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ORCIDBibTeX records: Michael A. Kochte
@inproceedings{DBLP:conf/date/BrandhoferKW20,
author = {Sebastian Brandhofer and
Michael A. Kochte and
Hans{-}Joachim Wunderlich},
title = {Synthesis of Fault-Tolerant Reconfigurable Scan Networks},
booktitle = {2020 Design, Automation {\&} Test in Europe Conference {\&}
Exhibition, {DATE} 2020, Grenoble, France, March 9-13, 2020},
pages = {798--803},
publisher = {{IEEE}},
year = {2020},
url = {https://doi.org/10.23919/DATE48585.2020.9116525},
doi = {10.23919/DATE48585.2020.9116525},
timestamp = {Thu, 25 Jun 2020 12:55:44 +0200},
biburl = {https://dblp.org/rec/conf/date/BrandhoferKW20.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tcad/LeeCK19,
author = {Kuen{-}Jong Lee and
Bo{-}Ren Chen and
Michael Andreas Kochte},
title = {On-Chip Self-Test Methodology With All Deterministic Compressed Test
Patterns Recorded in Scan Chains},
journal = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.},
volume = {38},
number = {2},
pages = {309--321},
year = {2019},
url = {https://doi.org/10.1109/TCAD.2018.2808241},
doi = {10.1109/TCAD.2018.2808241},
timestamp = {Thu, 24 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tcad/LeeCK19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tcad/KampmannK0SHW19,
author = {Matthias Kampmann and
Michael A. Kochte and
Chang Liu and
Eric Schneider and
Sybille Hellebrand and
Hans{-}Joachim Wunderlich},
title = {Built-In Test for Hidden Delay Faults},
journal = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.},
volume = {38},
number = {10},
pages = {1956--1968},
year = {2019},
url = {https://doi.org/10.1109/TCAD.2018.2864255},
doi = {10.1109/TCAD.2018.2864255},
timestamp = {Thu, 24 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tcad/KampmannK0SHW19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/HolstSKWW19,
author = {Stefan Holst and
Eric Schneider and
Michael A. Kochte and
Xiaoqing Wen and
Hans{-}Joachim Wunderlich},
title = {Variation-Aware Small Delay Fault Diagnosis on Compressed Test Responses},
booktitle = {{IEEE} International Test Conference, {ITC} 2019, Washington, DC,
USA, November 9-15, 2019},
pages = {1--10},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/ITC44170.2019.9000143},
doi = {10.1109/ITC44170.2019.9000143},
timestamp = {Mon, 24 Feb 2020 17:28:46 +0100},
biburl = {https://dblp.org/rec/conf/itc/HolstSKWW19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/KochteW18,
author = {Michael A. Kochte and
Hans{-}Joachim Wunderlich},
title = {Self-Test and Diagnosis for Self-Aware Systems},
journal = {{IEEE} Des. Test},
volume = {35},
number = {5},
pages = {7--18},
year = {2018},
url = {https://doi.org/10.1109/MDAT.2017.2762903},
doi = {10.1109/MDAT.2017.2762903},
timestamp = {Fri, 13 Mar 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/dt/KochteW18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/aspdac/SchneiderKW18,
author = {Eric Schneider and
Michael A. Kochte and
Hans{-}Joachim Wunderlich},
editor = {Youngsoo Shin},
title = {Multi-level timing simulation on GPUs},
booktitle = {23rd Asia and South Pacific Design Automation Conference, {ASP-DAC}
2018, Jeju, Korea (South), January 22-25, 2018},
pages = {470--475},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/ASPDAC.2018.8297368},
doi = {10.1109/ASPDAC.2018.8297368},
timestamp = {Wed, 16 Oct 2019 14:14:52 +0200},
biburl = {https://dblp.org/rec/conf/aspdac/SchneiderKW18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ets/AtteyaK0R0W18,
author = {Ahmed Atteya and
Michael A. Kochte and
Matthias Sauer and
Pascal Raiola and
Bernd Becker and
Hans{-}Joachim Wunderlich},
title = {Online prevention of security violations in reconfigurable scan networks},
booktitle = {23rd {IEEE} European Test Symposium, {ETS} 2018, Bremen, Germany,
May 28 - June 1, 2018},
pages = {1--6},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/ETS.2018.8400685},
doi = {10.1109/ETS.2018.8400685},
timestamp = {Tue, 21 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ets/AtteyaK0R0W18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iolts/RaiolaKAGW0018,
author = {Pascal Raiola and
Michael A. Kochte and
Ahmed Atteya and
Laura Rodr{\'{\i}}guez G{\'{o}}mez and
Hans{-}Joachim Wunderlich and
Bernd Becker and
Matthias Sauer},
editor = {Dimitris Gizopoulos and
Dan Alexandrescu and
Mihalis Maniatakos and
Panagiota Papavramidou},
title = {Detecting and Resolving Security Violations in Reconfigurable Scan
Networks},
booktitle = {24th {IEEE} International Symposium on On-Line Testing And Robust
System Design, {IOLTS} 2018, Platja D'Aro, Spain, July 2-4, 2018},
pages = {91--96},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/IOLTS.2018.8474188},
doi = {10.1109/IOLTS.2018.8474188},
timestamp = {Tue, 21 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/iolts/RaiolaKAGW0018.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tc/ZhangBKSWH17,
author = {Hongyan Zhang and
Lars Bauer and
Michael A. Kochte and
Eric Schneider and
Hans{-}Joachim Wunderlich and
J{\"{o}}rg Henkel},
title = {Aging Resilience and Fault Tolerance in Runtime Reconfigurable Architectures},
journal = {{IEEE} Trans. Computers},
volume = {66},
number = {6},
pages = {957--970},
year = {2017},
url = {https://doi.org/10.1109/TC.2016.2616405},
doi = {10.1109/TC.2016.2616405},
timestamp = {Tue, 24 Apr 2018 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tc/ZhangBKSWH17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tcad/SchneiderKHWW17,
author = {Eric Schneider and
Michael A. Kochte and
Stefan Holst and
Xiaoqing Wen and
Hans{-}Joachim Wunderlich},
