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International Conference on Artificial Intelligence Testing (AITest)

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AITest 2024: Shanghai, China

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IEEE International Conference on Artificial Intelligence Testing, AITest 2024, Shanghai, China, July 15-18, 2024. IEEE 2024, ISBN 979-8-3503-6505-4 [contents]

AITest 2023: Athens, Greece

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IEEE International Conference On Artificial Intelligence Testing, AITest 2023, Athens, Greece, July 17-20, 2023. IEEE 2023, ISBN 979-8-3503-3629-0 [contents]

AITest 2022: Newark, CA, USA

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IEEE International Conference On Artificial Intelligence Testing, AITest 2022, Newark, CA, USA, August 15-18, 2022. IEEE 2022, ISBN 978-1-6654-8737-5 [contents]

AITest 2021: Oxford, UK

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2021 IEEE International Conference on Artificial Intelligence Testing, AITest 2021, Oxford, United Kingdom, August 23-26, 2021. IEEE 2021, ISBN 978-1-6654-3481-2 [contents]

AITest 2020: Oxford, UK

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IEEE International Conference On Artificial Intelligence Testing, AITest 2020, Oxford, UK, August 3-6, 2020. IEEE 2020, ISBN 978-1-7281-6984-2 [contents]

AITest 2019: Newark, CA, USA

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IEEE International Conference On Artificial Intelligence Testing, AITest 2019, Newark, CA, USA, April 4-9, 2019. IEEE 2019, ISBN 978-1-7281-0492-8 [contents]

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