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ORCIDInternational Workshop on Microprocessor/SoC Test, Security and Verification (MTV)
International Workshop on Microprocessor Test and Verification
20th MTV 2019: Austin, TX, USA
- 20th International Workshop on Microprocessor/SoC Test, Security and Verification, MTV 2019, Austin, TX, USA, December 9-10, 2019. IEEE 2019, ISBN 978-1-7281-5025-3 [contents]
19th MTV 2018: Austin, TX, USA
- 19th International Workshop on Microprocessor and SOC Test and Verification, MTV 2018, Austin, TX, USA, December 9-10, 2018. IEEE 2018, ISBN 978-1-5386-9250-9 [contents]
18th MTV 2017: Austin, TX, USA
- 18th International Workshop on Microprocessor and SOC Test and Verification, MTV 2017, Austin, TX, USA, December 11-12, 2017. IEEE Computer Society 2017, ISBN 978-1-5386-3351-9 [contents]
17th MTV 2016: Austin, TX, USA
- 17th International Workshop on Microprocessor and SOC Test and Verification, MTV 2016, Austin, TX, USA, December 12-13, 2016. IEEE Computer Society 2016, ISBN 978-1-4673-8924-2 [contents]
16th MTV 2015: Austin, TX, USA
- 16th International Workshop on Microprocessor and SOC Test and Verification, MTV 2015, Austin, TX, USA, December 3-4, 2015. IEEE Computer Society 2015, ISBN 978-1-5090-0885-8 [contents]
15th MTV 2014: Austin, TX, USA
- 15th International Microprocessor Test and Verification Workshop, MTV 2014, Austin, TX, USA, December 15-16, 2014. IEEE Computer Society 2014, ISBN 978-1-4673-6858-2 [contents]
14th MTV 2013: Austin, TX, USA
- 14th International Workshop on Microprocessor Test and Verification, MTV 2013, Austin, TX, USA, December 11-13, 2013. IEEE Computer Society 2013, ISBN 978-1-4799-3246-7 [contents]
13th MTV 2012: Austin, TX, USA
- 13th International Workshop on Microprocessor Test and Verification, MTV 2012, Austin, TX, USA, December 10-13, 2012. IEEE Computer Society 2012, ISBN 978-1-4673-4441-8 [contents]
12th MTV 2011: Austin, TX, USA
- Magdy S. Abadir, Jay Bhadra, Li-C. Wang:
12th International Workshop on Microprocessor Test and Verification, MTV 2011, Austin, TX, USA, December 5-7, 2011. IEEE Computer Society 2011, ISBN 978-1-4577-2101-4 [contents]
11th MTV 2010: Austin, TX, USA
- Magdy S. Abadir, Jay Bhadra, Li-C. Wang:
11th International Workshop on Microprocessor Test and Verification, MTV 2010, Austin, TX, USA, December 13-15, 2010. IEEE Computer Society 2010, ISBN 978-0-7695-4354-3 [contents]
10th MTV 2009: Austin, TX, USA
- 10th International Workshop on Microprocessor Test and Verification, MTV 2009, Austin, Texas, USA, 7-9 December 2009. IEEE Computer Society 2009, ISBN 978-0-7695-4000-9 [contents]
9th MTV 2008: Austin, TX, USA
- Ninth International Workshop on Microprocessor Test and Verification, MTV 2008, Austin, Texas, USA, 8-10 December 2008. IEEE Computer Society 2008, ISBN 978-0-7695-3581-4 [contents]
8th MTV 2007: Austin, TX, USA
- Magdy S. Abadir, Li-C. Wang, Jayanta Bhadra:
Eighth International Workshop on Microprocessor Test and Verification (MTV 2007), Common Challenges and Solutions, 5-6 December 2007, Austin, Texas, USA. IEEE Computer Society 2007, ISBN 978-0-7695-3241-7 [contents]
7th MTV 2006: Austin, TX, USA
- Magdy S. Abadir, Li-C. Wang, Jayanta Bhadra:
Seventh International Workshop on Microprocessor Test and Verification (MTV 2006), Common Challenges and Solutions, 4-5 December 2006, Austin, Texas, USA. IEEE Computer Society 2006, ISBN 978-0-7695-2839-7 [contents]
6th MTV 2005: Austin, TX, USA
- Magdy S. Abadir, Li-C. Wang:
Sixth International Workshop on Microprocessor Test and Verification (MTV 2005), Common Challenges and Solutions, 3-4 November 2005, Austin, Texas, USA. IEEE Computer Society 2005, ISBN 0-7695-2627-6 [contents]
5th MTV 2004: Austin, TX, USA
- Fifth International Workshop on Microprocessor Test and Verification (MTV 2004), Common Challenges and Solutions, 08-10 September 2004, Austin, Texas, USA. IEEE Computer Society 2004, ISBN 0-7695-2320-X [contents]
4th MTV 2003: Dallas, TX, USA
- Fourth International Workshop on Microprocessor Test and Verification, Common Challenges and Solutions (MTV 2003), May 29-30, 2003, Hyatt Town Lake Hotel, Austin, Texas, USA. IEEE Computer Society 2003, ISBN 0-7695-2045-6 [contents]
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