title = {GPU-Accelerated Simulation of Small Delay Faults},
journal = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.},
volume = {36},
number = {5},
pages = {829--841},
year = {2017},
url = {https://doi.org/10.1109/TCAD.2016.2598560},
doi = {10.1109/TCAD.2016.2598560},
timestamp = {Thu, 24 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tcad/SchneiderKHWW17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tcad/HsuKL17,
author = {Wen{-}Hsuan Hsu and
Michael Andreas Kochte and
Kuen{-}Jong Lee},
title = {Built-In Test and Diagnosis for TSVs With Different Placement Topologies
and Crosstalk Impact Ranges},
journal = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.},
volume = {36},
number = {6},
pages = {1004--1017},
year = {2017},
url = {https://doi.org/10.1109/TCAD.2016.2613928},
doi = {10.1109/TCAD.2016.2613928},
timestamp = {Thu, 24 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tcad/HsuKL17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/UllKW17,
author = {Dominik Ull and
Michael A. Kochte and
Hans{-}Joachim Wunderlich},
title = {Structure-Oriented Test of Reconfigurable Scan Networks},
booktitle = {26th {IEEE} Asian Test Symposium, {ATS} 2017, Taipei City, Taiwan,
November 27-30, 2017},
pages = {127--132},
publisher = {{IEEE} Computer Society},
year = {2017},
url = {https://doi.org/10.1109/ATS.2017.34},
doi = {10.1109/ATS.2017.34},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/UllKW17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ets/KochteSGR0W17,
author = {Michael A. Kochte and
Matthias Sauer and
Laura Rodr{\'{\i}}guez G{\'{o}}mez and
Pascal Raiola and
Bernd Becker and
Hans{-}Joachim Wunderlich},
title = {Specification and verification of security in reconfigurable scan
networks},
booktitle = {22nd {IEEE} European Test Symposium, {ETS} 2017, Limassol, Cyprus,
May 22-26, 2017},
pages = {1--6},
publisher = {{IEEE}},
year = {2017},
url = {https://doi.org/10.1109/ETS.2017.7968247},
doi = {10.1109/ETS.2017.7968247},
timestamp = {Tue, 21 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ets/KochteSGR0W17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/HolstSKKMWKW17,
author = {Stefan Holst and
Eric Schneider and
Koshi Kawagoe and
Michael A. Kochte and
Kohei Miyase and
Hans{-}Joachim Wunderlich and
Seiji Kajihara and
Xiaoqing Wen},
title = {Analysis and mitigation or IR-Drop induced scan shift-errors},
booktitle = {{IEEE} International Test Conference, {ITC} 2017, Fort Worth, TX,
USA, October 31 - Nov. 2, 2017},
pages = {1--8},
publisher = {{IEEE}},
year = {2017},
url = {https://doi.org/10.1109/TEST.2017.8242055},
doi = {10.1109/TEST.2017.8242055},
timestamp = {Wed, 16 Oct 2019 14:14:52 +0200},
biburl = {https://dblp.org/rec/conf/itc/HolstSKKMWKW17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc-asia/KochteBW17,
author = {Michael A. Kochte and
Rafal Baranowski and
Hans{-}Joachim Wunderlich},
title = {Trustworthy reconfigurable access to on-chip infrastructure},
booktitle = {International Test Conference in Asia, ITC-Asia 2017, Taipei, Taiwan,
September 13-15, 2017},
pages = {119--124},
publisher = {{IEEE}},
year = {2017},
url = {https://doi.org/10.1109/ITC-ASIA.2017.8097125},
doi = {10.1109/ITC-ASIA.2017.8097125},
timestamp = {Mon, 09 Aug 2021 14:54:04 +0200},
biburl = {https://dblp.org/rec/conf/itc-asia/KochteBW17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/LiuKW17,
author = {Chang Liu and
Michael A. Kochte and
Hans{-}Joachim Wunderlich},
title = {Aging monitor reuse for small delay fault testing},
booktitle = {35th {IEEE} {VLSI} Test Symposium, {VTS} 2017, Las Vegas, NV, USA,
April 9-12, 2017},
pages = {1--6},
publisher = {{IEEE} Computer Society},
year = {2017},
url = {https://doi.org/10.1109/VTS.2017.7928921},
doi = {10.1109/VTS.2017.7928921},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/LiuKW17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/aspdac/ErbSKSWB16,
author = {Dominik Erb and
Karsten Scheibler and
Michael A. Kochte and
Matthias Sauer and
Hans{-}Joachim Wunderlich and
Bernd Becker},
title = {Mixed 01X-RSL-Encoding for fast and accurate {ATPG} with unknowns},
booktitle = {21st Asia and South Pacific Design Automation Conference, {ASP-DAC}
2016, Macao, Macao, January 25-28, 2016},
pages = {749--754},
publisher = {{IEEE}},
year = {2016},
url = {https://doi.org/10.1109/ASPDAC.2016.7428101},
doi = {10.1109/ASPDAC.2016.7428101},
timestamp = {Tue, 21 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/aspdac/ErbSKSWB16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/HolstSWKYWK16,
author = {Stefan Holst and
Eric Schneider and
Xiaoqing Wen and
Seiji Kajihara and
Yuta Yamato and
Hans{-}Joachim Wunderlich and
Michael A. Kochte},
title = {Timing-Accurate Estimation of IR-Drop Impact on Logic- and Clock-Paths
During At-Speed Scan Test},
booktitle = {25th {IEEE} Asian Test Symposium, {ATS} 2016, Hiroshima, Japan, November
21-24, 2016},
pages = {19--24},
publisher = {{IEEE} Computer Society},
year = {2016},
url = {https://doi.org/10.1109/ATS.2016.49},
doi = {10.1109/ATS.2016.49},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/HolstSWKYWK16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/KochteBSW16,
author = {Michael A. Kochte and
Rafal Baranowski and
Marcel Schaal and
Hans{-}Joachim Wunderlich},
title = {Test Strategies for Reconfigurable Scan Networks},
booktitle = {25th {IEEE} Asian Test Symposium, {ATS} 2016, Hiroshima, Japan, November
21-24, 2016},
pages = {113--118},
publisher = {{IEEE} Computer Society},
year = {2016},
url = {https://doi.org/10.1109/ATS.2016.35},
doi = {10.1109/ATS.2016.35},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/KochteBSW16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/YeKLW16,
