BibTeX records: Keith A. Jenkins

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@inproceedings{DBLP:conf/irps/ZhouJCV18,
  author       = {C. Zhou and
                  Keith A. Jenkins and
                  P. I. Chuang and
                  Christos Vezyrtzis},
  title        = {Effect of {HCI} degradation on the variability of {MOSFETS}},
  booktitle    = {{IEEE} International Reliability Physics Symposium, {IRPS} 2018, Burlingame,
                  CA, USA, March 11-15, 2018},
  pages        = {1},
  publisher    = {{IEEE}},
  year         = {2018},
  url          = {https://doi.org/10.1109/IRPS.2018.8353684},
  doi          = {10.1109/IRPS.2018.8353684},
  timestamp    = {Wed, 16 Oct 2019 14:14:55 +0200},
  biburl       = {https://dblp.org/rec/conf/irps/ZhouJCV18.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/StellariWJRLS18,
  author       = {Franco Stellari and
                  Alan J. Weger and
                  Keith A. Jenkins and
                  Giuseppe La Rosa and
                  Barry P. Linder and
                  Peilin Song},
  title        = {Estimating transistor channel temperature using time-resolved and
                  time-integrated {NIR} emission},
  booktitle    = {{IEEE} International Reliability Physics Symposium, {IRPS} 2018, Burlingame,
                  CA, USA, March 11-15, 2018},
  pages        = {6},
  publisher    = {{IEEE}},
  year         = {2018},
  url          = {https://doi.org/10.1109/IRPS.2018.8353625},
  doi          = {10.1109/IRPS.2018.8353625},
  timestamp    = {Tue, 22 Jan 2019 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/irps/StellariWJRLS18.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/essderc/CartierMLAFRJLC17,
  author       = {Eduard Cartier and
                  Atreya Majumdar and
                  K.{-}T. Lee and
                  Takashi Ando and
                  Martin M. Frank and
                  John Rozen and
                  Keith A. Jenkins and
                  C. Liang and
                  C.{-}W. Cheng and
                  John Bruley and
                  M. Hopstaken and
                  Pranita Kerber and
                  J.{-}B. Yau and
                  X. Sun and
                  R. T. Mo and
                  Chun{-}Chen Yeh and
                  Effendi Leobandung and
                  Vijay Narayanan},
  title        = {Electron mobility in thin In0.53Ga0.47As channel},
  booktitle    = {47th European Solid-State Device Research Conference, {ESSDERC} 2017,
                  Leuven, Belgium, September 11-14, 2017},
  pages        = {292--295},
  publisher    = {{IEEE}},
  year         = {2017},
  url          = {https://doi.org/10.1109/ESSDERC.2017.8066649},
  doi          = {10.1109/ESSDERC.2017.8066649},
  timestamp    = {Sat, 30 Sep 2023 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/essderc/CartierMLAFRJLC17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iccd/FleischerVBJ16,
  author       = {Bruce M. Fleischer and
                  Christos Vezyrtzis and
                  Karthik Balakrishnan and
                  Keith A. Jenkins},
  title        = {A statistical critical path monitor in 14nm {CMOS}},
  booktitle    = {34th {IEEE} International Conference on Computer Design, {ICCD} 2016,
                  Scottsdale, AZ, USA, October 2-5, 2016},
  pages        = {507--511},
  publisher    = {{IEEE} Computer Society},
  year         = {2016},
  url          = {https://doi.org/10.1109/ICCD.2016.7753334},
  doi          = {10.1109/ICCD.2016.7753334},
  timestamp    = {Thu, 23 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/iccd/FleischerVBJ16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/jssc/FluhrBBBDDEFGGGHJKMNPPPRRSSSSSDWWZ15,
  author       = {Eric J. Fluhr and
                  Steve Baumgartner and
                  David W. Boerstler and
                  John F. Bulzacchelli and
                  Timothy Diemoz and
                  Daniel Dreps and
                  George English and
                  Joshua Friedrich and
                  Anne Gattiker and
                  Tilman Gloekler and
                  Christopher J. Gonzalez and
                  Jason Hibbeler and
                  Keith A. Jenkins and
                  Yong Kim and
                  Paul Muench and
                  Ryan Nett and
                  Jose Paredes and
                  Juergen Pille and
                  Donald W. Plass and
                  Phillip J. Restle and
                  Raphael Robertazzi and
