Microelectronics Reliability, Volumes 88-90 export records of this page
first 1000 hits only:
see FAQ:
BHT key:
ask others
view this toc in
Volumes 88-90, September 2018 29th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis ( ESREF 2018 )
share record
persistent URL:
https://dblp.org/rec/journals/mr/CiappaCMI18 Mauro Ciappa , Paolo Cova , Gaudenzio Meneghesso , Francesco Iannuzzo : Editorial. 1 share record
persistent URL:
https://dblp.org/rec/journals/mr/ChenK18 Wen-Chieh Chen , Ming-Dou Ker : Surge protection design with surge-to-digital converter for microelectronic circuits and systems. 2-5 share record
persistent URL:
https://dblp.org/rec/journals/mr/AzizaHMCP18 Hassen Aziza , Basma Hajri , Mohammad M. Mansour , Ali Chehab , Annie Pérez : A lightweight write-assist scheme for reduced RRAM variability and power. 6-10 share record
persistent URL:
https://dblp.org/rec/journals/mr/VogtNMB18 Ivo Vogt , Tomonori Nakamura , B. Motamedi , Christian Boit : Device characterization of 16/14 nm FinFETs for reliability assessment with infrared emission spectra. 11-15 export record
dblp key:
journals/mr/UnterreitmeierN18 share record
persistent URL:
https://dblp.org/rec/journals/mr/UnterreitmeierN18 M. Unterreitmeier , O. Nagler , L. Pfitzner , Robert Weigel , R. Holmer : An acoustic emission sensor system for thin layer crack detection. 16-21 export record
dblp key:
journals/mr/AminiBHSMSB18 share record
persistent URL:
https://dblp.org/rec/journals/mr/AminiBHSMSB18 Elham Amini , Anne Beyreuther , Norbert Herfurth , Alexander Steigert , R. Muydinov , Bernd Szyszka , Christian Boit : IC security and quality improvement by protection of chip backside against hardware attacks. 22-25 share record
persistent URL:
https://dblp.org/rec/journals/mr/Mura18 Giovanna Mura : Reliability concerns from the gray market. 26-30 export record
dblp key:
journals/mr/BaszynskiRW18 share record
persistent URL:
https://dblp.org/rec/journals/mr/BaszynskiRW18 Michal Baszynski , P. Rydygier , Mariusz Wojcik : Experimental studies of: Laminate composition, drill bit wear out, and chloride ion concentration as factors affecting CAF formation rate. 31-37 share record
persistent URL:
https://dblp.org/rec/journals/mr/PazosAPS18 Sebastián Matías Pazos , Fernando L. Aguirre , Felix Palumbo , Fernando Silveira : Performance-reliability trade-offs in short range RF power amplifier design. 38-42 share record
persistent URL:
https://dblp.org/rec/journals/mr/BakerI18 Nick Baker , Francesco Iannuzzo : Smart SiC MOSFET accelerated lifetime testing. 43-47 export record
dblp key:
journals/mr/AhmadiTFSPS18 share record
persistent URL:
https://dblp.org/rec/journals/mr/AhmadiTFSPS18 Bahar Ahmadi , Pouya Tavousi , Joseph Favata , Peiman Shahbeigi-Roodposhti , Rengarajan Pelapur , Sina Shahbazmohamadi : A novel crowdsourcing platform for microelectronics counterfeit defect detection. 48-53 export record
dblp key:
journals/mr/Bey-TemsamaniKH18 share record
persistent URL:
https://dblp.org/rec/journals/mr/Bey-TemsamaniKH18 Abdellatif Bey-Temsamani , S. Kauffmann , Stijn Helsen , T. Gaens , V. Driesen : Physics-of-Failure (PoF) methodology for qualification and lifetime assessment of supercapacitors for industrial applications. 54-60 export record
dblp key:
journals/mr/CoutetMDGJLPC18 share record
persistent URL:
https://dblp.org/rec/journals/mr/CoutetMDGJLPC18 Julien Coutet , François Marc , Flavien Dozolme , Romain Guétard , Aurélien Janvresse , Pierre Lebossé , Antonin Pastre , Jean-Claude Clement : Influence of temperature of storage, write and read operations on multiple level cells NAND flash memories. 61-66 export record
dblp key:
journals/mr/MousnierSLLB18 share record
persistent URL:
https://dblp.org/rec/journals/mr/MousnierSLLB18 Morgane Mousnier , Kévin Sanchez , Elsa Locatelli , Thierry Lebey , Vincent Bley : Lock-in thermography for defect localization and thermal characterization for space application. 67-74 share record
persistent URL:
https://dblp.org/rec/journals/mr/MaCZWL18 Mingyao Ma , Kaiqi Chu , Mingyue Zhan , Ye Wang , Fang Liu : Statistical analysis of characteristic of ageing precursor of IGBT based on synthetic effect of multi-physical fields. 75-79 share record
persistent URL:
https://dblp.org/rec/journals/mr/DuongPR18a Pham Luu Trung Duong , Hyunseok Park , Nagarajan Raghavan : Application of multi-output Gaussian process regression for remaining useful life prediction of light emitting diodes. 80-84 share record
