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BibTeX records: Xavier Aymerich

Name: dblp XML data dump
Creator: Schloss Dagstuhl - Leibniz Center for Informatics
Published: 1993
License: https://creativecommons.org/publicdomain/zero/1.0/
Keywords: dblp, XML, computer science, scholarly publications, metadata

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@article{DBLP:journals/tetc/Maestro-Izquierdo19,
  author       = {Marcos Maestro{-}Izquierdo and
                  Javier Mart{\'{\i}}n{-}Mart{\'{\i}}nez and
                  Albert Crespo{-}Yepes and
                  Manel Escudero and
                  Rosana Rodr{\'{\i}}guez and
                  Montserrat Nafr{\'{\i}}a and
                  Xavier Aymerich and
                  Antonio Rubio},
  title        = {Experimental Verification of Memristor-Based Material Implication
                  {NAND} Operation},
  journal      = {{IEEE} Trans. Emerg. Top. Comput.},
  volume       = {7},
  number       = {4},
  pages        = {545--552},
  year         = {2019},
  url          = {https://doi.org/10.1109/TETC.2017.2760929},
  doi          = {10.1109/TETC.2017.2760929},
  timestamp    = {Thu, 06 Jul 2023 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/tetc/Maestro-Izquierdo19.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/dcis/PedroMRNA18,
  author       = {Marta Pedro and
                  Javier Mart{\'{\i}}n{-}Mart{\'{\i}}nez and
                  Rosana Rodr{\'{\i}}guez and
                  Montserrat Nafr{\'{\i}}a and
                  Xavier Aymerich},
  title        = {Investigation of Conductivity Changes in Memristors under Massive
                  Pulsed Characterization},
  booktitle    = {Conference on Design of Circuits and Integrated Systems, {DCIS} 2018,
                  Lyon, France, November 14-16, 2018},
  pages        = {1--4},
  publisher    = {{IEEE}},
  year         = {2018},
  url          = {https://doi.org/10.1109/DCIS.2018.8681457},
  doi          = {10.1109/DCIS.2018.8681457},
  timestamp    = {Tue, 03 Nov 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/dcis/PedroMRNA18.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/essderc/VelayudhanMPCRN15,
  author       = {V. Velayudhan and
                  Javier Mart{\'{\i}}n{-}Mart{\'{\i}}nez and
                  Marc Porti and
                  Carlos Couso and
                  Rosana Rodr{\'{\i}}guez and
                  Montserrat Nafr{\'{\i}}a and
                  Xavier Aymerich and
                  Carlos Marquez and
                  Francisco G{\'{a}}miz},
  title        = {Threshold voltage and on-current Variability related to interface
                  traps spatial distribution},
  booktitle    = {45th European Solid State Device Research Conference, {ESSDERC} 2015,
                  Graz, Austria, September 14-18, 2015},
  pages        = {230--233},
  publisher    = {{IEEE}},
  year         = {2015},
  url          = {https://doi.org/10.1109/ESSDERC.2015.7324756},
  doi          = {10.1109/ESSDERC.2015.7324756},
  timestamp    = {Tue, 29 Dec 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/essderc/VelayudhanMPCRN15.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/mr/BayerlLAPNAG13,
  author       = {Albin Bayerl and
                  Mario Lanza and
                  Lidia Aguilera and
                  Marc Porti and
                  Montserrat Nafr{\'{\i}}a and
                  Xavier Aymerich and
                  Stefan De Gendt},
  title        = {Nanoscale and device level electrical behavior of annealed {ALD} Hf-based
                  gate oxide stacks grown with different precursors},
  journal      = {Microelectron. Reliab.},
  volume       = {53},
  number       = {6},
  pages        = {867--871},
  year         = {2013},
  url          = {https://doi.org/10.1016/j.microrel.2013.02.005},
  doi          = {10.1016/J.MICROREL.2013.02.005},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/BayerlLAPNAG13.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/mr/VelayudhanGMRNA13,
  author       = {V. Velayudhan and
                  Francisco G{\'{a}}miz and
                  Javier Mart{\'{\i}}n{-}Mart{\'{\i}}nez and
                  Rosana Rodr{\'{\i}}guez and
