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ORCID25th ETS 2020: Tallinn, Estonia
- IEEE European Test Symposium, ETS 2020, Tallinn, Estonia, May 25-29, 2020. IEEE 2020, ISBN 978-1-7281-4312-5
- Rana Elnaggar, Siyuan Chen, Peilin Song, Krishnendu Chakrabarty
:
Detection of Rowhammer Attacks in SoCs with FPGAs. 1-2 - Erik Larsson, Zehang Xiang, Prathamesh Murali:
IEEE Std. P1687.1 for Access Control of Reconfigurable Scan Networks. 1-2 - Alberto Bosio, Stefano Di Carlo, Patrick Girard, Ernesto Sánchez, Alessandro Savino, Lukás Sekanina, Marcello Traiola, Zdenek Vasícek, Arnaud Virazel:
Design, Verification, Test and In-Field Implications of Approximate Computing Systems. 1-10 - Lizhou Wu, Moritz Fieback, Mottaqiallah Taouil, Said Hamdioui:
Device-Aware Test for Emerging Memories: Enabling Your Test Program for DPPB Level. 1-2 - Mohamed Elshamy, Giorgio Di Natale, Antonios Pavlidis, Marie-Minerve Louërat, Haralampos-G. D. Stratigopoulos:
Hardware Trojan Attacks in Analog/Mixed-Signal ICs via the Test Access Mechanism. 1-6 - Bruno Forlin, Ronaldo Husemann, Luigi Carro, Cezar Reinbrecht, Said Hamdioui, Mottaqiallah Taouil:
G-PUF: An Intrinsic PUF Based on GPU Error Signatures. 1-2 - Hassan Ebrahimi, Hans G. Kerkhoff:
A New Monitor Insertion Algorithm for Intermittent Fault Detection. 1-6 - Jongsin Yun, Benoit Nadeau-Dostie, Martin Keim, Cyrille Dray, El Mehdi Boujamaa:
MBIST Support for Reliable eMRAM Sensing. 1-6 - Helen-Maria Dounavi, Yiorgos Tsiatouhas:
Monitoring of BTI and HCI Aging in SRAM Decoders. 1-2 - Pascal Raiola, Tobias Paxian, Bernd Becker:
Minimal Witnesses for Security Weaknesses in Reconfigurable Scan Networks. 1-6 - Min-Chun Hu, Zhan Gao, Santosh Malagi, Joe Swenton, Jos Huisken, Kees Goossens, Cheng-Wen Wu, Erik Jan Marinissen:
Tightening the Mesh Size of the Cell-Aware ATPG Net for Catching All Detectable Weakest Faults. 1-6 - Felipe Augusto da Silva, Ahmet Cagri Bagbaba, Sandro Sartoni, Riccardo Cantoro, Matteo Sonza Reorda, Said Hamdioui, Christian Sauer:
Determined-Safe Faults Identification: A step towards ISO26262 hardware compliant designs. 1-6 - Michele Portolan, Vincent Reynaud, Paolo Maistri, Régis Leveugle:
Dynamic Authentication-Based Secure Access to Test Infrastructure. 1-6 - Jo Laufenberg, Thomas Kropf, Oliver Bringmann:
Automated Graph-Based Fault Injection Into Virtual Prototypes for Robustness Evaluation. 1-2 - Bastien Deveautour, Marcello Traiola, Arnaud Virazel, Patrick Girard:
QAMR: an Approximation-Based Fully Reliable TMR Alternative for Area Overhead Reduction. 1-6 - Rezgar Sadeghi, Zainalabedin Navabi:
Built-In Predictors for Dynamic Crosstalk Avoidance. 1-6 - Mehmet Ince, Sule Ozev:
Digital Defect Based Built-in Self-Test for Low Dropout Voltage Regulators. 1-2 - Amir Alipour, Vincent Beroulle, Bertrand Cambou, Jean-Luc Danger, Giorgio Di Natale, David Hély, Sylvain Guilley, Naghmeh Karimi:
PUF Enrollment and Life Cycle Management: Solutions and Perspectives for the Test Community. 1-10 - Michele Stucchi, Ferenc Fodor, Erik Jan Marinissen:
Accurate Measurements of Small Resistances in Vertical Interconnects with Small Aspect Ratios. 1-6 - Md Toufiq Hasan Anik, Rachit Saini, Jean-Luc Danger, Sylvain Guilley, Naghmeh Karimi:
Failure and Attack Detection by Digital Sensors. 1-2 - Stephen Sunter:
Analog Fault Simulation - a Hot Topic! 1-5 - Sarath Mohanachandran Nair, Christopher Münch, Mehdi Baradaran Tahoori:
Defect Characterization and Test Generation for Spintronic-based Compute-In-Memory. 1-6 - Shayesteh Masoumian, Georgios N. Selimis, Roel Maes, Geert Jan Schrijen, Said Hamdioui, Mottaqiallah Taouil:
Modeling Static Noise Margin for FinFET based SRAM PUFs. 1-6 - Bartosz Kaczmarek, Grzegorz Mrugalski, Nilanjan Mukherjee, Janusz Rajski, Lukasz Rybak, Jerzy Tyszer:
Test Sequence-Optimized BIST for Automotive Applications. 1-6 - Fong-Jyun Tsai, Chong-Siao Ye, Yu Huang, Kuen-Jong Lee, Wu-Tung Cheng, Sudhakar M. Reddy, Mark Kassab, Janusz Rajski:
Efficient Prognostication of Pattern Count with Different Input Compression Ratios. 1-2 - Manhong Zhu, Jia Li, Weibing Wang, Dapeng Chen:
A Built-In Self-Test Method For MEMS Piezoresistive Sensor. 1-6 - Renato S. Feitoza, Manuel J. Barragán, Antonio J. Ginés, Salvador Mir:
On-chip reduced-code static linearity test of Vcm-based switching SAR ADCs using an incremental analog-to-digital converter. 1-2 - Farimah Farahmandi, Ozgur Sinanoglu, Ronald D. Blanton, Samuel Pagliarini:
Design Obfuscation versus Test. 1-10 - Ching-Yuan Chen, Ching-Hong Cheng, Jiun-Lang Huang, Krishnendu Chakrabarty:
Functional-Like Transition Delay Fault Test-Pattern Generation using a Bayesian-Based Circuit Model. 1-6 - Giorgio Di Natale, Osnat Keren:
Nonlinear Codes for Control Flow Checking. 1-6 - Anthony Coyette, Wim Dobbelaere, Ronny Vanhooren, Nektar Xama, Jhon Gomez, Georges G. E. Gielen:
Latent Defect Screening with Visually-Enhanced Dynamic Part Average Testing. 1-6 - David Knichel, Thorben Moos, Amir Moradi:
The Risk of Outsourcing: Hidden SCA Trojans in Third-Party IP-Cores Threaten Cryptographic ICs. 1-6 - Michele Portolan, Jeff Rearick, Martin Keim:
Linking Chip, Board, and System Test via Standards. 1-8 - Jiho Park, Virinchi Roy Surabhi, Prashanth Krishnamurthy, Siddharth Garg, Ramesh Karri, Farshad Khorrami:
Anomaly Detection in Embedded Systems Using Power and Memory Side Channels. 1-2 - Daniel Oliveira, Sean Blanchard, Nathan DeBardeleben, Fernando Fernandes dos Santos, Gabriel Piscoya Dávila, Philippe O. A. Navaux, Carlo Cazzaniga, Christopher Frost, Robert C. Baumann, Paolo Rech:
Thermal Neutrons: a Possible Threat for Supercomputers and Safety Critical Applications. 1-6 - Katherine Shu-Min Li, Peter Yi-Yu Liao, Leon Chou, Ken Chau-Cheung Cheng, Andrew Yi-Ann Huang, Sying-Jyan Wang, Gus Chang-Hung Han:
PWS: Potential Wafermap Scratch Defect Pattern Recognition with Machine Learning Techniques. 1-6 - Andrei Gaita, Georgian Nicolae, Emilian C. David, Andi Buzo, Corneliu Burileanu, Georg Pelz:
A SIFT-based Waveform Clustering Method for aiding analog/mixed-signal IC Verification. 1-2 - Zahra Paria Najafi-Haghi, Marzieh Hashemipour-Nazari, Hans-Joachim Wunderlich:
Variation-Aware Defect Characterization at Cell Level. 1-6 - Safa Mhamdi, Patrick Girard, Arnaud Virazel, Alberto Bosio, Aymen Ladhar:
Learning-Based Cell-Aware Defect Diagnosis of Customer Returns. 1-2 - Nektar Xama, Jakob Raymaekers, Martin Andraud, Jhon Gomez, Wim Dobbelaere, Ronny Vanhooren, Anthony Coyette, Georges G. E. Gielen:
Avoiding Mixed-Signal Field Returns by Outlier Detection of Hard-to-Detect Defects based on Multivariate Statistics. 1-6 - Cezar Reinbrecht, Said Hamdioui, Mottaqiallah Taouil, Behrad Niazmand, Tara Ghasempouri, Jaan Raik, Johanna Sepúlveda:
LiD-CAT: A Lightweight Detector for Cache ATtacks. 1-6 - Moritz Fieback, Surya Nagarajan, Rajendra Bishnoi, Mehdi B. Tahoori, Mottaqiallah Taouil, Said Hamdioui:
Testing Scouting Logic-Based Computation-in-Memory Architectures. 1-6
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