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BibTeX records: Keith A. Jenkins
@inproceedings{DBLP:conf/irps/ZhouJCV18, author = {C. Zhou and Keith A. Jenkins and P. I. Chuang and Christos Vezyrtzis}, title = {Effect of {HCI} degradation on the variability of {MOSFETS}}, booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2018, Burlingame, CA, USA, March 11-15, 2018}, pages = {1}, publisher = {{IEEE}}, year = {2018}, url = {https://doi.org/10.1109/IRPS.2018.8353684}, doi = {10.1109/IRPS.2018.8353684}, timestamp = {Wed, 16 Oct 2019 14:14:55 +0200}, biburl = {https://dblp.org/rec/conf/irps/ZhouJCV18.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/irps/StellariWJRLS18, author = {Franco Stellari and Alan J. Weger and Keith A. Jenkins and Giuseppe La Rosa and Barry P. Linder and Peilin Song}, title = {Estimating transistor channel temperature using time-resolved and time-integrated {NIR} emission}, booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2018, Burlingame, CA, USA, March 11-15, 2018}, pages = {6}, publisher = {{IEEE}}, year = {2018}, url = {https://doi.org/10.1109/IRPS.2018.8353625}, doi = {10.1109/IRPS.2018.8353625}, timestamp = {Tue, 22 Jan 2019 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/irps/StellariWJRLS18.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/essderc/CartierMLAFRJLC17, author = {Eduard Cartier and Atreya Majumdar and K.{-}T. Lee and Takashi Ando and Martin M. Frank and John Rozen and Keith A. Jenkins and C. Liang and C.{-}W. Cheng and John Bruley and M. Hopstaken and Pranita Kerber and J.{-}B. Yau and X. Sun and R. T. Mo and Chun{-}Chen Yeh and Effendi Leobandung and Vijay Narayanan}, title = {Electron mobility in thin In0.53Ga0.47As channel}, booktitle = {47th European Solid-State Device Research Conference, {ESSDERC} 2017, Leuven, Belgium, September 11-14, 2017}, pages = {292--295}, publisher = {{IEEE}}, year = {2017}, url = {https://doi.org/10.1109/ESSDERC.2017.8066649}, doi = {10.1109/ESSDERC.2017.8066649}, timestamp = {Sat, 30 Sep 2023 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/essderc/CartierMLAFRJLC17.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/iccd/FleischerVBJ16, author = {Bruce M. Fleischer and Christos Vezyrtzis and Karthik Balakrishnan and Keith A. Jenkins}, title = {A statistical critical path monitor in 14nm {CMOS}}, booktitle = {34th {IEEE} International Conference on Computer Design, {ICCD} 2016, Scottsdale, AZ, USA, October 2-5, 2016}, pages = {507--511}, publisher = {{IEEE} Computer Society}, year = {2016}, url = {https://doi.org/10.1109/ICCD.2016.7753334}, doi = {10.1109/ICCD.2016.7753334}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/iccd/FleischerVBJ16.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/jssc/FluhrBBBDDEFGGGHJKMNPPPRRSSSSSDWWZ15, author = {Eric J. Fluhr and Steve Baumgartner and David W. Boerstler and John F. Bulzacchelli and Timothy Diemoz and Daniel Dreps and George English and Joshua Friedrich and Anne Gattiker and Tilman Gloekler and Christopher J. Gonzalez and Jason Hibbeler and Keith A. Jenkins and Yong Kim and Paul Muench and Ryan Nett and Jose Paredes and Juergen Pille and Donald W. Plass and Phillip J. Restle and Raphael Robertazzi and David Shan and David W. Siljenberg and Michael A. Sperling and Kevin Stawiasz and Gregory S. Still and Zeynep Toprak Deniz and James D. Warnock and Glen A. Wiedemeier and Victor V. Zyuban}, title = {The 12-Core POWER8{\texttrademark} Processor With 7.6 Tb/s {IO} Bandwidth, Integrated Voltage Regulation, and Resonant Clocking}, journal = {{IEEE} J. Solid State Circuits}, volume = {50}, number = {1}, pages = {10--23}, year = {2015}, url = {https://doi.org/10.1109/JSSC.2014.2358553}, doi = {10.1109/JSSC.2014.2358553}, timestamp = {Fri, 25 Feb 2022 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/jssc/FluhrBBBDDEFGGGHJKMNPPPRRSSSSSDWWZ15.