.MICROREL.2006.07.035},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/GorollKP06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/GotoH06,
  author       = {Yasunori Goto and
                  Tomokatsu Higuchi},
  title        = {A 3D analysis technique for detecting trace metal contamination},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {9-11},
  pages        = {1542--1547},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2006.07.017},
  doi          = {10.1016/J.MICROREL.2006.07.017},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/GotoH06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/GuhelBDGB06,
  author       = {Yannick Guhel and
                  Bertrand Boudart and
                  E. Delos and
                  Marianne Germain and
                  Z. Bougrioua},
  title        = {Comparative studies of Pt and Ir schottky contacts on undoped Al\({}_{\mbox{0.36}}\)Ga\({}_{\mbox{0.64}}\)N},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {5-6},
  pages        = {786--793},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2005.08.008},
  doi          = {10.1016/J.MICROREL.2005.08.008},
  timestamp    = {Mon, 21 Mar 2022 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/GuhelBDGB06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/HanWXZ06,
  author       = {Lei Han and
                  Fuliang Wang and
                  Wenhu Xu and
                  Jue Zhong},
  title        = {Bondability window and power input for wire bonding},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {2-4},
  pages        = {610--615},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2005.05.018},
  doi          = {10.1016/J.MICROREL.2005.05.018},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/HanWXZ06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/HatzopoulosTADK06,
  author       = {Argyrios T. Hatzopoulos and
                  Dimitrios H. Tassis and
                  N. Arpatzanis and
                  C. A. Dimitriadis and
                  G. Kamarinos},
  title        = {Effects of hot carriers in offset gated polysilicon thin-film transistors},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {2-4},
  pages        = {311--316},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2005.07.004},
  doi          = {10.1016/J.MICROREL.2005.07.004},
  timestamp    = {Tue, 13 Sep 2022 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/HatzopoulosTADK06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/HayamaTSORMSC06,
  author       = {Kiyoteru Hayama and
                  Kenichiro Takakura and
                  K. Shigaki and
                  Hidenori Ohyama and
                  Joan Marc Raf{\'{\i}} and
                  Abdelkarim Mercha and
                  Eddy Simoen and
                  Cor Claeys},
  title        = {Impact on the back gate degradation in partially depleted {SOI} n-MOSFETs
                  by 2-MeV electron irradiation},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {9-11},
  pages        = {1731--1735},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2006.07.063},
  doi          = {10.1016/J.MICROREL.2006.07.063},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/HayamaTSORMSC06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/HeLXW06,
  author       = {Z. W. He and
                  X. Q. Liu and
                  D. Y. Xu and
                  Y. Y. Wang},
  title        = {Effect of annealing on the properties of low-k nanoporous SiO\({}_{\mbox{2}}\)
                  films prepared by sol-gel method with catalyst {HF}},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {12},
  pages        = {2062--2066},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2006.05.002},
  doi          = {10.1016/J.MICROREL.2006.05.002},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/HeLXW06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/HeerDBPGFKS06,
  author       = {Michael Heer and
                  Viktor Dubec and
                  Sergey Bychikhin and
                  Dionyz Pogany and
                  Erich Gornik and
                  M. Frank and
                  A. Konrad and
                  J. Schulz},
  title        = {Analysis of triggering behaviour of high voltage {CMOS} {LDMOS} clamps
                  and SCRs during {ESD} induced latch-up},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {9-11},
  pages        = {1591--1596},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2006.07.040},
  doi          = {10.1016/J.MICROREL.2006.07.040},
  timestamp    = {Wed, 16 Mar 2022 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/HeerDBPGFKS06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/HuGR06,
  author       = {Chao{-}Kun Hu and
                  Lynne M. Gignac and
                  R. Rosenberg},
  title        = {Electromigration of Cu/low dielectric constant interconnects},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {2-4},
  pages        = {213--231},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2005.05.015},
  doi          = {10.1016/J.MICROREL.2005.05.015},
  timestamp    = {Mon, 11 Sep 2023 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/HuGR06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/HuangCHW06,
  author       = {Hou{-}Kuei Huang and
                  Cieh{-}Pin Chang and
                  Mau{-}Phon Houng and
                  Yeong{-}Her Wang},
  title        = {Current-dependent hot-electron stresses on InGaP-gated and AlGaAs-gated
                  low noise PHEMTs},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {12},
  pages        = {2038--2043},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2006.02.014},
  doi          = {10.1016/J.MICROREL.2006.02.014},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/HuangCHW06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/HuangT06,
  author       = {Guangyu Huang and
                  Cher Ming Tan},
  title        = {Device level electrical-thermal-stress coupled-field modeling},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {9-11},
  pages        = {1823--1827},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2006.07.076},
  doi          = {10.1016/J.MICROREL.2006.07.076},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/HuangT06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/HuangWHW06,
  author       = {Hou{-}Kuei Huang and
                  Chou{-}Sern Wang and
                  Mau{-}Phon Houng and
                  Yeong{-}Her Wang},
  title        = {Hot-electron effects on AlGaAs/InGaAs/GaAs PHEMTs under accelerated
                  {DC} stresses},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {12},
  pages        = {2025--2031},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2006.02.013},
  doi          = {10.1016/J.MICROREL.2006.02.013},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/HuangWHW06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/HuardDP06,
  author       = {Vincent Huard and
                  M. Denais and
                  C. R. Parthasarathy},
  title        = {{NBTI} degradation: From physical mechanisms to modelling},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {1},
  pages        = {1--23},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2005.02.001},
  doi          = {10.1016/J.MICROREL.2005.02.001},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/HuardDP06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/HungHC06,
  author       = {Y. H. Hung and
                  M. L. Huang and
                  C. H. Chang},
  title        = {Optimizing the controller {IC} for micro {HDD} process based on Taguchi
                  methods},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {7},
  pages        = {1183--1188},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2005.09.008},
  doi          = {10.1016/J.MICROREL.2005.09.008},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/HungHC06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/HunterB06,
  author       = {Bradford L. Hunter and
                  Brian K. Butka},
  title        = {Damped transient power clamps for improved {ESD} protection of {CMOS}},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {1},
  pages        = {77--85},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2005.05.006},
  doi          = {10.1016/J.MICROREL.2005.05.006},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/HunterB06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/IannuzzoBA06,
  author       = {Francesco Iannuzzo and
                  Giovanni Busatto and
                  Carmine Abbate},
  title        = {Investigation of {MOSFET} failure in soft-switching conditions},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {9-11},
  pages        = {1790--1794},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2006.07.061},
  doi          = {10.1016/J.MICROREL.2006.07.061},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/IannuzzoBA06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ImKKJKLKS06,
  author       = {Kyoung{-}Sik Im and
                  Jae{-}Hyok Ko and
                  Suk{-}Jin Kim and
                  Chan{-}Hee Jeon and
                  Chang{-}Su Kim and
                  Ki{-}Tae Lee and
                  Han{-}Gu Kim and
                  Il{-}Hun Son},
  title        = {Novel {ESD} strategy for high voltage non-volatile programming pin
                  application},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {9-11},
  pages        = {1664--1668},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2006.07.051},
  doi          = {10.1016/J.MICROREL.2006.07.051},
  timestamp    = {Fri, 14 Jan 2022 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/ImKKJKLKS06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/IraceBSBRM06,
  author       = {Andrea Irace and
                  Giovanni Breglio and
                  Paolo Spirito and
                  A. Bricconi and
                  Diego Raffo and
                  Luigi Merlin},
  title        = {Effect of a buffer layer in the epi-substrate region to boost the
                  avalanche capability of a 100V Schottky diode},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {9-11},
  pages        = {1784--1789},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2006.07.060},
  doi          = {10.1016/J.MICROREL.2006.07.060},
  timestamp    = {Thu, 14 Oct 2021 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/IraceBSBRM06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/IspasoiuCJSKGRO06,
  author       = {Radu Ispasoiu and
                  Tom Crawford and
                  Brian Johnston and
                  Chris Shaw and
                  Steven Kasapi and
                  Jason Goertz and
                  Olivier Rinaudo and
                  Peter Ouimet},
  title        = {Reduction of the acquisition time for {CMOS} time-resolved photon
                  emission by optimized {IR} detection},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {9-11},
  pages        = {1504--1507},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2006.07.026},
  doi          = {10.1016/J.MICROREL.2006.07.026},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/IspasoiuCJSKGRO06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Iyer06,
  author       = {Natarajan Mahadeva Iyer},
  title        = {Introduction to special section on selected papers from {EOS/ESD}
                  Symposium 2004},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {5-6},
  pages        = {655},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2005.10.012},
  doi          = {10.1016/J.MICROREL.2005.10.012},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/Iyer06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/JacobKN06,
  author       = {Peter Jacob and
                  Albert Kunz and
                  Giovanni Nicoletti},
  title        = {Reliability and wearout characterisation of LEDs},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {9-11},
  pages        = {1711--1714},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2006.07.048},
  doi          = {10.1016/J.MICROREL.2006.07.048},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/JacobKN06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/JangHKK06,
  author       = {Changsoo Jang and
                  Seongyoung Han and
                  Hangyu Kim and
                  Sayoon Kang},
  title        = {A numerical failure analysis on lead breakage issues of ultra fine
                  pitch flip chip-on-flex and tape carrier packages during chip/film
                  assembly process},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {2-4},
  pages        = {487--495},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2005.06.013},
  doi          = {10.1016/J.MICROREL.2005.06.013},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/JangHKK06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/JangKBKKJKS06,
  author       = {J. T. Jang and
                  Y. C. Kim and
                  W. H. Bong and
                  E. K. Kwon and
                  B. J. Kwon and
                  J. S. Jeon and
                  H. G. Kim and
                  I. H. Son},
  title        = {A new high-voltage tolerant {I/O} for improving {ESD} robustness},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {9-11},
  pages        = {1634--1637},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2006.07.033},
  doi          = {10.1016/J.MICROREL.2006.07.033},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/JangKBKKJKS06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/JenWF06,
  author       = {Yi{-}Ming Jen and
                  Ying{-}Lung Wu and
                  Chih{-}Kai Fang},
  title        = {Impact of the number of chips on the reliability of the solder balls
                  for wire-bonded stacked-chip ball grid array packages},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {2-4},
