BibTeX records: Darren Aaberge

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@inproceedings{DBLP:conf/vts/AabergeMDBDH05,
  author    = {Darren Aaberge and
               Ken Mockler and
               Dieu Van Dinh and
               Raoul Belleau and
               Tim Donovan and
               Reid Hewlitt},
  title     = {Meeting the Test Challenges of the 1 Gbps Parallel RapidIO Interface
               with New Automatic Test Equipment Capabilities},
  booktitle = {23rd {IEEE} {VLSI} Test Symposium {(VTS} 2005), 1-5 May 2005, Palm
               Springs, CA, {USA}},
  pages     = {75--84},
  publisher = {{IEEE} Computer Society},
  year      = {2005},
  url       = {https://doi.org/10.1109/VTS.2005.55},
  doi       = {10.1109/VTS.2005.55},
  timestamp = {Wed, 16 Oct 2019 14:14:54 +0200},
  biburl    = {https://dblp.org/rec/conf/vts/AabergeMDBDH05.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
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