                  David Shan and
                  David W. Siljenberg and
                  Michael A. Sperling and
                  Kevin Stawiasz and
                  Gregory S. Still and
                  Zeynep Toprak Deniz and
                  James D. Warnock and
                  Glen A. Wiedemeier and
                  Victor V. Zyuban},
  title        = {The 12-Core POWER8{\texttrademark} Processor With 7.6 Tb/s {IO} Bandwidth,
                  Integrated Voltage Regulation, and Resonant Clocking},
  journal      = {{IEEE} J. Solid State Circuits},
  volume       = {50},
  number       = {1},
  pages        = {10--23},
  year         = {2015},
  url          = {https://doi.org/10.1109/JSSC.2014.2358553},
  doi          = {10.1109/JSSC.2014.2358553},
  timestamp    = {Fri, 25 Feb 2022 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/jssc/FluhrBBBDDEFGGGHJKMNPPPRRSSSSSDWWZ15.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tvlsi/KimLJK15,
  author       = {Tony Tae{-}Hyoung Kim and
                  Pong{-}Fei Lu and
                  Keith A. Jenkins and
                  Chris H. Kim},
  title        = {A Ring-Oscillator-Based Reliability Monitor for Isolated Measurement
                  of {NBTI} and {PBTI} in High-k/Metal Gate Technology},
  journal      = {{IEEE} Trans. Very Large Scale Integr. Syst.},
  volume       = {23},
  number       = {7},
  pages        = {1360--1364},
  year         = {2015},
  url          = {https://doi.org/10.1109/TVLSI.2014.2339364},
  doi          = {10.1109/TVLSI.2014.2339364},
  timestamp    = {Wed, 11 Mar 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/tvlsi/KimLJK15.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/StellariJWLS15,
  author       = {Franco Stellari and
                  Keith A. Jenkins and
                  Alan J. Weger and
                  Barry P. Linder and
                  Peilin Song},
  title        = {Self-heating characterization of FinFET {SOI} devices using 2D time
                  resolved emission measurements},
  booktitle    = {{IEEE} International Reliability Physics Symposium, {IRPS} 2015, Monterey,
                  CA, USA, April 19-23, 2015},
  pages        = {2},
  publisher    = {{IEEE}},
  year         = {2015},
  url          = {https://doi.org/10.1109/IRPS.2015.7112672},
  doi          = {10.1109/IRPS.2015.7112672},
  timestamp    = {Wed, 16 Oct 2019 14:14:55 +0200},
  biburl       = {https://dblp.org/rec/conf/irps/StellariJWLS15.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/LuJMS15,
  author       = {Pong{-}Fei Lu and
                  Keith A. Jenkins and
                  K. Paul Muller and
                  Ralf Schaufler},
  title        = {Long-term data for {BTI} degradation in 32nm {IBM} microprocessor
                  using {HKMG} technology},
  booktitle    = {{IEEE} International Reliability Physics Symposium, {IRPS} 2015, Monterey,
                  CA, USA, April 19-23, 2015},
  pages        = {6},
  publisher    = {{IEEE}},
  year         = {2015},
  url          = {https://doi.org/10.1109/IRPS.2015.7112756},
  doi          = {10.1109/IRPS.2015.7112756},
  timestamp    = {Sun, 21 May 2017 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/irps/LuJMS15.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LuJWMS14,
  author       = {Pong{-}Fei Lu and
                  Keith A. Jenkins and
                  Tobias Webel and
                  Oliver Marquardt and
                  Birgit Schubert},
  title        = {Long-term {NBTI} degradation under real-use conditions in {IBM} microprocessors},
  journal      = {Microelectron. Reliab.},
  volume       = {54},
  number       = {11},
  pages        = {2371--2377},
  year         = {2014},
  url          = {https://doi.org/10.1016/j.microrel.2014.06.016},
  doi          = {10.1016/J.MICROREL.2014.06.016},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/LuJWMS14.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/isscc/RestleSHKDHBSJF14,
  author       = {Phillip J. Restle and
                  David Shan and
                  David Hogenmiller and
                  Yong Kim and
                  Alan J. Drake and
                  Jason Hibbeler and
                  Thomas J. Bucelot and
                  Gregory S. Still and
                  Keith A. Jenkins and
                  Joshua Friedrich},
  title        = {5.3 Wide-frequency-range resonant clock with on-the-fly mode changing
                  for the POWER8\({}^{\mbox{TM}}\) microprocessor},