  pages        = {386--399},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2005.06.011},
  doi          = {10.1016/J.MICROREL.2005.06.011},
  timestamp    = {Sun, 02 Oct 2022 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/JenWF06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/JilesenLA06,
  author       = {Jonathan Jilesen and
                  F. S. Lien and
                  H. Ahn},
  title        = {Investigation of increased performance of close series stacked tube
                  axial fans due to inclusion of diffuser element},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {5-6},
  pages        = {984--993},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2005.05.013},
  doi          = {10.1016/J.MICROREL.2005.05.013},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/JilesenLA06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/JiunAJO06,
  author       = {Hoh Huey Jiun and
                  Ibrahim Ahmad and
                  Azman Jalar and
                  Ghazali Omar},
  title        = {Effect of wafer thinning methods towards fracture strength and topography
                  of silicon die},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {5-6},
  pages        = {836--845},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2005.07.110},
  doi          = {10.1016/J.MICROREL.2005.07.110},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/JiunAJO06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/KangL06,
  author       = {H.{-}Y. Kang and
                  Amy H. I. Lee},
  title        = {Critical dimension control in photolithography based on the yield
                  by a simulation program},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {5-6},
  pages        = {1006--1012},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2005.08.003},
  doi          = {10.1016/J.MICROREL.2005.08.003},
  timestamp    = {Thu, 19 May 2022 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/KangL06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/KangasvieriNPRV06,
  author       = {T. Kangasvieri and
                  Olli Nousiainen and
                  Jussi Putaala and
                  Risto Rautioaho and
                  J. V{\"{a}}h{\"{a}}kangas},
  title        = {Reliability and {RF} performance of {BGA} solder joints with plastic-core
                  solder balls in {LTCC/PWB} assemblies},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {8},
  pages        = {1335--1347},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2005.11.003},
  doi          = {10.1016/J.MICROREL.2005.11.003},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/KangasvieriNPRV06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/KarjalainenR06,
  author       = {P{\"{a}}ivi H. Karjalainen and
                  Eero Ristolainen},
  title        = {Balancing temperature dependence of on-wafer {SOS} inductors},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {7},
  pages        = {1071--1079},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2005.09.003},
  doi          = {10.1016/J.MICROREL.2005.09.003},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/KarjalainenR06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/KatahiraKSTS06,
  author       = {Takayoshi Katahira and
                  Ilkka Kartio and
                  Hiroshi Segawa and
                  Michimasa Takahashi and
                  Katsumi Sagisaka},
  title        = {Vertically high-density interconnection for mobile application},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {5-6},
  pages        = {756--762},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2005.07.001},
  doi          = {10.1016/J.MICROREL.2005.07.001},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/KatahiraKSTS06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/KeimasiGP06,
  author       = {Mohammadreza Keimasi and
                  Sanka Ganesan and
                  Michael G. Pecht},
  title        = {Low temperature electrical measurements of silicon bipolar monolithic
                  microwave integrated circuit {(MMIC)} amplifiers},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {2-4},
  pages        = {326--334},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2005.07.002},
  doi          = {10.1016/J.MICROREL.2005.07.002},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/KeimasiGP06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/KeppensMTRCV06,
  author       = {Bart Keppens and
                  Markus P. J. Mergens and
                  Cong Son Trinh and
                  Christian C. Russ and
                  Benjamin Van Camp and
                  Koen G. Verhaege},
  title        = {{ESD} protection solutions for high voltage technologies},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {5-6},
  pages        = {677--688},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2005.10.009},
  doi          = {10.1016/J.MICROREL.2005.10.009},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/KeppensMTRCV06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/KimK06,
  author       = {Dae Whan Kim and
                  Byung{-}Seon Kong},
  title        = {The effect of hygro-mechanical and thermo-mechanical stress on delamination
                  of gold bump},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {7},
  pages        = {1087--1094},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2005.07.119},
  doi          = {10.1016/J.MICROREL.2005.07.119},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/KimK06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/KimKJ06,
  author       = {Jong{-}Woong Kim and
                  Dae{-}Gon Kim and
                  Seung{-}Boo Jung},
  title        = {Evaluation of displacement rate effect in shear test of Sn-3Ag-0.5Cu
                  solder bump for flip chip application},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {2-4},
  pages        = {535--542},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2005.06.008},
  doi          = {10.1016/J.MICROREL.2005.06.008},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/KimKJ06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/KimNA06,
  author       = {YoungBae Kim and
                  Hiroshi Noguchi and
                  Masazumi Amagai},
  title        = {Vibration fatigue reliability of {BGA-IC} package with Pb-free solder
                  and Pb-Sn solder},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {2-4},
  pages        = {459--466},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2005.02.003},
  doi          = {10.1016/J.MICROREL.2005.02.003},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/KimNA06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/KimSY06,
  author       = {Hyong Tae Kim and
                  Chang Seop Song and
                  Hae Jeong Yang},
  title        = {Algorithm for automatic alignment in 2D space by object transformation},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {1},
  pages        = {100--108},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2005.06.005},
  doi          = {10.1016/J.MICROREL.2005.06.005},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/KimSY06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/KimYY06,
  author       = {Kyung{-}Seob Kim and
                  C. H. Yu and
                  J. M. Yang},
  title        = {Tin whisker formation of lead-free plated leadframes},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {7},
  pages        = {1080--1086},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2005.08.007},
  doi          = {10.1016/J.MICROREL.2005.08.007},
  timestamp    = {Thu, 31 Aug 2023 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/KimYY06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/KohK06,
  author       = {Jung{-}Hyuk Koh and
                  Tae{-}geun Kim},
  title        = {Reliability of Pb(Mg, Nb)O\({}_{\mbox{3}}\)-Pb(Zr, Ti)O\({}_{\mbox{3}}\)
                  multilayer ceramic piezoelectric actuators by Weibull method},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {1},
  pages        = {183--188},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2005.04.011},
  doi          = {10.1016/J.MICROREL.2005.04.011},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/KohK06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/KomodaYYINWY06,
  author       = {Hirotaka Komoda and
                  Masaaki Yoshida and
                  Yoh Yamamoto and
                  Kouji Iwasaki and
                  Ikuko Nakatani and
                  Heiji Watanabe and
                  Kiyoshi Yasutake},
  title        = {Novel charge neutralization techniques applicable to wide current
                  range of {FIB} processing in {FIB-SEM} combined system},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {12},
  pages        = {2085--2095},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2006.01.014},
  doi          = {10.1016/J.MICROREL.2006.01.014},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/KomodaYYINWY06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/KozlowskaM06,
  author       = {Anna Kozlowska and
                  Andrzej Malag},
  title        = {Investigations of transient thermal properties of conductively cooled
                  diode laser arrays operating under quasicontinuous-wave conditions},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {12},
  pages        = {2079--2084},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2006.03.011},
  doi          = {10.1016/J.MICROREL.2006.03.011},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/KozlowskaM06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/KriegerWDBOL06,
  author       = {V. Krieger and
                  Wolfgang Wondrak and
                  A. Dehbi and
                  W. Bartel and
                  Yves Ousten and
                  Bruno Levrier},
  title        = {Defect detection in multilayer ceramic capacitors},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {9-11},
  pages        = {1926--1931},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2006.07.082},
  doi          = {10.1016/J.MICROREL.2006.07.082},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/KriegerWDBOL06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/KrivosheevaSLBdL06,
  author       = {A. V. Krivosheeva and
                  V. L. Shaposhnikov and
                  V. V. Lyskouski and
                  V. E. Borisenko and
                  F. Arnaud d'Avitaya and
                  J.{-}L. Lazzari},
  title        = {Prospects on Mn-doped ZnGeP\({}_{\mbox{2}}\) for spintronics},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {9-11},
  pages        = {1747--1749},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2006.08.006},
  doi          = {10.1016/J.MICROREL.2006.08.006},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/KrivosheevaSLBdL06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/KumtaRTA06,
  author       = {Amit Kumta and
                  Rusli and
                  Chin{-}Che Tin and
                  J. Ahn},
  title        = {Design of field-plate terminated 4H-SiC Schottky diodes using high-k
                  dielectrics},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {8},
  pages        = {1295--1302},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2005.11.009},
  doi          = {10.1016/J.MICROREL.2005.11.009},
  timestamp    = {Tue, 27 Apr 2021 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/KumtaRTA06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/KwonHP06,
  author       = {Woon{-}Seong Kwon and
                  Suk{-}Jin Ham and
                  Kyung{-}Wook Paik},
  title        = {Deformation mechanism and its effect on electrical conductivity of
                  {ACF} flip chip package under thermal cycling condition: An experimental
                  study},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {2-4},
  pages        = {589--599},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2005.06.014},
  doi          = {10.1016/J.MICROREL.2005.06.014},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/KwonHP06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Lai06,
  author       = {Yi{-}Shao Lai},
  title        = {On solution schemes for time-independent thermomechanical analysis
                  for structures containing polymeric materials},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {5-6},
  pages        = {859--863},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2005.02.010},
  doi          = {10.1016/J.MICROREL.2005.02.010},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/Lai06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LaiK06,
  author       = {Yi{-}Shao Lai and
                  Chin{-}Li Kao},
  title        = {Characteristics of current crowding in flip-chip solder bumps},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {5-6},
  pages        = {915--922},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2005.02.007},
  doi          = {10.1016/J.MICROREL.2005.02.007},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/LaiK06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LaiK06a,
  author       = {Yi{-}Shao Lai and
                  Chin{-}Li Kao},
  title        = {Electrothermal coupling analysis of current crowding and Joule heating
                  in flip-chip packages},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {8},
  pages        = {1357--1368},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2005.08.009},
  doi          = {10.1016/J.MICROREL.2005.08.009},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/LaiK06a.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LaiYY06,
  author       = {Yi{-}Shao Lai and
                  Ping{-}Feng Yang and
                  Chang{-}Lin Yeh},
  title        = {Experimental studies of board-level reliability of chip-scale packages
                  subjected to {JEDEC} drop test condition},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {2-4},