                  Montserrat Nafr{\'{\i}}a and
                  Xavier Aymerich},
  title        = {Influence of the interface trap location on the performance and variability
                  of ultra-scaled MOSFETs},
  journal      = {Microelectron. Reliab.},
  volume       = {53},
  number       = {9-11},
  pages        = {1243--1246},
  year         = {2013},
  url          = {https://doi.org/10.1016/j.microrel.2013.07.052},
  doi          = {10.1016/J.MICROREL.2013.07.052},
  timestamp    = {Tue, 29 Dec 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/VelayudhanGMRNA13.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/mr/Crespo-YepesMRNA13,
  author       = {Albert Crespo{-}Yepes and
                  Javier Mart{\'{\i}}n{-}Mart{\'{\i}}nez and
                  Rosana Rodr{\'{\i}}guez and
                  Montserrat Nafr{\'{\i}}a and
                  Xavier Aymerich},
  title        = {Resistive switching like-behavior in MOSFETs with ultra-thin HfSiON
                  dielectric gate stack: pMOS and nMOS comparison and reliability implications},
  journal      = {Microelectron. Reliab.},
  volume       = {53},
  number       = {9-11},
  pages        = {1247--1251},
  year         = {2013},
  url          = {https://doi.org/10.1016/j.microrel.2013.07.046},
  doi          = {10.1016/J.MICROREL.2013.07.046},
  timestamp    = {Fri, 09 Apr 2021 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/Crespo-YepesMRNA13.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/mr/AyalaMRGNAS12,
  author       = {Nuria Ayala and
                  Javier Mart{\'{\i}}n{-}Mart{\'{\i}}nez and
                  Rosana Rodr{\'{\i}}guez and
                  M. B. Gonz{\'{a}}lez and
                  Montserrat Nafr{\'{\i}}a and
                  Xavier Aymerich and
                  Eddy Simoen},
  title        = {Characterization and {SPICE} modeling of the {CHC} related time-dependent
                  variability in strained and unstrained pMOSFETs},
  journal      = {Microelectron. Reliab.},
  volume       = {52},
  number       = {9-10},
  pages        = {1924--1927},
  year         = {2012},
  url          = {https://doi.org/10.1016/j.microrel.2012.06.014},
  doi          = {10.1016/J.MICROREL.2012.06.014},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/AyalaMRGNAS12.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/mr/IglesiasLBPNALKBZS12,
  author       = {Violaine Iglesias and
                  Mario Lanza and
                  Albin Bayerl and
                  Marc Porti and
                  Montserrat Nafr{\'{\i}}a and
                  Xavier Aymerich and
                  Lifeng Liu and
                  Jinfeng Kang and
                  Gennadi Bersuker and
                  Kai Zhang and
                  Ziyong Shen},
  title        = {Nanoscale observations of resistive switching high and low conductivity
                  states on TiN/HfO\({}_{\mbox{2}}\)/Pt structures},
  journal      = {Microelectron. Reliab.},
  volume       = {52},
  number       = {9-10},
  pages        = {2110--2114},
  year         = {2012},
  url          = {https://doi.org/10.1016/j.microrel.2012.06.073},
  doi          = {10.1016/J.MICROREL.2012.06.073},
  timestamp    = {Fri, 04 Feb 2022 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/IglesiasLBPNALKBZS12.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/essderc/AyalaMRNA12,
  author       = {Nuria Ayala and
                  Javier Mart{\'{\i}}n{-}Mart{\'{\i}}nez and
                  Rosana Rodr{\'{\i}}guez and
                  Montserrat Nafr{\'{\i}}a and
                  Xavier Aymerich},
  title        = {Unified characterization of {RTN} and {BTI} for circuit performance
                  and variability simulation},
  booktitle    = {Proceedings of the 2012 European Solid-State Device Research Conference,
                  {ESSDERC} 2012, Bordeaux, France, September 17-21, 2012},
  pages        = {266--269},
  publisher    = {{IEEE}},
  year         = {2012},
  url          = {https://doi.org/10.1109/ESSDERC.2012.6343384},
  doi          = {10.1109/ESSDERC.2012.6343384},
