BibTeX records: Charvaka Duvvury

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@article{DBLP:journals/mr/GossnerD15,
  author    = {Harald Gossner and
               Charvaka Duvvury},
  title     = {System efficient {ESD} design},
  journal   = {Microelectronics Reliability},
  volume    = {55},
  number    = {12},
  pages     = {2607--2613},
  year      = {2015},
  url       = {https://doi.org/10.1016/j.microrel.2014.12.020},
  doi       = {10.1016/j.microrel.2014.12.020},
  timestamp = {Sun, 28 May 2017 01:00:00 +0200},
  biburl    = {https://dblp.org/rec/bib/journals/mr/GossnerD15},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/DuvvurySBRKMC06,
  author    = {Charvaka Duvvury and
               Robert Steinhoff and
               Gianluca Boselli and
               Vijay Reddy and
               Hans Kunz and
               Steve Marum and
               Roger Cline},
  title     = {Gate oxide failures due to anomalous stress from {HBM} {ESD} testers},
  journal   = {Microelectronics Reliability},
  volume    = {46},
  number    = {5-6},
  pages     = {656--665},
  year      = {2006},
  url       = {https://doi.org/10.1016/j.microrel.2005.07.120},
  doi       = {10.1016/j.microrel.2005.07.120},
  timestamp = {Sun, 28 May 2017 01:00:00 +0200},
  biburl    = {https://dblp.org/rec/bib/journals/mr/DuvvurySBRKMC06},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BoselliD05,
  author    = {Gianluca Boselli and
               Charvaka Duvvury},
  title     = {Trends and challenges to {ESD} and Latch-up designs for nanometer
               {CMOS} technologies},
  journal   = {Microelectronics Reliability},
  volume    = {45},
  number    = {9-11},
  pages     = {1406--1414},
  year      = {2005},
  url       = {https://doi.org/10.1016/j.microrel.2005.07.028},
  doi       = {10.1016/j.microrel.2005.07.028},
  timestamp = {Sun, 28 May 2017 01:00:00 +0200},
  biburl    = {https://dblp.org/rec/bib/journals/mr/BoselliD05},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Salcedo-SunerDCC04,
  author    = {Jorge Salcedo{-}Su{\~{n}}er and
               Charvaka Duvvury and
               Roger Cline and
               Alfonso Cadena{-}Hernandez},
  title     = {Latchup in voltage tolerant circuits: a new phenomenon},
  journal   = {Microelectronics Reliability},
  volume    = {44},
  number    = {4},
  pages     = {549--562},
  year      = {2004},
  url       = {https://doi.org/10.1016/j.microrel.2003.12.004},
  doi       = {10.1016/j.microrel.2003.12.004},
  timestamp = {Sun, 28 May 2017 01:00:00 +0200},
  biburl    = {https://dblp.org/rec/bib/journals/mr/Salcedo-SunerDCC04},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/SallingHWDCP02,
  author    = {Craig Salling and
               Jerry Hu and
               Jeff Wu and
               Charvaka Duvvury and
               Roger Cline and
               Rith Pok},
  title     = {Development of substrate-pumped nMOS protection for a 0.13 mum technology},
  journal   = {Microelectronics Reliability},
  volume    = {42},
  number    = {6},
  pages     = {887--899},
  year      = {2002},
  url       = {https://doi.org/10.1016/S0026-2714(02)00052-5},
  doi       = {10.1016/S0026-2714(02)00052-5},
  timestamp = {Wed, 28 Mar 2018 01:00:00 +0200},
  biburl    = {https://dblp.org/rec/bib/journals/mr/SallingHWDCP02},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/isqed/Duvvury02,
  author    = {Charvaka Duvvury},
  title     = {Issues in Deep Submicron State-of-the-Art {ESD} Design (Tutorial Abstract)},
  booktitle = {3rd International Symposium on Quality of Electronic Design, {ISQED}
               2002, San Jose, CA, USA, March 18-21, 2002},
  pages     = {8},
  year      = {2002},
  crossref  = {DBLP:conf/isqed/2002},
  url       = {http://doi.ieeecomputersociety.org/10.1109/ISQED.2002.10013},
  doi       = {10.1109/ISQED.2002.10013},
  timestamp = {Fri, 26 Sep 2014 14:08:23 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/isqed/Duvvury02},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/VoldmanAACDMW01,
  author    = {S. Voldman and
               W. Anderson and
               R. Ashton and
               M. Chaine and
               Charvaka Duvvury and
               T. Maloney and
               E. Worley},
  title     = {A strategy for characterization and evaluation of {ESD} robustness
               of {CMOS} semiconductor technologies},
  journal   = {Microelectronics Reliability},
  volume    = {41},
  number    = {3},
  pages     = {335--348},
  year      = {2001},
  url       = {https://doi.org/10.1016/S0026-2714(00)00236-5},
  doi       = {10.1016/S0026-2714(00)00236-5},
  timestamp = {Sun, 28 May 2017 01:00:00 +0200},