  pages        = {645--650},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2005.07.005},
  doi          = {10.1016/J.MICROREL.2005.07.005},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/LaiYY06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LamhamdiGBSPBP06,
  author       = {Mohamed Lamhamdi and
                  Jean Guastavino and
                  Laurent Boudou and
                  Y. Segui and
                  Patrick Pons and
                  Laurent Bouscayrol and
                  Robert Plana},
  title        = {Charging-Effects in {RF} capacitive switches influence of insulating
                  layers composition},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {9-11},
  pages        = {1700--1704},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2006.07.046},
  doi          = {10.1016/J.MICROREL.2006.07.046},
  timestamp    = {Thu, 07 Dec 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/LamhamdiGBSPBP06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LarsonVL06,
  author       = {Michael C. Larson and
                  Melody A. Verges and
                  Xia Liu},
  title        = {Residual compression in area array packages induced by underfill shrinkage},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {2-4},
  pages        = {496--502},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2005.04.001},
  doi          = {10.1016/J.MICROREL.2005.04.001},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/LarsonVL06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Lee06,
  author       = {Jing Lee},
  title        = {A reliability-driven placement procedure based on thermal-force model},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {5-6},
  pages        = {973--983},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2005.04.015},
  doi          = {10.1016/J.MICROREL.2005.04.015},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/Lee06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LeeL06,
  author       = {Dong{-}Jun Lee and
                  Hyo S. Lee},
  title        = {Major factors to the solder joint strength of {ENIG} layer in {FC}
                  {BGA} package},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {7},
  pages        = {1119--1127},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2005.08.006},
  doi          = {10.1016/J.MICROREL.2005.08.006},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/LeeL06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LeeYKYP06,
  author       = {In Kyung Lee and
                  Se Re Na Yun and
                  Kyosun Kim and
                  Chong{-}Gun Yu and
                  Jong Tae Park},
  title        = {New experimental findings on hot-carrier-induced degradation in lateral
                  {DMOS} transistors},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {9-11},
  pages        = {1864--1867},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2006.07.071},
  doi          = {10.1016/J.MICROREL.2006.07.071},
  timestamp    = {Sun, 02 Oct 2022 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/LeeYKYP06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LegierskiWM06,
  author       = {Jaroslaw Legierski and
                  Boguslaw Wiecek and
                  Gilbert De Mey},
  title        = {Measurements and simulations of transient characteristics of heat
                  pipes},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {1},
  pages        = {109--115},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2005.06.003},
  doi          = {10.1016/J.MICROREL.2005.06.003},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/LegierskiWM06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LiYCGFS06,
  author       = {Baozhen Li and
                  Emmanuel Yashchin and
                  Cathryn Christiansen and
                  Jason Gill and
                  Ronald Filippi and
                  Timothy D. Sullivan},
  title        = {Application of three-parameter lognormal distribution in {EM} data
                  analysis},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {12},
  pages        = {2049--2055},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2006.01.001},
  doi          = {10.1016/J.MICROREL.2006.01.001},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/LiYCGFS06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LinK06,
  author       = {Kun{-}Hsien Lin and
                  Ming{-}Dou Ker},
  title        = {Electrostatic discharge protection scheme without leakage current
                  path for {CMOS} {IC} operating in power-down-mode condition on a system
                  board},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {2-4},
  pages        = {301--310},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2004.12.020},
  doi          = {10.1016/J.MICROREL.2004.12.020},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/LinK06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LitovskiAZ06,
  author       = {Vanco B. Litovski and
                  Miona Andrejevic and
                  Mark Zwolinski},
  title        = {Analogue electronic circuit diagnosis based on ANNs},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {8},
  pages        = {1382--1391},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2005.11.008},
  doi          = {10.1016/J.MICROREL.2005.11.008},
  timestamp    = {Mon, 01 May 2023 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/LitovskiAZ06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LiuSVL06,
  author       = {Xia Liu and
                  Valmiki K. Sooklal and
                  Melody A. Verges and
                  Michael C. Larson},
  title        = {Experimental study and life prediction on high cycle vibration fatigue
                  in {BGA} packages},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {7},
  pages        = {1128--1138},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2005.09.011},
  doi          = {10.1016/J.MICROREL.2005.09.011},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/LiuSVL06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LloydMPCL06,
  author       = {J. R. Lloyd and
                  C. E. Murray and
                  S. Ponoth and
                  S. Cohen and
                  E. Liniger},
  title        = {The effect of Cu diffusion on the {TDDB} behavior in a low-k interlevel
                  dielectrics},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {9-11},
  pages        = {1643--1647},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2006.08.003},
  doi          = {10.1016/J.MICROREL.2006.08.003},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/LloydMPCL06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LuBN06,
  author       = {Henry Y. Lu and
                  Haluk Balkan and
                  K. Y. Simon Ng},
  title        = {Microstructure evolution of the Sn-Ag-y{\%}Cu interconnect},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {7},
  pages        = {1058--1070},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2005.08.004},
  doi          = {10.1016/J.MICROREL.2005.08.004},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/LuBN06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LuSZ06,
  author       = {Hua Lu and
                  Helen Shi and
                  Ming Zhou},
  title        = {Thermally induced deformation of solder joints in real packages: Measurement
                  and analysis},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {7},
  pages        = {1148--1159},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2005.10.002},
  doi          = {10.1016/J.MICROREL.2005.10.002},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/LuSZ06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LucovskySFULLB06,
  author       = {Gerald Lucovsky and
                  H. Seo and
                  L. B. Fleming and
                  M. D. Ulrich and
                  J. L{\"{u}}ning and
                  Patrick Lysaght and
                  Gennadi Bersuker},
  title        = {Intrinsic bonding defects in transition metal elemental oxides},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {9-11},
  pages        = {1623--1628},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2006.07.032},
  doi          = {10.1016/J.MICROREL.2006.07.032},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/LucovskySFULLB06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LuoJZZWLNHGS06,
  author       = {J. F. Luo and
                  Yuan Ji and
                  T. X. Zhong and
                  Y. Q. Zhang and
                  J. Z. Wang and
                  J. P. Liu and
                  N. H. Niu and
                  J. Han and
                  X. Guo and
                  G. D. Shen},
  title        = {{EBSD} measurements of elastic strain fields in a GaN/sapphire structure},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {1},
  pages        = {178--182},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2005.05.012},
  doi          = {10.1016/J.MICROREL.2005.05.012},
  timestamp    = {Tue, 22 Dec 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/LuoJZZWLNHGS06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/MaananeMMBMTKE06,
  author       = {Hichame Maanane and
                  Mohamed Masmoudi and
                  J{\'{e}}r{\^{o}}me Marcon and
                  Mohamed Ali Bela{\"{\i}}d and
                  Karine Mourgues and
                  C. Tolant and
                  K. Ketata and
                  Philippe Eudeline},
  title        = {Study of {RF} N\({}^{\mbox{-}}\) {LDMOS} critical electrical parameter
                  drifts after a thermal and electrical ageing in pulsed {RF}},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {5-6},
  pages        = {994--1000},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2005.07.107},
  doi          = {10.1016/J.MICROREL.2005.07.107},
  timestamp    = {Sun, 02 Oct 2022 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/MaananeMMBMTKE06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Matters-KammererMRPHSMGM06,
  author       = {Marion K. Matters{-}Kammerer and
                  U. Mackens and
                  Klaus Reimann and
                  Rainer Pietig and
                  D. Hennings and
                  B. Schreinemacher and
                  R. Mauczok and
                  S. Gruhlke and
                  C. Martiny},
  title        = {Material properties and {RF} applications of high k and ferrite {LTCC}
                  ceramics},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {1},
  pages        = {134--143},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2004.10.022},
  doi          = {10.1016/J.MICROREL.2004.10.022},
  timestamp    = {Fri, 23 Jul 2021 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/Matters-KammererMRPHSMGM06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/McCluskeyDWH06,
  author       = {F. Patrick McCluskey and
                  M. Dash and
                  Z. Wang and
                  D. Huff},
  title        = {Reliability of high temperature solder alternatives},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {9-11},
  pages        = {1910--1914},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2006.07.090},
  doi          = {10.1016/J.MICROREL.2006.07.090},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/McCluskeyDWH06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/MeneghiniPMPTMVZ06,
  author       = {Matteo Meneghini and
                  Simona Podda and
                  A. Morelli and
                  Ruggero Pintus and
                  L. Trevisanello and
                  Gaudenzio Meneghesso and
                  Massimo Vanzi and
                  Enrico Zanoni},
  title        = {High brightness GaN LEDs degradation during dc and pulsed stress},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {9-11},
  pages        = {1720--1724},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2006.07.050},
  doi          = {10.1016/J.MICROREL.2006.07.050},
  timestamp    = {Sat, 09 Apr 2022 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/MeneghiniPMPTMVZ06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/MisraTMA06,
  author       = {E. Misra and
                  N. D. Theodore and
                  J. W. Mayer and
                  T. L. Alford},
  title        = {Failure mechanisms of pure silver, pure aluminum and silver-aluminum
                  alloy under high current stress},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {12},
  pages        = {2096--2103},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2006.01.011},
  doi          = {10.1016/J.MICROREL.2006.01.011},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/MisraTMA06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/MiyazakiO06,
  author       = {Toru Miyazaki and
                  Tomoya Omata},
  title        = {Electromigration degradation mechanism for Pb-free flip-chip micro
                  solder bumps},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {9-11},
  pages        = {1898--1903},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2006.07.088},
  doi          = {10.1016/J.MICROREL.2006.07.088},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/MiyazakiO06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/MoreauHR06,
  author       = {C. Moreau and
                  P. Le Helleye and
                  D. Ruelloux},
  title        = {A complete {RF} power technology assessment for military applications},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {9-11},
  pages        = {1817--1822},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2006.08.007},
  doi          = {10.1016/J.MICROREL.2006.08.007},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/MoreauHR06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/MoritaATK06,
  author       = {Yasuyuki Morita and