  timestamp    = {Sat, 19 Oct 2019 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/essderc/AyalaMRNA12.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/mr/Martin-MartinezAGVRNAS10,
  author       = {Javier Mart{\'{\i}}n{-}Mart{\'{\i}}nez and
                  Esteve Amat and
                  M. B. Gonz{\'{a}}lez and
                  P. Verheyen and
                  Rosana Rodr{\'{\i}}guez and
                  Montserrat Nafr{\'{\i}}a and
                  Xavier Aymerich and
                  Eddy Simoen},
  title        = {{SPICE} modelling of hot-carrier degradation in Si\({}_{\mbox{1-}}\)\({}_{\mbox{x}}\)Ge\({}_{\mbox{x}}\)
                  {S/D} and HfSiON based pMOS transistors},
  journal      = {Microelectron. Reliab.},
  volume       = {50},
  number       = {9-11},
  pages        = {1263--1266},
  year         = {2010},
  url          = {https://doi.org/10.1016/j.microrel.2010.07.150},
  doi          = {10.1016/J.MICROREL.2010.07.150},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/Martin-MartinezAGVRNAS10.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/mr/LanzaPNAWH10,
  author       = {Mario Lanza and
                  Marc Porti and
                  Montserrat Nafr{\'{\i}}a and
                  Xavier Aymerich and
                  E. Whittaker and
                  B. Hamilton},
  title        = {{UHV} {CAFM} characterization of high-k dielectrics: Effect of the
                  technique resolution on the pre- and post-breakdown electrical measurements},
  journal      = {Microelectron. Reliab.},
  volume       = {50},
  number       = {9-11},
  pages        = {1312--1315},
  year         = {2010},
  url          = {https://doi.org/10.1016/j.microrel.2010.07.049},
  doi          = {10.1016/J.MICROREL.2010.07.049},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/LanzaPNAWH10.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/mr/Crespo-YepesMRNA09,
  author       = {Albert Crespo{-}Yepes and
                  Javier Mart{\'{\i}}n{-}Mart{\'{\i}}nez and
                  Rosana Rodr{\'{\i}}guez and
                  Montserrat Nafr{\'{\i}}a and
                  Xavier Aymerich},
  title        = {Reversible dielectric breakdown in ultrathin Hf based high-k stacks
                  under current-limited stresses},
  journal      = {Microelectron. Reliab.},
  volume       = {49},
  number       = {9-11},
  pages        = {1024--1028},
  year         = {2009},
  url          = {https://doi.org/10.1016/j.microrel.2009.06.029},
  doi          = {10.1016/J.MICROREL.2009.06.029},
  timestamp    = {Fri, 09 Apr 2021 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/Crespo-YepesMRNA09.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/mr/LanzaPNAGS09,
  author       = {Mario Lanza and
                  Marc Porti and
                  Montserrat Nafr{\'{\i}}a and
                  Xavier Aymerich and
                  G. Ghidini and
                  A. Sebastiani},
  title        = {Trapped charge and stress induced leakage current {(SILC)} in tunnel
                  SiO\({}_{\mbox{2}}\) layers of de-processed {MOS} non-volatile memory
                  devices observed at the nanoscale},
  journal      = {Microelectron. Reliab.},
  volume       = {49},
  number       = {9-11},
  pages        = {1188--1191},
  year         = {2009},
  url          = {https://doi.org/10.1016/j.microrel.2009.06.016},
  doi          = {10.1016/J.MICROREL.2009.06.016},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/LanzaPNAGS09.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/mr/PolspoelVAPNA08,
  author       = {W. Polspoel and
                  Wilfried Vandervorst and
                  Lidia Aguilera and
                  Marc Porti and
                  Montserrat Nafr{\'{\i}}a and
                  Xavier Aymerich},
  title        = {Nanometer-scale leakage measurements in high vacuum on de-processed
                  high-k capacitors},
  journal      = {Microelectron. Reliab.},
  volume       = {48},
  number       = {8-9},
  pages        = {1521--1524},
  year         = {2008},
  url          = {https://doi.org/10.1016/j.microrel.2008.07.026},
  doi          = {10.1016/J.MICROREL.2008.07.026},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/PolspoelVAPNA08.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/mr/AmatRNAS07,