  biburl    = {https://dblp.org/rec/bib/journals/mr/VoldmanAACDMW01},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/isqed/Duvvury01,
  author    = {Charvaka Duvvury},
  title     = {Issues in Deep Submicron State-of-the-Art {ESD} Design},
  booktitle = {2nd International Symposium on Quality of Electronic Design {(ISQED}
               2001), 26-28 March 2001, San Jose, CA, {USA}},
  pages     = {10},
  year      = {2001},
  crossref  = {DBLP:conf/isqed/2001},
  url       = {http://doi.ieeecomputersociety.org/10.1109/ISQED.2001.10038},
  doi       = {10.1109/ISQED.2001.10038},
  timestamp = {Fri, 26 Sep 2014 14:08:23 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/isqed/Duvvury01},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/isqed/Duvvury00,
  author    = {Charvaka Duvvury},
  title     = {{ESD:} Design For {IC} Chip Quality and Reliability},
  booktitle = {1st International Symposium on Quality of Electronic Design {(ISQED}
               2000), 20-22 March 2000, San Jose, CA, {USA}},
  pages     = {251},
  year      = {2000},
  crossref  = {DBLP:conf/isqed/2000},
  url       = {https://doi.org/10.1109/ISQED.2000.838880},
  doi       = {10.1109/ISQED.2000.838880},
  timestamp = {Thu, 25 May 2017 01:00:00 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/isqed/Duvvury00},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tcad/DiazKD94,
  author    = {Carlos H. D{\'{\i}}az and
               Sung{-}Mo Kang and
               Charvaka Duvvury},
  title     = {Circuit-level electrothermal simulation of electrical overstress failures
               in advanced {MOS} {I/O} protection devices},
  journal   = {{IEEE} Trans. on {CAD} of Integrated Circuits and Systems},
  volume    = {13},
  number    = {4},
  pages     = {482--493},
  year      = {1994},
  url       = {https://doi.org/10.1109/43.275358},
  doi       = {10.1109/43.275358},
  timestamp = {Sat, 20 May 2017 01:00:00 +0200},
  biburl    = {https://dblp.org/rec/bib/journals/tcad/DiazKD94},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iscas/DiazDK93,
  author    = {Carlos H. D{\'{\i}}az and
               Charvaka Duvvury and
               Sung{-}Mo Kang},
  title     = {Thermal Failure Simulation for Electrical Overstress in Semiconductor
               Devices},
  booktitle = {1993 {IEEE} International Symposium on Circuits and Systems, {ISCAS}
               1993, Chicago, Illinois, USA, May 3-6, 1993},
  pages     = {1389--1392},
  year      = {1993},
  crossref  = {DBLP:conf/iscas/1993},
  timestamp = {Fri, 20 May 2016 10:25:33 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/iscas/DiazDK93},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/isqed/2002,
  title     = {3rd International Symposium on Quality of Electronic Design, {ISQED}
               2002, San Jose, CA, USA, March 18-21, 2002},
  publisher = {{IEEE} Computer Society},
  year      = {2002},
  url       = {http://ieeexplore.ieee.org/xpl/mostRecentIssue.jsp?punumber=7827},
  isbn      = {0-7695-1561-4},
  timestamp = {Fri, 26 Sep 2014 14:08:23 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/isqed/2002},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/isqed/2001,
  title     = {2nd International Symposium on Quality of Electronic Design {(ISQED}
               2001), 26-28 March 2001, San Jose, CA, {USA}},
  publisher = {{IEEE} Computer Society},
  year      = {2001},
  url       = {http://ieeexplore.ieee.org/xpl/mostRecentIssue.jsp?punumber=7308},
  isbn      = {0-7695-1025-6},
  timestamp = {Fri, 26 Sep 2014 14:08:23 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/isqed/2001},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/isqed/2000,
  title     = {1st International Symposium on Quality of Electronic Design {(ISQED}
               2000), 20-22 March 2000, San Jose, CA, {USA}},
  publisher = {{IEEE} Computer Society},
  year      = {2000},
  url       = {http://ieeexplore.ieee.org/xpl/mostRecentIssue.jsp?punumber=6767},
  isbn      = {0-7695-0525-2},
  timestamp = {Fri, 26 Sep 2014 14:08:22 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/isqed/2000},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/iscas/1993,
  title     = {1993 {IEEE} International Symposium on Circuits and Systems, {ISCAS}
               1993, Chicago, Illinois, USA, May 3-6, 1993},
  publisher = {{IEEE}},
  year      = {1993},
  url       = {http://ieeexplore.ieee.org/xpl/mostRecentIssue.jsp?punumber=1067},
  isbn      = {0-7803-1281-3},
  timestamp = {Fri, 20 May 2016 10:25:33 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/iscas/1993},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
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