                  Kazuo Arakawa and
                  Mitsugu Todo and
                  Masayuki Kaneto},
  title        = {Experimental study on the thermo-mechanical effects of underfill and
                  low-CTE substrate in a flip-chip device},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {5-6},
  pages        = {923--929},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2005.02.013},
  doi          = {10.1016/J.MICROREL.2005.02.013},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/MoritaATK06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/MuraliSV06,
  author       = {Sarangapani Murali and
                  Narasimalu Srikanth and
                  Charles J. Vath III},
  title        = {Effect of wire diameter on the thermosonic bond reliability},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {2-4},
  pages        = {467--475},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2005.05.011},
  doi          = {10.1016/J.MICROREL.2005.05.011},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/MuraliSV06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/NasehDC06,
  author       = {Sasan Naseh and
                  M. Jamal Deen and
                  Chih{-}Hung Chen},
  title        = {Hot-carrier reliability of submicron NMOSFETs and integrated {NMOS}
                  low noise amplifiers},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {2-4},
  pages        = {201--212},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2005.04.009},
  doi          = {10.1016/J.MICROREL.2005.04.009},
  timestamp    = {Fri, 27 Mar 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/NasehDC06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/NguyenGCCPMJ06,
  author       = {Hung Son Nguyen and
                  Z. H. Gan and
                  Zhe Chen and
                  V. Chandrasekar and
                  K. Prasad and
                  S. G. Mhaisalkar and
                  Ning Jiang},
  title        = {Reliability studies of barrier layers for Cu/PAE low-k interconnects},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {8},
  pages        = {1309--1314},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2005.11.005},
  doi          = {10.1016/J.MICROREL.2005.11.005},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/NguyenGCCPMJ06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/NicholsonS06,
  author       = {R. A. Nicholson and
                  H. Suri},
  title        = {Physical-to-Logical Mapping of Emission Data using Place-and-Route},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {9-11},
  pages        = {1548--1553},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2006.07.018},
  doi          = {10.1016/J.MICROREL.2006.07.018},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/NicholsonS06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/OatesL06,
  author       = {A. S. Oates and
                  Shou{-}Chung Lee},
  title        = {Electromigration failure distributions of dual damascene Cu /low -
                  k interconnects},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {9-11},
  pages        = {1581--1586},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2006.07.038},
  doi          = {10.1016/J.MICROREL.2006.07.038},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/OatesL06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/OssaimeeKFGO06,
  author       = {M. Ossaimee and
                  Khaled Kirah and
                  W. Fikry and
                  A. Girgis and
                  O. A. Omar},
  title        = {Simplified quantitative stress-induced leakage current {(SILC)} model
                  for {MOS} devices},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {2-4},
  pages        = {287--292},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2005.07.007},
  doi          = {10.1016/J.MICROREL.2005.07.007},
  timestamp    = {Thu, 05 Nov 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/OssaimeeKFGO06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/PalegoPCB06,
  author       = {Cristiano Palego and
                  Arnaud Pothier and
                  Aurelian Crunteanu and
                  Pierre Blondy},
  title        = {High power reliability aspects on {RF} {MEMS} varactor design},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {9-11},
  pages        = {1705--1710},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2006.07.047},
  doi          = {10.1016/J.MICROREL.2006.07.047},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/PalegoPCB06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/PanCYH06,
  author       = {C. T. Pan and
                  P. J. Cheng and
                  C. K. Yen and
                  C. C. Hsieh},
  title        = {Application of polyimide to bending-mode microactuators with Ni/Fe
                  and Fe/Pt magnet},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {8},
  pages        = {1369--1381},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2005.10.015},
  doi          = {10.1016/J.MICROREL.2005.10.015},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/PanCYH06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/PanGTV06,
  author       = {M. Y. Pan and
                  Manoj Gupta and
                  Andrew A. O. Tay and
                  Kripesh Vaidyanathan},
  title        = {Development of bulk nanostructured copper with superior hardness for
                  use as an interconnect material in electronic packaging},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {5-6},
  pages        = {763--767},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2005.06.009},
  doi          = {10.1016/J.MICROREL.2005.06.009},
  timestamp    = {Tue, 15 Aug 2023 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/PanGTV06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ParkO06,
  author       = {Jongwoo Park and
                  John Osenbach},
  title        = {Processability and reliability of epoxy adhesive used in microelectronic
                  devices linked to effects of degree of cure and damp heat aging},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {2-4},
  pages        = {503--511},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2005.05.010},
  doi          = {10.1016/J.MICROREL.2005.05.010},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/ParkO06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ParthasarathyDHRRGPVB06,
  author       = {C. R. Parthasarathy and
                  M. Denais and
                  Vincent Huard and
                  G. Ribes and
                  David Roy and
                  Chloe Gu{\'{e}}rin and
                  F. Perrier and
                  E. Vincent and
                  Alain Bravaix},
  title        = {Designing in reliability in advanced {CMOS} technologies},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {9-11},
  pages        = {1464--1471},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2006.07.012},
  doi          = {10.1016/J.MICROREL.2006.07.012},
  timestamp    = {Sat, 30 Sep 2023 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/ParthasarathyDHRRGPVB06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/PechtD06,
  author       = {Michael G. Pecht and
                  Yuliang Deng},
  title        = {Electronic device encapsulation using red phosphorus flame retardants},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {1},
  pages        = {53--62},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2005.09.001},
  doi          = {10.1016/J.MICROREL.2005.09.001},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/PechtD06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/PengKCKC06,
  author       = {Chih{-}Tang Peng and
                  Chia{-}Tai Kuo and
                  Kuo{-}Ning Chiang and
                  Terry Ku and
                  Kenny Chang},
  title        = {Experimental characterization and mechanical behavior analysis of
                  intermetallic compounds of Sn-3.5Ag lead-free solder bump with Ti/Cu/Ni
                  {UBM} on copper chip},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {2-4},
  pages        = {523--534},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2005.06.010},
  doi          = {10.1016/J.MICROREL.2005.06.010},
  timestamp    = {Sun, 02 Oct 2022 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/PengKCKC06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/PerpinaSSBMM06,
  author       = {X. Perpi{\~{n}}{\`{a}} and
                  Jean{-}Fran{\c{c}}ois Serviere and
                  J. Saiz and
                  Davide Barlini and
                  Michel Mermet{-}Guyennet and
                  Jos{\'{e}} Mill{\'{a}}n},
  title        = {Temperature measurement on series resistance and devices in power
                  packs based on on-state voltage drop monitoring at high current},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {9-11},
  pages        = {1834--1839},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2006.07.078},
  doi          = {10.1016/J.MICROREL.2006.07.078},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/PerpinaSSBMM06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/PershenkovTBRM06,
  author       = {V. S. Pershenkov and
                  A. D. Tremasov and
                  V. V. Belyakov and
                  A. U. Razvalyaev and
                  V. S. Mochkin},
  title        = {X-ray ion mobility spectrometer},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {2-4},
  pages        = {641--644},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2005.07.003},
  doi          = {10.1016/J.MICROREL.2005.07.003},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/PershenkovTBRM06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/PlieningerDP06,
  author       = {R. Plieninger and
                  M. Dittes and
                  Klaus Pressel},
  title        = {Modern {IC} packaging trends and their reliability implications},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {9-11},
  pages        = {1868--1873},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2006.08.008},
  doi          = {10.1016/J.MICROREL.2006.08.008},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/PlieningerDP06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/PomplKRK06,
  author       = {T. Pompl and
                  A. Kerber and
                  M. R{\"{o}}hner and
                  Martin Kerber},
  title        = {Gate voltage and oxide thickness dependence of progressive wear-out
                  of ultra-thin gate oxides},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {9-11},
  pages        = {1603--1607},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2006.07.042},
  doi          = {10.1016/J.MICROREL.2006.07.042},
  timestamp    = {Fri, 09 Oct 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/PomplKRK06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/PramanikIS06,
  author       = {C. Pramanik and
                  Tarikul Islam and
                  Hiranmay Saha},
  title        = {Temperature compensation of piezoresistive micro-machined porous silicon
                  pressure sensor by {ANN}},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {2-4},
  pages        = {343--351},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2005.04.008},
  doi          = {10.1016/J.MICROREL.2005.04.008},
  timestamp    = {Thu, 29 Feb 2024 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/PramanikIS06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/QiLGSS06,
  author       = {Yan Qi and
                  Rex Lam and
                  Hamid R. Ghorbani and
                  Polina Snugovsky and
                  Jan K. Spelt},
  title        = {Temperature profile effects in accelerated thermal cycling of SnPb
                  and Pb-free solder joints},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {2-4},
  pages        = {574--588},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2005.01.008},
  doi          = {10.1016/J.MICROREL.2005.01.008},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/QiLGSS06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/QianSTM06,
  author       = {Zhongling Qian and
                  Frank Siegelin and
                  Birgit Tippelt and
                  Stefan M{\"{u}}ller},
  title        = {Localization and physical analysis of a complex {SRAM} failure in
                  90nm technology},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {9-11},
  pages        = {1558--1562},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2006.07.020},
  doi          = {10.1016/J.MICROREL.2006.07.020},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/QianSTM06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/RadivojevicKOSSV06,
  author       = {Zoran Radivojevic and
                  Ivan Kassamakov and
                  Markku Oinonen and
                  H. Saarikko and
                  Henri Sepp{\"{a}}nen and
                  Pasi Vihinen},
  title        = {Transient {IR} imaging of light and flexible microelectronic devices},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {1},
  pages        = {116--123},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2005.01.013},
  doi          = {10.1016/J.MICROREL.2005.01.013},
  timestamp    = {Mon, 05 Jul 2021 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/RadivojevicKOSSV06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/RafiSHMCOC06,
  author       = {Joan Marc Raf{\'{\i}} and
                  Eddy Simoen and
                  Kiyoteru Hayama and
                  Abdelkarim Mercha and
                  Francesca Campabadal and
                  Hidenori Ohyama and
                  Cor Claeys},
  title        = {Hot-carrier-induced degradation of drain current hysteresis and transients
                  in thin gate oxide floating body partially depleted {SOI} nMOSFETs},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {9-11},
