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AST@ICSE 2006: Shanghai, China

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Hong Zhu, Joseph R. Horgan, Shing-Chi Cheung, J. Jenny Li:
Proceedings of the 2006 International Workshop on Automation of Software Test, AST 2006, Shanghai, China, May 23, 2006. ACM 2006, ISBN 1-59593-408-1

Model-driven Testing

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Mingsong Chen, Xiaokang Qiu, Xuandong Li:
Automatic Test Case Generation for UML Activity Diagrams. 2-8
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  - conf/icse/VieiraLHSK06
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Marlon Vieira, Johanne Leduc, William M. Hasling, Rajesh Subramanyan, Jürgen Kazmeier:
Automation of GUI Testing Using a Model-driven Approach. 9-14
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  - conf/icse/PfallerFHRRW06
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Christian Pfaller, Andreas Fleischmann, Judith Hartmann, Martin Rappl, Sabine Rittmann, Doris Wild:
On the Integration of Design and Test: A Model-Based Approach for Embedded Systems. 15-21
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  - conf/icse/LundS06
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Mass Soldal Lund, Ketil Stølen:
Deriving Tests from UML 2.0 Sequence Diagrams with neg and assert. 22-28

Test Case Generation

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Hui Liu, Hee Beng Kuan Tan:
Automated Verification and Test Case Generation for Input Validation. 29-35
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Mengluo Ji, Ji Wang, Shuhao Li, Zhi-Chang Qi:
Automated WCET Analysis Based on Program Modes. 36-42
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Lijun Shan, Hong Zhu:
Testing Software Modelling Tools Using Data Mutation. 43-49

Component and Integration Testing

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Aynur Abdurazik, Jeff Offutt:
Coupling-based Class Integration and Test Order. 50-56
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Leonard Gallagher, Jeff Offutt:
Automatically Testing Interacting Software Components. 57-63
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Hai Yuan, Tao Xie:
Substra: A Framework for Automatic Generation of Integration Tests. 64-70

Economics of Test Automation: Test Cost and Effectiveness

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Kai-Yuan Cai, Yong-Chao Li, Wei-Yi Ning, W. Eric Wong, Hai Hu:
Optimal and Adaptive Testing with Cost Constraints. 71-77
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Jeff Offutt, Yu-Seung Ma, Yong Rae Kwon:
The Class-Level Mutants of MuJava. 78-84
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  - conf/icse/RamlerW06
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Rudolf Ramler, Klaus Wolfmaier:
Economic Perspectives in Test Automation: Balancing Automated and Manual Testing with Opportunity Cost. 85-91
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Cyrille Artho, Armin Biere:
Advanced Unit Testing: How to Scale up a Unit Test Framework. 92-98

Tools and Environments

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Qian Yang, J. Jenny Li, David M. Weiss:
A Survey of Coverage Based Testing Tools. 99-103
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  - conf/icse/OkikaRLS06
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Joseph C. Okika, Anders P. Ravn, Zhiming Liu, Lokesh Siddalingaiah:
Developing a TTCN-3 Test Harness for Legacy Software. 104-110
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Jacques Philippe Sauvé, Osório Lopes Abath Neto, Walfredo Cirne:
EasyAccept: A Tool to Easily Create, Run and Drive Development with Automated Acceptance Tests. 111-117
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  - conf/icse/DelamaroVM06
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Márcio Eduardo Delamaro, Auri Marcelo Rizzo Vincenzi, José Carlos Maldonado:
A Strategy to Perform Coverage Testing of Mobile Applications. 118-124

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