  booktitle    = {2014 {IEEE} International Conference on Solid-State Circuits Conference,
                  {ISSCC} 2014, Digest of Technical Papers, San Francisco, CA, USA,
                  February 9-13, 2014},
  pages        = {100--101},
  publisher    = {{IEEE}},
  year         = {2014},
  url          = {https://doi.org/10.1109/ISSCC.2014.6757355},
  doi          = {10.1109/ISSCC.2014.6757355},
  timestamp    = {Fri, 25 Feb 2022 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/isscc/RestleSHKDHBSJF14.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/JenkinsL13,
  author       = {Keith A. Jenkins and
                  Pong{-}Fei Lu},
  title        = {On-chip circuit to monitor long-term {NBTI} and {PBTI} degradation},
  journal      = {Microelectron. Reliab.},
  volume       = {53},
  number       = {9-11},
  pages        = {1252--1256},
  year         = {2013},
  url          = {https://doi.org/10.1016/j.microrel.2013.07.039},
  doi          = {10.1016/J.MICROREL.2013.07.039},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/JenkinsL13.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/esscirc/KuangJSS13,
  author       = {Jente B. Kuang and
                  Keith A. Jenkins and
                  Kevin Stawiasz and
                  Jeremy D. Schaub},
  title        = {Performance impact of through-silicon vias (TSVs) in three-dimensional
                  technology measured by {SRAM} ring oscillators},
  booktitle    = {{ESSCIRC} 2013 - Proceedings of the 39th European Solid-State Circuits
                  Conference, Bucharest, Romania, September 16-20, 2013},
  pages        = {419--422},
  publisher    = {{IEEE}},
  year         = {2013},
  url          = {https://doi.org/10.1109/ESSCIRC.2013.6649162},
  doi          = {10.1109/ESSCIRC.2013.6649162},
  timestamp    = {Fri, 23 Jul 2021 15:40:30 +0200},
  biburl       = {https://dblp.org/rec/conf/esscirc/KuangJSS13.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/JenkinsRWHBB13,
  author       = {Keith A. Jenkins and
                  Phillip J. Restle and
                  P. Z. Wang and
                  D. Hogenmiller and
                  David W. Boerstler and
                  Thomas J. Bucelot},
  title        = {On-chip circuit for measuring multi-GHz clock signal waveforms},
  booktitle    = {31st {IEEE} {VLSI} Test Symposium, {VTS} 2013, Berkeley, CA, USA,
                  April 29 - May 2, 2013},
  pages        = {1--4},
  publisher    = {{IEEE} Computer Society},
  year         = {2013},
  url          = {https://doi.org/10.1109/VTS.2013.6548933},
  doi          = {10.1109/VTS.2013.6548933},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/vts/JenkinsRWHBB13.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/isqed/BalakrishnanJB11,
  author       = {Karthik Balakrishnan and
                  Keith A. Jenkins and
                  Duane S. Boning},
  title        = {A simple array-based test structure for the {AC} variability characterization
                  of MOSFETs},
  booktitle    = {Proceedings of the 12th International Symposium on Quality Electronic
                  Design, {ISQED} 2011, Santa Clara, California, USA, 14-16 March 2011},
  pages        = {539--544},
  publisher    = {{IEEE}},
  year         = {2011},
  url          = {https://doi.org/10.1109/ISQED.2011.5770779},
  doi          = {10.1109/ISQED.2011.5770779},
  timestamp    = {Wed, 16 Oct 2019 14:14:55 +0200},
  biburl       = {https://dblp.org/rec/conf/isqed/BalakrishnanJB11.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/jssc/RaoJK09,
  author       = {Rahul M. Rao and
                  Keith A. Jenkins and
                  Jae{-}Joon Kim},
  title        = {A Local Random Variability Detector With Complete Digital On-Chip
                  Measurement Circuitry},
  journal      = {{IEEE} J. Solid State Circuits},
  volume       = {44},
  number       = {9},
  pages        = {2616--2623},
  year         = {2009},
  url          = {https://doi.org/10.1109/JSSC.2009.2025342},
  doi          = {10.1109/JSSC.2009.2025342},
  timestamp    = {Sun, 30 Aug 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/jssc/RaoJK09.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/JenkinsL09,
  author       = {Keith A. Jenkins and
                  Lionel Li},
  title        = {A Scalable, Digital {BIST} Circuit for Measurement and Compensation
                  of Static Phase Offset},
  booktitle    = {27th {IEEE} {VLSI} Test Symposium, {VTS} 2009, May 3-7, 2009, Santa