  author       = {Esteve Amat and
                  Rosana Rodr{\'{\i}}guez and
                  Montserrat Nafr{\'{\i}}a and
                  Xavier Aymerich and
                  James H. Stathis},
  title        = {Influence of the SiO\({}_{\mbox{2}}\) layer thickness on the degradation
                  of HfO\({}_{\mbox{2}}\)/SiO\({}_{\mbox{2}}\) stacks subjected to static
                  and dynamic stress conditions},
  journal      = {Microelectron. Reliab.},
  volume       = {47},
  number       = {4-5},
  pages        = {544--547},
  year         = {2007},
  url          = {https://doi.org/10.1016/j.microrel.2007.01.003},
  doi          = {10.1016/J.MICROREL.2007.01.003},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/AmatRNAS07.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/mr/FernandezRNA07,
  author       = {Raul Fern{\'{a}}ndez and
                  Rosana Rodr{\'{\i}}guez and
                  Montserrat Nafr{\'{\i}}a and
                  Xavier Aymerich},
  title        = {Effect of oxide breakdown on {RS} latches},
  journal      = {Microelectron. Reliab.},
  volume       = {47},
  number       = {4-5},
  pages        = {581--584},
  year         = {2007},
  url          = {https://doi.org/10.1016/j.microrel.2007.01.021},
  doi          = {10.1016/J.MICROREL.2007.01.021},
  timestamp    = {Wed, 14 Jul 2021 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/FernandezRNA07.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/mr/Martin-MartinezRNAS07,
  author       = {Javier Mart{\'{\i}}n{-}Mart{\'{\i}}nez and
                  Rosana Rodr{\'{\i}}guez and
                  Montserrat Nafr{\'{\i}}a and
                  Xavier Aymerich and
                  James H. Stathis},
  title        = {Worn-out oxide {MOSFET} characteristics: Role of gate current and
                  device parameters on a current mirror},
  journal      = {Microelectron. Reliab.},
  volume       = {47},
  number       = {4-5},
  pages        = {665--668},
  year         = {2007},
  url          = {https://doi.org/10.1016/j.microrel.2007.01.035},
  doi          = {10.1016/J.MICROREL.2007.01.035},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/Martin-MartinezRNAS07.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/mr/Martin-MartinezGRNACPG07,
  author       = {Javier Mart{\'{\i}}n{-}Mart{\'{\i}}nez and
                  Simone Gerardin and
                  Rosana Rodr{\'{\i}}guez and
                  Montserrat Nafr{\'{\i}}a and
                  Xavier Aymerich and
                  Andrea Cester and
                  Alessandro Paccagnella and
                  G. Ghidini},
  title        = {Lifetime estimation of analog circuits from the electrical characteristics
                  of stressed MOSFETs},
  journal      = {Microelectron. Reliab.},
  volume       = {47},
  number       = {9-11},
  pages        = {1349--1352},
  year         = {2007},
  url          = {https://doi.org/10.1016/j.microrel.2007.07.088},
  doi          = {10.1016/J.MICROREL.2007.07.088},
  timestamp    = {Sun, 02 Oct 2022 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/Martin-MartinezGRNACPG07.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/mr/FernandezRNAKG06,
  author       = {Raul Fern{\'{a}}ndez and
                  Rosana Rodr{\'{\i}}guez and
                  Montserrat Nafr{\'{\i}}a and
                  Xavier Aymerich and
                  Ben Kaczer and
                  Guido Groeseneken},
  title        = {FinFET and {MOSFET} preliminary comparison of gate oxide reliability},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {9-11},
  pages        = {1608--1611},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2006.07.043},
  doi          = {10.1016/J.MICROREL.2006.07.043},
  timestamp    = {Wed, 14 Jul 2021 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/FernandezRNAKG06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/mr/BlascoNAPV05,
  author       = {X. Blasco and
                  Montserrat Nafr{\'{\i}}a and
                  Xavier Aymerich and
                  J. P{\'{e}}try and
                  Wilfried Vandervorst},
