Journal of Electronic Testing, Volume 29

Volume 29, Number 1, February 2013

Volume 29, Number 2, April 2013

Special Issue on Manufacturable and Dependable Multicore Architectures at Nanoscale (MEDIAN)

Volume 29, Number 3, June 2013

Special Issue on Defect and Fault Tolerance

Volume 29, Number 4, August 2013

Special Issue on Defect and Fault Tolerance

Volume 29, Number 5, October 2013

Special Issue on Verification and Testing Challenges in Future Microprocessor and SoC Designs

Volume 29, Number 6, December 2013

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