BibTeX records: A. S. Oates

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@inproceedings{DBLP:conf/irps/ChenLOL18,
  author    = {Pin{-}Shiang Chen and
               Shou{-}Chung Lee and
               A. S. Oates and
               C. W. Liu},
  title     = {{BEOL} {TDDB} reliability modeling and lifetime prediction using critical
               energy to breakdown},
  booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2018, Burlingame,
               CA, USA, March 11-15, 2018},
  pages     = {6},
  year      = {2018},
  crossref  = {DBLP:conf/irps/2018},
  url       = {https://doi.org/10.1109/IRPS.2018.8353626},
  doi       = {10.1109/IRPS.2018.8353626},
  timestamp = {Tue, 22 Jan 2019 16:39:11 +0100},
  biburl    = {https://dblp.org/rec/bib/conf/irps/ChenLOL18},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/OngLO18,
  author    = {Yi Ching Ong and
               Shou{-}Chung Lee and
               A. S. Oates},
  title     = {Percolation defect nucleation and growth as a description of the statistics
               of electrical breakdown for gate, {MOL} and {BEOL} dielectrics},
  booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2018, Burlingame,
               CA, USA, March 11-15, 2018},
  pages     = {7--1},
  year      = {2018},
  crossref  = {DBLP:conf/irps/2018},
  url       = {https://doi.org/10.1109/IRPS.2018.8353667},
  doi       = {10.1109/IRPS.2018.8353667},
  timestamp = {Tue, 22 Jan 2019 16:39:11 +0100},
  biburl    = {https://dblp.org/rec/bib/conf/irps/OngLO18},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/LinO15,
  author    = {M. H. Lin and
               A. S. Oates},
  title     = {Mechanisms of electromigration under {AC} and pulsed-DC stress in
               Cu/low-k dual damascene interconnects},
  booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2015, Monterey,
               CA, USA, April 19-23, 2015},
  pages     = {2},
  year      = {2015},
  crossref  = {DBLP:conf/irps/2015},
  url       = {https://doi.org/10.1109/IRPS.2015.7112681},
  doi       = {10.1109/IRPS.2015.7112681},
  timestamp = {Sun, 21 May 2017 01:00:00 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/irps/LinO15},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/LeeO15,
  author    = {Shou{-}Chung Lee and
               A. S. Oates},
  title     = {On the voltage dependence of copper/low-k dielectric breakdown},
  booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2015, Monterey,
               CA, USA, April 19-23, 2015},
  pages     = {3},
  year      = {2015},
  crossref  = {DBLP:conf/irps/2015},
  url       = {https://doi.org/10.1109/IRPS.2015.7112699},
  doi       = {10.1109/IRPS.2015.7112699},
  timestamp = {Sun, 21 May 2017 01:00:00 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/irps/LeeO15},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/OatesL06,
  author    = {A. S. Oates and
               Shou{-}Chung Lee},
  title     = {Electromigration failure distributions of dual damascene Cu /low -
               k interconnects},
  journal   = {Microelectronics Reliability},
  volume    = {46},
  number    = {9-11},
  pages     = {1581--1586},
  year      = {2006},
  url       = {https://doi.org/10.1016/j.microrel.2006.07.038},
  doi       = {10.1016/j.microrel.2006.07.038},
  timestamp = {Sun, 28 May 2017 01:00:00 +0200},
  biburl    = {https://dblp.org/rec/bib/journals/mr/OatesL06},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/SouzaMSOC04,
  author    = {Merlyne M. De Souza and
               S. K. Manhas and
               D. Chandra Sekhar and
               A. S. Oates and
               Prasad Chaparala},
  title     = {Influence of mobility model on extraction of stress dependent source-drain
               series resistance},
  journal   = {Microelectronics Reliability},
  volume    = {44},
  number    = {1},
  pages     = {25--32},
  year      = {2004},
  url       = {https://doi.org/10.1016/j.microrel.2003.09.005},
  doi       = {10.1016/j.microrel.2003.09.005},