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/tvlsi/KimLJK15, author = {Tony Tae{-}Hyoung Kim and Pong{-}Fei Lu and Keith A. Jenkins and Chris H. Kim}, title = {A Ring-Oscillator-Based Reliability Monitor for Isolated Measurement of {NBTI} and {PBTI} in High-k/Metal Gate Technology}, journal = {{IEEE} Trans. Very Large Scale Integr. Syst.}, volume = {23}, number = {7}, pages = {1360--1364}, year = {2015}, url = {https://doi.org/10.1109/TVLSI.2014.2339364}, doi = {10.1109/TVLSI.2014.2339364}, timestamp = {Wed, 11 Mar 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/tvlsi/KimLJK15.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/irps/StellariJWLS15, author = {Franco Stellari and Keith A. Jenkins and Alan J. Weger and Barry P. Linder and Peilin Song}, title = {Self-heating characterization of FinFET {SOI} devices using 2D time resolved emission measurements}, booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2015, Monterey, CA, USA, April 19-23, 2015}, pages = {2}, publisher = {{IEEE}}, year = {2015}, url = {https://doi.org/10.1109/IRPS.2015.7112672}, doi = {10.1109/IRPS.2015.7112672}, timestamp = {Wed, 16 Oct 2019 14:14:55 +0200}, biburl = {https://dblp.org/rec/conf/irps/StellariJWLS15.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/irps/LuJMS15, author = {Pong{-}Fei Lu and Keith A. Jenkins and K. Paul Muller and Ralf Schaufler}, title = {Long-term data for {BTI} degradation in 32nm {IBM} microprocessor using {HKMG} technology}, booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2015, Monterey, CA, USA, April 19-23, 2015}, pages = {6}, publisher = {{IEEE}}, year = {2015}, url = {https://doi.org/10.1109/IRPS.2015.7112756}, doi = {10.1109/IRPS.2015.7112756}, timestamp = {Sun, 21 May 2017 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/irps/LuJMS15.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/LuJWMS14, author = {Pong{-}Fei Lu and Keith A. Jenkins and Tobias Webel and Oliver Marquardt and Birgit Schubert}, title = {Long-term {NBTI} degradation under real-use conditions in {IBM} microprocessors}, journal = {Microelectron. Reliab.}, volume = {54}, number = {11}, pages = {2371--2377}, year = {2014}, url = {https://doi.org/10.1016/j.microrel.2014.06.016}, doi = {10.1016/J.MICROREL.2014.06.016}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/LuJWMS14.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/isscc/RestleSHKDHBSJF14, author = {Phillip J. Restle and David Shan and David Hogenmiller and Yong Kim and Alan J. Drake and Jason Hibbeler and Thomas J. Bucelot and Gregory S. Still and Keith A. Jenkins and Joshua Friedrich}, title = {5.3 Wide-frequency-range resonant clock with on-the-fly mode changing for the POWER8\({}^{\mbox{TM}}\) microprocessor}, booktitle = {2014 {IEEE} International Conference on Solid-State Circuits Conference, {ISSCC} 2014, Digest of Technical Papers, San Francisco, CA, USA, February 9-13, 2014}, pages = {100--101}, publisher = {{IEEE}}, year = {2014}, url = {https://doi.org/10.1109/ISSCC.2014.6757355}, doi = {10.1109/ISSCC.2014.6757355}, timestamp = {Fri, 25 Feb 2022 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/isscc/RestleSHKDHBSJF14.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/JenkinsL13, author = {Keith A. Jenkins and Pong{-}Fei Lu}, title = {On-chip circuit to monitor long-term {NBTI} and {PBTI} degradation}, journal = {Microelectron. Reliab.}, volume = {53}, number = {9-11}, pages = {1252--1256}, year = {2013}, url = {https://doi.org/10.1016/j.microrel.2013.07.039}, doi = {10.1016/J.MICROREL.2013.07.039}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/JenkinsL13.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/esscirc/KuangJSS13, author = {Jente B. Kuang and Keith A. Jenkins and Kevin Stawiasz and Jeremy D. Schaub}, title = {Performance impact of through-silicon vias (TSVs) in three-dimensional technology measured by {SRAM} ring oscillators}, booktitle = {{ESSCIRC} 2013 - Proceedings of the 39th European Solid-State Circuits Conference, Bucharest, Romania, September 16-20, 2013}, pages = {419--422}, publisher = {{IEEE}}, year = {2013}, url = {https://doi.org/10.1109/ESSCIRC.2013.6649162}, doi = {10.1109/ESSCIRC.2013.6649162}, timestamp = {Fri, 23 Jul 2021 15:40:30 +0200}, biburl = {https://dblp.org/rec/conf/esscirc/KuangJSS13.