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ORCIDBibTeX records: Janusz Rajski
@article{DBLP:journals/tcad/RajskiTTW24,
author = {Janusz Rajski and
Maciej Trawka and
Jerzy Tyszer and
Bartosz Wlodarczak},
title = {H\({}_{\mbox{2}}\)B: Crypto Hash Functions Based on Hybrid Ring Generators},
journal = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.},
volume = {43},
number = {2},
pages = {442--455},
year = {2024},
url = {https://doi.org/10.1109/TCAD.2023.3320633},
doi = {10.1109/TCAD.2023.3320633},
timestamp = {Thu, 29 Feb 2024 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/tcad/RajskiTTW24.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tcad/JoeMPR24,
author = {Jerin Joe and
Nilanjan Mukherjee and
Irith Pomeranz and
Janusz Rajski},
title = {Generation of Two-Cycle Tests for Structurally Similar Circuits},
journal = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.},
volume = {43},
number = {2},
pages = {694--703},
year = {2024},
url = {https://doi.org/10.1109/TCAD.2023.3321973},
doi = {10.1109/TCAD.2023.3321973},
timestamp = {Thu, 29 Feb 2024 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/tcad/JoeMPR24.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tcad/RajskiTTW23,
author = {Janusz Rajski and
Maciej Trawka and
Jerzy Tyszer and
Bartosz Wlodarczak},
title = {A Lightweight True Random Number Generator for Root of Trust Applications},
journal = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.},
volume = {42},
number = {9},
pages = {2815--2825},
year = {2023},
url = {https://doi.org/10.1109/TCAD.2023.3237957},
doi = {10.1109/TCAD.2023.3237957},
timestamp = {Thu, 14 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tcad/RajskiTTW23.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tcad/MrugalskiRTW23,
author = {Grzegorz Mrugalski and
Janusz Rajski and
Jerzy Tyszer and
Bartosz Wlodarczak},
title = {X-Masking for Deterministic In-System Tests},
journal = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.},
volume = {42},
number = {11},
pages = {4260--4269},
year = {2023},
url = {https://doi.org/10.1109/TCAD.2023.3261781},
doi = {10.1109/TCAD.2023.3261781},
timestamp = {Thu, 09 Nov 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/tcad/MrugalskiRTW23.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tvlsi/EggersglussMRT23,
author = {Stephan Eggersgl{\"{u}}{\ss} and
Sylwester Milewski and
Janusz Rajski and
Jerzy Tyszer},
title = {A New Static Compaction of Deterministic Test Sets},
journal = {{IEEE} Trans. Very Large Scale Integr. Syst.},
volume = {31},
number = {4},
pages = {411--420},
year = {2023},
url = {https://doi.org/10.1109/TVLSI.2023.3240246},
doi = {10.1109/TVLSI.2023.3240246},
timestamp = {Sat, 29 Apr 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tvlsi/EggersglussMRT23.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ets/RajskiTTW23,
author = {Janusz Rajski and
Maciej Trawka and
Jerzy Tyszer and
Bartosz Wlodarczak},
title = {Hybrid Ring Generators for In-System Test Applications},
booktitle = {{IEEE} European Test Symposium, {ETS} 2023, Venezia, Italy, May 22-26,
2023},
pages = {1--6},
publisher = {{IEEE}},
year = {2023},
url = {https://doi.org/10.1109/ETS56758.2023.10174093},
doi = {10.1109/ETS56758.2023.10174093},
timestamp = {Fri, 14 Jul 2023 22:01:39 +0200},
biburl = {https://dblp.org/rec/conf/ets/RajskiTTW23.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tcad/KaczmarekM0PR0T22,
author = {Bartosz Kaczmarek and
Grzegorz Mrugalski and
Nilanjan Mukherjee and
Artur Pogiel and
Janusz Rajski and
Lukasz Rybak and
Jerzy Tyszer},
title = {{LBIST} for Automotive ICs With Enhanced Test Generation},
journal = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.},
volume = {41},
number = {7},
pages = {2290--2300},
year = {2022},
url = {https://doi.org/10.1109/TCAD.2021.3100741},
doi = {10.1109/TCAD.2021.3100741},