  title        = {Breakdown spots of ultra-thin (EOT{\textless}1.5nm) HfO\({}_{\mbox{2}}\)/SiO\({}_{\mbox{2}}\)
                  stacks observed with enhanced - {CAFM}},
  journal      = {Microelectron. Reliab.},
  volume       = {45},
  number       = {5-6},
  pages        = {811--814},
  year         = {2005},
  url          = {https://doi.org/10.1016/j.microrel.2004.11.042},
  doi          = {10.1016/J.MICROREL.2004.11.042},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/BlascoNAPV05.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/mr/FernandezRNA05,
  author       = {Raul Fern{\'{a}}ndez and
                  Rosana Rodr{\'{\i}}guez and
                  Montserrat Nafr{\'{\i}}a and
                  Xavier Aymerich},
  title        = {Influence of oxide breakdown position and device aspect ratio on MOSFET's
                  output characteristics},
  journal      = {Microelectron. Reliab.},
  volume       = {45},
  number       = {5-6},
  pages        = {861--864},
  year         = {2005},
  url          = {https://doi.org/10.1016/j.microrel.2004.10.029},
  doi          = {10.1016/J.MICROREL.2004.10.029},
  timestamp    = {Wed, 14 Jul 2021 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/FernandezRNA05.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/mr/AguileraPNA05,
  author       = {Lidia Aguilera and
                  Marc Porti and
                  Montserrat Nafr{\'{\i}}a and
                  Xavier Aymerich},
  title        = {Pre- and post-BD electrical conduction of stressed HfO\({}_{\mbox{2}}\)/SiO\({}_{\mbox{2}}\)
                  {MOS} gate stacks observed at the nanoscale},
  journal      = {Microelectron. Reliab.},
  volume       = {45},
  number       = {9-11},
  pages        = {1390--1393},
  year         = {2005},
  url          = {https://doi.org/10.1016/j.microrel.2005.07.105},
  doi          = {10.1016/J.MICROREL.2005.07.105},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/AguileraPNA05.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/mr/FernandezRNA04,
  author       = {Raul Fern{\'{a}}ndez and
                  Rosana Rodr{\'{\i}}guez and
                  Montserrat Nafr{\'{\i}}a and
                  Xavier Aymerich},
  title        = {A new approach to the modeling of oxide breakdown on {CMOS} circuits},
  journal      = {Microelectron. Reliab.},
  volume       = {44},
  number       = {9-11},
  pages        = {1519--1522},
  year         = {2004},
  url          = {https://doi.org/10.1016/j.microrel.2004.07.026},
  doi          = {10.1016/J.MICROREL.2004.07.026},
  timestamp    = {Wed, 14 Jul 2021 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/FernandezRNA04.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/mr/PortiMNA04,
  author       = {Marc Porti and
                  S. Meli and
                  Montserrat Nafr{\'{\i}}a and
                  Xavier Aymerich},
  title        = {Standard and {C-AFM} tests to study the post-BD gate oxide conduction
                  of {MOS} devices after current limited stresses},
  journal      = {Microelectron. Reliab.},
  volume       = {44},
  number       = {9-11},
  pages        = {1523--1528},
  year         = {2004},
  url          = {https://doi.org/10.1016/j.microrel.2004.07.030},
  doi          = {10.1016/J.MICROREL.2004.07.030},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/PortiMNA04.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/mr/PortiMNA03,
  author       = {Marc Porti and
                  S. Meli and
                  Montserrat Nafr{\'{\i}}a and
                  Xavier Aymerich},
  title        = {Pre-breakdown noise in electrically stressed thin SiO\({}_{\mbox{2}}\)
                  layers of {MOS} devices observed with {C-AFM}},
  journal      = {Microelectron. Reliab.},
  volume       = {43},
  number       = {8},
  pages        = {1203--1209},
  year         = {2003},
  url          = {https://doi.org/10.1016/S0026-2714(03)00173-2},
  doi          = {10.1016/S0026-2714(03)00173-2},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/PortiMNA03.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/mr/PortiNA03,
  author       = {Marc Porti and
                  Montserrat Nafr{\'{\i}}a and
                  Xavier Aymerich},