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/vts/JenkinsRWHBB13, author = {Keith A. Jenkins and Phillip J. Restle and P. Z. Wang and D. Hogenmiller and David W. Boerstler and Thomas J. Bucelot}, title = {On-chip circuit for measuring multi-GHz clock signal waveforms}, booktitle = {31st {IEEE} {VLSI} Test Symposium, {VTS} 2013, Berkeley, CA, USA, April 29 - May 2, 2013}, pages = {1--4}, publisher = {{IEEE} Computer Society}, year = {2013}, url = {https://doi.org/10.1109/VTS.2013.6548933}, doi = {10.1109/VTS.2013.6548933}, timestamp = {Fri, 24 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/vts/JenkinsRWHBB13.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/isqed/BalakrishnanJB11, author = {Karthik Balakrishnan and Keith A. Jenkins and Duane S. Boning}, title = {A simple array-based test structure for the {AC} variability characterization of MOSFETs}, booktitle = {Proceedings of the 12th International Symposium on Quality Electronic Design, {ISQED} 2011, Santa Clara, California, USA, 14-16 March 2011}, pages = {539--544}, publisher = {{IEEE}}, year = {2011}, url = {https://doi.org/10.1109/ISQED.2011.5770779}, doi = {10.1109/ISQED.2011.5770779}, timestamp = {Wed, 16 Oct 2019 14:14:55 +0200}, biburl = {https://dblp.org/rec/conf/isqed/BalakrishnanJB11.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/jssc/RaoJK09, author = {Rahul M. Rao and Keith A. Jenkins and Jae{-}Joon Kim}, title = {A Local Random Variability Detector With Complete Digital On-Chip Measurement Circuitry}, journal = {{IEEE} J. Solid State Circuits}, volume = {44}, number = {9}, pages = {2616--2623}, year = {2009}, url = {https://doi.org/10.1109/JSSC.2009.2025342}, doi = {10.1109/JSSC.2009.2025342}, timestamp = {Sun, 30 Aug 2020 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/jssc/RaoJK09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/vts/JenkinsL09, author = {Keith A. Jenkins and Lionel Li}, title = {A Scalable, Digital {BIST} Circuit for Measurement and Compensation of Static Phase Offset}, booktitle = {27th {IEEE} {VLSI} Test Symposium, {VTS} 2009, May 3-7, 2009, Santa Cruz, California, {USA}}, pages = {185--188}, publisher = {{IEEE} Computer Society}, year = {2009}, url = {https://doi.org/10.1109/VTS.2009.36}, doi = {10.1109/VTS.2009.36}, timestamp = {Fri, 24 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/vts/JenkinsL09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/jssc/MukhopadhyayKJC08, author = {Saibal Mukhopadhyay and Keunwoo Kim and Keith A. Jenkins and Ching{-}Te Chuang and Kaushik Roy}, title = {An On-Chip Test Structure and Digital Measurement Method for Statistical Characterization of Local Random Variability in a Process}, journal = {{IEEE} J. Solid State Circuits}, volume = {43}, number = {9}, pages = {1951--1963}, year = {2008}, url = {https://doi.org/10.1109/JSSC.2008.2001896}, doi = {10.1109/JSSC.2008.2001896}, timestamp = {Sun, 30 Aug 2020 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/jssc/MukhopadhyayKJC08.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/tcas/RheeJLA08, author = {Woogeun Rhee and Keith A. Jenkins and John C. Liobe and Herschel A. Ainspan}, title = {Experimental Analysis of Substrate Noise Effect on {PLL} Performance}, journal = {{IEEE} Trans. Circuits Syst. {II} Express Briefs}, volume = {55-II}, number = {7}, pages = {638--642}, year = {2008}, url = {https://doi.org/10.1109/TCSII.2008.921582}, doi = {10.1109/TCSII.2008.921582}, timestamp = {Sat, 09 Apr 2022 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/tcas/RheeJLA08.