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J. W. C. DeVries

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Journal Articles

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2015
[j3]
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  dblp key:
  - journals/mr/JablonskiLBVVDV15
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  persistent URL:
  - https://dblp.org/rec/journals/mr/JablonskiLBVVDV15
Michal Jablonski, Riccardo Lucchini, Frederick Bossuyt, Thomas Vervust, Jan Vanfleteren, J. W. C. DeVries, Pasquale Vena, Mario Gonzalez:
Impact of geometry on stretchable meandered interconnect uniaxial tensile extension fatigue reliability. Microelectron. Reliab. 55(1): 143-154 (2015)
2012
[j2]
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  - journals/mr/FarleyZDD12
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  - https://dblp.org/rec/journals/mr/FarleyZDD12
D. Farley, Yi Zhou, A. Dasgupta, J. W. C. DeVries:
An adaptive Cu trace fatigue model based on average cross-section strain. Microelectron. Reliab. 52(11): 2763-2772 (2012)
2010
[j1]
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  - journals/mr/FarleyZAADCD10
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D. Farley, Y. Zhou, F. Askari, M. Al-Bassyiouni, A. Dasgupta, J. F. J. Caers, J. W. C. DeVries:
Copper trace fatigue models for mechanical cycling, vibration and shock/drop of high-density PWAs. Microelectron. Reliab. 50(7): 937-947 (2010)

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