  pages        = {1657--1663},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2006.07.037},
  doi          = {10.1016/J.MICROREL.2006.07.037},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/RafiSHMCOC06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/RajabzadehM06,
  author       = {Amir Rajabzadeh and
                  Seyed Ghassem Miremadi},
  title        = {Transient detection in {COTS} processors using software approach},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {1},
  pages        = {124--133},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2004.10.013},
  doi          = {10.1016/J.MICROREL.2004.10.013},
  timestamp    = {Mon, 26 Oct 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/RajabzadehM06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/RajabzadehM06a,
  author       = {Amir Rajabzadeh and
                  Seyed Ghassem Miremadi},
  title        = {{CFCET:} {A} hardware-based control flow checking technique in {COTS}
                  processors using execution tracing},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {5-6},
  pages        = {959--972},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2005.07.108},
  doi          = {10.1016/J.MICROREL.2005.07.108},
  timestamp    = {Mon, 26 Oct 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/RajabzadehM06a.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/RamkumarGV06,
  author       = {S. Manian Ramkumar and
                  Reza Ghaffarian and
                  Arun Varanasi},
  title        = {Lead-free 0201 manufacturing, assembly and reliability test results},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {2-4},
  pages        = {244--262},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2005.09.007},
  doi          = {10.1016/J.MICROREL.2005.09.007},
  timestamp    = {Sat, 30 Sep 2023 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/RamkumarGV06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/RampnouxMSGCD06,
  author       = {Jean{-}Michel Rampnoux and
                  H. Michel and
                  M. Amine Salhi and
                  St{\'{e}}phane Grauby and
                  Wilfrid Claeys and
                  Stefan Dilhaire},
  title        = {Time gating imaging through thick silicon substrate: a new step towards
                  backside characterisation},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {9-11},
  pages        = {1520--1524},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2006.07.029},
  doi          = {10.1016/J.MICROREL.2006.07.029},
  timestamp    = {Thu, 14 Oct 2021 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/RampnouxMSGCD06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/RanuarezDC06,
  author       = {Juan C. Ranu{\'{a}}rez and
                  M. Jamal Deen and
                  Chih{-}Hung Chen},
  title        = {A review of gate tunneling current in {MOS} devices},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {12},
  pages        = {1939--1956},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2005.12.006},
  doi          = {10.1016/J.MICROREL.2005.12.006},
  timestamp    = {Fri, 27 Mar 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/RanuarezDC06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/RatchevSS06,
  author       = {Petar Ratchev and
                  Serguei Stoukatch and
                  Bart Swinnen},
  title        = {Mechanical reliability of Au and Cu wire bonds to Al, Ni/Au and Ni/Pd/Au
                  capped Cu bond pads},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {8},
  pages        = {1315--1325},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2005.11.002},
  doi          = {10.1016/J.MICROREL.2005.11.002},
  timestamp    = {Sat, 09 Apr 2022 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/RatchevSS06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/RidoutDBH06,
  author       = {Stephen Ridout and
                  Milos Dusek and
                  Chris Bailey and
                  Chris Hunt},
  title        = {Assessing the performance of crack detection tests for solder joints},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {12},
  pages        = {2122--2130},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2006.05.001},
  doi          = {10.1016/J.MICROREL.2006.05.001},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/RidoutDBH06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/RodriguezAGHGP06,
  author       = {Nicolas Rodriguez and
                  J{\'{e}}r{\^{o}}me Adrian and
                  Catherine Grosjean and
                  G{\'{e}}rald Haller and
                  Christophe Girardeaux and
                  Alain Portavoce},
  title        = {Evaluation of scanning capacitance microscopy sample preparation by
                  focused ion beam},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {9-11},
  pages        = {1554--1557},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2006.07.019},
  doi          = {10.1016/J.MICROREL.2006.07.019},
  timestamp    = {Thu, 03 Aug 2023 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/RodriguezAGHGP06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Roesch06,
  author       = {William J. Roesch},
  title        = {Historical review of compound semiconductor reliability},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {8},
  pages        = {1218--1227},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2006.02.008},
  doi          = {10.1016/J.MICROREL.2006.02.008},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/Roesch06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Roesch06a,
  author       = {William J. Roesch},
  title        = {Compound semiconductor activation energy in humidity},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {8},
  pages        = {1238--1246},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2006.02.006},
  doi          = {10.1016/J.MICROREL.2006.02.006},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/Roesch06a.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/RoosmalenZ06,
  author       = {A. J. van Roosmalen and
                  G. Q. Zhang},
  title        = {Reliability challenges in the nanoelectronics era},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {9-11},
  pages        = {1403--1414},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2006.07.011},
  doi          = {10.1016/J.MICROREL.2006.07.011},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/RoosmalenZ06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/RoyT06,
  author       = {Arijit Roy and
                  Cher Ming Tan},
  title        = {Experimental investigation on the impact of stress free temperature
                  on the electromigration performance of copper dual damascene submicron
                  interconnect},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {9-11},
  pages        = {1652--1656},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2006.07.036},
  doi          = {10.1016/J.MICROREL.2006.07.036},
  timestamp    = {Tue, 27 Sep 2022 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/RoyT06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/SalcedoLAH06,
  author       = {Javier A. Salcedo and
                  Juin J. Liou and
                  Muhammad Yaqub Afridi and
                  Allen R. Hefner},
  title        = {On-chip electrostatic discharge protection for {CMOS} gas sensor systems-on-a-chip
                  (SoC)},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {8},
  pages        = {1285--1294},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2005.12.002},
  doi          = {10.1016/J.MICROREL.2005.12.002},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/SalcedoLAH06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/SalmHKS06,
  author       = {Cora Salm and
                  Andr{\'{e}} J. Hof and
                  Fred G. Kuper and
                  Jurriaan Schmitz},
  title        = {Reduced temperature dependence of hot carrier degradation in deuterated
                  nMOSFETs},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {9-11},
  pages        = {1617--1622},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2006.08.004},
  doi          = {10.1016/J.MICROREL.2006.08.004},
  timestamp    = {Thu, 14 Oct 2021 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/SalmHKS06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/SanadaY06,
  author       = {Masaru Sanada and
                  Yutaka Yoshizawa},
  title        = {Fault diagnosis technology based on transistor behavior analysis for
                  physical analysis},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {9-11},
  pages        = {1575--1580},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2006.07.023},
  doi          = {10.1016/J.MICROREL.2006.07.023},
  timestamp    = {Mon, 07 Nov 2022 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/SanadaY06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/SanchezOM06,
  author       = {Francisco J. Garc{\'{\i}}a{-}S{\'{a}}nchez and
                  Adelmo Ortiz{-}Conde and
                  Juan Muci},
  title        = {Understanding threshold voltage in undoped-body MOSFETs: An appraisal
                  of various criteria},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {5-6},
  pages        = {731--742},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2005.07.116},
  doi          = {10.1016/J.MICROREL.2005.07.116},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/SanchezOM06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/SchlangenSKB06,
  author       = {Rudolf Schlangen and
                  Peter Sadewater and
                  Uwe Kerst and
                  Christian Boit},
  title        = {Contact to contacts or silicide by use of backside {FIB} circuit edit
                  allowing to approach every active circuit node},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {9-11},
  pages        = {1498--1503},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2006.07.025},
  doi          = {10.1016/J.MICROREL.2006.07.025},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/SchlangenSKB06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/SedaghatKAJ06,
  author       = {Reza Sedaghat and
                  Mayuri Kunchwar and
                  Raha Abedi and
                  M. Reza Javaheri},
  title        = {Transistor-level to gate-level comprehensive fault synthesis for n-input
                  primitive gates},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {12},
  pages        = {2149--2158},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2005.12.005},
  doi          = {10.1016/J.MICROREL.2005.12.005},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/SedaghatKAJ06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ShuCC06,
  author       = {Ming{-}Hung Shu and
                  Ching{-}Hsue Cheng and
                  Jing{-}Rong Chang},
  title        = {Using intuitionistic fuzzy sets for fault-tree analysis on printed
                  circuit board assembly},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {12},
  pages        = {2139--2148},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2006.01.007},
  doi          = {10.1016/J.MICROREL.2006.01.007},
  timestamp    = {Thu, 14 Oct 2021 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/ShuCC06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/SiekierskaFKKLOPPSS06,
  author       = {Krystyna Siekierska and
                  Pawel Fras and
                  Artur Kokoszka and
                  Tomasz Kostienko and
                  Norbert Lugowski and
                  Dariusz Obrebski and
                  Adam Pawlak and
                  Piotr Penkala and
                  Dariusz Stachanczyk and
                  Marek Szlezak},
  title        = {Distributed collaborative design of {IP} components in the {TRMS}
                  environment},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {5-6},
  pages        = {1019--1024},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2005.07.118},
  doi          = {10.1016/J.MICROREL.2005.07.118},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/SiekierskaFKKLOPPSS06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/SikoraPUP06,
  author       = {Axel Sikora and
                  Frank{-}Peter Pesl and
                  Walter Unger and
                  Uwe Paschen},
  title        = {Technologies and reliability of modern embedded flash cells},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {12},
  pages        = {1980--2005},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2006.01.003},
  doi          = {10.1016/J.MICROREL.2006.01.003},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/SikoraPUP06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Singh06,
  author       = {Ranbir Singh},
  title        = {Reliability and performance limitations in SiC power devices},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {5-6},
  pages        = {713--730},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2005.10.013},
  doi          = {10.1016/J.MICROREL.2005.10.013},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/Singh06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/SinghalLCHTJNMRR06,
  author       = {Sameer Singhal and
                  T. Li and
                  Apurva Chaudhari and
                  Allen W. Hanson and
                  Robert J. Therrien and
                  Wayne Johnson and
                  Walter Nagy and
                  J. Marquart and
                  Pradeep Rajagopal and
                  John C. Roberts},
  title        = {Reliability of large periphery GaN-on-Si HFETs},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {8},
  pages        = {1247--1253},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2006.02.009},
  doi          = {10.1016/J.MICROREL.2006.02.009},
