BibTeX records: Bob Podnar

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@inproceedings{DBLP:conf/itc/TendolkarBSPGKCBTTA06,
  author       = {Nandu Tendolkar and
                  Dawit Belete and
                  Bill Schwarz and
                  Bob Podnar and
                  Akshay Gupta and
                  Steve Karako and
                  Wu{-}Tung Cheng and
                  Alex Babin and
                  Kun{-}Han Tsai and
                  Nagesh Tamarapalli and
                  Greg Aldrich},
  editor       = {Scott Davidson and
                  Anne Gattiker},
  title        = {Improving Transition Fault Test Pattern Quality through At-Speed Diagnosis},
  booktitle    = {2006 {IEEE} International Test Conference, {ITC} 2006, Santa Clara,
                  CA, USA, October 22-27, 2006},
  pages        = {1--9},
  publisher    = {{IEEE} Computer Society},
  year         = {2006},
  url          = {https://doi.org/10.1109/TEST.2006.297623},
  doi          = {10.1109/TEST.2006.297623},
  timestamp    = {Tue, 12 Dec 2023 09:46:27 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/TendolkarBSPGKCBTTA06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}