author = {Jin{-}Cun Ye and
Michael A. Kochte and
Kuen{-}Jong Lee and
Hans{-}Joachim Wunderlich},
title = {Autonomous Testing for 3D-ICs with {IEEE} Std. 1687},
booktitle = {25th {IEEE} Asian Test Symposium, {ATS} 2016, Hiroshima, Japan, November
21-24, 2016},
pages = {215--220},
publisher = {{IEEE} Computer Society},
year = {2016},
url = {https://doi.org/10.1109/ATS.2016.56},
doi = {10.1109/ATS.2016.56},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/YeKLW16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dsn/SchollBKW16,
author = {Alexander Sch{\"{o}}ll and
Claus Braun and
Michael A. Kochte and
Hans{-}Joachim Wunderlich},
title = {Efficient Algorithm-Based Fault Tolerance for Sparse Matrix Operations},
booktitle = {46th Annual {IEEE/IFIP} International Conference on Dependable Systems
and Networks, {DSN} 2016, Toulouse, France, June 28 - July 1, 2016},
pages = {251--262},
publisher = {{IEEE} Computer Society},
year = {2016},
url = {https://doi.org/10.1109/DSN.2016.31},
doi = {10.1109/DSN.2016.31},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dsn/SchollBKW16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ets/KochteBSBW16,
author = {Michael A. Kochte and
Rafal Baranowski and
Matthias Sauer and
Bernd Becker and
Hans{-}Joachim Wunderlich},
title = {Formal verification of secure reconfigurable scan network infrastructure},
booktitle = {21th {IEEE} European Test Symposium, {ETS} 2016, Amsterdam, Netherlands,
May 23-27, 2016},
pages = {1--6},
publisher = {{IEEE}},
year = {2016},
url = {https://doi.org/10.1109/ETS.2016.7519290},
doi = {10.1109/ETS.2016.7519290},
timestamp = {Tue, 21 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ets/KochteBSBW16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/LeeTK16,
author = {Kuen{-}Jong Lee and
Pin{-}Hao Tang and
Michael A. Kochte},
title = {An on-chip self-test architecture with test patterns recorded in scan
chains},
booktitle = {2016 {IEEE} International Test Conference, {ITC} 2016, Fort Worth,
TX, USA, November 15-17, 2016},
pages = {1--10},
publisher = {{IEEE}},
year = {2016},
url = {https://doi.org/10.1109/TEST.2016.7805865},
doi = {10.1109/TEST.2016.7805865},
timestamp = {Wed, 16 Oct 2019 14:14:52 +0200},
biburl = {https://dblp.org/rec/conf/itc/LeeTK16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/latw/KochteW16,
author = {Michael A. Kochte and
Hans{-}Joachim Wunderlich},
title = {Dependable on-chip infrastructure for dependable MPSOCs},
booktitle = {17th Latin-American Test Symposium, {LATS} 2016, Foz do Iguacu, Brazil,
April 6-8, 2016},
pages = {183--188},
publisher = {{IEEE}},
year = {2016},
url = {https://doi.org/10.1109/LATW.2016.7483366},
doi = {10.1109/LATW.2016.7483366},
timestamp = {Wed, 16 Oct 2019 14:14:55 +0200},
biburl = {https://dblp.org/rec/conf/latw/KochteW16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/it/BauerHHKKRSWWWW15,
author = {Lars Bauer and
J{\"{o}}rg Henkel and
Andreas Herkersdorf and
Michael A. Kochte and
Johannes Maximilian K{\"{u}}hn and
Wolfgang Rosenstiel and
Thomas Schweizer and
Stefan Wallentowitz and
Volker Wenzel and
Thomas Wild and
Hans{-}Joachim Wunderlich and
Hongyan Zhang},
title = {Adaptive multi-layer techniques for increased system dependability},
journal = {it Inf. Technol.},
volume = {57},
number = {3},
pages = {149--158},
year = {2015},
url = {https://doi.org/10.1515/itit-2014-1082},
doi = {10.1515/ITIT-2014-1082},
timestamp = {Mon, 28 Aug 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/it/BauerHHKKRSWWWW15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tcad/BaranowskiKW15,
author = {Rafal Baranowski and
Michael A. Kochte and
Hans{-}Joachim Wunderlich},
title = {Fine-Grained Access Management in Reconfigurable Scan Networks},
journal = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.},
volume = {34},
number = {6},
pages = {937--946},
year = {2015},
url = {https://doi.org/10.1109/TCAD.2015.2391266},
doi = {10.1109/TCAD.2015.2391266},
timestamp = {Thu, 24 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tcad/BaranowskiKW15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tcad/ErbKRSWB15,
author = {Dominik Erb and
Michael A. Kochte and
Sven Reimer and
Matthias Sauer and
Hans{-}Joachim Wunderlich and
Bernd Becker},
title = {Accurate QBF-Based Test Pattern Generation in Presence of Unknown
Values},
journal = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.},
volume = {34},
number = {12},
pages = {2025--2038},
year = {2015},
url = {https://doi.org/10.1109/TCAD.2015.2440315},
doi = {10.1109/TCAD.2015.2440315},
timestamp = {Tue, 21 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/tcad/ErbKRSWB15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/todaes/BaranowskiKW15,
author = {Rafal Baranowski and
Michael A. Kochte and
Hans{-}Joachim Wunderlich},
title = {Reconfigurable Scan Networks: Modeling, Verification, and Optimal
Pattern Generation},
journal = {{ACM} Trans. Design Autom. Electr. Syst.},
volume = {20},
number = {2},
pages = {30:1--30:27},
year = {2015},
url = {https://doi.org/10.1145/2699863},
doi = {10.1145/2699863},
timestamp = {Tue, 06 Nov 2018 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/todaes/BaranowskiKW15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/AsadaWHMKKSWQ15,
author = {Koji Asada and
Xiaoqing Wen and
Stefan Holst and
Kohei Miyase and
Seiji Kajihara and
Michael A. Kochte and
Eric Schneider and
Hans{-}Joachim Wunderlich and
Jun Qian},
title = {Logic/Clock-Path-Aware At-Speed Scan Test Generation for Avoiding
False Capture Failures and Reducing Clock Stretch},