timestamp = {Tue, 28 Jun 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tcad/KaczmarekM0PR0T22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tcad/YeZT0LCRZKR22,
author = {Chong{-}Siao Ye and
Shi{-}Xuan Zheng and
Fong{-}Jyun Tsai and
Chen Wang and
Kuen{-}Jong Lee and
Wu{-}Tung Cheng and
Sudhakar M. Reddy and
Justyna Zawada and
Mark Kassab and
Janusz Rajski},
title = {Efficient Test Compression Configuration Selection},
journal = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.},
volume = {41},
number = {7},
pages = {2323--2336},
year = {2022},
url = {https://doi.org/10.1109/TCAD.2021.3099100},
doi = {10.1109/TCAD.2021.3099100},
timestamp = {Tue, 28 Jun 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tcad/YeZT0LCRZKR22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ets/MrugalskiRTW22,
author = {Grzegorz Mrugalski and
Janusz Rajski and
Jerzy Tyszer and
Bartosz Wlodarczak},
title = {X-Masking for In-System Deterministic Test},
booktitle = {{IEEE} European Test Symposium, {ETS} 2022, Barcelona, Spain, May
23-27, 2022},
pages = {1--6},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/ETS54262.2022.9810407},
doi = {10.1109/ETS54262.2022.9810407},
timestamp = {Tue, 05 Jul 2022 16:47:06 +0200},
biburl = {https://dblp.org/rec/conf/ets/MrugalskiRTW22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/MrugalskiRTW22,
author = {Grzegorz Mrugalski and
Janusz Rajski and
Jerzy Tyszer and
Bartosz Wlodarczak},
title = {{DIST:} Deterministic In-System Test with X-masking},
booktitle = {{IEEE} International Test Conference, {ITC} 2022, Anaheim, CA, USA,
September 23-30, 2022},
pages = {20--27},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/ITC50671.2022.00008},
doi = {10.1109/ITC50671.2022.00008},
timestamp = {Thu, 05 Jan 2023 13:13:27 +0100},
biburl = {https://dblp.org/rec/conf/itc/MrugalskiRTW22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Joe0PR22,
author = {Jerin Joe and
Nilanjan Mukherjee and
Irith Pomeranz and
Janusz Rajski},
title = {Test Generation for an Iterative Design Flow with {RTL} Changes},
booktitle = {{IEEE} International Test Conference, {ITC} 2022, Anaheim, CA, USA,
September 23-30, 2022},
pages = {305--313},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/ITC50671.2022.00039},
doi = {10.1109/ITC50671.2022.00039},
timestamp = {Thu, 05 Jan 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Joe0PR22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/RajskiTTW22,
author = {Janusz Rajski and
Maciej Trawka and
Jerzy Tyszer and
Bartosz Wlodarczak},
title = {Hardware Root of Trust for SSN-basedDFT Ecosystems},
booktitle = {{IEEE} International Test Conference, {ITC} 2022, Anaheim, CA, USA,
September 23-30, 2022},
pages = {479--483},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/ITC50671.2022.00056},
doi = {10.1109/ITC50671.2022.00056},
timestamp = {Thu, 05 Jan 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/RajskiTTW22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/JoeMPR22,
author = {Jerin Joe and
Nilanjan Mukherjee and
Irith Pomeranz and
Janusz Rajski},
title = {Fast Test Generation for Structurally Similar Circuits},
booktitle = {40th {IEEE} {VLSI} Test Symposium, {VTS} 2022, San Diego, CA, USA,
April 25-27, 2022},
pages = {1--7},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/VTS52500.2021.9794232},
doi = {10.1109/VTS52500.2021.9794232},
timestamp = {Wed, 22 Jun 2022 15:24:48 +0200},
biburl = {https://dblp.org/rec/conf/vts/JoeMPR22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/ZhengYLWCKRR22,
author = {Shi{-}Xuan Zheng and
Chung{-}Yu Yeh and
Kuen{-}Jong Lee and
Chen Wang and
Wu{-}Tung Cheng and
Mark Kassab and
Janusz Rajski and
Sudhakar M. Reddy},
title = {Accurate Estimation of Test Pattern Counts for a Wide-Range of {EDT}
Input/Output Channel Configurations},
booktitle = {40th {IEEE} {VLSI} Test Symposium, {VTS} 2022, San Diego, CA, USA,
April 25-27, 2022},
pages = {1--7},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/VTS52500.2021.9794207},