  timestamp    = {Mon, 04 Apr 2022 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/SinghalLCHTJNMRR06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/SomisettyEYB06,
  author       = {Shivarajiv Somisetty and
                  Peter Ersland and
                  Xinxing Yang and
                  Jason Barrett},
  title        = {Reliability investigation and characterization of failure modes in
                  Schottky diodes},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {8},
  pages        = {1254--1260},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2006.02.005},
  doi          = {10.1016/J.MICROREL.2006.02.005},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/SomisettyEYB06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/SozzaCDMLT06,
  author       = {A. Sozza and
                  Arnaud Curutchet and
                  Christian Dua and
                  Nathalie Malbert and
                  Nathalie Labat and
                  Andr{\'{e}} Touboul},
  title        = {AlGaN/GaN {HEMT} Reliability Assessment by means of Low Frequency
                  Noise Measurements},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {9-11},
  pages        = {1725--1730},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2006.07.062},
  doi          = {10.1016/J.MICROREL.2006.07.062},
  timestamp    = {Thu, 16 Apr 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/SozzaCDMLT06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/StathisZ06,
  author       = {James H. Stathis and
                  Sufi Zafar},
  title        = {The negative bias temperature instability in {MOS} devices: {A} review},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {2-4},
  pages        = {270--286},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2005.08.001},
  doi          = {10.1016/J.MICROREL.2005.08.001},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/StathisZ06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Stojcev06,
  author       = {Mile K. Stojcev},
  title        = {Stephen Brown Zvonko Vranesic, Fundamental of Digital Logic with Verilog
                  Design, McGraw Hill, Boston, 2004, Hardcover, pp 844, plus XX, {ISBN}
                  0-07-121359-7},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {1},
  pages        = {194--195},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2005.01.001},
  doi          = {10.1016/J.MICROREL.2005.01.001},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/Stojcev06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Stojcev06a,
  author       = {Mile K. Stojcev},
  title        = {John P. Hayes, Computer Architecture and Organization, Third ed.,
                  McGraw-Hill Book Company, Inc., Boston, 1988, Softcover, pp 604, plus
                  XIV, {ISBN} 0-07-115997-5},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {1},
  pages        = {196--197},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2005.01.004},
  doi          = {10.1016/J.MICROREL.2005.01.004},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/Stojcev06a.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Stojcev06b,
  author       = {Mile K. Stojcev},
  title        = {S. Sutherland, S. Davidman and P. Flake, System Verilog for Design:
                  {A} Guide to Using System Verilog for Hardware Design and Modeling
                  Hardcover, Kluwer Academic Publishers, Norwell, {MA} {(2004)} {ISBN}
                  1-4020-7530-8 pp 374, plus XXVIII, euro 119},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {1},
  pages        = {198--199},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2005.06.012},
  doi          = {10.1016/J.MICROREL.2005.06.012},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/Stojcev06b.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Stojcev06c,
  author       = {Mile K. Stojcev},
  title        = {Sachin Sapatnekar, Timing, Kluwer Academic Publishers, Hardcover,
                  {ISBN} 1-4020-7671-1, pp 294, plus {IX}},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {2-4},
  pages        = {651--652},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2005.02.005},
  doi          = {10.1016/J.MICROREL.2005.02.005},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/Stojcev06c.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Stojcev06d,
  author       = {Mile K. Stojcev},
  title        = {Low Power Electronics Design, Christian Pignet, Editor, {CRC} Press,
                  Boca Raton, 2005, Hardcover, pp 854, plus 18, {ISBN} 0-8493-1941-2},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {2-4},
  pages        = {653--654},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2005.04.006},
  doi          = {10.1016/J.MICROREL.2005.04.006},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/Stojcev06d.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Stojcev06e,
  author       = {Mile K. Stojcev},
  title        = {F. Mayer-Linderberg, Dedicated Digital Processors: Methods in Hardware/Software
                  System Design, John Wiley {\&} Sons, Ltd., Chichester {(2004)}
                  {ISBN} 0-470-84444-2 Hardcover, pp 302, plus {XI}},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {5-6},
  pages        = {1025--1026},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2005.05.017},
  doi          = {10.1016/J.MICROREL.2005.05.017},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/Stojcev06e.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Stojcev06f,
  author       = {Mile K. Stojcev},
  title        = {R. Jacob Baker, {CMOS} Circuit Design, Layout, and Simulation (second
                  ed.), Wiley Interscience {\&} {IEEE} Press {(2005)} {ISBN} 0-471-70055-X
                  Hardcover, pp 1039, plus {XXXIII}},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {7},
  pages        = {1214--1215},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2005.09.006},
  doi          = {10.1016/J.MICROREL.2005.09.006},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/Stojcev06f.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Stojcev06g,
  author       = {Mile K. Stojcev},
  title        = {Alfredo Benso, Paolo Prinetto, editors, Fault injection techniques
                  and tools for embedded systems reliability and evaluation, Kluwer
                  Academic Publishers, Boston, 2003. Hardcover, pp 241, plus XIV, {ISBN}
                  1-4020-7589-8},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {8},
  pages        = {1396--1397},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2005.11.006},
  doi          = {10.1016/J.MICROREL.2005.11.006},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/Stojcev06g.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Stojcev06h,
  author       = {Mile K. Stojcev},
  title        = {Sachin Sapatnekar, Timing, Kluwer Academic Publishers, Hardcover,
                  pp 294, plus IX, {ISBN} 1-4020-7671-1},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {8},
  pages        = {1398--1399},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2005.11.007},
  doi          = {10.1016/J.MICROREL.2005.11.007},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/Stojcev06h.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/SuCY06,
  author       = {Fei Su and
                  Kerm Sin Chian and
                  Sung Yi},
  title        = {An optical characterization technique for hygroscopic expansion of
                  polymers and plastic packages},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {2-4},
  pages        = {600--609},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2005.06.017},
  doi          = {10.1016/J.MICROREL.2005.06.017},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/SuCY06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/SunSYS06,
  author       = {Zhilin Sun and
                  Weifeng Sun and
                  Yangbo Yi and
                  Longxing Shi},
  title        = {Study of the power capability of {LDMOS} and the improved methods},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {5-6},
  pages        = {1001--1005},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2005.07.111},
  doi          = {10.1016/J.MICROREL.2005.07.111},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/SunSYS06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/SzymanskiK06,
  author       = {Andrzej Szymanski and
                  Ewa Kurjata{-}Pfitzner},
  title        = {Effects of package and process variation on 2.4GHz analog integrated
                  circuits},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {1},
  pages        = {189--193},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2005.02.006},
  doi          = {10.1016/J.MICROREL.2005.02.006},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/SzymanskiK06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/TanGC06,
  author       = {Cher Ming Tan and
                  Zhenghao Gan and
                  Tai Chong Chai},
  title        = {Feasibility study of the application of voltage contrast to printed
                  circuit board},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {5-6},
  pages        = {939--948},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2005.04.014},
  doi          = {10.1016/J.MICROREL.2005.04.014},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/TanGC06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/TanLTL06,
  author       = {Cher Ming Tan and
                  Wei Li and
                  Kok Tong Tan and
                  Frankie Low},
  title        = {Development of highly accelerated electromigration test},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {9-11},
  pages        = {1638--1642},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2006.07.034},
  doi          = {10.1016/J.MICROREL.2006.07.034},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/TanLTL06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/TanduoCTMM06,
  author       = {P. Tanduo and
                  Luca Cola and
                  S. Testa and
                  M. Menchise and
                  A. Mervic},
  title        = {Read disturb in flash memories: reliability case},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {9-11},
  pages        = {1439--1444},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2006.07.007},
  doi          = {10.1016/J.MICROREL.2006.07.007},
  timestamp    = {Thu, 21 Apr 2022 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/TanduoCTMM06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/TaoWDX06,
  author       = {Bo Tao and
                  Yiping Wu and
                  Han Ding and
                  You{-}Lun Xiong},
  title        = {A quantitative method of reliability estimation for surface mount
                  solder joints based on heating factor Q\({}_{\mbox{eta}}\)},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {5-6},
  pages        = {864--872},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2005.04.013},
  doi          = {10.1016/J.MICROREL.2005.04.013},
  timestamp    = {Fri, 21 Oct 2022 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/TaoWDX06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/TassisHADK06,
  author       = {Dimitrios H. Tassis and
                  Argyrios T. Hatzopoulos and
                  N. Arpatzanis and
                  C. A. Dimitriadis and
                  G. Kamarinos},
  title        = {Dynamic hot-carrier induced degradation in n-channel polysilicon thin-film
                  transistors},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {12},
  pages        = {2032--2037},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2006.03.010},
  doi          = {10.1016/J.MICROREL.2006.03.010},
  timestamp    = {Tue, 13 Sep 2022 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/TassisHADK06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/TeeNZ06,
  author       = {Tong Yan Tee and
                  Hun Shen Ng and
                  Zhaowei Zhong},
  title        = {Board level solder joint reliability analysis of stacked die mixed
                  flip-chip and wirebond {BGA}},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {12},
  pages        = {2131--2138},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2006.01.010},
  doi          = {10.1016/J.MICROREL.2006.01.010},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/TeeNZ06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ThijsILJDDSDG06,
  author       = {Steven Thijs and
                  M. Natarajan Iyer and
                  Dimitri Linten and
                  Wutthinan Jeamsaksiri and
                  T. Daenen and
                  Robin Degraeve and
                  Andries J. Scholten and
                  Stefaan Decoutere and
                  Guido Groeseneken},
  title        = {Implementation of plug-and-play {ESD} protection in 5.5GHz 90nm {RF}
                  {CMOS} LNAs - Concepts, constraints and solutions},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {5-6},
  pages        = {702--712},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2005.06.018},
  doi          = {10.1016/J.MICROREL.2005.06.018},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/ThijsILJDDSDG06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/TsaiCLH06,
  author       = {M. Y. Tsai and
                  W. C. Chiang and
                  T. M. Liu and
                  G. H. Hsu},
  title        = {Thermal deformation measurements and predictions of {MAP-BGA} electronic
                  packages},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {2-4},
  pages        = {476--486},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2005.02.014},
  doi          = {10.1016/J.MICROREL.2005.02.014},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/TsaiCLH06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/TsuchiyaY06,
  author       = {Hideaki Tsuchiya and
                  Shinji Yokogawa},
  title        = {Electromigration lifetimes and void growth at low cumulative failure