booktitle = {24th {IEEE} Asian Test Symposium, {ATS} 2015, Mumbai, India, November
22-25, 2015},
pages = {103--108},
publisher = {{IEEE} Computer Society},
year = {2015},
url = {https://doi.org/10.1109/ATS.2015.25},
doi = {10.1109/ATS.2015.25},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/AsadaWHMKKSWQ15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/KampmannKSIHW15,
author = {Matthias Kampmann and
Michael A. Kochte and
Eric Schneider and
Thomas Indlekofer and
Sybille Hellebrand and
Hans{-}Joachim Wunderlich},
title = {Optimized Selection of Frequencies for Faster-Than-at-Speed Test},
booktitle = {24th {IEEE} Asian Test Symposium, {ATS} 2015, Mumbai, India, November
22-25, 2015},
pages = {109--114},
publisher = {{IEEE} Computer Society},
year = {2015},
url = {https://doi.org/10.1109/ATS.2015.26},
doi = {10.1109/ATS.2015.26},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ats/KampmannKSIHW15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/KochteDBOMW15,
author = {Michael A. Kochte and
Atefe Dalirsani and
Andrea Bernabei and
Martin Oma{\~{n}}a and
Cecilia Metra and
Hans{-}Joachim Wunderlich},
title = {Intermittent and Transient Fault Diagnosis on Sparse Code Signatures},
booktitle = {24th {IEEE} Asian Test Symposium, {ATS} 2015, Mumbai, India, November
22-25, 2015},
pages = {157--162},
publisher = {{IEEE} Computer Society},
year = {2015},
url = {https://doi.org/10.1109/ATS.2015.34},
doi = {10.1109/ATS.2015.34},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/KochteDBOMW15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/date/SchneiderHKWW15,
author = {Eric Schneider and
Stefan Holst and
Michael A. Kochte and
Xiaoqing Wen and
Hans{-}Joachim Wunderlich},
editor = {Wolfgang Nebel and
David Atienza},
title = {GPU-accelerated small delay fault simulation},
booktitle = {Proceedings of the 2015 Design, Automation {\&} Test in Europe
Conference {\&} Exhibition, {DATE} 2015, Grenoble, France, March
9-13, 2015},
pages = {1174--1179},
publisher = {{ACM}},
year = {2015},
url = {http://dl.acm.org/citation.cfm?id=2757084},
timestamp = {Mon, 09 Aug 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/date/SchneiderHKWW15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/SchollBKW15,
author = {Alexander Sch{\"{o}}ll and
Claus Braun and
Michael A. Kochte and
Hans{-}Joachim Wunderlich},
title = {Low-overhead fault-tolerance for the preconditioned conjugate gradient
solver},
booktitle = {2015 {IEEE} International Symposium on Defect and Fault Tolerance
in {VLSI} and Nanotechnology Systems, {DFTS} 2015, Amherst, MA, USA,
October 12-14, 2015},
pages = {60--65},
publisher = {{IEEE} Computer Society},
year = {2015},
url = {https://doi.org/10.1109/DFT.2015.7315136},
doi = {10.1109/DFT.2015.7315136},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dft/SchollBKW15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iccad/ZhangKSBWH15,
author = {Hongyan Zhang and
Michael A. Kochte and
Eric Schneider and
Lars Bauer and
Hans{-}Joachim Wunderlich and
J{\"{o}}rg Henkel},
editor = {Diana Marculescu and
Frank Liu},
title = {{STRAP:} Stress-Aware Placement for Aging Mitigation in Runtime Reconfigurable
Architectures},
booktitle = {Proceedings of the {IEEE/ACM} International Conference on Computer-Aided
Design, {ICCAD} 2015, Austin, TX, USA, November 2-6, 2015},
pages = {38--45},
publisher = {{IEEE}},
year = {2015},
url = {https://doi.org/10.1109/ICCAD.2015.7372547},
doi = {10.1109/ICCAD.2015.7372547},
timestamp = {Mon, 26 Jun 2023 16:43:56 +0200},
biburl = {https://dblp.org/rec/conf/iccad/ZhangKSBWH15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iolts/SchollBKW15,
author = {Alexander Sch{\"{o}}ll and
Claus Braun and
Michael A. Kochte and
Hans{-}Joachim Wunderlich},
title = {Efficient on-line fault-tolerance for the preconditioned conjugate
gradient method},
booktitle = {21st {IEEE} International On-Line Testing Symposium, {IOLTS} 2015,
Halkidiki, Greece, July 6-8, 2015},
pages = {95--100},
publisher = {{IEEE}},
year = {2015},
url = {https://doi.org/10.1109/IOLTS.2015.7229839},
doi = {10.1109/IOLTS.2015.7229839},
timestamp = {Wed, 16 Oct 2019 14:14:52 +0200},
biburl = {https://dblp.org/rec/conf/iolts/SchollBKW15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iolts/LiuKW15,
author = {Chang Liu and
Michael A. Kochte and
Hans{-}Joachim Wunderlich},
title = {Efficient observation point selection for aging monitoring},
booktitle = {21st {IEEE} International On-Line Testing Symposium, {IOLTS} 2015,
Halkidiki, Greece, July 6-8, 2015},
pages = {176--181},
publisher = {{IEEE}},
year = {2015},
url = {https://doi.org/10.1109/IOLTS.2015.7229855},
doi = {10.1109/IOLTS.2015.7229855},
timestamp = {Wed, 28 Feb 2018 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/iolts/LiuKW15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@phdthesis{DBLP:phd/dnb/Kochte14,
author = {Michael A. Kochte},
title = {Boolean reasoning for digital circuits in presence of unknown values:
application to test automation},
school = {University of Stuttgart},
year = {2014},
url = {http://elib.uni-stuttgart.de/opus/volltexte/2014/9320/},
urn = {urn:nbn:de:bsz:93-opus-93201},
timestamp = {Sat, 17 Jul 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/phd/dnb/Kochte14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/BaranowskiKW14,
author = {Rafal Baranowski and
Michael A. Kochte and
Hans{-}Joachim Wunderlich},
title = {Access Port Protection for Reconfigurable Scan Networks},
journal = {J. Electron. Test.},
volume = {30},
number = {6},
pages = {711--723},
year = {2014},
url = {https://doi.org/10.1007/s10836-014-5484-2},