persistent URL:
https://dblp.org/rec/journals/mr/DuongXYR18 Pham Luu Trung Duong , Xuechu Xu , Qing Yang , Nagarajan Raghavan : Gaussian process regression approach for robust design and yield enhancement of self-assembled nanostructures. 85-90 share record
persistent URL:
https://dblp.org/rec/journals/mr/PrathibaSA18 G. Prathiba , M. Santhi , A. Ahilan : Design and implementation of reliable flash ADC for microwave applications. 91-97 export record
dblp key:
journals/mr/Dixon-Luinenburg18 share record
persistent URL:
https://dblp.org/rec/journals/mr/Dixon-Luinenburg18 O. Dixon-Luinenburg , J. Fine : In-situ transistor reliability measurements through nanoprobing. 98-102 share record
persistent URL:
https://dblp.org/rec/journals/mr/SunHLZ18 Xiaoman Sun , Meng Huang , Yi Liu , Xiaoming Zha : Investigation of artificial neural network algorithm based IGBT online condition monitoring. 103-106 share record
persistent URL:
https://dblp.org/rec/journals/mr/YeLWNZ18 Xuerong Ye , Yigang Lin , Qingmin Wang , Hao Niu , Guofu Zhai : Manufacturing process-based storage degradation modelling and reliability assessment. 107-110 export record
dblp key:
journals/mr/ZimpeckMAHKR18 share record
persistent URL:
https://dblp.org/rec/journals/mr/ZimpeckMAHKR18 Alexandra L. Zimpeck , Cristina Meinhardt , Laurent Artola , Guillaume Hubert , Fernanda Lima Kastensmidt , Ricardo Augusto da Luz Reis : Impact of different transistor arrangements on gate variability. 111-115 share record
persistent URL:
https://dblp.org/rec/journals/mr/MoraesZMR18 Leonardo B. Moraes , Alexandra L. Zimpeck , Cristina Meinhardt , Ricardo Augusto da Luz Reis : Evaluation of variability using Schmitt trigger on full adders layout. 116-121 share record
persistent URL:
https://dblp.org/rec/journals/mr/LeiteFB18 Thiago Ferreira de Paiva Leite , Laurent Fesquet , Rodrigo Possamai Bastos : A body built-in cell for detecting transient faults and dynamically biasing subcircuits of integrated systems. 122-127 export record
dblp key:
journals/mr/VieraDFPNRB18 share record
persistent URL:
https://dblp.org/rec/journals/mr/VieraDFPNRB18 Raphael Andreoni Camponogara Viera , Jean-Max Dutertre , Marie-Lise Flottes , Olivier Potin , Giorgio Di Natale , Bruno Rouzeyre , Rodrigo Possamai Bastos : Assessing body built-in current sensors for detection of multiple transient faults. 128-134
Si Technologies & Nanoelectronics:
Hot Carriers, High K, Gate Materials
export record
dblp key:
journals/mr/StojadinovicDDG18 share record
persistent URL:
https://dblp.org/rec/journals/mr/StojadinovicDDG18 Ninoslav Stojadinovic , Snezana Djoric-Veljkovic , Vojkan Davidovic , Snezana Golubovic , Srboljub Stankovic , Aneta Prijic , Zoran Prijic , Ivica Manic , Danijel Dankovic : NBTI and irradiation related degradation mechanisms in power VDMOS transistors. 135-141 export record
dblp key:
journals/mr/Rodriguez-Fernandez18 share record
persistent URL:
https://dblp.org/rec/journals/mr/Rodriguez-Fernandez18 A. Rodriguez-Fernandez , J. Muñoz-Gorriz , Jordi Suñé , Enrique Miranda : A new method for estimating the conductive filament temperature in OxRAM devices based on escape rate theory. 142-146 share record
persistent URL:
https://dblp.org/rec/journals/mr/JongSS18 Maurits J. de Jong , Cora Salm , Jurriaan Schmitz : Towards understanding recovery of hot-carrier induced degradation. 147-151 share record
persistent URL:
https://dblp.org/rec/journals/mr/BeckmeierM18 D. Beckmeier , Andreas Martin : Variation-resilient quantifiable plasma process induced damage monitoring. 152-158 share record
persistent URL:
https://dblp.org/rec/journals/mr/MarcaPKRCB18 Vincenzo Della Marca , Jérémy Postel-Pellerin , T. Kempf , Arnaud Régnier , Philippe Chiquet , Marc Bocquet : Quantitative correlation between Flash and equivalent transistor for endurance electrical parameters extraction. 159-163 share record
persistent URL:
https://dblp.org/rec/journals/mr/FengRMDPW18 Xuan Feng , Nagarajan Raghavan , Sen Mei , Shurong Dong , Kin Leong Pey , Hei Wong : Statistical nature of hard breakdown recovery in high-κ dielectric stacks studied using ramped voltage stress. 164-168 share record
persistent URL:
https://dblp.org/rec/journals/mr/XuWWZD18 Shunqiang Xu , Hongyi Wang , Jianfei Wu , Liming Zheng , Jietao Diao : A new multitime programmable non-volatile memory cell using high voltage NMOS. 169-172 share record