                  Cruz, California, {USA}},
  pages        = {185--188},
  publisher    = {{IEEE} Computer Society},
  year         = {2009},
  url          = {https://doi.org/10.1109/VTS.2009.36},
  doi          = {10.1109/VTS.2009.36},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/vts/JenkinsL09.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/jssc/MukhopadhyayKJC08,
  author       = {Saibal Mukhopadhyay and
                  Keunwoo Kim and
                  Keith A. Jenkins and
                  Ching{-}Te Chuang and
                  Kaushik Roy},
  title        = {An On-Chip Test Structure and Digital Measurement Method for Statistical
                  Characterization of Local Random Variability in a Process},
  journal      = {{IEEE} J. Solid State Circuits},
  volume       = {43},
  number       = {9},
  pages        = {1951--1963},
  year         = {2008},
  url          = {https://doi.org/10.1109/JSSC.2008.2001896},
  doi          = {10.1109/JSSC.2008.2001896},
  timestamp    = {Sun, 30 Aug 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/jssc/MukhopadhyayKJC08.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tcas/RheeJLA08,
  author       = {Woogeun Rhee and
                  Keith A. Jenkins and
                  John C. Liobe and
                  Herschel A. Ainspan},
  title        = {Experimental Analysis of Substrate Noise Effect on {PLL} Performance},
  journal      = {{IEEE} Trans. Circuits Syst. {II} Express Briefs},
  volume       = {55-II},
  number       = {7},
  pages        = {638--642},
  year         = {2008},
  url          = {https://doi.org/10.1109/TCSII.2008.921582},
  doi          = {10.1109/TCSII.2008.921582},
  timestamp    = {Sat, 09 Apr 2022 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/tcas/RheeJLA08.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/isscc/RaoJK08,
  author       = {Rahul M. Rao and
                  Keith A. Jenkins and
                  Jae{-}Joon Kim},
  title        = {A Completely Digital On-Chip Circuit for Local-Random-Variability
                  Measurement},
  booktitle    = {2008 {IEEE} International Solid-State Circuits Conference, {ISSCC}
                  2008, Digest of Technical Papers, San Francisco, CA, USA, February
                  3-7, 2008},
  pages        = {412--413},
  publisher    = {{IEEE}},
  year         = {2008},
  url          = {https://doi.org/10.1109/ISSCC.2008.4523232},
  doi          = {10.1109/ISSCC.2008.4523232},
  timestamp    = {Wed, 16 Oct 2019 14:14:55 +0200},
  biburl       = {https://dblp.org/rec/conf/isscc/RaoJK08.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/cicc/JenkinsSX07,
  author       = {Keith A. Jenkins and
                  Kenneth L. Shepard and
                  Zheng Xu},
  title        = {On-Chip Circuit for Measuring Period Jitter and Skew of Clock Distribution
                  Networks},
  booktitle    = {Proceedings of the {IEEE} 2007 Custom Integrated Circuits Conference,
                  {CICC} 2007, DoubleTree Hotel, San Jose, California, USA, September
                  16-19, 2007},
  pages        = {157--160},
  publisher    = {{IEEE}},
  year         = {2007},
  url          = {https://doi.org/10.1109/CICC.2007.4405703},
  doi          = {10.1109/CICC.2007.4405703},
  timestamp    = {Wed, 16 Oct 2019 14:14:52 +0200},
  biburl       = {https://dblp.org/rec/conf/cicc/JenkinsSX07.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/isscc/MukhopadhyayKJCR07,
  author       = {Saibal Mukhopadhyay and
                  Keunwoo Kim and
                  Keith A. Jenkins and
                  Ching{-}Te Chuang and
                  Kaushik Roy},
  title        = {Statistical Characterization and On-Chip Measurement Methods for Local
                  Random Variability of a Process Using Sense-Amplifier-Based Test Structure},
  booktitle    = {2007 {IEEE} International Solid-State Circuits Conference, {ISSCC}
                  2007, Digest of Technical Papers, San Francisco, CA, USA, February
                  11-15, 2007},
  pages        = {400--611},
  publisher    = {{IEEE}},
  year         = {2007},
  url          = {https://doi.org/10.1109/ISSCC.2007.373463},
  doi          = {10.1109/ISSCC.2007.373463},
  timestamp    = {Wed, 16 Oct 2019 14:14:55 +0200},
  biburl       = {https://dblp.org/rec/conf/isscc/MukhopadhyayKJCR07.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/ibmrd/KnickerbockerABDHJKMPPSSSSTWWMSD05,
  author       = {John U. Knickerbocker and