doi = {10.1007/S10836-014-5484-2},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/BaranowskiKW14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/HerkersdorfAEGGHKKKMNRRSSTTWWW14,
author = {Andreas Herkersdorf and
Hananeh Aliee and
Michael Engel and
Michael Gla{\ss} and
Christina Gimmler{-}Dumont and
J{\"{o}}rg Henkel and
Veit Kleeberger and
Michael A. Kochte and
Johannes Maximilian K{\"{u}}hn and
Daniel Mueller{-}Gritschneder and
Sani R. Nassif and
Holm Rauchfuss and
Wolfgang Rosenstiel and
Ulf Schlichtmann and
Muhammad Shafique and
Mehdi Baradaran Tahoori and
J{\"{u}}rgen Teich and
Norbert Wehn and
Christian Weis and
Hans{-}Joachim Wunderlich},
title = {Resilience Articulation Point {(RAP):} Cross-layer dependability modeling
for nanometer system-on-chip resilience},
journal = {Microelectron. Reliab.},
volume = {54},
number = {6-7},
pages = {1066--1074},
year = {2014},
url = {https://doi.org/10.1016/j.microrel.2013.12.012},
doi = {10.1016/J.MICROREL.2013.12.012},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/HerkersdorfAEGGHKKKMNRRSSTTWWW14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/todaes/ErbKSHSWB14,
author = {Dominik Erb and
Michael A. Kochte and
Matthias Sauer and
Stefan Hillebrecht and
Tobias Schubert and
Hans{-}Joachim Wunderlich and
Bernd Becker},
title = {Exact Logic and Fault Simulation in Presence of Unknowns},
journal = {{ACM} Trans. Design Autom. Electr. Syst.},
volume = {19},
number = {3},
pages = {28:1--28:17},
year = {2014},
url = {https://doi.org/10.1145/2611760},
doi = {10.1145/2611760},
timestamp = {Tue, 21 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/todaes/ErbKSHSWB14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dac/ZhangKIBWH14,
author = {Hongyan Zhang and
Michael A. Kochte and
Michael E. Imhof and
Lars Bauer and
Hans{-}Joachim Wunderlich and
J{\"{o}}rg Henkel},
title = {{GUARD:} GUAranteed Reliability in Dynamically Reconfigurable Systems},
booktitle = {The 51st Annual Design Automation Conference 2014, {DAC} '14, San
Francisco, CA, USA, June 1-5, 2014},
pages = {32:1--32:6},
publisher = {{ACM}},
year = {2014},
url = {https://doi.org/10.1145/2593069.2593146},
doi = {10.1145/2593069.2593146},
timestamp = {Tue, 06 Nov 2018 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dac/ZhangKIBWH14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iolts/DalirsaniKW14,
author = {Atefe Dalirsani and
Michael A. Kochte and
Hans{-}Joachim Wunderlich},
title = {Area-efficient synthesis of fault-secure NoC switches},
booktitle = {2014 {IEEE} 20th International On-Line Testing Symposium, {IOLTS}
2014, Platja d'Aro, Girona, Spain, July 7-9, 2014},
pages = {13--18},
publisher = {{IEEE}},
year = {2014},
url = {https://doi.org/10.1109/IOLTS.2014.6873662},
doi = {10.1109/IOLTS.2014.6873662},
timestamp = {Wed, 16 Oct 2019 14:14:52 +0200},
biburl = {https://dblp.org/rec/conf/iolts/DalirsaniKW14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ErbSKSWB14,
author = {Dominik Erb and
Karsten Scheibler and
Michael A. Kochte and
Matthias Sauer and
Hans{-}Joachim Wunderlich and
Bernd Becker},
title = {Test pattern generation in presence of unknown values based on restricted
symbolic logic},
booktitle = {2014 International Test Conference, {ITC} 2014, Seattle, WA, USA,
October 20-23, 2014},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/TEST.2014.7035350},
doi = {10.1109/TEST.2014.7035350},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/ErbSKSWB14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/HellebrandIKKLW14,
author = {Sybille Hellebrand and
Thomas Indlekofer and
Matthias Kampmann and
Michael A. Kochte and
Chang Liu and
Hans{-}Joachim Wunderlich},
title = {{FAST-BIST:} Faster-than-at-Speed {BIST} targeting hidden delay defects},
booktitle = {2014 International Test Conference, {ITC} 2014, Seattle, WA, USA,
October 20-23, 2014},
pages = {1--8},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/TEST.2014.7035360},
doi = {10.1109/TEST.2014.7035360},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/HellebrandIKKLW14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/mbmv/BaranowskiKW14,
author = {Rafal Baranowski and
Michael A. Kochte and
Hans{-}Joachim Wunderlich},
editor = {J{\"{u}}rgen Ruf and
Dirk Allmendinger and
Matteo Michel},
title = {Verifikation Rekonfigurierbarer Scan-Netze},
booktitle = {Methoden und Beschreibungssprachen zur Modellierung und Verifikation
von Schaltungen und Systemen, {MBMV} 2014, B{\"{o}}blingen, Germany},
pages = {137--146},
publisher = {Cuvillier},
year = {2014},
timestamp = {Thu, 13 Mar 2014 18:26:03 +0100},
biburl = {https://dblp.org/rec/conf/mbmv/BaranowskiKW14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/YamatoMKWWK13,
author = {Yuta Yamato and
Kohei Miyase and
Seiji Kajihara and
Xiaoqing Wen and
Laung{-}Terng Wang and
Michael A. Kochte},
title = {{LCTI-SS:} Low-Clock-Tree-Impact Scan Segmentation for Avoiding Shift
Timing Failures in Scan Testing},
journal = {{IEEE} Des. Test},
volume = {30},
number = {4},
pages = {60--70},
year = {2013},
url = {https://doi.org/10.1109/MDT.2012.2221152},
doi = {10.1109/MDT.2012.2221152},
timestamp = {Fri, 13 Mar 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/dt/YamatoMKWWK13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tc/BauerBIKSZHW13,
author = {Lars Bauer and
Claus Braun and
Michael E. Imhof and
Michael A. Kochte and
Eric Schneider and
Hongyan Zhang and
J{\"{o}}rg Henkel and
Hans{-}Joachim Wunderlich},
title = {Test Strategies for Reliable Runtime Reconfigurable Architectures},
journal = {{IEEE} Trans. Computers},
volume = {62},
number = {8},
pages = {1494--1507},
year = {2013},
url = {https://doi.org/10.1109/TC.2013.53},