persistent URL:
https://dblp.org/rec/journals/mr/FuSGWZW18 Guicui Fu , Yutai Su , Wendi Guo , Bo Wan , Zhongqing Zhang , Ye Wang : Life prediction methodology of system-in-package based on physics of failure. 173-178 share record
persistent URL:
https://dblp.org/rec/journals/mr/KimLKSL18 Gang-Jun Kim , Nam-Hyun Lee , Jongkyun Kim , Jung Eun Seok , Yunsung Lee : Effect of DC/AC stress on the reliability of cell capacitor in DRAM. 179-182 share record
persistent URL:
https://dblp.org/rec/journals/mr/KimLKLSL18 Jongkyun Kim , Namhyun Lee , Gang-Jun Kim , Young-Yun Lee , Jung-Eun Seok , Yunsung Lee : Effect of OFF-state stress on reliability of nMOSFET in SWD circuits of DRAM. 183-185 share record
persistent URL:
https://dblp.org/rec/journals/mr/YunSSK18 Yeohyeok Yun , Ji-Hoon Seo , Donghee Son , Bongkoo Kang : Method to estimate profile of threshold voltage degradation in MOSFETs due to electrical stress. 186-190 share record
persistent URL:
https://dblp.org/rec/journals/mr/YunKSSK18 Yeohyeok Yun , Gang-Jun Kim , Ji-Hoon Seo , Donghee Son , Bongkoo Kang : Method to extract parameters of power law for nano-scale SiON pMOSFETs under negative bias temperature instability. 191-195 export record
dblp key:
journals/mr/AlmeidaMBSRM18 share record
persistent URL:
https://dblp.org/rec/journals/mr/AlmeidaMBSRM18 Roberto B. Almeida , Cleiton M. Marques , Paulo F. Butzen , Fabio G. R. G. da Silva , Ricardo A. L. Reis , Cristina Meinhardt : Analysis of 6 T SRAM cell in sub-45 nm CMOS and FinFET technologies. 196-202
Si Technologies & Nanoelectronics:
ESD, EMI, Latch-up
share record
persistent URL:
https://dblp.org/rec/journals/mr/Wu18 Chunlei Wu : Electrically induced physical damage (EIPD) cases study: From electrical overstress (EOS) to product defects. 203-207 share record
persistent URL:
https://dblp.org/rec/journals/mr/HollandB18 Steffen Holland , Rolf Brenner : Voltage oscillations during surge pulses induced by self-extinguishing non-destructive second breakdown in pn-junction diodes. 208-213 share record
persistent URL:
https://dblp.org/rec/journals/mr/GoerlVBBV18 Roger C. Goerl , Paulo Ricardo Cechelero Villa , Letícia Maria Veiras Bolzani , Eduardo Augusto Bezerra , Fabian Luis Vargas : An efficient EDAC approach for handling multiple bit upsets in memory array. 214-218 share record
persistent URL:
https://dblp.org/rec/journals/mr/DouziKBTS18 Shawki Douzi , Moncef Kadi , Habib Boulzazen , Mohamed Tlig , Jaleleddine Ben Hadj Slama : Conducted EMI evolution of power SiC MOSFET in a Buck converter after short-circuit aging tests. 219-224 share record
persistent URL:
https://dblp.org/rec/journals/mr/ZhangXMY18 Zhen Zhang , Yaoting Xue , Ruiqing Ma , Yongheng Yang : An easy-implemented confidence filter for signal processing in the complex electromagnetic environment. 225-229 share record
persistent URL:
https://dblp.org/rec/journals/mr/WuZLLWW18 Jianfei Wu , Wei Zhu , Binhong Li , Yafei Li , Hongyi Wang , Mengjun Wang : Investigations on immunity of interfaces between intelligent media processor and DDR3 SDRAM memory. 230-235 export record
dblp key:
journals/mr/BaburskeNSBKL18 share record
persistent URL:
https://dblp.org/rec/journals/mr/BaburskeNSBKL18 Roman Baburske , Franz-Josef Niedernostheide , Hans-Joachim Schulze , Riteshkumar Bhojani , J. Kowalsky , Josef Lutz : Unified view on energy and electrical failure of the short-circuit operation of IGBTs. 236-241
Progress in Failure Analysis:
Defect Detection and Analysis
share record
persistent URL:
https://dblp.org/rec/journals/mr/YamagishiC18 Yuji Yamagishi , Y. Cho : High resolution observation of defects at SiO2 /4H-SiC interfaces using time-resolved scanning nonlinear dielectric microscopy. 242-245 share record
persistent URL:
https://dblp.org/rec/journals/mr/LowTTZL18 Yi Chao Low , Pik Kee Tan , Soon Leng Tan , Yuzhe Zhao , Jeffrey Lam : Solving 28 nm I/O circuit reliability issue due to IC design weakness. 246-249 share record
persistent URL:
https://dblp.org/rec/journals/mr/AmsterRYIM18 Oskar Amster , K. A. Rubin , Y. Yang , D. Iyer , A. Messinger : Application of Scanning Microwave Microscopy nano-C-V to investigate dopant defect under a poly gate device. 250-254 export record
dblp key:
journals/mr/RavikumarLCPY18 share record
persistent URL:
https://dblp.org/rec/journals/mr/RavikumarLCPY18 Venkat Krishnan Ravikumar , Gabriel Lim , Jiann Min Chin , Kin Leong Pey , Joel K. W. Yang : Understanding spatial resolution of laser voltage imaging. 255-261 export record
dblp key:
journals/mr/KozicHRSSSB18 share record
persistent URL:
https://dblp.org/rec/journals/mr/KozicHRSSSB18 Eva Kozic , René Hammer , Jördis Rosc , Bernhard Sartory , Joerg Siegert , Franz Schrank , Roland Brunner : Metallization defect detection in 3D integrated components using scanning acoustic microscopy and acoustic simulations. 262-266 share record
persistent URL:
https://dblp.org/rec/journals/mr/VillaGR18 Emanuele Villa , Audrey Garnier , Antoine Reverdy : Exploitation of Laser Voltage techniques for identification and complete characterization of a scan chain transition fail issue using the second harmonic approach. 267-272 export record
dblp key:
journals/mr/BeyreutherHANWB18 share record
persistent URL:
https://dblp.org/rec/journals/mr/BeyreutherHANWB18 Anne Beyreuther , Norbert Herfurth , Elham Amini , Tomonori Nakamura , Ingrid De Wolf , Christian Boit : Photon emission as a characterization tool for bipolar parasitics in FinFET technology. 273-276 share record
persistent URL:
https://dblp.org/rec/journals/mr/LiLBB18 Tan Li , Hosung Lee , GeunYong Bak , Sanghyeon Baeg : Failure signature analysis of power-opens in DDR3 SDRAMs. 277-281 export record
dblp key:
journals/mr/HertlVADMPRS18 share record
persistent URL:
https://dblp.org/rec/journals/mr/HertlVADMPRS18 Michael Hertl , Nicolas Vivet , Fabien Allanic , Sandra Dureau , Armelle Minguet , Nicolas Porcher , Isaline Richard , Pauline Serre : Use of golden samples for the assessment of the quality and reproducibility of scanning acoustic microscopy images of electronics samples. 282-287 share record
persistent URL:
https://dblp.org/rec/journals/mr/AlaouiBTV18 Nabil El Belghiti Alaoui , Alexandre Boyer , Patrick Tounsi , Arnaud Viard : New defect detection approach using near electromagnetic field probing of high density PCBAs. 288-293 share record
persistent URL:
https://dblp.org/rec/journals/mr/MarcelloMM18 Giulia Marcello , E. Meda , Matteo Medda : Complex automotive ICs defect localization driven by quiescent power supply current: Three cases study. 294-298 export record
dblp key:
journals/mr/SchaffusABDGHKM18 share record
persistent URL:
https://dblp.org/rec/journals/mr/SchaffusABDGHKM18 T. Schaffus , P. Albert , W. Breuer , D. Debie , M. Graml , C. Hollerith , F. Kroninger , W. Mack , H. Pfaff , M. Schaffus , J. Walter : Influence of sample preparation on intrinsic stresses inside a model Chip - First results of partial decapsulation. 299-303 share record
persistent URL:
https://dblp.org/rec/journals/mr/BahmanJI18 Amir Sajjad Bahman , S. M. Jensen , Francesco Iannuzzo : Failure mechanism analysis of fuses subjected to manufacturing and operational thermal stresses. 304-308 share record
persistent URL:
https://dblp.org/rec/journals/mr/TanZRLPHTM18 Pik Kee Tan , Yuzhe Zhao , Francis Rivai , Binghai Liu , Yanlin Pan , Ran He , Hao Tan , Zhihong Mai : Cross-sectional nanoprobing sample preparation on sub-micron device with fast laser grooving technique. 309-314 share record
persistent URL:
https://dblp.org/rec/journals/mr/Veenhuizen18 Marc van Veenhuizen : Void detection in solder bumps with deep learning. 315-320 export record
dblp key:
journals/mr/ChithambaramTZL18 share record
persistent URL:
https://dblp.org/rec/journals/mr/ChithambaramTZL18 Shaalini Chithambaram , Pik Kee Tan , Yuzhe Zhao , Binghai Liu , Yinzhe Ma , Alfred Quah , Dayanand Nagalingam , Yanlin Pan , Zhihong Mai : Failure analysis on 14 nm FinFET devices with ESD CDM failure. 321-333 share record
persistent URL:
https://dblp.org/rec/journals/mr/VogtNWB18 Ivo Vogt , Tomonori Nakamura , Ingrid De Wolf , Christian Boit : Detection of failure mechanisms in 24-40 nm FinFETs with (spectral) photon emission techniques using InGaAs camera. 334-338 share record
persistent URL:
https://dblp.org/rec/journals/mr/YeCZ18 Xuerong Ye , Cen Chen , Guofu Zhai : Fault localization of a switched mode power supply based on extended integer-coded dictionary method. 339-344 share record
persistent URL:
https://dblp.org/rec/journals/mr/KimKYYB18 Hye-Young Kim , Jae-Yeon Kim , Ki-Tae Yoo , Won-Jon Yang , Jai-Won Byeon : Failure mechanism of Ag nanowire-coated conductive transparent electrode for wearable devices under folding and torsional fatigue condition. 345-349 share record
