BibTeX records: Andrzej Dziedzic

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@article{DBLP:journals/mr/DabrowskiD18,
  author    = {Arkadiusz Dabrowski and
               Andrzej Dziedzic},
  title     = {Stability of low ohmic thick-film resistors under pulsed operation},
  journal   = {Microelectronics Reliability},
  volume    = {84},
  pages     = {95--104},
  year      = {2018},
  url       = {https://doi.org/10.1016/j.microrel.2018.03.024},
  doi       = {10.1016/j.microrel.2018.03.024},
  timestamp = {Fri, 30 Nov 2018 00:00:00 +0100},
  biburl    = {https://dblp.org/rec/bib/journals/mr/DabrowskiD18},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/NowakD14,
  author    = {Damian Nowak and
               Andrzej Dziedzic},
  title     = {Fabrication and advanced electrical and stability characterization
               of laser-shaped thick-film and {LTCC} microresistors for high temperature
               applications},
  journal   = {Microelectronics Reliability},
  volume    = {54},
  number    = {11},
  pages     = {2641--2644},
  year      = {2014},
  url       = {https://doi.org/10.1016/j.microrel.2014.04.010},
  doi       = {10.1016/j.microrel.2014.04.010},
  timestamp = {Fri, 30 Nov 2018 00:00:00 +0100},
  biburl    = {https://dblp.org/rec/bib/journals/mr/NowakD14},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/SteplewskiSKD12,
  author    = {Wojciech Steplewski and
               Tomasz Serzysko and
               Grazyna Koziol and
               Andrzej Dziedzic},
  title     = {Preliminary assessment of the stability of thin- and polymer thick-film
               resistors embedded into printed wiring boards},
  journal   = {Microelectronics Reliability},
  volume    = {52},
  number    = {8},
  pages     = {1719--1725},
  year      = {2012},
  url       = {https://doi.org/10.1016/j.microrel.2012.03.026},
  doi       = {10.1016/j.microrel.2012.03.026},
  timestamp = {Fri, 30 Nov 2018 00:00:00 +0100},
  biburl    = {https://dblp.org/rec/bib/journals/mr/SteplewskiSKD12},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Dziedzic11,
  author    = {Andrzej Dziedzic},
  title     = {10th Electron Technology {ELTE} 2010 and 34th International Microelectronics
               and Packaging {IMAPS/CPMT} Poland Joint Conference - Guest Editorial},
  journal   = {Microelectronics Reliability},
  volume    = {51},
  number    = {7},
  pages     = {1157--1158},
  year      = {2011},
  url       = {https://doi.org/10.1016/j.microrel.2011.04.024},
  doi       = {10.1016/j.microrel.2011.04.024},
  timestamp = {Fri, 30 Nov 2018 00:00:00 +0100},
  biburl    = {https://dblp.org/rec/bib/journals/mr/Dziedzic11},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/DudekNDP11,
  author    = {M. W. Dudek and
               K. Nitsch and
               Andrzej Dziedzic and
               T. Piasecki},
  title     = {Wide frequency range ac electrical characterization of thick-film
               microvaristors},
  journal   = {Microelectronics Reliability},
  volume    = {51},
  number    = {7},
  pages     = {1219--1224},
  year      = {2011},
  url       = {https://doi.org/10.1016/j.microrel.2011.02.026},
  doi       = {10.1016/j.microrel.2011.02.026},
  timestamp = {Fri, 30 Nov 2018 00:00:00 +0100},
  biburl    = {https://dblp.org/rec/bib/journals/mr/DudekNDP11},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/NowakD11,
  author    = {Damian Nowak and
               Andrzej Dziedzic},
  title     = {{LTCC} package for high temperature applications},
  journal   = {Microelectronics Reliability},
  volume    = {51},
  number    = {7},
  pages     = {1241--1244},
  year      = {2011},
  url       = {https://doi.org/10.1016/j.microrel.2011.02.018},
  doi       = {10.1016/j.microrel.2011.02.018},
  timestamp = {Fri, 30 Nov 2018 00:00:00 +0100},
  biburl    = {https://dblp.org/rec/bib/journals/mr/NowakD11},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Dziedzic09,
  author    = {Andrzej Dziedzic},
  title     = {{IMAPS-CPMT} Poland 2008 - Guest Editorial},
  journal   = {Microelectronics Reliability},
  volume    = {49},
  number    = {6},
  pages     = {567--568},
  year      = {2009},
  url       = {https://doi.org/10.1016/j.microrel.2009.03.020},
  doi       = {10.1016/j.microrel.2009.03.020},
  timestamp = {Fri, 30 Nov 2018 00:00:00 +0100},
  biburl    = {https://dblp.org/rec/bib/journals/mr/Dziedzic09},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/NowakMDK09,
  author    = {Damian Nowak and
               Edward Mis and
               Andrzej Dziedzic and
               Jaroslaw Kita},
  title     = {Fabrication and electrical properties of laser-shaped thick-film and
               {LTCC} microresistors},