                  probability},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {9-11},
  pages        = {1415--1420},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2006.08.001},
  doi          = {10.1016/J.MICROREL.2006.08.001},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/TsuchiyaY06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/TyaginovVSG06,
  author       = {S. E. Tyaginov and
                  M. I. Vexler and
                  A. F. Shulekin and
                  I. V. Grekhov},
  title        = {The post-damage behavior of a {MOS} tunnel emitter transistor},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {7},
  pages        = {1035--1041},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2005.10.006},
  doi          = {10.1016/J.MICROREL.2005.10.006},
  timestamp    = {Sun, 02 Oct 2022 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/TyaginovVSG06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/UbachsSDZ06,
  author       = {R. L. J. M. Ubachs and
                  Olaf van der Sluis and
                  W. D. van Driel and
                  G. Q. Zhang},
  title        = {Multiscale modelling of multilayer substrates},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {9-11},
  pages        = {1472--1477},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2006.07.013},
  doi          = {10.1016/J.MICROREL.2006.07.013},
  timestamp    = {Sat, 30 Sep 2023 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/UbachsSDZ06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/UllanLCBCGMMPP06,
  author       = {Miguel Ull{\'{a}}n and
                  Manuel Lozano and
                  Mokhtar Chmeissani and
                  G. Blanchot and
                  Enric Cabruja and
                  J. Garc{\'{\i}}a and
                  M. Maiorino and
                  Ricardo Mart{\'{\i}}nez and
                  Giulio Pellegrini and
                  Carles Puigdengoles},
  title        = {Test structure assembly for bump bond yield measurement on high density
                  flip chip technologies},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {7},
  pages        = {1095--1100},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2005.10.001},
  doi          = {10.1016/J.MICROREL.2005.10.001},
  timestamp    = {Thu, 05 Nov 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/UllanLCBCGMMPP06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/VermeerschM06,
  author       = {Bjorn Vermeersch and
                  Gilbert De Mey},
  title        = {Thermal impedance plots of micro-scaled devices},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {1},
  pages        = {174--177},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2005.05.014},
  doi          = {10.1016/J.MICROREL.2005.05.014},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/VermeerschM06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/WagnerUW06,
  author       = {M. Wagner and
                  W. Unger and
                  Wolfgang Wondrak},
  title        = {Part average analysis - {A} tool for reducing failure rates in automotive
                  electronics},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {9-11},
  pages        = {1433--1438},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2006.07.006},
  doi          = {10.1016/J.MICROREL.2006.07.006},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/WagnerUW06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Wakil06,
  author       = {Jamil A. Wakil},
  title        = {Thermal performance impacts of heat spreading lids on flip chip packages:
                  With and without heat sinks},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {2-4},
  pages        = {380--385},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2005.01.007},
  doi          = {10.1016/J.MICROREL.2005.01.007},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/Wakil06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/WangLCWC06,
  author       = {Robin C. J. Wang and
                  C. C. Lee and
                  L. D. Chen and
                  Kenneth Wu and
                  K. S. Chang{-}Liao},
  title        = {A study of Cu/Low-k stress-induced voiding at via bottom and its microstructure
                  effect},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {9-11},
  pages        = {1673--1678},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2006.07.053},
  doi          = {10.1016/J.MICROREL.2006.07.053},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/WangLCWC06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/WangLPHCY06,
  author       = {Yuqi Wang and
                  K. H. Low and
                  John H. L. Pang and
                  Kay Hiang Hoon and
                  F. X. Che and
                  Y. S. Yong},
  title        = {Modeling and simulation for a drop-impact analysis of multi-layered
                  printed circuit boards},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {2-4},
  pages        = {558--573},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2005.05.007},
  doi          = {10.1016/J.MICROREL.2005.05.007},
  timestamp    = {Sat, 30 Sep 2023 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/WangLPHCY06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/WangOM06,
  author       = {Jingchao Wang and
                  Edgar Olthof and
                  Wim Metselaar},
  title        = {Hot-carrier degradation analysis based on ring oscillators},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {9-11},
  pages        = {1858--1863},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2006.07.070},
  doi          = {10.1016/J.MICROREL.2006.07.070},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/WangOM06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/WelTBLHGRBP06,
  author       = {P. J. van der Wel and
                  S. J. C. H. Theeuwen and
                  J. A. Bielen and
                  Y. Li and
                  R. A. van den Heuvel and
                  J. G. Gommans and
                  F. van Rijs and
                  P. Bron and
                  H. J. F. Peuscher},
  title        = {Wear out failure mechanisms in aluminium and gold based {LDMOS} {RF}
                  power applications},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {8},
  pages        = {1279--1284},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2006.02.011},
  doi          = {10.1016/J.MICROREL.2006.02.011},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/WelTBLHGRBP06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Whitman06,
  author       = {Charles S. Whitman},
  title        = {Reliability results of HBTs with an InGaP emitter},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {8},
  pages        = {1261--1271},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2006.02.004},
  doi          = {10.1016/J.MICROREL.2006.02.004},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/Whitman06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Whitman06a,
  author       = {Charles S. Whitman},
  title        = {Erratum to "Reliability results of HBTs with an InGaP emitter" [Microelectron.
                  Reliability 46 {(2006)} 1261-1271]},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {12},
  pages        = {2159},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2006.08.015},
  doi          = {10.1016/J.MICROREL.2006.08.015},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/Whitman06a.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/WhitmanGRA06,
  author       = {Charles S. Whitman and
                  Terri M. Gilbert and
                  Ann M. Rahn and
                  Jennifer A. Antonell},
  title        = {Determining factors affecting {ESD} failure voltage using {DOE}},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {8},
  pages        = {1228--1237},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2006.02.007},
  doi          = {10.1016/J.MICROREL.2006.02.007},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/WhitmanGRA06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/WhitmanGRA06a,
  author       = {Charles S. Whitman and
                  Terri M. Gilbert and
                  Ann M. Rahn and
                  Jennifer A. Antonell},
  title        = {Erratum to "Determining factors affecting {ESD} failure voltage using
                  DOE" [Microelectron. Reliability 46 {(2006)} 1228-1237]},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {12},
  pages        = {2160},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2006.08.016},
  doi          = {10.1016/J.MICROREL.2006.08.016},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/WhitmanGRA06a.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/WolborskiBOPSRLH06,
  author       = {Maciej Wolborski and
                  Mietek Bakowski and
                  Armando Ortiz and
                  Viljami Pore and
                  Adolf Sch{\"{o}}ner and
                  Mikko Ritala and
                  Markku Leskel{\"{a}} and
                  Anders Hall{\'{e}}n},
  title        = {Characterisation of the Al\({}_{\mbox{2}}\)O\({}_{\mbox{3}}\) films
                  deposited by ultrasonic spray pyrolysis and atomic layer deposition
                  methods for passivation of 4H-SiC devices},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {5-6},
  pages        = {743--755},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2005.08.002},
  doi          = {10.1016/J.MICROREL.2005.08.002},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/WolborskiBOPSRLH06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/WolfGBH06,
  author       = {Heinrich Wolf and
                  Horst A. Gieser and
                  Detlef Bonfert and
                  Markus Hauser},
  title        = {{ESD} Susceptibility of Submicron Air Gaps},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {9-11},
  pages        = {1587--1590},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2006.07.039},
  doi          = {10.1016/J.MICROREL.2006.07.039},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/WolfGBH06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/WongM06,
  author       = {Ee{-}Hua Wong and
                  Yiu{-}Wing Mai},
  title        = {New insights into board level drop impact},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {5-6},
  pages        = {930--938},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2005.07.114},
  doi          = {10.1016/J.MICROREL.2005.07.114},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/WongM06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/WongWCKC06,
  author       = {C. K. Wong and
                  Hei Wong and
                  Mansun Chan and
                  Chi{-}Wah Kok and
                  H. P. Chan},
  title        = {Minimizing hydrogen content in silicon oxynitride by thermal oxidation
                  of silicon-rich silicon nitride},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {12},
  pages        = {2056--2061},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2006.01.006},
  doi          = {10.1016/J.MICROREL.2006.01.006},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/WongWCKC06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/WuZLHL06,
  author       = {J. D. Wu and
                  P. J. Zheng and
                  C. W. Lee and
                  S. C. Hung and
                  J. J. Lee},
  title        = {A study in flip-chip UBM/bump reliability with effects of SnPb solder
                  composition},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {1},
  pages        = {41--52},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2005.01.012},
  doi          = {10.1016/J.MICROREL.2005.01.012},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/WuZLHL06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/WunderleM06,
  author       = {Bernhard Wunderle and
                  Bernd Michel},
  title        = {Progress in reliability research in the micro and nano region},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {9-11},
  pages        = {1685--1694},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2006.08.005},
  doi          = {10.1016/J.MICROREL.2006.08.005},
  timestamp    = {Sat, 30 Sep 2023 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/WunderleM06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/XingWY06,
  author       = {Jianhui Xing and
                  Hong Wang and
                  Shiyuan Yang},
  title        = {Constructing {IP} cores' transparency paths for SoC test access using
                  greedy search},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {7},
  pages        = {1199--1208},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2005.10.004},
  doi          = {10.1016/J.MICROREL.2005.10.004},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/XingWY06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/YamadaTYNOSKI06,
  author       = {Yasushi Yamada and
                  Yoshikazu Takaku and
                  Yuji Yagi and
                  Y. Nishibe and
                  Ikuo Ohnuma and
                  Yuji Sutou and
                  R. Kainuma and
                  Kiyohito Ishida},
  title        = {Pb-free high temperature solders for power device packaging},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {9-11},
  pages        = {1932--1937},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2006.07.083},
  doi          = {10.1016/J.MICROREL.2006.07.083},
  timestamp    = {Sat, 30 Sep 2023 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/YamadaTYNOSKI06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/YamashitaS06,
  author       = {M. Yamashita and
                  K. Suganuma},
  title        = {Improvement in high-temperature degradation by isotropic conductive
                  adhesives including Ag-Sn alloy fillers},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {5-6},
