BibTeX records: G. Ghidini

download as .bib file

@article{DBLP:journals/mr/Ghidini12,
  author       = {G. Ghidini},
  title        = {Charge-related phenomena and reliability of non-volatile memories},
  journal      = {Microelectron. Reliab.},
  volume       = {52},
  number       = {9-10},
  pages        = {1876--1882},
  year         = {2012},
  url          = {https://doi.org/10.1016/j.microrel.2012.06.109},
  doi          = {10.1016/J.MICROREL.2012.06.109},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/Ghidini12.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/mr/LanzaPNAGS09,
  author       = {Mario Lanza and
                  Marc Porti and
                  Montserrat Nafr{\'{\i}}a and
                  Xavier Aymerich and
                  G. Ghidini and
                  A. Sebastiani},
  title        = {Trapped charge and stress induced leakage current {(SILC)} in tunnel
                  SiO\({}_{\mbox{2}}\) layers of de-processed {MOS} non-volatile memory
                  devices observed at the nanoscale},
  journal      = {Microelectron. Reliab.},
  volume       = {49},
  number       = {9-11},
  pages        = {1188--1191},
  year         = {2009},
  url          = {https://doi.org/10.1016/j.microrel.2009.06.016},
  doi          = {10.1016/J.MICROREL.2009.06.016},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/LanzaPNAGS09.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/mr/SebastianiPMG07,
  author       = {A. Sebastiani and
                  R. Piagge and
                  Alberto Modelli and
                  G. Ghidini},
  title        = {High-K dielectrics for inter-poly application in non volatile memories},
  journal      = {Microelectron. Reliab.},
  volume       = {47},
  number       = {4-5},
  pages        = {598--601},
  year         = {2007},
  url          = {https://doi.org/10.1016/j.microrel.2007.01.045},
  doi          = {10.1016/J.MICROREL.2007.01.045},
  timestamp    = {Thu, 05 Nov 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/SebastianiPMG07.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/mr/Martin-MartinezGRNACPG07,
  author       = {Javier Mart{\'{\i}}n{-}Mart{\'{\i}}nez and
                  Simone Gerardin and
                  Rosana Rodr{\'{\i}}guez and
                  Montserrat Nafr{\'{\i}}a and
                  Xavier Aymerich and
                  Andrea Cester and
                  Alessandro Paccagnella and
                  G. Ghidini},
  title        = {Lifetime estimation of analog circuits from the electrical characteristics
                  of stressed MOSFETs},
  journal      = {Microelectron. Reliab.},
  volume       = {47},
  number       = {9-11},
  pages        = {1349--1352},
  year         = {2007},
  url          = {https://doi.org/10.1016/j.microrel.2007.07.088},
  doi          = {10.1016/J.MICROREL.2007.07.088},
  timestamp    = {Sun, 02 Oct 2022 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/Martin-MartinezGRNACPG07.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/mr/GerardinGCPG06,
  author       = {Simone Gerardin and
                  Alessio Griffoni and
                  Andrea Cester and
                  Alessandro Paccagnella and
                  G. Ghidini},
  title        = {Degradation of static and dynamic behavior of {CMOS} inverters during
                  constant and pulsed voltage stress},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {9-11},
  pages        = {1669--1672},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2006.07.052},
  doi          = {10.1016/J.MICROREL.2006.07.052},
  timestamp    = {Sun, 02 Oct 2022 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/GerardinGCPG06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/mr/GhidiniLBBGGGG05,
  author       = {G. Ghidini and
                  M. Langenbuch and
                  R. Bottini and
                  D. Brazzelli and
                  Andrea Ghetti and
                  N. Galbiati and
                  G. Giusto and
                  A. Garavaglia},
  title        = {Impact of interface and bulk trapped charges on transistor reliability},
  journal      = {Microelectron. Reliab.},
  volume       = {45},
  number       = {5-6},
  pages        = {857--860},
  year         = {2005},
  url          = {https://doi.org/10.1016/j.microrel.2004.11.031},
  doi          = {10.1016/J.MICROREL.2004.11.031},
  timestamp    = {Sun, 02 Oct 2022 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/GhidiniLBBGGGG05.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/mr/LangenbuchBVG05,
  author       = {M. Langenbuch and
                  R. Bottini and
                  Maria Elena Vitali and
                  G. Ghidini},
  title        = {In situ steam generation {(ISSG)} versus standard steam technology:
                  impact on oxide reliability},
  journal      = {Microelectron. Reliab.},
  volume       = {45},
  number       = {5-6},
  pages        = {875--878},
  year         = {2005},
  url          = {https://doi.org/10.1016/j.microrel.2004.10.026},
  doi          = {10.1016/J.MICROREL.2004.10.026},
  timestamp    = {Tue, 16 Jan 2024 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/LangenbuchBVG05.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/mr/GhidiniCGSSV05,
  author       = {G. Ghidini and
                  C. Capolupo and
                  G. Giusto and
                  A. Sebastiani and
                  B. Stragliati and
                  Maria Elena Vitali},
  title        = {Tunnel oxide degradation under pulsed stress},
  journal      = {Microelectron. Reliab.},
  volume       = {45},
  number       = {9-11},
  pages        = {1337--1342},
  year         = {2005},
  url          = {https://doi.org/10.1016/j.microrel.2005.07.017},
  doi          = {10.1016/J.MICROREL.2005.07.017},
  timestamp    = {Tue, 16 Jan 2024 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/GhidiniCGSSV05.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/mr/GhidiniGGGBPSCI03,
  author       = {G. Ghidini and
                  A. Garavaglia and
                  G. Giusto and
                  Andrea Ghetti and
                  R. Bottini and
                  D. Peschiaroli and
                  M. Scaravaggi and
                  F. Cazzaniga and
                  Daniele Ielmini},
  title        = {Impact of gate stack process on conduction and reliability of 0.18
                  mum {PMOSFET}},
  journal      = {Microelectron. Reliab.},
  volume       = {43},
  number       = {8},
  pages        = {1221--1227},
  year         = {2003},
  url          = {https://doi.org/10.1016/S0026-2714(03)00175-6},
  doi          = {10.1016/S0026-2714(03)00175-6},
  timestamp    = {Sun, 02 Oct 2022 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/GhidiniGGGBPSCI03.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/mr/GhettiBBGP03,
  author       = {Andrea Ghetti and
                  D. Brazzelli and
                  A. Benvenuti and
                  G. Ghidini and
                  Alessia Pavan},
  title        = {Anomalous gate oxide conduction on isolation edges: analysis and process
                  optimization},
  journal      = {Microelectron. Reliab.},
  volume       = {43},
  number       = {8},
  pages        = {1229--1235},
  year         = {2003},
  url          = {https://doi.org/10.1016/S0026-2714(03)00176-8},
  doi          = {10.1016/S0026-2714(03)00176-8},
  timestamp    = {Sun, 02 Oct 2022 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/GhettiBBGP03.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/mr/CiminoCPG03,
  author       = {S. Cimino and
                  Andrea Cester and
                  Alessandro Paccagnella and
                  G. Ghidini},
  title        = {Ionising radiation effects on {MOSFET} drain current},
  journal      = {Microelectron. Reliab.},
  volume       = {43},
  number       = {8},
  pages        = {1247--1251},
  year         = {2003},
  url          = {https://doi.org/10.1016/S0026-2714(03)00179-3},
  doi          = {10.1016/S0026-2714(03)00179-3},
  timestamp    = {Sun, 02 Oct 2022 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/CiminoCPG03.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/mr/GhidiniB02,
  author       = {G. Ghidini and
                  D. Brazzelli},
  title        = {Evaluation methodology of thin dielectrics for non-volatile memory
                  application},
  journal      = {Microelectron. Reliab.},
  volume       = {42},
  number       = {9-11},
  pages        = {1473--1480},
  year         = {2002},
  url          = {https://doi.org/10.1016/S0026-2714(02)00173-7},
  doi          = {10.1016/S0026-2714(02)00173-7},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/GhidiniB02.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/mr/GalbiatiGCL01,
  author       = {N. Galbiati and
                  G. Ghidini and
                  C. Cremonesi and
                  Luca Larcher},
  title        = {Impact of the As dose in 0.35 mum {EEPROM} technology: characterization
                  and modeling},
  journal      = {Microelectron. Reliab.},
  volume       = {41},
  number       = {7},
  pages        = {999--1002},
  year         = {2001},
  url          = {https://doi.org/10.1016/S0026-2714(01)00056-7},
  doi          = {10.1016/S0026-2714(01)00056-7},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/GalbiatiGCL01.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
a service of  Schloss Dagstuhl - Leibniz Center for Informatics

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.