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ORCIDIEEE Transactions on Reliability, Volume 55
Volume 55, Number 1, March 2006
- Wenbiao Zhao, Rong Pan
, Alexander Aron, Adamantios Mettas:
Some properties of confidence bounds on reliability estimation for parts under varying stresses. 7-17 - Per Hokstad, Alexandre Maria, Pierre Tomis:
Estimation of common cause factors from systems with different numbers of channels. 18-25 - Jose Emmanuel Ramirez-Marquez, Wei Jiang:
On improved confidence bounds for system reliability. 26-36 - Chunghun Ha, Way Kuo:
Multi-path heuristic for redundancy allocation: the tree heuristic. 37-43 - John F. Shortle, Max B. Mendel:
A generalized framework for probabilistic design with application to rotors. 44-52 - Chi-Hyuck Jun, Saminathan Balamurali, Sang-Ho Lee:
Variables sampling plans for Weibull distributed lifetimes under sudden death testing. 53-58 - Chen-Mao Liao, Sheng-Tsaing Tseng:
Optimal design for step-stress accelerated degradation tests. 59-66 - Chengjie Xiong, Kejun Zhu, Ming Ji:
Analysis of a simple step-stress life test with a random stress-change time. 67-74 - Payman Sadegh, Adrian Thompson, Xiaodong Luo, Young Park, Tobias Sienel:
A methodology for predicting service life and design of reliability experiments. 75-85 - Hichem Boudali, Joanne Bechta Dugan:
A continuous-time Bayesian network reliability modeling, and analysis framework. 86-97 - Hisashi Yamamoto, Ming Jian Zuo, Tomoaki Akiba, Zhigang Tian:
Recursive formulas for the reliability of multi-state consecutive-k-out-of-n: G systems. 98-104 - Chin Ching Chiu, Chung-Hsien Hsu, Yi-Shiung Yeh:
A genetic algorithm for reliability-oriented task assignment with k~ duplications in distributed systems. 105-117 - Guan Jun Wang, Yuan Lin Zhang:
Optimal periodic preventive repair and replacement policy assuming geometric process repair. 118-122 - Yong Chen, Jionghua Jin:
Quality-oriented-maintenance for multiple interactive tooling components in discrete manufacturing processes. 123-134 - T. T. John, P. Chen:
Lognormal selection with applications to lifetime data. 135-148 - V. Roshan Joseph, I-Tang Yu:
Reliability improvement experiments with degradation data. 149-157
Volume 55, Number 2, 2006
- Yue Song, Hai-Lin Feng, San-yang Liu:
Reliability models of a bridge system structure under incomplete information. 162-168 - Jianfang Zhang:
The calculating formulae, and experimental methods in error propagation analysis. 169-181 - Zhihua Zheng, Lirong Cui, Alan G. Hawkes:
A study on a single-unit Markov repairable system with repair time omission. 182-188 - Ji Hwan Cha:
An extended model for optimal burn-in procedures. 189-198 - S. Satitsatian, Kailash C. Kapur:
An algorithm for lower reliability bounds of multistate two-terminal networks. 199-206 - Juan A. Carrasco:
Failure Transition Distance-Based Importance Sampling Schemes for theSimulation of Repairable Fault-Tolerant Computer Systems. 207-236 - A. M. Mathai, Serge B. Provost:
On q-logistic and related models. 237-244 - Mark Bebbington, Chin-Diew Lai, Ricardas Zitikis:
Useful periods for lifetime distributions with bathtub shaped hazard rate functions. 245-251 - Masahiro Hayashi, Takeo Abe, I. Nakajima:
Transformation from availability expression to failure frequency expression. 252-261 - Debasis Kundu, Ammar M. Sarhan:
Analysis of incomplete data in presence of competing risks among several groups. 262-269 - Debasis Kundu, Rameshwar D. Gupta:
Estimation of P[Y<X] for Weibull distributions. 270-280 - Swapna S. Gokhale, Michael R. Lyu, Kishor S. Trivedi:
Incorporating fault debugging activities into software reliability models: a simulation approach. 281-292 - Shyue-Kung Lu, Chih-Hsien Hsu:
Fault tolerance techniques for high capacity RAM. 293-306 - Kyungmee O. Kim:
Relating integrated circuit yield and time-dependent reliability for various defect density distributions. 307-313 - Majid Asadi, Ismihan Bayramoglu:
The mean residual life function of a k-out-of-n structure at the system level. 314-318 - Ming Jian Zuo, Zhigang Tian:
Performance evaluation of generalized multi-state k-out-of-n systems. 319-327 - Shwu-Tzy Jiang, Thomas L. Landers, Teri Reed Rhoads:
Assessment of repairable-system reliability using proportional intensity models: a review. 328-336 - Yuan-Shun Dai, Gregory Levitin:
Reliability and performance of tree-structured grid services. 337-349 - Zhihua Tang, Joanne Bechta Dugan:
BDD-based reliability analysis of phased-mission systems with multimode failures. 350-360 - Xiang Zhang, Ernst Gockenbach:
Assessment of the actual condition of the electrical components in medium-voltage networks. 361-368 - Hung-Yau Lin, Fu-Min Yeh, Sy-Yen Kuo:
An efficient algorithm for spare allocation problems. 369-378 - Chanseok Park, William J. Padgett:
Stochastic degradation models with several accelerating variables. 379-390 - M. Walter, Winfrid G. Schneeweiss:
Review of "The Modeling World of Reliability/Safety Engineering". 391 - Winfrid G. Schneeweiss:
"Review of Petri Net Picture Book" and "Petri Nets for Reliability Modeling". 391-392
Volume 55, Number 3, September 2006
- Michael Falk, Lothar Heins, Andreas Wensauer:
Safety Assessment of Fuel Rods via Generalized Bernoulli Chains. 393-396 - Laurent Cauffriez, Vincent Benard, Dominique Renaux:
A New Formalism for Designing and Specifying RAMS Parameters for Complex Distributed Control Systems: The Safe-SADT Formalism. 397-410 - Michael Grottke, Lei Li, Kalyanaraman Vaidyanathan, Kishor S. Trivedi:
Analysis of Software Aging in a Web Server. 411-420 - Ling Yuan, Jin Song Dong, Jing Sun, Hamid Abdul Basit:
Generic Fault Tolerant Software Architecture Reasoning and Customization. 421-435 - Chin-Yu Huang, Chu-Ti Lin:
Software Reliability Analysis by Considering Fault Dependency and Debugging Time Lag. 436-450 - Dimiter R. Avresky, Sean J. Geoghegan, Y. Varoglu:
Evaluation of Software-Implemented Fault-Tolerance (SIFT) Approach in Gracefully Degradable Multi-Computer Systems. 451-457 - X. Teng, H. Pham:
A New Methodology for Predicting Software Reliability in the Random Field Environments. 458-468 - Suprasad V. Amari:
Bounds on MTBF of Systems Subjected to Periodic Maintenance. 469-474 - William J. Owen:
A New Three-Parameter Extension to the Birnbaum-Saunders Distribution. 475-479 - Bharatendra Rai, Nanua Singh:
Customer-Rush Near Warranty Expiration Limit, and Nonparametric Hazard Rate Estimation From Known Mileage Accumulation Rates. 480-489 - Félix Belzunce, Eva-María Ortega, José-María Ruiz:
Comparison of Expected Failure Times for Several Replacement Policies. 490-495 - T. Li, B. Wang:
On Optimal p-Cycle-Based Protection in WDM Optical Networks With Sparse-Partial Wavelength Conversion. 496-506 - Gregory Levitin, Yuan-Shun Dai, Hanoch Ben-Haim:
Reliability and Performance of Star Topology Grid Service With Precedence Constraints on Subtask Execution. 507-515 - Anwar Haque, Pin-Han Ho:
A Study on the Design of Survivable Optical Virtual Private Networks (O-VPN). 516-524 - Ni Wang, Jye-Chyi Lu, Paul H. Kvam:
Reliability Modeling in Spatially Distributed Logistics Systems. 525-534 - Xiaohu Li, Peng Zhao:
Some Aging Properties of the Residual Life of$k$-out-of-$n$Systems. 535-541 - Jian-Ming Bai, Ze-Hui Li, Xin-Bing Kong:
Generalized Shock Models Based on a Cluster Point Process. 542-550 - David W. Coit, Abdullah Konak:
Multiple Weighted Objectives Heuristic for the Redundancy Allocation Problem. 551-558 - Subha Chakraborti, Schalk W. Human:
Parameter Estimation and Performance of the$p$-Chart for Attributes Data. 559-566
Volume 55, Number 4, December 2006
- X. Teng, H. Pham, Daniel R. Jeske:
Reliability Modeling of Hardware and Software Interactions, and Its Applications. 571-577 - Swapna S. Gokhale, Kishor S. Trivedi:
Analytical Models for Architecture-Based Software Reliability Prediction: A Unification Framework. 578-590 - A. Heard, Marianna Pensky:
Confidence Intervals for Reliability and Quantile Functions With Application to NASA Space Flight Data. 591-601 - Ehab S. Elmallah, Hosam M. F. AboElFotoh:
Circular Layout Cutsets: An Approach for Improving Consecutive Cutset Bounds for Network Reliability. 602-612 - Donghoon Han, N. Balakrishnan, Ananda Sen, Evans Gouno:
Corrections on "Optimal Step-Stress Test Under Progressive Type-I Censoring". 613-614
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