                  Paul S. Andry and
                  L. Paivikki Buchwalter and
                  Alina Deutsch and
                  Raymond R. Horton and
                  Keith A. Jenkins and
                  Young Hoon Kwark and
                  Gerald McVicker and
                  Chirag S. Patel and
                  Robert J. Polastre and
                  Christian D. Schuster and
                  Arun Sharma and
                  Sri M. Sri{-}Jayantha and
                  Christopher W. Surovic and
                  Cornelia K. Tsang and
                  Bucknell C. Webb and
                  Steven L. Wright and
                  Samuel R. McKnight and
                  Edmund J. Sprogis and
                  Bing Dang},
  title        = {Development of next-generation system-on-package {(SOP)} technology
                  based on silicon carriers with fine-pitch chip interconnection},
  journal      = {{IBM} J. Res. Dev.},
  volume       = {49},
  number       = {4-5},
  pages        = {725--754},
  year         = {2005},
  url          = {https://doi.org/10.1147/rd.494.0725},
  doi          = {10.1147/RD.494.0725},
  timestamp    = {Fri, 13 Mar 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/ibmrd/KnickerbockerABDHJKMPPSSSSTWWMSD05.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/esscirc/JenkinsJH05,
  author       = {Keith A. Jenkins and
                  Anup P. Jose and
                  David F. Heidel},
  editor       = {Laurent Fesquet and
                  Andreas Kaiser and
                  Sorin Cristoloveanu and
                  Michel Brillou{\"{e}}t},
  title        = {An on-chip jitter measurement circuit with sub-picosecond resolution},
  booktitle    = {Proceedings of the 31st European Solid-State Circuits Conference,
                  {ESSCIRC} 2005, Grenoble, France, 12-16 September 2005},
  pages        = {157--160},
  publisher    = {{IEEE}},
  year         = {2005},
  url          = {https://doi.org/10.1109/ESSCIR.2005.1541583},
  doi          = {10.1109/ESSCIR.2005.1541583},
  timestamp    = {Fri, 28 Apr 2023 15:39:25 +0200},
  biburl       = {https://dblp.org/rec/conf/esscirc/JenkinsJH05.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/JoseJR05,
  author       = {Anup P. Jose and
                  Keith A. Jenkins and
                  Scott K. Reynolds},
  title        = {On-Chip Spectrum Analyzer for Analog Built-In Self Test},
  booktitle    = {23rd {IEEE} {VLSI} Test Symposium {(VTS} 2005), 1-5 May 2005, Palm
                  Springs, CA, {USA}},
  pages        = {131--136},
  publisher    = {{IEEE} Computer Society},
  year         = {2005},
  url          = {https://doi.org/10.1109/VTS.2005.63},
  doi          = {10.1109/VTS.2005.63},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/vts/JoseJR05.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ets/XiaSJL04,
  author       = {Tian Xia and
                  Peilin Song and
                  Keith A. Jenkins and
                  Jien{-}Chung Lo},
  title        = {Delay chain based programmable jitter generator},
  booktitle    = {9th European Test Symposium, {ETS} 2004, Ajaccio, France, May 23-26,
                  2004},
  pages        = {16--21},
  publisher    = {{IEEE} Computer Society},
  year         = {2004},
  url          = {https://doi.org/10.1109/ETSYM.2004.1347578},
  doi          = {10.1109/ETSYM.2004.1347578},
  timestamp    = {Thu, 23 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/ets/XiaSJL04.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/PolonskyJWC04,
  author       = {Stas Polonsky and
                  Keith A. Jenkins and
                  Alan J. Weger and
                  Shinho Cho},
  title        = {{CMOS} {IC} diagnostics using the luminescence of OFF-state leakage
                  currents},
  booktitle    = {Proceedings 2004 International Test Conference {(ITC} 2004), October
                  26-28, 2004, Charlotte, NC, {USA}},
  pages        = {134--139},
  publisher    = {{IEEE} Computer Society},
  year         = {2004},
  url          = {https://doi.org/10.1109/TEST.2004.1386945},
  doi          = {10.1109/TEST.2004.1386945},
  timestamp    = {Thu, 23 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/PolonskyJWC04.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/ibmrd/PlouchartZKSTRTWWLNOPRSFKKKJR03,
  author       = {Jean{-}Olivier Plouchart and
                  Noah Zamdmer and
                  Jonghae Kim and
                  Melanie Sherony and
                  Yue Tan and