persistent URL:
https://dblp.org/rec/journals/mr/LiZO18 Zhongliang Li , Zhixue Zheng , Rachid Outbib : A prognostic methodology for power MOSFETs under thermal stress using echo state network and particle filter. 350-354 export record
dblp key:
journals/mr/MedeirosBTVH18 share record
persistent URL:
https://dblp.org/rec/journals/mr/MedeirosBTVH18 G. Cardoso Medeiros , Letícia Maria Veiras Bolzani , Mottaqiallah Taouil , Fabian Vargas , Said Hamdioui : A defect-oriented test approach using on-Chip current sensors for resistive defects in FinFET SRAMs. 355-359 share record
persistent URL:
https://dblp.org/rec/journals/mr/MiuraSN18 Katsuyoshi Miura , Atsuki Seko , Koji Nakamae : Simulation-based evaluation of probing attacks to arbiter PUFs using a time-resolved emission microscope. 360-364 export record
dblp key:
journals/mr/DreherSVHAB18 share record
persistent URL:
https://dblp.org/rec/journals/mr/DreherSVHAB18 P. Dreher , Roman Schmidt , A. Vetter , J. Hepp , Karl Aberer , Christoph J. Brabec : Non-destructive imaging of defects in Ag-sinter die attach layers - A comparative study including X-ray, Scanning Acoustic Microscopy and Thermography. 365-370 share record
persistent URL:
https://dblp.org/rec/journals/mr/AhmadiJS18 Bahar Ahmadi , Bahram Javidi , Sina Shahbazmohamadi : Automated detection of counterfeit ICs using machine learning. 371-377
Reliability of Microwave and Compound Semiconductors Devices
export record
dblp key:
journals/mr/BarnesHVSBBGMMS18 share record
persistent URL:
https://dblp.org/rec/journals/mr/BarnesHVSBBGMMS18 Andrew Barnes , Florence Hélière , P. Villar , Hannes Stuhldreier , C. Beaurain , D. Bouw , M. Grunwald , E. Moess , Tobias Muck , C. Schildbach , T. Ayles , A. Kramer , B. Bildner : Qualification of GaN microwave transistors for the European Space Agency Biomass mission. 378-384 export record
dblp key:
journals/mr/DammannBBKKGSQ18 share record
persistent URL:
https://dblp.org/rec/journals/mr/DammannBBKKGSQ18 Maximilian Dammann , Martina Baeumler , Peter Brückner , Tobias Kemmer , Helmer Konstanzer , Andreas Graff , Michél Simon-Najasek , Rüdiger Quay : Comparison of reliability of 100 nm AlGaN/GaN HEMTs with T-gate and SAG-gate technology. 385-388 export record
dblp key:
journals/mr/PribahsnikBNML18 share record
persistent URL:
https://dblp.org/rec/journals/mr/PribahsnikBNML18 Florian Peter Pribahsnik , Mirko Bernardoni , Michael Nelhiebel , M. Mataln , A. Lindemann : Combined experimental and numerical approach to study electro-mechanical resonant phenomena in GaN-on-Si heterostructures. 389-392 export record
dblp key:
journals/mr/SasangkaGGT18 share record
persistent URL:
https://dblp.org/rec/journals/mr/SasangkaGGT18 W. A. Sasangka , Yu Gao , Chee Lip Gan , Carl V. Thompson : Impact of carbon impurities on the initial leakage current of AlGaN/GaN high electron mobility transistors. 393-396 export record
dblp key:
journals/mr/RzinCSMHHSMSSGB18 share record
persistent URL:
https://dblp.org/rec/journals/mr/RzinCSMHHSMSSGB18 Mehdi Rzin , Alessandro Chini , Carlo De Santi , Matteo Meneghini , A. Hugger , M. Hollmer , H. Stieglauer , M. Madel , J. Splettstößer , D. Sommer , Jan Grünenpütt , K. Beilenhoff , Hervé Blanck , J.-T. Chen , O. Kordina , Gaudenzio Meneghesso , Enrico Zanoni : On-wafer RF stress and trapping kinetics of Fe-doped AlGaN/GaN HEMTs. 397-401 export record
dblp key:
journals/mr/ChihaniTBDDW18 share record
persistent URL:
https://dblp.org/rec/journals/mr/ChihaniTBDDW18 Omar Chihani , L. Théolier , Alain Bensoussan , Jean-Yves Delétage , André Durier , Eric Woirgard : Effect of HTRB lifetest on AlGaN/GaN HEMTs under different voltages and temperatures stresses. 402-405 share record
persistent URL:
https://dblp.org/rec/journals/mr/HachemTMT18 D. Hachem , David Trémouilles , Frederic Morancho , Gaëtan Toulon : A new electro-optical transmission-line measurement-method revealing a possible contribution of source and drain contact resistances to GaN HEMT dynamic on-resistance. 406-410 share record
persistent URL:
https://dblp.org/rec/journals/mr/KimCPCJ18 Dongshin Kim , Ju-Hwan Choi , Nochang Park , Sung-Il Chan , Yongchae Jeong : Analysis of semiconductor fault using DS (damped sinusoidal) HPEM injection. 411-417 export record
dblp key:
journals/mr/OualliDPAPGLJTL18 share record
persistent URL:
https://dblp.org/rec/journals/mr/OualliDPAPGLJTL18 Mourad Oualli , Christian Dua , O. Patard , P. Altuntas , S. Piotrowicz , Piero Gamarra , C. Lacam , J.-C. Jacquet , L. Teisseire , D. Lancereau , Eric Chartier , C. Potier , Sylvain L. Delage : Stability and robustness of InAlGaN/GaN HEMT in short-term DC tests for different passivation schemes. 418-422
Power Devices Reliability:
Silicon and Passive
share record
persistent URL:
https://dblp.org/rec/journals/mr/HuLIB18 Keting Hu , Zhigang Liu , Francesco Iannuzzo , Frede Blaabjerg : Simple and effective open switch fault diagnosis of single-phase PWM rectifier. 423-427 export record
dblp key:
journals/mr/BrandeleroEDM18 share record
persistent URL:
https://dblp.org/rec/journals/mr/BrandeleroEDM18 J. Brandelero , Jeffrey Ewanchuk , Nicolas Degrenne , Stefan Mollov : Lifetime extension through Tj equalisation by use of intelligent gate driver with multi-chip power module. 428-432 share record
persistent URL:
https://dblp.org/rec/journals/mr/HasegawaNO18 Kazunori Hasegawa , Shinichi Nishizawa , Ichiro Omura : ESR and capacitance monitoring of a dc-link capacitor used in a three-phase PWM inverter with a front-end diode rectifier. 433-437 share record
persistent URL:
https://dblp.org/rec/journals/mr/MagnoneBM18 Paolo Magnone , Giacomo Barletta , A. Magrì : Investigation of degradation mechanisms in low-voltage p-channel power MOSFETs under High Temperature Gate Bias stress. 438-442 export record
dblp key:
journals/mr/MatsumoriUSTI18 share record
persistent URL:
https://dblp.org/rec/journals/mr/MatsumoriUSTI18 Hiroaki Matsumori , Kazuki Urata , Toshihisa Shimizu , Koushi Takano , Hitoshi Ishii : Capacitor loss analysis method for power electronics converters. 443-446 share record
persistent URL:
https://dblp.org/rec/journals/mr/KrempS18 S. Kremp , O. Schilling : Humidity robustness for high voltage power modules: Limiting mechanisms and improvement of lifetime. 447-452 share record
persistent URL:
https://dblp.org/rec/journals/mr/NiuWYWB18 Hao Niu , Shujuan Wang , Xuerong Ye , Huai Wang , Frede Blaabjerg : Lifetime prediction of aluminum electrolytic capacitors in LED drivers considering parameter shifts. 453-457 share record
persistent URL:
https://dblp.org/rec/journals/mr/WatanabeO18 Akihiko Watanabe , Ichiro Omura : A power cycling degradation inspector of power semiconductor devices. 458-461 export record
dblp key:
journals/mr/DornicIKTOEM18 share record
persistent URL:
https://dblp.org/rec/journals/mr/DornicIKTOEM18 Nausicaa Dornic , Ali Ibrahim , Zoubir Khatir , Son-Ha Tran , Jean-Pierre Ousten , Jeffrey Ewanchuk , Stefan Mollov : Analysis of the degradation mechanisms occurring in the topside interconnections of IGBT power devices during power cycling. 462-469 export record
dblp key:
journals/mr/PapadopoulosCKS18 share record
persistent URL:
https://dblp.org/rec/journals/mr/PapadopoulosCKS18 Charalampos Papadopoulos , Chiara Corvasce , Arnost Kopta , Daniel Schneider , Gontran Pâques , Munaf Rahimo : The influence of humidity on the high voltage blocking reliability of power IGBT modules and means of protection. 470-475 share record
persistent URL:
https://dblp.org/rec/journals/mr/CiappaPS18 Mauro Ciappa , Ying Pang , Chenchen Sun : Experimental characterization of critical high-electric field spots in power semiconductors by planar and scanning collimated alpha sources. 476-481 export record
dblp key:
journals/mr/TsukudaAHNO18 share record
persistent URL:
https://dblp.org/rec/journals/mr/TsukudaAHNO18 Masanori Tsukuda , Seiya Abe , Kazunori Hasegawa , Tamotsu Ninomiya , Ichiro Omura : Bias voltage criteria of gate shielding effect for protecting IGBTs from shoot-through phenomena. 482-485 share record
persistent URL:
https://dblp.org/rec/journals/mr/HalickSSP18 Mohamed Sathik Mohamed Halick , Prasanth Sundarajan , F. Sasongko , Josep Pou : Online condition monitoring of IGBT modules using voltage change rate identification. 486-492 export record
dblp key:
journals/mr/SamavatianAI18 share record
persistent URL:
https://dblp.org/rec/journals/mr/SamavatianAI18 Vahid Samavatian , Yvan Avenas , Hossein Iman-Eini : Mutual and self-aging effects of power semiconductors on the thermal behaviour of DC-DC boost power converter. 493-499 export record
dblp key:
journals/mr/Bat-OchirBHTDO18 share record
persistent URL:
https://dblp.org/rec/journals/mr/Bat-OchirBHTDO18 Bat-Otgon Bat-Ochir , Battuvshin Bayarkhuu , Kazunori Hasegawa , Masanori Tsukuda , Bayasgalan Dugarjav , Ichiro Omura : Envelop tracking based embedded current measurement for monitoring of IGBT and power converter system. 500-504 share record
persistent URL:
https://dblp.org/rec/journals/mr/TripathiTO18 Ravi N. Tripathi , Masanori Tsukuda , Ichiro Omura : A fully digital feedback control of gate driver for current balancing of parallel connected power devices. 505-509 share record
persistent URL:
https://dblp.org/rec/journals/mr/StiasnyQWM18 Th. Stiasny , Olivier Quittard , Daniel Waltisberg , U. Meier : Reliability evaluation of IGCT from accelerated testing, quality monitoring and field return analysis. 510-513 share record
persistent URL:
https://dblp.org/rec/journals/mr/PengZLL18 Yu Peng , Y. J. Zhang , Datong Liu , L. S. Liu : Degradation estimation using feature increment stepwise linear regression for PWM Inverter of Electro-Mechanical Actuator. 514-518 share record
persistent URL:
https://dblp.org/rec/journals/mr/WangWZB18 Zhongxu Wang , Huai Wang , Yi Zhang , Frede Blaabjerg : A multi-port thermal coupling model for multi-chip power modules suitable for circuit simulators. 519-523 share record
persistent URL:
https://dblp.org/rec/journals/mr/WangW18 Haoran Wang , Huai Wang : An analytical circuit based nonlinear thermal model for capacitor banks. 524-527 share record
persistent URL:
https://dblp.org/rec/journals/mr/LiMDM18 Nga Man Li , Subramani Manoharan , Diganta Das , F. Patrick McCluskey : Analysis of indentation measured mechanical properties on Multilayer Ceramic Capacitors (MLCCs). 528-533 share record
persistent URL:
https://dblp.org/rec/journals/mr/WuestTJSS18 Felix Wuest , S. Trampert , S. Janzen , S. Straube , M. Schneider-Ramelow : Comparison of temperature sensitive electrical parameter based methods for junction temperature determination during accelerated aging of power electronics. 534-539 share record
persistent URL:
https://dblp.org/rec/journals/mr/AbbateBSTV18 Carmine Abbate , Giovanni Busatto , Annunziata Sanseverino , D. Tedesco , Francesco Velardi : Measure of high frequency input impedance to study the instability of power devices in short circuit. 540-544 share record
persistent URL:
https://dblp.org/rec/journals/mr/DavariKI18 P. Davari , O. Kristensen , Francesco Iannuzzo : Investigation of acoustic emission as a non-invasive method for detection of power semiconductor aging. 545-549
Power Devices Reliability:
Wide Bandgap Devices
share record
persistent URL:
https://dblp.org/rec/journals/mr/LutzF18 Josef Lutz , Jörg Franke : Reliability and reliability investigation of wide-bandgap power devices. 550-556 share record
persistent URL:
https://dblp.org/rec/journals/mr/GonzalezA18 Jose Angel Ortiz Gonzalez , Olayiwola Alatise : Bias temperature instability and condition monitoring in SiC power MOSFETs. 557-562 share record
persistent URL:
https://dblp.org/rec/journals/mr/LuoRIB18 Haoze Luo , Paula Diaz Reigosa , Francesco Iannuzzo , Frede Blaabjerg : On-line solder layer degradation measurement for SiC-MOSFET modules under accelerated power cycling condition. 563-567 export record
dblp key:
journals/mr/FabrisMSHLNJXGM18 share record
persistent URL:
https://dblp.org/rec/journals/mr/FabrisMSHLNJXGM18 Eric E. Fabris , Matteo Meneghini , Carlo De Santi , Zongyang Hu , Wenshen Li , Kazuki Nomoto , Debdeep Jena , Huili Grace Xing , Xiang Gao , Gaudenzio Meneghesso , Enrico Zanoni : Degradation of GaN-on-GaN vertical diodes submitted to high current stress. 568-571 export record
dblp key:
journals/mr/TajalliCNMSMZM18 share record
persistent URL:
https://dblp.org/rec/journals/mr/TajalliCNMSMZM18 Alaleh Tajalli , Eleonora Canato , A. Nardo , Matteo Meneghini , Arno Stockman , Peter Moens , Enrico Zanoni , Gaudenzio Meneghesso : Impact of sidewall etching on the dynamic performance of GaN-on-Si E-mode transistors. 572-576 share record
persistent URL:
https://dblp.org/rec/journals/mr/ReigosaIC18 Paula Diaz Reigosa , Francesco Iannuzzo , Lorenzo Ceccarelli : Effect of short-circuit stress on the degradation of the SiO2 dielectric in SiC power MOSFETs. 577-583 export record
dblp key:
journals/mr/BorgaMSHZLDZM18 share record
persistent URL:
https://dblp.org/rec/journals/mr/BorgaMSHZLDZM18 Matteo Borga , Matteo Meneghini , Steve Stoffels , Marleen Van Hove , M. Zhao , X. Li , Stefaan Decoutere , Enrico Zanoni , Gaudenzio Meneghesso : Impact of the substrate and buffer design on the performance of GaN on Si power HEMTs. 584-588 share record
