BibTeX records: J. Maciak

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@article{DBLP:journals/mr/MroozKPSVBM01,
  author    = {O. Mrooz and
               A. Kovalski and
               J. Pogorzelska and
               O. Shpotyuk and
               M. Vakiv and
               Bohdan S. Butkiewicz and
               J. Maciak},
  title     = {Thermoelectrical degradation processes in {NTC} thermistors for in-rush
               current protection of electronic circuits},
  journal   = {Microelectronics Reliability},
  volume    = {41},
  number    = {5},
  pages     = {773--777},
  year      = {2001},
  url       = {https://doi.org/10.1016/S0026-2714(01)00027-0},
  doi       = {10.1016/S0026-2714(01)00027-0},
  timestamp = {Fri, 02 Nov 2018 00:00:00 +0100},
  biburl    = {https://dblp.org/rec/bib/journals/mr/MroozKPSVBM01},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
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