                  Asit Ray and
                  Mohamed Talbi and
                  Lawrence F. Wagner and
                  Kun Wu and
                  Naftali E. Lustig and
                  Shreesh Narasimha and
                  Patricia O'Neil and
                  Nghia Phan and
                  Michael Rohn and
                  James Strom and
                  David M. Friend and
                  Stephen V. Kosonocky and
                  Daniel R. Knebel and
                  Suhwan Kim and
                  Keith A. Jenkins and
                  Michel M. Rivier},
  title        = {Application of an {SOI} 0.12-{\(\mathrm{\mu}\)}m {CMOS} technology
                  to SoCs with low-power and high-frequency circuits},
  journal      = {{IBM} J. Res. Dev.},
  volume       = {47},
  number       = {5-6},
  pages        = {611--630},
  year         = {2003},
  url          = {https://doi.org/10.1147/rd.475.0611},
  doi          = {10.1147/RD.475.0611},
  timestamp    = {Thu, 14 Oct 2021 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/ibmrd/PlouchartZKSTRTWWLNOPRSFKKKJR03.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/jssc/RestleMWCEJARQB01,
  author       = {Phillip J. Restle and
                  Timothy G. McNamara and
                  David A. Webber and
                  Peter J. Camporese and
                  Kwok F. Eng and
                  Keith A. Jenkins and
                  David H. Allen and
                  Michael J. Rohn and
                  Michael P. Quaranta and
                  David W. Boerstler and
                  Charles J. Alpert and
                  Craig A. Carter and
                  Roger N. Bailey and
                  John G. Petrovick and
                  Byron L. Krauter and
                  Bradley D. McCredie},
  title        = {A clock distribution network for microprocessors},
  journal      = {{IEEE} J. Solid State Circuits},
  volume       = {36},
  number       = {5},
  pages        = {792--799},
  year         = {2001},
  url          = {https://doi.org/10.1109/4.918917},
  doi          = {10.1109/4.918917},
  timestamp    = {Mon, 04 Apr 2022 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/jssc/RestleMWCEJARQB01.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/JenkinsE00,
  author       = {Keith A. Jenkins and
                  James P. Eckhardt},
  title        = {Measuring Jitter and Phase Error in Microprocessor Phase-Locked Loops},
  journal      = {{IEEE} Des. Test Comput.},
  volume       = {17},
  number       = {2},
  pages        = {86--93},
  year         = {2000},
  url          = {https://doi.org/10.1109/54.844337},
  doi          = {10.1109/54.844337},
  timestamp    = {Sun, 17 May 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/dt/JenkinsE00.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/jssc/RestleJDC98,
  author       = {Phillip J. Restle and
                  Keith A. Jenkins and
                  Alina Deutsch and
                  Peter W. Cook},
  title        = {Measurement and modeling of on-chip transmission line effects in a
                  400 MHz microprocessor},
  journal      = {{IEEE} J. Solid State Circuits},
  volume       = {33},
  number       = {4},
  pages        = {662--665},
  year         = {1998},
  url          = {https://doi.org/10.1109/4.663576},
  doi          = {10.1109/4.663576},
  timestamp    = {Tue, 05 Jul 2022 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/jssc/RestleJDC98.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/jssc/BurghartzESAJ98,
  author       = {Joachim N. Burghartz and
                  Daniel C. Edelstein and
                  Mehmet Soyuer and
                  Herschel A. Ainspan and
                  Keith A. Jenkins},
  title        = {{RF} circuit design aspects of spiral inductors on silicon},
  journal      = {{IEEE} J. Solid State Circuits},
  volume       = {33},
  number       = {12},
  pages        = {2028--2034},
  year         = {1998},
  url          = {https://doi.org/10.1109/4.735544},
  doi          = {10.1109/4.735544},
  timestamp    = {Tue, 05 Jul 2022 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/jssc/BurghartzESAJ98.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/KosonockyBWHKABHHIJJPRS98,
  author       = {Stephen V. Kosonocky and
                  Arthur A. Bright and
                  Kevin W. Warren and
                  Ruud A. Haring and
                  Steve Klepner and
                  Sameh W. Asaad and
                  S. Basavaiah and