doi = {10.1109/VTS52500.2021.9794207},
timestamp = {Wed, 22 Jun 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/vts/ZhengYLWCKRR22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tcad/HapkeHMBVDGFR21,
author = {Friedrich Hapke and
Will Howell and
Peter C. Maxwell and
Edward Brazil and
Srikanth Venkataraman and
Rudrajit Dutta and
Andreas Glowatz and
Anja Fast and
Janusz Rajski},
title = {Defect-Oriented Test: Effectiveness in High Volume Manufacturing},
journal = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.},
volume = {40},
number = {3},
pages = {584--597},
year = {2021},
url = {https://doi.org/10.1109/TCAD.2020.3001259},
doi = {10.1109/TCAD.2020.3001259},
timestamp = {Thu, 27 Jul 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tcad/HapkeHMBVDGFR21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tetc/ChengMMRTT21,
author = {Wu{-}Tung Cheng and
Sylwester Milewski and
Grzegorz Mrugalski and
Janusz Rajski and
Maciej Trawka and
Jerzy Tyszer},
title = {Autonomous Scan Patterns for Laser Voltage Imaging},
journal = {{IEEE} Trans. Emerg. Top. Comput.},
volume = {9},
number = {2},
pages = {680--691},
year = {2021},
url = {https://doi.org/10.1109/TETC.2019.2944590},
doi = {10.1109/TETC.2019.2944590},
timestamp = {Tue, 15 Jun 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tetc/ChengMMRTT21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tvlsi/MukherjeeTSLMMM21,
author = {Nilanjan Mukherjee and
Daniel Tille and
Mahendar Sapati and
Yingdi Liu and
Jeffrey Mayer and
Sylwester Milewski and
Elham K. Moghaddam and
Janusz Rajski and
Jedrzej Solecki and
Jerzy Tyszer},
title = {Time and Area Optimized Testing of Automotive ICs},
journal = {{IEEE} Trans. Very Large Scale Integr. Syst.},
volume = {29},
number = {1},
pages = {76--88},
year = {2021},
url = {https://doi.org/10.1109/TVLSI.2020.3025138},
doi = {10.1109/TVLSI.2020.3025138},
timestamp = {Thu, 11 Feb 2021 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/tvlsi/MukherjeeTSLMMM21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tvlsi/LiuMMMRTW21,
author = {Yingdi Liu and
Sylwester Milewski and
Grzegorz Mrugalski and
Nilanjan Mukherjee and
Janusz Rajski and
Jerzy Tyszer and
Bartosz Wlodarczak},
title = {X-Tolerant Compactor maXpress for In-System Test Applications With
Observation Scan},
journal = {{IEEE} Trans. Very Large Scale Integr. Syst.},
volume = {29},
number = {8},
pages = {1553--1566},
year = {2021},
url = {https://doi.org/10.1109/TVLSI.2021.3092421},
doi = {10.1109/TVLSI.2021.3092421},
timestamp = {Thu, 12 Aug 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tvlsi/LiuMMMRTW21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ets/GrzelakKPRT21,
author = {Bartosz Grzelak and
Martin Keim and
Artur Pogiel and
Janusz Rajski and
Jerzy Tyszer},
title = {Convolutional Compaction-Based {MRAM} Fault Diagnosis},
booktitle = {26th {IEEE} European Test Symposium, {ETS} 2021, Bruges, Belgium,
May 24-28, 2021},
pages = {1--6},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/ETS50041.2021.9465464},
doi = {10.1109/ETS50041.2021.9465464},
timestamp = {Fri, 02 Jul 2021 14:14:26 +0200},
biburl = {https://dblp.org/rec/conf/ets/GrzelakKPRT21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/EggersglussMRT21,
author = {Stephan Eggersgl{\"{u}}{\ss} and
Sylwester Milewski and
Janusz Rajski and
Jerzy Tyszer},
title = {On Reduction of Deterministic Test Pattern Sets},
booktitle = {{IEEE} International Test Conference, {ITC} 2021, Anaheim, CA, USA,
October 10-15, 2021},
pages = {260--267},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/ITC50571.2021.00035},
doi = {10.1109/ITC50571.2021.00035},
timestamp = {Mon, 29 Nov 2021 13:19:22 +0100},
biburl = {https://dblp.org/rec/conf/itc/EggersglussMRT21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/ChengMRTT20,
author = {Wu{-}Tung Cheng and
Grzegorz Mrugalski and
Janusz Rajski and
Maciej Trawka and
Jerzy Tyszer},
title = {Scan Integrity Tests for {EDT} Compression},