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/isscc/RaoJK08, author = {Rahul M. Rao and Keith A. Jenkins and Jae{-}Joon Kim}, title = {A Completely Digital On-Chip Circuit for Local-Random-Variability Measurement}, booktitle = {2008 {IEEE} International Solid-State Circuits Conference, {ISSCC} 2008, Digest of Technical Papers, San Francisco, CA, USA, February 3-7, 2008}, pages = {412--413}, publisher = {{IEEE}}, year = {2008}, url = {https://doi.org/10.1109/ISSCC.2008.4523232}, doi = {10.1109/ISSCC.2008.4523232}, timestamp = {Wed, 16 Oct 2019 14:14:55 +0200}, biburl = {https://dblp.org/rec/conf/isscc/RaoJK08.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/cicc/JenkinsSX07, author = {Keith A. Jenkins and Kenneth L. Shepard and Zheng Xu}, title = {On-Chip Circuit for Measuring Period Jitter and Skew of Clock Distribution Networks}, booktitle = {Proceedings of the {IEEE} 2007 Custom Integrated Circuits Conference, {CICC} 2007, DoubleTree Hotel, San Jose, California, USA, September 16-19, 2007}, pages = {157--160}, publisher = {{IEEE}}, year = {2007}, url = {https://doi.org/10.1109/CICC.2007.4405703}, doi = {10.1109/CICC.2007.4405703}, timestamp = {Wed, 16 Oct 2019 14:14:52 +0200}, biburl = {https://dblp.org/rec/conf/cicc/JenkinsSX07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/isscc/MukhopadhyayKJCR07, author = {Saibal Mukhopadhyay and Keunwoo Kim and Keith A. Jenkins and Ching{-}Te Chuang and Kaushik Roy}, title = {Statistical Characterization and On-Chip Measurement Methods for Local Random Variability of a Process Using Sense-Amplifier-Based Test Structure}, booktitle = {2007 {IEEE} International Solid-State Circuits Conference, {ISSCC} 2007, Digest of Technical Papers, San Francisco, CA, USA, February 11-15, 2007}, pages = {400--611}, publisher = {{IEEE}}, year = {2007}, url = {https://doi.org/10.1109/ISSCC.2007.373463}, doi = {10.1109/ISSCC.2007.373463}, timestamp = {Wed, 16 Oct 2019 14:14:55 +0200}, biburl = {https://dblp.org/rec/conf/isscc/MukhopadhyayKJCR07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/ibmrd/KnickerbockerABDHJKMPPSSSSTWWMSD05, author = {John U. Knickerbocker and Paul S. Andry and L. Paivikki Buchwalter and Alina Deutsch and Raymond R. Horton and Keith A. Jenkins and Young Hoon Kwark and Gerald McVicker and Chirag S. Patel and Robert J. Polastre and Christian D. Schuster and Arun Sharma and Sri M. Sri{-}Jayantha and Christopher W. Surovic and Cornelia K. Tsang and Bucknell C. Webb and Steven L. Wright and Samuel R. McKnight and Edmund J. Sprogis and Bing Dang}, title = {Development of next-generation system-on-package {(SOP)} technology based on silicon carriers with fine-pitch chip interconnection}, journal = {{IBM} J. Res. Dev.}, volume = {49}, number = {4-5}, pages = {725--754}, year = {2005}, url = {https://doi.org/10.1147/rd.494.0725}, doi = {10.1147/RD.494.0725}, timestamp = {Fri, 13 Mar 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/ibmrd/KnickerbockerABDHJKMPPSSSSTWWMSD05.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/esscirc/JenkinsJH05, author = {Keith A. Jenkins and Anup P. Jose and David F. Heidel}, editor = {Laurent Fesquet and Andreas Kaiser and Sorin Cristoloveanu and Michel Brillou{\"{e}}t}, title = {An on-chip jitter measurement circuit with sub-picosecond resolution}, booktitle = {Proceedings of the 31st European Solid-State Circuits Conference, {ESSCIRC} 2005, Grenoble, France, 12-16 September 2005}, pages = {157--160}, publisher = {{IEEE}}, year = {2005}, url = {https://doi.org/10.1109/ESSCIR.2005.1541583}, doi = {10.1109/ESSCIR.2005.1541583}, timestamp = {Fri, 28 Apr 2023 15:39:25 +0200}, biburl = {https://dblp.org/rec/conf/esscirc/JenkinsJH05.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/vts/JoseJR05, author = {Anup P. Jose and Keith A. Jenkins and Scott K. Reynolds}, title = {On-Chip Spectrum Analyzer for Analog Built-In Self Test}, booktitle = {23rd {IEEE} {VLSI} Test Symposium {(VTS} 2005), 1-5 May 2005, Palm Springs, CA, {USA}}, pages = {131--136}, publisher = {{IEEE} Computer Society}, year = {2005}, url = {https://doi.org/10.1109/VTS.2005.63}, doi = {10.1109/VTS.2005.63}, timestamp = {Fri, 24 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/vts/JoseJR05.