                  Bob Havreluk and
                  David F. Heidel and
                  Michael Immediato and
                  Keith A. Jenkins and
                  Rajiv V. Joshi and
                  Benjamin D. Parker and
                  T. V. Rajeevakumar and
                  Kevin Stawiasz},
  title        = {Designing a Testable System on a Chip},
  booktitle    = {16th {IEEE} {VLSI} Test Symposium {(VTS} '98), 28 April - 1 May 1998,
                  Princeton, NJ, {USA}},
  pages        = {2--7},
  publisher    = {{IEEE} Computer Society},
  year         = {1998},
  url          = {https://doi.org/10.1109/VTEST.1998.670841},
  doi          = {10.1109/VTEST.1998.670841},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/vts/KosonockyBWHKABHHIJJPRS98.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/Jenkins97,
  author       = {Keith A. Jenkins},
  title        = {Detecting and Preventing Measurement Errors},
  journal      = {{IEEE} Des. Test Comput.},
  volume       = {14},
  number       = {4},
  pages        = {78--86},
  year         = {1997},
  url          = {https://doi.org/10.1109/54.632884},
  doi          = {10.1109/54.632884},
  timestamp    = {Sun, 17 May 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/dt/Jenkins97.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/jssc/BurghartzSJKDSM97,
  author       = {Joachim N. Burghartz and
                  Mehmet Soyuer and
                  Keith A. Jenkins and
                  Michael Kies and
                  Margaret Dolan and
                  Kenneth J. Stein and
                  John Malinowski and
                  David L. Harame},
  title        = {Integrated {RF} components in a SiGe bipolar technology},
  journal      = {{IEEE} J. Solid State Circuits},
  volume       = {32},
  number       = {9},
  pages        = {1440--1445},
  year         = {1997},
  url          = {https://doi.org/10.1109/4.628759},
  doi          = {10.1109/4.628759},
  timestamp    = {Thu, 07 Jul 2022 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/jssc/BurghartzSJKDSM97.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/jssc/SoyuerBAJXSDH97,
  author       = {Mehmet Soyuer and
                  Joachim N. Burghartz and
                  Herschel A. Ainspan and
                  Keith A. Jenkins and
                  Peter Xiao and
                  Arvin R. Shahani and
                  Margaret S. Dolan and
                  David L. Harame},
  title        = {An 11 GHz 3-V SiGe voltage controlled oscillator with integrated resonator},
  journal      = {{IEEE} J. Solid State Circuits},
  volume       = {32},
  number       = {9},
  pages        = {1451--1454},
  year         = {1997},
  url          = {https://doi.org/10.1109/4.628762},
  doi          = {10.1109/4.628762},
  timestamp    = {Thu, 07 Jul 2022 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/jssc/SoyuerBAJXSDH97.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/jssc/SoyuerJBACPEP96,
  author       = {Mehmet Soyuer and
                  Keith A. Jenkins and
                  Joachim N. Burghartz and
                  Herschel A. Ainspan and
                  Frank J. Canora and
                  Slaila Ponnapalli and
                  John F. Ewen and
                  William E. Pence},
  title        = {A 2.4-GHz silicon bipolar oscillator with integrated resonator},
  journal      = {{IEEE} J. Solid State Circuits},
  volume       = {31},
  number       = {2},
  pages        = {268--270},
  year         = {1996},
  url          = {https://doi.org/10.1109/4.488006},
  doi          = {10.1109/4.488006},
  timestamp    = {Mon, 18 Jul 2022 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/jssc/SoyuerJBACPEP96.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/jssc/SoyuerJBH96,
  author       = {Mehmet Soyuer and
                  Keith A. Jenkins and
                  Joachim N. Burghartz and
                  Michael D. Hulvey},
  title        = {A 3-V 4-GHz nMOS voltage-controlled oscillator with integrated resonator},
  journal      = {{IEEE} J. Solid State Circuits},
  volume       = {31},
  number       = {12},
  pages        = {2042--2045},
  year         = {1996},
  url          = {https://doi.org/10.1109/4.545829},
  doi          = {10.1109/4.545829},
  timestamp    = {Mon, 18 Jul 2022 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/jssc/SoyuerJBH96.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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