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ORCIDBibTeX records: Horst A. Gieser
@inproceedings{DBLP:conf/date/LippmannBLMBHGK22,
author = {Bernhard Lippmann and
Ann{-}Christin Bette and
Matthias Ludwig and
Johannes Mutter and
Johanna Baehr and
Alexander Hepp and
Horst A. Gieser and
Nicola Kovac and
Tobias Zweifel and
Martin Rasche and
Oliver Kellermann},
editor = {Cristiana Bolchini and
Ingrid Verbauwhede and
Ioana Vatajelu},
title = {Physical and Functional Reverse Engineering Challenges for Advanced
Semiconductor Solutions},
booktitle = {2022 Design, Automation {\&} Test in Europe Conference {\&}
Exhibition, {DATE} 2022, Antwerp, Belgium, March 14-23, 2022},
pages = {796--801},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.23919/DATE54114.2022.9774610},
doi = {10.23919/DATE54114.2022.9774610},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/date/LippmannBLMBHGK22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/integration/LippmannUSLWEDG20,
author = {Bernhard Lippmann and
Niklas Unverricht and
Aayush Singla and
Matthias Ludwig and
Michael Werner and
Peter Egger and
Anja D{\"{u}}botzky and
Helmut Gr{\"{a}}b and
Horst A. Gieser and
Martin Rasche and
Oliver Kellermann},
title = {Verification of physical designs using an integrated reverse engineering
flow for nanoscale technologies},
journal = {Integr.},
volume = {71},
pages = {11--29},
year = {2020},
url = {https://doi.org/10.1016/j.vlsi.2019.11.005},
doi = {10.1016/J.VLSI.2019.11.005},
timestamp = {Thu, 14 Oct 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/integration/LippmannUSLWEDG20.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tches/HeyszlMUSWGFDKK20,
author = {Johann Heyszl and
Katja Miller and
Florian Unterstein and
Marc Schink and
Alexander Wagner and
Horst A. Gieser and
Sven Freud and
Tobias Damm and
Dominik Klein and
Dennis K{\"{u}}gler},
title = {Investigating Profiled Side-Channel Attacks Against the {DES} Key
Schedule},
journal = {{IACR} Trans. Cryptogr. Hardw. Embed. Syst.},
volume = {2020},
number = {3},
pages = {22--72},
year = {2020},
url = {https://doi.org/10.13154/tches.v2020.i3.22-72},
doi = {10.13154/TCHES.V2020.I3.22-72},
timestamp = {Sat, 19 Aug 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tches/HeyszlMUSWGFDKK20.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/aspdac/LippmannWUSEDGR19,
author = {Bernhard Lippmann and
Michael Werner and
Niklas Unverricht and
Aayush Singla and
Peter Egger and
Anja D{\"{u}}botzky and
Horst A. Gieser and
Martin Rasche and
Oliver Kellermann and
Helmut Graeb},
editor = {Toshiyuki Shibuya},
title = {Integrated flow for reverse engineering of nanoscale technologies},
booktitle = {Proceedings of the 24th Asia and South Pacific Design Automation Conference,
{ASPDAC} 2019, Tokyo, Japan, January 21-24, 2019},
pages = {82--89},
publisher = {{ACM}},
year = {2019},
url = {https://doi.org/10.1145/3287624.3288738},
doi = {10.1145/3287624.3288738},
timestamp = {Sun, 20 Jan 2019 16:08:16 +0100},
biburl = {https://dblp.org/rec/conf/aspdac/LippmannWUSEDGR19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/iacr/HeyszlMUSWGFD0K19,
author = {Johann Heyszl and
Katja Miller and
Florian Unterstein and
Marc Schink and
Alexander Wagner and
Horst A. Gieser and
Sven Freud and
Tobias Damm and
Dominik Klein and
Dennis K{\"{u}}gler},
title = {Investigating Profiled Side-Channel Attacks Against the {DES} Key
Schedule},
journal = {{IACR} Cryptol. ePrint Arch.},
pages = {1448},
year = {2019},
url = {https://eprint.iacr.org/2019/1448},
timestamp = {Sat, 23 Jan 2021 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/iacr/HeyszlMUSWGFD0K19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/newcas/LimGSC15,
author = {Tekfouy Lim and
Horst A. Gieser and
Luca Santarelli and
Franco Cacialli},
title = {Electrostatic discharge sensitivity investigation on organic field-effect
thin film transistors},
booktitle = {{IEEE} 13th International New Circuits and Systems Conference, {NEWCAS}
2015, Grenoble, France, June 7-10, 2015},
pages = {1--4},
publisher = {{IEEE}},
year = {2015},
url = {https://doi.org/10.1109/NEWCAS.2015.7182117},
doi = {10.1109/NEWCAS.2015.7182117},
timestamp = {Mon, 15 Jun 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/newcas/LimGSC15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/WolfGW09,