doi = {10.1109/TC.2013.53},
timestamp = {Tue, 24 Apr 2018 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tc/BauerBIKSZHW13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/ErbKSWB13,
author = {Dominik Erb and
Michael A. Kochte and
Matthias Sauer and
Hans{-}Joachim Wunderlich and
Bernd Becker},
title = {Accurate Multi-cycle {ATPG} in Presence of X-Values},
booktitle = {22nd Asian Test Symposium, {ATS} 2013, Yilan County, Taiwan, November
18-21, 2013},
pages = {245--250},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/ATS.2013.53},
doi = {10.1109/ATS.2013.53},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/ErbKSWB13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/BaranowskiKW13,
author = {Rafal Baranowski and
Michael A. Kochte and
Hans{-}Joachim Wunderlich},
title = {Securing Access to Reconfigurable Scan Networks},
booktitle = {22nd Asian Test Symposium, {ATS} 2013, Yilan County, Taiwan, November
18-21, 2013},
pages = {295--300},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/ATS.2013.61},
doi = {10.1109/ATS.2013.61},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/BaranowskiKW13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/date/HillebrechtKEWB13,
author = {Stefan Hillebrecht and
Michael A. Kochte and
Dominik Erb and
Hans{-}Joachim Wunderlich and
Bernd Becker},
editor = {Enrico Macii},
title = {Accurate QBF-based test pattern generation in presence of unknown
values},
booktitle = {Design, Automation and Test in Europe, {DATE} 13, Grenoble, France,
March 18-22, 2013},
pages = {436--441},
publisher = {{EDA} Consortium San Jose, CA, {USA} / {ACM} {DL}},
year = {2013},
url = {https://doi.org/10.7873/DATE.2013.098},
doi = {10.7873/DATE.2013.098},
timestamp = {Tue, 21 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/date/HillebrechtKEWB13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/DalirsaniKW13,
author = {Atefe Dalirsani and
Michael A. Kochte and
Hans{-}Joachim Wunderlich},
title = {SAT-based code synthesis for fault-secure circuits},
booktitle = {2013 {IEEE} International Symposium on Defect and Fault Tolerance
in {VLSI} and Nanotechnology Systems, {DFTS} 2013, New York City,
NY, USA, October 2-4, 2013},
pages = {39--44},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/DFT.2013.6653580},
doi = {10.1109/DFT.2013.6653580},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dft/DalirsaniKW13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ets/BaranowskiKW13,
author = {Rafal Baranowski and
Michael A. Kochte and
Hans{-}Joachim Wunderlich},
title = {Scan pattern retargeting and merging with reduced access time},
booktitle = {18th {IEEE} European Test Symposium, {ETS} 2013, Avignon, France,
May 27-30, 2013},
pages = {1--7},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/ETS.2013.6569354},
doi = {10.1109/ETS.2013.6569354},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ets/BaranowskiKW13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ZhangBKSBIWH13,
author = {Hongyan Zhang and
Lars Bauer and
Michael A. Kochte and
Eric Schneider and
Claus Braun and
Michael E. Imhof and
Hans{-}Joachim Wunderlich and
J{\"{o}}rg Henkel},
title = {Module diversification: Fault tolerance and aging mitigation for runtime
reconfigurable architectures},
booktitle = {2013 {IEEE} International Test Conference, {ITC} 2013, Anaheim, CA,
USA, September 6-13, 2013},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/TEST.2013.6651926},
doi = {10.1109/TEST.2013.6651926},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/ZhangBKSBIWH13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tcad/KochteEW12,
author = {Michael A. Kochte and
Melanie Elm and
Hans{-}Joachim Wunderlich},
title = {Accurate X-Propagation for Test Applications by SAT-Based Reasoning},
journal = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.},
volume = {31},
number = {12},
pages = {1908--1919},
year = {2012},
url = {https://doi.org/10.1109/TCAD.2012.2210422},
doi = {10.1109/TCAD.2012.2210422},
timestamp = {Thu, 24 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tcad/KochteEW12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ahs/BauerBIKZWH12,
author = {Lars Bauer and
Claus Braun and
Michael E. Imhof and
Michael A. Kochte and
Hongyan Zhang and
Hans{-}Joachim Wunderlich and
J{\"{o}}rg Henkel},
editor = {Umeshkumar D. Patel and
Khaled Benkrid and
David Merodio},
title = {{OTERA:} Online test strategies for reliable reconfigurable architectures
- Invited paper for the {AHS-2012} special session "Dependability
by reconfigurable hardware"},
booktitle = {2012 {NASA/ESA} Conference on Adaptive Hardware and Systems, {AHS}
2012, Erlangen, Germany, June 25-28, 2012},
pages = {38--45},
publisher = {{IEEE}},
year = {2012},
url = {https://doi.org/10.1109/AHS.2012.6268667},
doi = {10.1109/AHS.2012.6268667},
timestamp = {Wed, 16 Oct 2019 14:14:52 +0200},
biburl = {https://dblp.org/rec/conf/ahs/BauerBIKZWH12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ets/HillebrechtKWB12,
author = {Stefan Hillebrecht and
Michael A. Kochte and
Hans{-}Joachim Wunderlich and
Bernd Becker},
title = {Exact stuck-at fault classification in presence of unknowns},
booktitle = {17th {IEEE} European Test Symposium, {ETS} 2012, Annecy, France, May
28 - June 1 2012},
pages = {1--6},
publisher = {{IEEE} Computer Society},
year = {2012},
url = {https://doi.org/10.1109/ETS.2012.6233017},
doi = {10.1109/ETS.2012.6233017},
timestamp = {Tue, 21 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ets/HillebrechtKWB12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iolts/AbdelfattahBBIKZHW12,
author = {Mohamed Abdelfattah and