  journal   = {Microelectronics Reliability},
  volume    = {49},
  number    = {6},
  pages     = {600--606},
  year      = {2009},
  url       = {https://doi.org/10.1016/j.microrel.2009.02.019},
  doi       = {10.1016/j.microrel.2009.02.019},
  timestamp = {Fri, 30 Nov 2018 00:00:00 +0100},
  biburl    = {https://dblp.org/rec/bib/journals/mr/NowakMDK09},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/MisDM09,
  author    = {Edward Mis and
               Andrzej Dziedzic and
               Witold Mielcarek},
  title     = {Microvaristors in thick-film and {LTCC} circuits},
  journal   = {Microelectronics Reliability},
  volume    = {49},
  number    = {6},
  pages     = {607--613},
  year      = {2009},
  url       = {https://doi.org/10.1016/j.microrel.2009.03.002},
  doi       = {10.1016/j.microrel.2009.03.002},
  timestamp = {Fri, 30 Nov 2018 00:00:00 +0100},
  biburl    = {https://dblp.org/rec/bib/journals/mr/MisDM09},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Dziedzic08,
  author    = {Andrzej Dziedzic},
  title     = {{IMAPS} Poland 2007 - Guest Editorial},
  journal   = {Microelectronics Reliability},
  volume    = {48},
  number    = {6},
  pages     = {859},
  year      = {2008},
  url       = {https://doi.org/10.1016/j.microrel.2008.04.014},
  doi       = {10.1016/j.microrel.2008.04.014},
  timestamp = {Fri, 30 Nov 2018 00:00:00 +0100},
  biburl    = {https://dblp.org/rec/bib/journals/mr/Dziedzic08},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/MleczkoZSKDC08,
  author    = {K. Mleczko and
               Z. Zawislak and
               A. W. Stadler and
               Andrzej Kolek and
               Andrzej Dziedzic and
               J. Cichosz},
  title     = {Evaluation of conductive-to-resistive layers interaction in thick-film
               resistors},
  journal   = {Microelectronics Reliability},
  volume    = {48},
  number    = {6},
  pages     = {881--885},
  year      = {2008},
  url       = {https://doi.org/10.1016/j.microrel.2008.03.012},
  doi       = {10.1016/j.microrel.2008.03.012},
  timestamp = {Fri, 30 Nov 2018 00:00:00 +0100},
  biburl    = {https://dblp.org/rec/bib/journals/mr/MleczkoZSKDC08},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/MarkowskiD08,
  author    = {Piotr Markowski and
               Andrzej Dziedzic},
  title     = {Planar and three-dimensional thick-film thermoelectric microgenerators},
  journal   = {Microelectronics Reliability},
  volume    = {48},
  number    = {6},
  pages     = {890--896},
  year      = {2008},
  url       = {https://doi.org/10.1016/j.microrel.2008.03.008},
  doi       = {10.1016/j.microrel.2008.03.008},
  timestamp = {Fri, 30 Nov 2018 00:00:00 +0100},
  biburl    = {https://dblp.org/rec/bib/journals/mr/MarkowskiD08},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/DziedzicF07,
  author    = {Andrzej Dziedzic and
               Jan Felba},
  title     = {Polytronic 2005},
  journal   = {Microelectronics Reliability},
  volume    = {47},
  number    = {2-3},
  pages     = {327},
  year      = {2007},
  url       = {https://doi.org/10.1016/j.microrel.2006.03.001},
  doi       = {10.1016/j.microrel.2006.03.001},
  timestamp = {Fri, 30 Nov 2018 00:00:00 +0100},
  biburl    = {https://dblp.org/rec/bib/journals/mr/DziedzicF07},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Dziedzic07,
  author    = {Andrzej Dziedzic},
  title     = {Carbon/polyesterimide thick-film resistive composites - Experimental
               characterization and theoretical analysis of physicochemical, electrical
               and stability properties},
  journal   = {Microelectronics Reliability},
  volume    = {47},
  number    = {2-3},
  pages     = {354--362},
  year      = {2007},
  url       = {https://doi.org/10.1016/j.microrel.2006.02.016},
  doi       = {10.1016/j.microrel.2006.02.016},
  timestamp = {Fri, 30 Nov 2018 00:00:00 +0100},
  biburl    = {https://dblp.org/rec/bib/journals/mr/Dziedzic07},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/DziedzicKET06,
  author    = {Andrzej Dziedzic and
               Andrzej Kolek and
               Waleed Ehrhardt and
               Heiko Thust},
  title     = {Advanced electrical and stability characterization of untrimmed and
               variously trimmed thick-film and {LTCC} resistors},
  journal   = {Microelectronics Reliability},
  volume    = {46},
  number    = {2-4},
  pages     = {352--359},
  year      = {2006},
  url       = {https://doi.org/10.1016/j.microrel.2004.12.014},
  doi       = {10.1016/j.microrel.2004.12.014},
  timestamp = {Fri, 30 Nov 2018 00:00:00 +0100},
  biburl    = {https://dblp.org/rec/bib/journals/mr/DziedzicKET06},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Dziedzic05,