author = {Heinrich Wolf and
Horst A. Gieser and
Dirk Walter},
title = {Investigating the {CDM} susceptibility of IC's at package and wafer
level by capacitive coupled {TLP}},
journal = {Microelectron. Reliab.},
volume = {49},
number = {12},
pages = {1476--1481},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2009.10.006},
doi = {10.1016/J.MICROREL.2009.10.006},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/WolfGW09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/EthertonQWWMDSZAG06,
author = {M. Etherton and
Ning Qu and
J. Willemen and
Wolfgang Wilkening and
S. Mettler and
Mariano Dissegna and
R. Stella and
L. Zullino and
A. Andreini and
Horst A. Gieser},
title = {Study of {CDM} specific effects for a smart power input protection
structure},
journal = {Microelectron. Reliab.},
volume = {46},
number = {5-6},
pages = {666--676},
year = {2006},
url = {https://doi.org/10.1016/j.microrel.2005.10.008},
doi = {10.1016/J.MICROREL.2005.10.008},
timestamp = {Fri, 27 Mar 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/EthertonQWWMDSZAG06.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/WolfGBH06,
author = {Heinrich Wolf and
Horst A. Gieser and
Detlef Bonfert and
Markus Hauser},
title = {{ESD} Susceptibility of Submicron Air Gaps},
journal = {Microelectron. Reliab.},
volume = {46},
number = {9-11},
pages = {1587--1590},
year = {2006},
url = {https://doi.org/10.1016/j.microrel.2006.07.039},
doi = {10.1016/J.MICROREL.2006.07.039},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/WolfGBH06.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BonfertGWFKS06,
author = {Detlef Bonfert and
Horst A. Gieser and
Heinrich Wolf and
M. Frank and
A. Konrad and
J. Schulz},
title = {Transient-induced latch-up test setup for wafer-level and package-level},
journal = {Microelectron. Reliab.},
volume = {46},
number = {9-11},
pages = {1629--1633},
year = {2006},
url = {https://doi.org/10.1016/j.microrel.2006.08.002},
doi = {10.1016/J.MICROREL.2006.08.002},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/BonfertGWFKS06.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/WolfGSW05,
author = {Heinrich Wolf and
Horst A. Gieser and
Wolfgang Stadler and
Wolfgang Wilkening},
title = {Capacitively coupled transmission line pulsing cc-TLP--a traceable
and reproducible stress method in the CDM-domain},
journal = {Microelectron. Reliab.},
volume = {45},
number = {2},
pages = {279--285},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2004.05.015},
doi = {10.1016/J.MICROREL.2004.05.015},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/WolfGSW05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Bargstadt-FrankeSESDGWB05,
author = {S. Bargst{\"{a}}dt{-}Franke and
Wolfgang Stadler and
Kai Esmark and
Martin Streibl and
Krzysztof Domanski and
Horst A. Gieser and
Heinrich Wolf and
Waclaw Bala},
title = {Transient latch-up: experimental analysis and device simulation},
journal = {Microelectron. Reliab.},
volume = {45},
number = {2},
pages = {297--304},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2004.05.017},
doi = {10.1016/J.MICROREL.2004.05.017},
timestamp = {Fri, 16 Apr 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/Bargstadt-FrankeSESDGWB05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/WolfGSG05,
author = {Heinrich Wolf and
Horst A. Gieser and
Wolfgang Soldner and
Harald Gossner},
title = {A Dedicated {TLP} Set-Up to Investigate the {ESD} Robustness of {RF}
Elements and Circuits},
journal = {Microelectron. Reliab.},
volume = {45},
number = {9-11},
pages = {1421--1424},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2005.07.032},
doi = {10.1016/J.MICROREL.2005.07.032},
timestamp = {Thu, 14 Oct 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/WolfGSG05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Gieser03,
author = {Horst A. Gieser},
title = {On-chip electrostatic discharge {ESD}},
journal = {Microelectron. Reliab.},
volume = {43},
number = {7},
pages = {985--986},
year = {2003},
url = {https://doi.org/10.1016/S0026-2714(03)00122-7},
doi = {10.1016/S0026-2714(03)00122-7},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Gieser03.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
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