Lars Bauer and
Claus Braun and
Michael E. Imhof and
Michael A. Kochte and
Hongyan Zhang and
J{\"{o}}rg Henkel and
Hans{-}Joachim Wunderlich},
title = {Transparent structural online test for reconfigurable systems},
booktitle = {18th {IEEE} International On-Line Testing Symposium, {IOLTS} 2012,
Sitges, Spain, June 27-29, 2012},
pages = {37--42},
publisher = {{IEEE} Computer Society},
year = {2012},
url = {https://doi.org/10.1109/IOLTS.2012.6313838},
doi = {10.1109/IOLTS.2012.6313838},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/iolts/AbdelfattahBBIKZHW12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/BaranowskiKW12,
author = {Rafal Baranowski and
Michael A. Kochte and
Hans{-}Joachim Wunderlich},
title = {Modeling, verification and pattern generation for reconfigurable scan
networks},
booktitle = {2012 {IEEE} International Test Conference, {ITC} 2012, Anaheim, CA,
USA, November 5-8, 2012},
pages = {1--9},
publisher = {{IEEE} Computer Society},
year = {2012},
url = {https://doi.org/10.1109/TEST.2012.6401555},
doi = {10.1109/TEST.2012.6401555},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/BaranowskiKW12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/chinaf/BaranowskiCHIKPWZ11,
author = {Rafal Baranowski and
Stefano Di Carlo and
Nadereh Hatami and
Michael E. Imhof and
Michael A. Kochte and
Paolo Prinetto and
Hans{-}Joachim Wunderlich and
Christian G. Zoellin},
title = {Efficient multi-level fault simulation of {HW/SW} systems for structural
faults},
journal = {Sci. China Inf. Sci.},
volume = {54},
number = {9},
pages = {1784--1796},
year = {2011},
url = {https://doi.org/10.1007/s11432-011-4366-9},
doi = {10.1007/S11432-011-4366-9},
timestamp = {Tue, 21 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/chinaf/BaranowskiCHIKPWZ11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/KochteKMWW11,
author = {Michael A. Kochte and
Sandip Kundu and
Kohei Miyase and
Xiaoqing Wen and
Hans{-}Joachim Wunderlich},
title = {Efficient BDD-based Fault Simulation in Presence of Unknown Values},
booktitle = {Proceedings of the 20th {IEEE} Asian Test Symposium, {ATS} 2011, New
Delhi, India, November 20-23, 2011},
pages = {383--388},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/ATS.2011.52},
doi = {10.1109/ATS.2011.52},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/KochteKMWW11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/date/KochteW11,
author = {Michael A. Kochte and
Hans{-}Joachim Wunderlich},
title = {SAT-based fault coverage evaluation in the presence of unknown values},
booktitle = {Design, Automation and Test in Europe, {DATE} 2011, Grenoble, France,
March 14-18, 2011},
pages = {1303--1308},
publisher = {{IEEE}},
year = {2011},
url = {https://doi.org/10.1109/DATE.2011.5763209},
doi = {10.1109/DATE.2011.5763209},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/date/KochteW11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/islped/KochteMWKYEW11,
author = {Michael A. Kochte and
Kohei Miyase and
Xiaoqing Wen and
Seiji Kajihara and
Yuta Yamato and
Kazunari Enokimoto and
Hans{-}Joachim Wunderlich},
editor = {Naehyuck Chang and
Hiroshi Nakamura and
Koji Inoue and
Kenichi Osada and
Massimo Poncino},
title = {SAT-based capture-power reduction for at-speed broadcast-scan-based
test compression architectures},
booktitle = {Proceedings of the 2011 International Symposium on Low Power Electronics
and Design, 2011, Fukuoka, Japan, August 1-3, 2011},
pages = {33--38},
publisher = {{IEEE/ACM}},
year = {2011},
url = {http://portal.acm.org/citation.cfm?id=2016812\&\#38;CFID=34981777\&\#38;CFTOKEN=25607807},
timestamp = {Mon, 13 Aug 2012 09:40:34 +0200},
biburl = {https://dblp.org/rec/conf/islped/KochteMWKYEW11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/YamatoWKMKW11,
author = {Yuta Yamato and
Xiaoqing Wen and
Michael A. Kochte and
Kohei Miyase and
Seiji Kajihara and
Laung{-}Terng Wang},
editor = {Bill Eklow and
R. D. (Shawn) Blanton},
title = {A novel scan segmentation design method for avoiding shift timing
failure in scan testing},
booktitle = {2011 {IEEE} International Test Conference, {ITC} 2011, Anaheim, CA,
USA, September 20-22, 2011},
pages = {1--8},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/TEST.2011.6139162},
doi = {10.1109/TEST.2011.6139162},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/YamatoWKMKW11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/WenEMYKKGT11,
author = {Xiaoqing Wen and
Kazunari Enokimoto and
Kohei Miyase and
Yuta Yamato and
Michael A. Kochte and
Seiji Kajihara and
Patrick Girard and
Mohammad Tehranipoor},
title = {Power-aware test generation with guaranteed launch safety for at-speed
scan testing},
booktitle = {29th {IEEE} {VLSI} Test Symposium, {VTS} 2011, May 1-5, 2011, Dana
Point, California, {USA}},
pages = {166--171},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/VTS.2011.5783778},
doi = {10.1109/VTS.2011.5783778},
timestamp = {Wed, 16 Oct 2019 14:14:54 +0200},
biburl = {https://dblp.org/rec/conf/vts/WenEMYKKGT11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/KochteZW10,
author = {Michael A. Kochte and
Christian G. Zoellin and
Hans{-}Joachim Wunderlich},
title = {Efficient Concurrent Self-Test with Partially Specified Patterns},
journal = {J. Electron. Test.},
volume = {26},
number = {5},
pages = {581--594},
year = {2010},
url = {https://doi.org/10.1007/s10836-010-5167-6},
doi = {10.1007/S10836-010-5167-6},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/KochteZW10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/KochteZBIWHCP10,
author = {Michael A. Kochte and
Christian G. Zoellin and
Rafal Baranowski and