journal = {{IEEE} Des. Test},
volume = {37},
number = {4},
pages = {21--26},
year = {2020},
url = {https://doi.org/10.1109/MDAT.2020.2968271},
doi = {10.1109/MDAT.2020.2968271},
timestamp = {Thu, 14 Oct 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/dt/ChengMRTT20.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tcad/Liu0RRT20,
author = {Yingdi Liu and
Nilanjan Mukherjee and
Janusz Rajski and
Sudhakar M. Reddy and
Jerzy Tyszer},
title = {Deterministic Stellar {BIST} for Automotive ICs},
journal = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.},
volume = {39},
number = {8},
pages = {1699--1710},
year = {2020},
url = {https://doi.org/10.1109/TCAD.2019.2925353},
doi = {10.1109/TCAD.2019.2925353},
timestamp = {Thu, 24 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tcad/Liu0RRT20.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tcad/HuangMRTW20,
author = {Yu Huang and
Sylwester Milewski and
Janusz Rajski and
Jerzy Tyszer and
Chen Wang},
title = {Low Cost Hypercompression of Test Data},
journal = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.},
volume = {39},
number = {10},
pages = {2964--2975},
year = {2020},
url = {https://doi.org/10.1109/TCAD.2019.2945760},
doi = {10.1109/TCAD.2019.2945760},
timestamp = {Tue, 06 Oct 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tcad/HuangMRTW20.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ets/KaczmarekM0RRT20,
author = {Bartosz Kaczmarek and
Grzegorz Mrugalski and
Nilanjan Mukherjee and
Janusz Rajski and
Lukasz Rybak and
Jerzy Tyszer},
title = {Test Sequence-Optimized {BIST} for Automotive Applications},
booktitle = {{IEEE} European Test Symposium, {ETS} 2020, Tallinn, Estonia, May
25-29, 2020},
pages = {1--6},
publisher = {{IEEE}},
year = {2020},
url = {https://doi.org/10.1109/ETS48528.2020.9131585},
doi = {10.1109/ETS48528.2020.9131585},
timestamp = {Wed, 22 Jun 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ets/KaczmarekM0RRT20.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ets/TsaiY0LCRKR20,
author = {Fong{-}Jyun Tsai and
Chong{-}Siao Ye and
Yu Huang and
Kuen{-}Jong Lee and
Wu{-}Tung Cheng and
Sudhakar M. Reddy and
Mark Kassab and
Janusz Rajski},
title = {Efficient Prognostication of Pattern Count with Different Input Compression
Ratios},
booktitle = {{IEEE} European Test Symposium, {ETS} 2020, Tallinn, Estonia, May
25-29, 2020},
pages = {1--2},
publisher = {{IEEE}},
year = {2020},
url = {https://doi.org/10.1109/ETS48528.2020.9131586},
doi = {10.1109/ETS48528.2020.9131586},
timestamp = {Thu, 14 Oct 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ets/TsaiY0LCRKR20.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/CoteKJRMKOERCMY20,
author = {Jean{-}Fran{\c{c}}ois C{\^{o}}t{\'{e}} and
Mark Kassab and
Wojciech Janiszewski and
Ricardo Rodrigues and
Reinhard Meier and
Bartosz Kaczmarek and
Peter Orlando and
Geir Eide and
Janusz Rajski and
Glenn Col{\'{o}}n{-}Bonet and
Naveen Mysore and
Ya Yin and
Pankaj Pant},
title = {Streaming Scan Network {(SSN):} An Efficient Packetized Data Network
for Testing of Complex SoCs},
booktitle = {{IEEE} International Test Conference, {ITC} 2020, Washington, DC,
USA, November 1-6, 2020},
pages = {1--10},
publisher = {{IEEE}},
year = {2020},
url = {https://doi.org/10.1109/ITC44778.2020.9325233},
doi = {10.1109/ITC44778.2020.9325233},
timestamp = {Wed, 27 Jan 2021 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/CoteKJRMKOERCMY20.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/LiuMM0RTW20,
author = {Yingdi Liu and
Sylwester Milewski and
Grzegorz Mrugalski and
Nilanjan Mukherjee and
Janusz Rajski and
Jerzy Tyszer and
Bartosz Wldarczak},
title = {X-Tolerant Tunable Compactor for In-System Test},
booktitle = {{IEEE} International Test Conference, {ITC} 2020, Washington, DC,
USA, November 1-6, 2020},
pages = {1--10},
publisher = {{IEEE}},
year = {2020},
url = {https://doi.org/10.1109/ITC44778.2020.9325266},