  title        = {Oxide conductivity increase during the progressive-breakdown of SiO2
                  gate oxides observed with {C-AFM}},
  journal      = {Microelectron. Reliab.},
  volume       = {43},
  number       = {9-11},
  pages        = {1501--1505},
  year         = {2003},
  url          = {https://doi.org/10.1016/S0026-2714(03)00266-X},
  doi          = {10.1016/S0026-2714(03)00266-X},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/PortiNA03.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/tim/AbadalPBA03,
  author       = {Gabriel Abadal and
                  Francesc P{\'{e}}rez{-}Murano and
                  N{\'{u}}ria Barniol and
                  Xavier Aymerich},
  title        = {The measurement of the tip current noise as a method to characterize
                  the exposed area of coated {ESTM} tips},
  journal      = {{IEEE} Trans. Instrum. Meas.},
  volume       = {52},
  number       = {3},
  pages        = {859--864},
  year         = {2003},
  url          = {https://doi.org/10.1109/TIM.2003.814683},
  doi          = {10.1109/TIM.2003.814683},
  timestamp    = {Mon, 08 Jun 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/tim/AbadalPBA03.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/mr/BlascoNA02,
  author       = {X. Blasco and
                  Montserrat Nafr{\'{\i}}a and
                  Xavier Aymerich},
  title        = {Conduction and Breakdown Behaviour of Atomic Force Microscopy Grown
                  SiO\({}_{\mbox{2}}\) Gate Oxide on {MOS} Structures},
  journal      = {Microelectron. Reliab.},
  volume       = {42},
  number       = {9-11},
  pages        = {1513--1516},
  year         = {2002},
  url          = {https://doi.org/10.1016/S0026-2714(02)00181-6},
  doi          = {10.1016/S0026-2714(02)00181-6},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/BlascoNA02.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/mr/RodriguezPNA01,
  author       = {Rosana Rodr{\'{\i}}guez and
                  Marc Porti and
                  Montserrat Nafr{\'{\i}}a and
                  Xavier Aymerich},
  title        = {Influence of a low field with opposite polarity to the stress on the
                  degradation of 4.5 nm thick SiO\({}_{\mbox{2}}\) films},
  journal      = {Microelectron. Reliab.},
  volume       = {41},
  number       = {7},
  pages        = {1011--1013},
  year         = {2001},
  url          = {https://doi.org/10.1016/S0026-2714(01)00059-2},
  doi          = {10.1016/S0026-2714(01)00059-2},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/RodriguezPNA01.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/mr/PortiBNAOE01,
  author       = {Marc Porti and
                  X. Blasco and
                  Montserrat Nafr{\'{\i}}a and
                  Xavier Aymerich and
                  Alexander Olbrich and
                  Bernd Ebersberger},
  title        = {Local current fluctuations before and after breakdown of thin SiO\({}_{\mbox{2}}\)
                  films observed with conductive atomic force microscope},
  journal      = {Microelectron. Reliab.},
  volume       = {41},
  number       = {7},
  pages        = {1041--1044},
  year         = {2001},
  url          = {https://doi.org/10.1016/S0026-2714(01)00066-X},
  doi          = {10.1016/S0026-2714(01)00066-X},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/PortiBNAOE01.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/mr/HillBPNA01,
  author       = {Daniel Hill and
                  X. Blasco and
                  Marc Porti and
                  Montserrat Nafr{\'{\i}}a and
                  Xavier Aymerich},
  title        = {Characterising the surface roughness of {AFM} grown SiO\({}_{\mbox{2}}\)
                  on Si},
  journal      = {Microelectron. Reliab.},
  volume       = {41},
  number       = {7},
  pages        = {1077--1079},
  year         = {2001},
  url          = {https://doi.org/10.1016/S0026-2714(01)00078-6},
  doi          = {10.1016/S0026-2714(01)00078-6},
  timestamp    = {Tue, 14 Jul 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/HillBPNA01.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

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