  timestamp = {Sun, 28 May 2017 01:00:00 +0200},
  biburl    = {https://dblp.org/rec/bib/journals/mr/SouzaMSOC04},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ManhasSOS03,
  author    = {S. K. Manhas and
               D. Chandra Sekhar and
               A. S. Oates and
               Merlyne M. De Souza},
  title     = {Characterisation of series resistance degradation through charge pumping
               technique},
  journal   = {Microelectronics Reliability},
  volume    = {43},
  number    = {4},
  pages     = {617--624},
  year      = {2003},
  url       = {https://doi.org/10.1016/S0026-2714(03)00017-9},
  doi       = {10.1016/S0026-2714(03)00017-9},
  timestamp = {Sun, 28 May 2017 01:00:00 +0200},
  biburl    = {https://dblp.org/rec/bib/journals/mr/ManhasSOS03},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/SouzaWMNO01,
  author    = {Merlyne M. De Souza and
               J. Wang and
               S. K. Manhas and
               E. M. Sankara Narayanan and
               A. S. Oates},
  title     = {A comparison of early stage hot carrier degradation behaviour in 5
               and 3 {V} sub-micron low doped drain metal oxide semiconductor field
               effect transistors},
  journal   = {Microelectronics Reliability},
  volume    = {41},
  number    = {2},
  pages     = {169--177},
  year      = {2001},
  url       = {https://doi.org/10.1016/S0026-2714(00)00210-9},
  doi       = {10.1016/S0026-2714(00)00210-9},
  timestamp = {Sun, 28 May 2017 01:00:00 +0200},
  biburl    = {https://dblp.org/rec/bib/journals/mr/SouzaWMNO01},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/isqed/LiLYMCCZO01,
  author    = {Wei Li and
               Qiang Li and
               J. S. Yuan and
               Joshua McConkey and
               Yuan Chen and
               Sundar Chetlur and
               Jonathan Zhou and
               A. S. Oates},
  title     = {Hot-carrier-Induced Circuit Degradation for 0.18 {\(\mathrm{\mu}\)}m
               {CMOS} Technology},
  booktitle = {2nd International Symposium on Quality of Electronic Design {(ISQED}
               2001), 26-28 March 2001, San Jose, CA, {USA}},
  pages     = {284--289},
  year      = {2001},
  crossref  = {DBLP:conf/isqed/2001},
  url       = {https://doi.org/10.1109/ISQED.2001.915244},
  doi       = {10.1109/ISQED.2001.915244},
  timestamp = {Thu, 25 May 2017 01:00:00 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/isqed/LiLYMCCZO01},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/irps/2018,
  title     = {{IEEE} International Reliability Physics Symposium, {IRPS} 2018, Burlingame,
               CA, USA, March 11-15, 2018},
  publisher = {{IEEE}},
  year      = {2018},
  url       = {http://ieeexplore.ieee.org/xpl/mostRecentIssue.jsp?punumber=8345372},
  isbn      = {978-1-5386-5479-8},
  timestamp = {Tue, 22 Jan 2019 16:39:11 +0100},
  biburl    = {https://dblp.org/rec/bib/conf/irps/2018},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/irps/2015,
  title     = {{IEEE} International Reliability Physics Symposium, {IRPS} 2015, Monterey,
               CA, USA, April 19-23, 2015},
  publisher = {{IEEE}},
  year      = {2015},
  url       = {http://ieeexplore.ieee.org/xpl/mostRecentIssue.jsp?punumber=7106273},
  isbn      = {978-1-4673-7362-3},
  timestamp = {Mon, 07 Mar 2016 09:32:18 +0100},
  biburl    = {https://dblp.org/rec/bib/conf/irps/2015},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/isqed/2001,
  title     = {2nd International Symposium on Quality of Electronic Design {(ISQED}
               2001), 26-28 March 2001, San Jose, CA, {USA}},
  publisher = {{IEEE} Computer Society},
  year      = {2001},
  url       = {http://ieeexplore.ieee.org/xpl/mostRecentIssue.jsp?punumber=7308},
  isbn      = {0-7695-1025-6},
  timestamp = {Fri, 26 Sep 2014 14:08:23 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/isqed/2001},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
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