  author    = {Andrzej Dziedzic},
  title     = {{IMAPS} Poland 2004 - Guest Editorial},
  journal   = {Microelectronics Reliability},
  volume    = {45},
  number    = {12},
  pages     = {1901--1902},
  year      = {2005},
  url       = {https://doi.org/10.1016/j.microrel.2005.03.001},
  doi       = {10.1016/j.microrel.2005.03.001},
  timestamp = {Fri, 30 Nov 2018 00:00:00 +0100},
  biburl    = {https://dblp.org/rec/bib/journals/mr/Dziedzic05},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BelavicHKHCGD05,
  author    = {Darko Belavic and
               Marko Hrovat and
               Jaroslaw Kita and
               Janez Holc and
               Jena Cilensek and
               Leszek J. Golonka and
               Andrzej Dziedzic},
  title     = {Evaluation of compatibility of thick-film {PTC} thermistors and {LTCC}
               structures},
  journal   = {Microelectronics Reliability},
  volume    = {45},
  number    = {12},
  pages     = {1924--1929},
  year      = {2005},
  url       = {https://doi.org/10.1016/j.microrel.2005.03.002},
  doi       = {10.1016/j.microrel.2005.03.002},
  timestamp = {Fri, 30 Nov 2018 00:00:00 +0100},
  biburl    = {https://dblp.org/rec/bib/journals/mr/BelavicHKHCGD05},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/WronskiKMD05,
  author    = {Marek Wronski and
               Slawomir Kaminski and
               Edward Mis and
               Andrzej Dziedzic},
  title     = {New trim configurations for laser trimmed thick-film resistors - theoretical
               analysis, numerical simulation and experimental verification},
  journal   = {Microelectronics Reliability},
  volume    = {45},
  number    = {12},
  pages     = {1941--1948},
  year      = {2005},
  url       = {https://doi.org/10.1016/j.microrel.2005.03.006},
  doi       = {10.1016/j.microrel.2005.03.006},
  timestamp = {Fri, 30 Nov 2018 00:00:00 +0100},
  biburl    = {https://dblp.org/rec/bib/journals/mr/WronskiKMD05},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Dziedzic03,
  author    = {Andrzej Dziedzic},
  title     = {Special Section on IMAPS-Europe 2002},
  journal   = {Microelectronics Reliability},
  volume    = {43},
  number    = {3},
  pages     = {343},
  year      = {2003},
  url       = {https://doi.org/10.1016/S0026-2714(02)00340-2},
  doi       = {10.1016/S0026-2714(02)00340-2},
  timestamp = {Fri, 02 Nov 2018 00:00:00 +0100},
  biburl    = {https://dblp.org/rec/bib/journals/mr/Dziedzic03},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/DziedzicRGW03,
  author    = {Andrzej Dziedzic and
               Lars Rebenklau and
               Leszek J. Golonka and
               Klaus{-}J{\"{u}}rgen Wolter},
  title     = {Fodel microresistors-processing and basic electrical properties},
  journal   = {Microelectronics Reliability},
  volume    = {43},
  number    = {3},
  pages     = {377--383},
  year      = {2003},
  url       = {https://doi.org/10.1016/S0026-2714(02)00346-3},
  doi       = {10.1016/S0026-2714(02)00346-3},
  timestamp = {Fri, 02 Nov 2018 00:00:00 +0100},
  biburl    = {https://dblp.org/rec/bib/journals/mr/DziedzicRGW03},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Dziedzic02,
  author    = {Andrzej Dziedzic},
  title     = {Electrical and structural investigations in reliability characterisation
               of modern passives and passive integrated components},
  journal   = {Microelectronics Reliability},
  volume    = {42},
  number    = {4-5},
  pages     = {709--719},
  year      = {2002},
  url       = {https://doi.org/10.1016/S0026-2714(02)00044-6},
  doi       = {10.1016/S0026-2714(02)00044-6},
  timestamp = {Fri, 02 Nov 2018 00:00:00 +0100},
  biburl    = {https://dblp.org/rec/bib/journals/mr/Dziedzic02},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/DziedzicGKTDBRW01,
  author    = {Andrzej Dziedzic and
               Leszek J. Golonka and
               Jaroslaw Kita and
               Heiko Thust and
               Karl{-}Heinz Drue and
               Reinhard Bauer and
               Lars Rebenklau and
               Klaus{-}J{\"{u}}rgen Wolter},
  title     = {Electrical and stability properties and ultrasonic microscope characterisation
               of low temperature co-fired ceramics resistors},
  journal   = {Microelectronics Reliability},
  volume    = {41},
  number    = {5},
  pages     = {669--676},
  year      = {2001},
  url       = {https://doi.org/10.1016/S0026-2714(01)00004-X},
  doi       = {10.1016/S0026-2714(01)00004-X},
  timestamp = {Fri, 02 Nov 2018 00:00:00 +0100},
  biburl    = {https://dblp.org/rec/bib/journals/mr/DziedzicGKTDBRW01},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
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