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/ets/XiaSJL04, author = {Tian Xia and Peilin Song and Keith A. Jenkins and Jien{-}Chung Lo}, title = {Delay chain based programmable jitter generator}, booktitle = {9th European Test Symposium, {ETS} 2004, Ajaccio, France, May 23-26, 2004}, pages = {16--21}, publisher = {{IEEE} Computer Society}, year = {2004}, url = {https://doi.org/10.1109/ETSYM.2004.1347578}, doi = {10.1109/ETSYM.2004.1347578}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/ets/XiaSJL04.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/PolonskyJWC04, author = {Stas Polonsky and Keith A. Jenkins and Alan J. Weger and Shinho Cho}, title = {{CMOS} {IC} diagnostics using the luminescence of OFF-state leakage currents}, booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October 26-28, 2004, Charlotte, NC, {USA}}, pages = {134--139}, publisher = {{IEEE} Computer Society}, year = {2004}, url = {https://doi.org/10.1109/TEST.2004.1386945}, doi = {10.1109/TEST.2004.1386945}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/PolonskyJWC04.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/ibmrd/PlouchartZKSTRTWWLNOPRSFKKKJR03, author = {Jean{-}Olivier Plouchart and Noah Zamdmer and Jonghae Kim and Melanie Sherony and Yue Tan and Asit Ray and Mohamed Talbi and Lawrence F. Wagner and Kun Wu and Naftali E. Lustig and Shreesh Narasimha and Patricia O'Neil and Nghia Phan and Michael Rohn and James Strom and David M. Friend and Stephen V. Kosonocky and Daniel R. Knebel and Suhwan Kim and Keith A. Jenkins and Michel M. Rivier}, title = {Application of an {SOI} 0.12-{\(\mathrm{\mu}\)}m {CMOS} technology to SoCs with low-power and high-frequency circuits}, journal = {{IBM} J. Res. Dev.}, volume = {47}, number = {5-6}, pages = {611--630}, year = {2003}, url = {https://doi.org/10.1147/rd.475.0611}, doi = {10.1147/RD.475.0611}, timestamp = {Thu, 14 Oct 2021 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/ibmrd/PlouchartZKSTRTWWLNOPRSFKKKJR03.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/jssc/RestleMWCEJARQB01, author = {Phillip J. Restle and Timothy G. McNamara and David A. Webber and Peter J. Camporese and Kwok F. Eng and Keith A. Jenkins and David H. Allen and Michael J. Rohn and Michael P. Quaranta and David W. Boerstler and Charles J. Alpert and Craig A. Carter and Roger N. Bailey and John G. Petrovick and Byron L. Krauter and Bradley D. McCredie}, title = {A clock distribution network for microprocessors}, journal = {{IEEE} J. Solid State Circuits}, volume = {36}, number = {5}, pages = {792--799}, year = {2001}, url = {https://doi.org/10.1109/4.918917}, doi = {10.1109/4.918917}, timestamp = {Mon, 04 Apr 2022 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/jssc/RestleMWCEJARQB01.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/dt/JenkinsE00, author = {Keith A. Jenkins and James P. Eckhardt}, title = {Measuring Jitter and Phase Error in Microprocessor Phase-Locked Loops}, journal = {{IEEE} Des. Test Comput.}, volume = {17}, number = {2}, pages = {86--93}, year = {2000}, url = {https://doi.org/10.1109/54.844337}, doi = {10.1109/54.844337}, timestamp = {Sun, 17 May 2020 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/dt/JenkinsE00.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/jssc/RestleJDC98, author = {Phillip J. Restle and Keith A. Jenkins and Alina Deutsch and Peter W. Cook}, title = {Measurement and modeling of on-chip transmission line effects in a 400 MHz microprocessor}, journal = {{IEEE} J. Solid State Circuits}, volume = {33}, number = {4}, pages = {662--665}, year = {1998}, url = {https://doi.org/10.1109/4.663576}, doi = {10.1109/4.663576}, timestamp = {Tue, 05 Jul 2022 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/jssc/RestleJDC98.