Michael E. Imhof and
Hans{-}Joachim Wunderlich and
Nadereh Hatami and
Stefano Di Carlo and
Paolo Prinetto},
title = {Efficient Simulation of Structural Faults for the Reliability Evaluation
at System-Level},
booktitle = {Proceedings of the 19th {IEEE} Asian Test Symposium, {ATS} 2010, 1-4
December 2010, Shanghai, China},
pages = {3--8},
publisher = {{IEEE} Computer Society},
year = {2010},
url = {https://doi.org/10.1109/ATS.2010.10},
doi = {10.1109/ATS.2010.10},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/KochteZBIWHCP10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/ElmKW10,
author = {Melanie Elm and
Michael A. Kochte and
Hans{-}Joachim Wunderlich},
title = {On Determining the Real Output Xs by SAT-Based Reasoning},
booktitle = {Proceedings of the 19th {IEEE} Asian Test Symposium, {ATS} 2010, 1-4
December 2010, Shanghai, China},
pages = {39--44},
publisher = {{IEEE} Computer Society},
year = {2010},
url = {https://doi.org/10.1109/ATS.2010.16},
doi = {10.1109/ATS.2010.16},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/ElmKW10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dac/KochteSWZ10,
author = {Michael A. Kochte and
Marcel Schaal and
Hans{-}Joachim Wunderlich and
Christian G. Zoellin},
editor = {Sachin S. Sapatnekar},
title = {Efficient fault simulation on many-core processors},
booktitle = {Proceedings of the 47th Design Automation Conference, {DAC} 2010,
Anaheim, California, USA, July 13-18, 2010},
pages = {380--385},
publisher = {{ACM}},
year = {2010},
url = {https://doi.org/10.1145/1837274.1837369},
doi = {10.1145/1837274.1837369},
timestamp = {Tue, 06 Nov 2018 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dac/KochteSWZ10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/KochteZBIWHCP10,
author = {Michael A. Kochte and
Christian G. Zoellin and
Rafal Baranowski and
Michael E. Imhof and
Hans{-}Joachim Wunderlich and
Nadereh Hatami and
Stefano Di Carlo and
Paolo Prinetto},
editor = {Ron Press and
Erik H. Volkerink},
title = {System reliability evaluation using concurrent multi-level simulation
of structural faults},
booktitle = {2011 {IEEE} International Test Conference, {ITC} 2010, Austin, TX,
USA, November 2-4, 2010},
pages = {817},
publisher = {{IEEE} Computer Society},
year = {2010},
url = {https://doi.org/10.1109/TEST.2010.5699309},
doi = {10.1109/TEST.2010.5699309},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/KochteZBIWHCP10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/date/KochteZIKRWCP09,
author = {Michael A. Kochte and
Christian G. Zoellin and
Michael E. Imhof and
Rauf Salimi Khaligh and
Martin Radetzki and
Hans{-}Joachim Wunderlich and
Stefano Di Carlo and
Paolo Prinetto},
editor = {Luca Benini and
Giovanni De Micheli and
Bashir M. Al{-}Hashimi and
Wolfgang M{\"{u}}ller},
title = {Test exploration and validation using transaction level models},
booktitle = {Design, Automation and Test in Europe, {DATE} 2009, Nice, France,
April 20-24, 2009},
pages = {1250--1253},
publisher = {{IEEE}},
year = {2009},
url = {https://doi.org/10.1109/DATE.2009.5090856},
doi = {10.1109/DATE.2009.5090856},
timestamp = {Wed, 16 Oct 2019 14:14:53 +0200},
biburl = {https://dblp.org/rec/conf/date/KochteZIKRWCP09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ets/KochteZW09,
author = {Michael A. Kochte and
Christian G. Zoellin and
Hans{-}Joachim Wunderlich},
title = {Concurrent Self-Test with Partially Specified Patterns for Low Test
Latency and Overhead},
booktitle = {14th {IEEE} European Test Symposium, {ETS} 2009, Sevilla, Spain, May
25-29, 2009},
pages = {53--58},
publisher = {{IEEE} Computer Society},
year = {2009},
url = {https://doi.org/10.1109/ETS.2009.26},
doi = {10.1109/ETS.2009.26},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ets/KochteZW09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ets/KochteHEW09,
author = {Michael A. Kochte and
Stefan Holst and
Melanie Elm and
Hans{-}Joachim Wunderlich},
title = {Test Encoding for Extreme Response Compaction},
booktitle = {14th {IEEE} European Test Symposium, {ETS} 2009, Sevilla, Spain, May
25-29, 2009},
pages = {155--160},
publisher = {{IEEE} Computer Society},
year = {2009},
url = {https://doi.org/10.1109/ETS.2009.22},
doi = {10.1109/ETS.2009.22},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ets/KochteHEW09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/cf/KochteN08,
author = {Michael A. Kochte and
Ramesh Natarajan},
editor = {Alex Ram{\'{\i}}rez and
Gianfranco Bilardi and
Michael Gschwind},
title = {A framework for scheduling parallel dbms user-defined programs on
an attached high-performance computer},
booktitle = {Proceedings of the 5th Conference on Computing Frontiers, 2008, Ischia,
Italy, May 5-7, 2008},
pages = {97--104},
publisher = {{ACM}},
year = {2008},
url = {https://doi.org/10.1145/1366230.1366245},
doi = {10.1145/1366230.1366245},
timestamp = {Tue, 06 Nov 2018 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/cf/KochteN08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/delta/KochteZIW08,
author = {Michael A. Kochte and
Christian G. Zoellin and
Michael E. Imhof and
Hans{-}Joachim Wunderlich},
title = {Test Set Stripping Limiting the Maximum Number of Specified Bits},
booktitle = {4th {IEEE} International Symposium on Electronic Design, Test and
Applications, {DELTA} 2008, Hong Kong, January 23-25, 2008},
pages = {581--586},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/DELTA.2008.64},
doi = {10.1109/DELTA.2008.64},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/delta/KochteZIW08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
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