  pages        = {850--858},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2005.05.020},
  doi          = {10.1016/J.MICROREL.2005.05.020},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/YamashitaS06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/YamashitaS06a,
  author       = {M. Yamashita and
                  K. Suganuma},
  title        = {Degradation by Sn diffusion applied to surface mounting with Ag-epoxy
                  conductive adhesive with joining pressure},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {7},
  pages        = {1113--1118},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2005.07.112},
  doi          = {10.1016/J.MICROREL.2005.07.112},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/YamashitaS06a.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/YanTVMK06,
  author       = {M. Y. Yan and
                  King{-}Ning Tu and
                  A. V. Vairagar and
                  S. G. Mhaisalkar and
                  Ahila Krishnamoorthy},
  title        = {A direct measurement of electromigration induced drift velocity in
                  Cu dual damascene interconnects},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {8},
  pages        = {1392--1395},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2005.11.004},
  doi          = {10.1016/J.MICROREL.2005.11.004},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/YanTVMK06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/YangJLP06,
  author       = {Se Young Yang and
                  Young{-}Doo Jeon and
                  Soon{-}Bok Lee and
                  Kyung{-}Wook Paik},
  title        = {Solder reflow process induced residual warpage measurement and its
                  influence on reliability of flip-chip electronic packages},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {2-4},
  pages        = {512--522},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2005.06.007},
  doi          = {10.1016/J.MICROREL.2005.06.007},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/YangJLP06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/YangKL06,
  author       = {Bing{-}Liang Yang and
                  Paul C. K. Kwok and
                  P. T. Lai},
  title        = {Influence of {TCE} concentration in thermal oxidation on reliability
                  of SiC {MOS} capacitors under Fowler-Nordheim electron injection},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {12},
  pages        = {2044--2048},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2005.12.007},
  doi          = {10.1016/J.MICROREL.2005.12.007},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/YangKL06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/YangLJL06,
  author       = {Se Young Yang and
                  Wang{-}Joo Lee and
                  S. H. Jeong and
                  S. J. Lee},
  title        = {Structural reliability assessment of multi-stack package {(MSP)} under
                  high temperature storage {(HTS)} testing condition},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {9-11},
  pages        = {1904--1909},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2006.07.089},
  doi          = {10.1016/J.MICROREL.2006.07.089},
  timestamp    = {Fri, 19 Jan 2024 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/YangLJL06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/YangWC06,
  author       = {Shuang Yang and
                  Ji Wu and
                  Aristos Christou},
  title        = {Initial stage of silver electrochemical migration degradation},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {9-11},
  pages        = {1915--1921},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2006.07.080},
  doi          = {10.1016/J.MICROREL.2006.07.080},
  timestamp    = {Sat, 30 Sep 2023 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/YangWC06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/YangYLB06,
  author       = {Zunxian Yang and
                  Ying Yu and
                  Xinxin Li and
                  Haifei Bao},
  title        = {Nano-mechanical electro-thermal probe array used for high-density
                  storage based on {NEMS} technology},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {5-6},
  pages        = {805--810},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2005.07.117},
  doi          = {10.1016/J.MICROREL.2005.07.117},
  timestamp    = {Sat, 30 Sep 2023 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/YangYLB06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/YarimbiyikSAZB06,
  author       = {A. Emre Yarimbiyik and
                  Harry A. Schafft and
                  Richard A. Allen and
                  Mona E. Zaghloul and
                  David L. Blackburn},
  title        = {Modeling and simulation of resistivity of nanometer scale copper},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {7},
  pages        = {1050--1057},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2005.09.004},
  doi          = {10.1016/J.MICROREL.2005.09.004},
  timestamp    = {Thu, 14 Oct 2021 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/YarimbiyikSAZB06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/YehL06,
  author       = {Chang{-}Lin Yeh and
                  Yi{-}Shao Lai},
  title        = {Support excitation scheme for transient analysis of {JEDEC} board-level
                  drop test},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {2-4},
  pages        = {626--636},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2004.12.021},
  doi          = {10.1016/J.MICROREL.2004.12.021},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/YehL06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/YehL06a,
  author       = {Chang{-}Lin Yeh and
                  Yi{-}Shao Lai},
  title        = {Transient fracturing of solder joints subjected to displacement-controlled
                  impact loads},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {5-6},
  pages        = {885--895},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2005.07.113},
  doi          = {10.1016/J.MICROREL.2005.07.113},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/YehL06a.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/YehLK06,
  author       = {Chang{-}Lin Yeh and
                  Yi{-}Shao Lai and
                  Chin{-}Li Kao},
  title        = {Evaluation of board-level reliability of electronic packages under
                  consecutive drops},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {7},
  pages        = {1172--1182},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2005.09.002},
  doi          = {10.1016/J.MICROREL.2005.09.002},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/YehLK06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/YeoGDHJ06,
  author       = {H. C. Yeo and
                  Ningqun Guo and
                  Hejun Du and
                  Weimin Huang and
                  X. M. Jian},
  title        = {Characterisation of {IC} packaging interfaces and loading effects},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {9-11},
  pages        = {1892--1897},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2006.07.087},
  doi          = {10.1016/J.MICROREL.2006.07.087},
  timestamp    = {Wed, 05 Oct 2022 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/YeoGDHJ06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/YewCHYC06,
  author       = {Ming{-}Chih Yew and
                  C. Y. Chou and
                  C. S. Huang and
                  W. K. Yang and
                  Kuo{-}Ning Chiang},
  title        = {The solder on rubber {(SOR)} interconnection design and its reliability
                  assessment based on shear strength test and finite element analysis},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {9-11},
  pages        = {1874--1879},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2006.07.084},
  doi          = {10.1016/J.MICROREL.2006.07.084},
  timestamp    = {Wed, 23 Nov 2022 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/YewCHYC06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/YoonJ06,
  author       = {Jeong{-}Won Yoon and
                  Seung{-}Boo Jung},
  title        = {High temperature reliability and interfacial reaction of eutectic
                  Sn-0.7Cu/Ni solder joints during isothermal aging},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {5-6},
  pages        = {905--914},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2005.05.009},
  doi          = {10.1016/J.MICROREL.2005.05.009},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/YoonJ06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/YuJY06,
  author       = {Chuanzhao Yu and
                  L. Jiang and
                  Jiann{-}Shiun Yuan},
  title        = {Study of performance degradations in {DC-DC} converter due to hot
                  carrier stress by simulation},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {9-11},
  pages        = {1840--1843},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2006.07.079},
  doi          = {10.1016/J.MICROREL.2006.07.079},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/YuJY06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/YuYX06,
  author       = {Chuanzhao Yu and
                  J. S. Yuan and
                  Enjun Xiao},
  title        = {Dynamic voltage stress effects on nMOS varactor},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {9-11},
  pages        = {1812--1816},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2006.07.075},
  doi          = {10.1016/J.MICROREL.2006.07.075},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/YuYX06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/YuanDSSEEKZ06,
  author       = {Cadmus A. Yuan and
                  Willem D. van Driel and
                  Richard B. R. van Silfhout and
                  Olaf van der Sluis and
                  Roy A. B. Engelen and
                  Leo J. Ernst and
                  Fred van Keulen and
                  G. Q. Zhang},
  title        = {Delamination analysis of Cu/low-k technology subjected to chemical-mechanical
                  polishing process conditions},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {9-11},
  pages        = {1679--1684},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2006.07.054},
  doi          = {10.1016/J.MICROREL.2006.07.054},
  timestamp    = {Sat, 30 Sep 2023 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/YuanDSSEEKZ06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ZarandiM06,
  author       = {Hamid R. Zarandi and
                  Seyed Ghassem Miremadi},
  title        = {A fault-tolerant cache architecture based on binary set partitioning},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {1},
  pages        = {86--99},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2005.02.009},
  doi          = {10.1016/J.MICROREL.2005.02.009},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/ZarandiM06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ZemliakC06,
  author       = {Alexander Zemliak and
                  Roque De La Cruz},
  title        = {Numerical analysis of a double avalanche region {IMPATT} diode on
                  the basis of nonlinear model},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {2-4},
  pages        = {293--300},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2005.02.002},
  doi          = {10.1016/J.MICROREL.2005.02.002},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/ZemliakC06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ZhangHB06,
  author       = {Guang{-}Ming Zhang and
                  David M. Harvey and
                  Derek R. Braden},
  title        = {Resolution improvement of acoustic microimaging by continuous wavelet
                  transform for semiconductor inspection},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {5-6},
  pages        = {811--821},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2005.07.008},
  doi          = {10.1016/J.MICROREL.2005.07.008},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/ZhangHB06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ZhangSZ06,
  author       = {Y. L. Zhang and
                  D. X. Q. Shi and
                  Wei Zhou},
  title        = {Reliability study of underfill/chip interface under accelerated temperature
                  cycling {(ATC)} loading},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {2-4},
  pages        = {409--420},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2005.04.012},
  doi          = {10.1016/J.MICROREL.2005.04.012},
  timestamp    = {Tue, 27 Oct 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/ZhangSZ06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ZhaoXT06,
  author       = {Yao Zhao and
                  Mingzhen Xu and
                  Changhua Tan},
  title        = {Effect of reverse substrate bias on ultra-thin gate oxide n-MOSFET
                  degradation under different stress modes},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {1},
  pages        = {164--168},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2005.05.002},
  doi          = {10.1016/J.MICROREL.2005.05.002},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/ZhaoXT06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ZimprichLW06,
  author       = {P. Zimprich and
                  T. Licht and
                  B. Weiss},
  title        = {A new method to characterize the thermomechanical response of multilayered
                  structures in power electronics},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {9-11},
  pages        = {1844--1847},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2006.07.067},
  doi          = {10.1016/J.MICROREL.2006.07.067},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/ZimprichLW06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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