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/jssc/BurghartzESAJ98, author = {Joachim N. Burghartz and Daniel C. Edelstein and Mehmet Soyuer and Herschel A. Ainspan and Keith A. Jenkins}, title = {{RF} circuit design aspects of spiral inductors on silicon}, journal = {{IEEE} J. Solid State Circuits}, volume = {33}, number = {12}, pages = {2028--2034}, year = {1998}, url = {https://doi.org/10.1109/4.735544}, doi = {10.1109/4.735544}, timestamp = {Tue, 05 Jul 2022 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/jssc/BurghartzESAJ98.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/vts/KosonockyBWHKABHHIJJPRS98, author = {Stephen V. Kosonocky and Arthur A. Bright and Kevin W. Warren and Ruud A. Haring and Steve Klepner and Sameh W. Asaad and S. Basavaiah and Bob Havreluk and David F. Heidel and Michael Immediato and Keith A. Jenkins and Rajiv V. Joshi and Benjamin D. Parker and T. V. Rajeevakumar and Kevin Stawiasz}, title = {Designing a Testable System on a Chip}, booktitle = {16th {IEEE} {VLSI} Test Symposium {(VTS} '98), 28 April - 1 May 1998, Princeton, NJ, {USA}}, pages = {2--7}, publisher = {{IEEE} Computer Society}, year = {1998}, url = {https://doi.org/10.1109/VTEST.1998.670841}, doi = {10.1109/VTEST.1998.670841}, timestamp = {Fri, 24 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/vts/KosonockyBWHKABHHIJJPRS98.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/dt/Jenkins97, author = {Keith A. Jenkins}, title = {Detecting and Preventing Measurement Errors}, journal = {{IEEE} Des. Test Comput.}, volume = {14}, number = {4}, pages = {78--86}, year = {1997}, url = {https://doi.org/10.1109/54.632884}, doi = {10.1109/54.632884}, timestamp = {Sun, 17 May 2020 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/dt/Jenkins97.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/jssc/BurghartzSJKDSM97, author = {Joachim N. Burghartz and Mehmet Soyuer and Keith A. Jenkins and Michael Kies and Margaret Dolan and Kenneth J. Stein and John Malinowski and David L. Harame}, title = {Integrated {RF} components in a SiGe bipolar technology}, journal = {{IEEE} J. Solid State Circuits}, volume = {32}, number = {9}, pages = {1440--1445}, year = {1997}, url = {https://doi.org/10.1109/4.628759}, doi = {10.1109/4.628759}, timestamp = {Thu, 07 Jul 2022 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/jssc/BurghartzSJKDSM97.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/jssc/SoyuerBAJXSDH97, author = {Mehmet Soyuer and Joachim N. Burghartz and Herschel A. Ainspan and Keith A. Jenkins and Peter Xiao and Arvin R. Shahani and Margaret S. Dolan and David L. Harame}, title = {An 11 GHz 3-V SiGe voltage controlled oscillator with integrated resonator}, journal = {{IEEE} J. Solid State Circuits}, volume = {32}, number = {9}, pages = {1451--1454}, year = {1997}, url = {https://doi.org/10.1109/4.628762}, doi = {10.1109/4.628762}, timestamp = {Thu, 07 Jul 2022 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/jssc/SoyuerBAJXSDH97.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/jssc/SoyuerJBACPEP96, author = {Mehmet Soyuer and Keith A. Jenkins and Joachim N. Burghartz and Herschel A. Ainspan and Frank J. Canora and Slaila Ponnapalli and John F. Ewen and William E. Pence}, title = {A 2.4-GHz silicon bipolar oscillator with integrated resonator}, journal = {{IEEE} J. Solid State Circuits}, volume = {31}, number = {2}, pages = {268--270}, year = {1996}, url = {https://doi.org/10.1109/4.488006}, doi = {10.1109/4.488006}, timestamp = {Mon, 18 Jul 2022 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/jssc/SoyuerJBACPEP96.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/jssc/SoyuerJBH96, author = {Mehmet Soyuer and Keith A. Jenkins and Joachim N. Burghartz and Michael D. Hulvey}, title = {A 3-V 4-GHz nMOS voltage-controlled oscillator with integrated resonator}, journal = {{IEEE} J. Solid State Circuits}, volume = {31}, number = {12}, pages = {2042--2045}, year = {1996}, url = {https://doi.org/10.1109/4.545829}, doi = {10.1109/4.545829}, timestamp = {Mon, 18 Jul 2022 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/jssc/SoyuerJBH96.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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