


Остановите войну!
for scientists:


default search action
Data Mining and Knowledge Discovery, Volume 16
Volume 16, Number 1, February 2008
- Tao Li, Chang-Shing Perng, Sheng Ma:
Guest editorial: special issue on temporal data mining: theory, algorithms and applications. 1-3 - Florian Verhein, Sanjay Chawla:
Mining spatio-temporal patterns in object mobility databases. 5-38 - Florent Masseglia, Pascal Poncelet
, Maguelonne Teisseire, Alice Marascu:
Web usage mining: extracting unexpected periods from web logs. 39-65 - Xin Wang, Ata Kabán:
A dynamic bibliometric model for identifying online communities. 67-107 - Michail Vlachos
, Kun-Lung Wu, Shyh-Kwei Chen, Philip S. Yu:
Correlating burst events on streaming stock market data. 109-133
Volume 16, Number 2, April 2008
- Girish Keshav Palshikar, Manoj M. Apte
:
Collusion set detection using graph clustering. 135-164 - Anna M. Manning, David J. Haglin, John A. Keane:
A recursive search algorithm for statistical disclosure assessment. 165-196 - Hong Yao, Howard J. Hamilton:
Mining functional dependencies from data. 197-219 - James Cheng, Yiping Ke
, Wilfred Ng:
Effective elimination of redundant association rules. 221-249
Volume 16, Number 3, June 2008
- Charu C. Aggarwal, Philip S. Yu:
A framework for condensation-based anonymization of string data. 251-275 - Manjeet Rege, Ming Dong, Farshad Fotouhi:
Bipartite isoperimetric graph partitioning for data co-clustering. 276-312 - Daniel Sánchez
, José-María Serrano
, Ignacio J. Blanco
, María J. Martín-Bautista
, María Amparo Vila Miranda
:
Using association rules to mine for strong approximate dependencies. 313-348 - Amol Ghoting, Srinivasan Parthasarathy
, Matthew Eric Otey:
Fast mining of distance-based outliers in high-dimensional datasets. 349-364

manage site settings
To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.