persistent URL:
https://dblp.org/rec/journals/mr/MannenW18 Tomoyuki Mannen , Keiji Wada : Operating-waveform analysis based reliability evaluation of power MOSFETs used for a leg short-circuit initial charge method. 589-592 export record
dblp key:
journals/mr/JiangWLCYLTS18 share record
persistent URL:
https://dblp.org/rec/journals/mr/JiangWLCYLTS18 Xi Jiang , Jun Wang , Jiwu Lu , Jianjun Chen , Xin Yang , Zongjian Li , Chunming Tu , Zheng John Shen : Failure modes and mechanism analysis of SiC MOSFET under short-circuit conditions. 593-597 share record
persistent URL:
https://dblp.org/rec/journals/mr/BoigeRLBGB18 F. Boige , Frédéric Richardeau , Stéphane Lefebvre , Jean-Marc Blaquière , G. Guibaud , A. Bourennane : Ensure an original and safe "fail-to-open" mode in planar and trench power SiC MOSFET devices in extreme short-circuit operation. 598-603 export record
dblp key:
journals/mr/AsllaniFCMP18 share record
persistent URL:
https://dblp.org/rec/journals/mr/AsllaniFCMP18 Besar Asllani , Asad Fayyaz , Alberto Castellazzi , Hervé Morel , Dominique Planson : V TH subthreshold hysteresis technology and temperature dependence in commercial 4H-SiC MOSFETs. 604-609 export record
dblp key:
journals/mr/PagnanoLUSIGKC18 share record
persistent URL:
https://dblp.org/rec/journals/mr/PagnanoLUSIGKC18 Dario Pagnano , Giorgia Longobardi , Florin Udrea , Jinming Sun , Mohamed Imam , Reenu Garg , Hyeongnam Kim , Alain Charles : On the impact of substrate electron injection on dynamic Ron in GaN-on-Si HEMTs. 610-614 share record
persistent URL:
https://dblp.org/rec/journals/mr/StellaOYCP18 Fausto Stella , Olufisayo Olanrewaju , Zineng Yang , Alberto Castellazzi , Gianmario Pellegrino : Experimentally validated methodology for real-time temperature cycle tracking in SiC power modules. 615-619 export record
dblp key:
journals/mr/RuzzarinMSSPMZ18 share record
persistent URL:
https://dblp.org/rec/journals/mr/RuzzarinMSSPMZ18 Maria Ruzzarin , Matteo Meneghini , Carlo De Santi , Min Sun , Tomás Palacios , Gaudenzio Meneghesso , Enrico Zanoni : Degradation of vertical GaN-on-GaN fin transistors: Step-stress and constant voltage experiments. 620-626 export record
dblp key:
journals/mr/CeccarelliLI18 share record
persistent URL:
https://dblp.org/rec/journals/mr/CeccarelliLI18 Lorenzo Ceccarelli , Haoze Luo , Francesco Iannuzzo : Investigating SiC MOSFET body diode's light emission as temperature-sensitive electrical parameter. 627-630 share record
persistent URL:
https://dblp.org/rec/journals/mr/ZhangAB18 Teng Zhang , Bruno Allard , J. Bi : The synergetic effects of high temperature gate bias and total ionization dose on 1.2 kV SiC devices. 631-635 export record
dblp key:
journals/mr/Avino-SalvadoMB18 share record
persistent URL:
https://dblp.org/rec/journals/mr/Avino-SalvadoMB18 Oriol Avino-Salvado , Hervé Morel , Cyril Buttay , Denis Labrousse , Stéphane Lefebvre : Threshold voltage instability in SiC MOSFETs as a consequence of current conduction in their body diode. 636-640 export record
dblp key:
journals/mr/LorinVGGBGG18 share record
persistent URL:
https://dblp.org/rec/journals/mr/LorinVGGBGG18 Thomas Lorin , William Vandendaele , Romain Gwoziecki , Charlotte Gillot , Jérome Biscarrat , Gérard Ghibaudo , F. Gaillard : Study of forward AC stress degradation of GaN-on-Si Schottky diodes. 641-644 share record
persistent URL:
https://dblp.org/rec/journals/mr/NguyenLA18 Tien Anh Nguyen , Stéphane Lefebvre , Stephane Azzopardi : Effect of short circuit aging on safe operating area of SiC MOSFET. 645-651 share record
persistent URL:
https://dblp.org/rec/journals/mr/FuFKD18 J. Z. Fu , F. Fouquet , M. Kadi , Pascal Dherbécourt : Evolution of C-V and I-V characteristics for a commercial 600 V GaN GIT power device under repetitive short-circuit tests. 652-655 share record
persistent URL:
https://dblp.org/rec/journals/mr/MolinKRM18 Quentin Molin , Mehdi Kanoun , Christophe Raynaud , Hervé Morel : Measurement and analysis of SiC-MOSFET threshold voltage shift. 656-660 share record
persistent URL:
https://dblp.org/rec/journals/mr/DuRIC18 H. Du , Paula Diaz Reigosa , Francesco Iannuzzo , Lorenzo Ceccarelli : Investigation on the degradation indicators of short-circuit tests in 1.2 kV SiC MOSFET power modules. 661-665