BibTeX records: S. I. Han

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@inproceedings{DBLP:conf/irps/JiGLLLUPHSLSLSH19,
  author       = {Y. Ji and
                  H. J. Goo and
                  J. Lim and
                  S. B. Lee and
                  S. Lee and
                  Taiki Uemura and
                  J. C. Park and
                  S. I. Han and
                  S. C. Shin and
                  J. H. Lee and
                  Y. J. Song and
                  K. M. Lee and
                  H. M. Shin and
                  S. H. Hwang and
                  B. Y. Seo and
                  Y. K. Lee and
                  J. C. Kim and
                  Gwanhyeob Koh and
                  K. C. Park and
                  Sangwoo Pae and
                  Gi{-}Tae Jeong and
                  J. S. Yoon and
                  E. S. Jung},
  title        = {Reliability of 8Mbit Embedded-STT-MRAM in 28nm {FDSOI} Technology},
  booktitle    = {{IEEE} International Reliability Physics Symposium, {IRPS} 2019, Monterey,
                  CA, USA, March 31 - April 4, 2019},
  pages        = {1--3},
  publisher    = {{IEEE}},
  year         = {2019},
  url          = {https://doi.org/10.1109/IRPS.2019.8720429},
  doi          = {10.1109/IRPS.2019.8720429},
  timestamp    = {Wed, 20 Apr 2022 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/irps/JiGLLLUPHSLSLSH19.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}