doi = {10.1109/ITC44778.2020.9325266},
timestamp = {Mon, 25 Jan 2021 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/LiuMM0RTW20.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/TsaiYLZ0CRKRWZ20,
author = {Fong{-}Jyun Tsai and
Chong{-}Siao Ye and
Kuen{-}Jong Lee and
Shi{-}Xuan Zheng and
Yu Huang and
Wu{-}Tung Cheng and
Sudhakar M. Reddy and
Mark Kassab and
Janusz Rajski and
Chen Wang and
Justyna Zawada},
title = {Prediction of Test Pattern Count and Test Data Volume for Scan Architectures
under Different Input Channel Configurations},
booktitle = {{IEEE} International Test Conference, {ITC} 2020, Washington, DC,
USA, November 1-6, 2020},
pages = {1--10},
publisher = {{IEEE}},
year = {2020},
url = {https://doi.org/10.1109/ITC44778.2020.9325219},
doi = {10.1109/ITC44778.2020.9325219},
timestamp = {Wed, 22 Jun 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/TsaiYLZ0CRKRWZ20.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc-asia/TsaiY0LCRKRZ20,
author = {Fong{-}Jyun Tsai and
Chong{-}Siao Ye and
Yu Huang and
Kuen{-}Jong Lee and
Wu{-}Tung Cheng and
Sudhakar M. Reddy and
Mark Kassab and
Janusz Rajski and
Shi{-}Xuan Zheng},
title = {Estimation of Test Data Volume for Scan Architectures with Different
Numbers of Input Channels},
booktitle = {{IEEE} International Test Conference in Asia, ITC-Asia 2020, Taipei,
Taiwan, September 23-25, 2020},
pages = {130--135},
publisher = {{IEEE}},
year = {2020},
url = {https://doi.org/10.1109/ITC-Asia51099.2020.00034},
doi = {10.1109/ITC-ASIA51099.2020.00034},
timestamp = {Thu, 14 Oct 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc-asia/TsaiY0LCRKRZ20.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/HuangRK0M20,
author = {Yu Huang and
Janusz Rajski and
Mark Kassab and
Nilanjan Mukherjee and
Jeffrey Mayer},
title = {Effective Design of Layout-Friendly {EDT} Decompressor},
booktitle = {38th {IEEE} {VLSI} Test Symposium, {VTS} 2020, San Diego, CA, USA,
April 5-8, 2020},
pages = {1--6},
publisher = {{IEEE}},
year = {2020},
url = {https://doi.org/10.1109/VTS48691.2020.9107623},
doi = {10.1109/VTS48691.2020.9107623},
timestamp = {Thu, 22 Oct 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/vts/HuangRK0M20.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tcad/MoghaddamMRSTZ19,
author = {Elham K. Moghaddam and
Nilanjan Mukherjee and
Janusz Rajski and
Jedrzej Solecki and
Jerzy Tyszer and
Justyna Zawada},
title = {Logic {BIST} With Capture-Per-Clock Hybrid Test Points},
journal = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.},
volume = {38},
number = {6},
pages = {1028--1041},
year = {2019},
url = {https://doi.org/10.1109/TCAD.2018.2834441},
doi = {10.1109/TCAD.2018.2834441},
timestamp = {Thu, 24 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tcad/MoghaddamMRSTZ19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/MukherjeeTTSLMM19,
author = {Nilanjan Mukherjee and
Jerzy Tyszer and
Daniel Tille and
Mahendar Sapati and
Yingdi Liu and
Jeffrey Mayer and
Sylwester Milewski and
Elham K. Moghaddam and
Janusz Rajski and
Jedrzej Solecki},
title = {Test Time and Area Optimized BrST Scheme for Automotive ICs},
booktitle = {{IEEE} International Test Conference, {ITC} 2019, Washington, DC,
USA, November 9-15, 2019},
pages = {1--10},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/ITC44170.2019.9000133},
doi = {10.1109/ITC44170.2019.9000133},
timestamp = {Mon, 24 Feb 2020 17:28:46 +0100},
biburl = {https://dblp.org/rec/conf/itc/MukherjeeTTSLMM19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/ChengMRTT19,
author = {Wu{-}Tung Cheng and
Grzegorz Mrugalski and
Janusz Rajski and
Maciej Trawka and
Jerzy Tyszer},
title = {On Cyclic Scan Integrity Tests for EDT-based Compression},
booktitle = {37th {IEEE} {VLSI} Test Symposium, {VTS} 2019, Monterey, CA, USA,
April 23-25, 2019},
pages = {1--6},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/VTS.2019.8758670},
doi = {10.1109/VTS.2019.8758670},
timestamp = {Thu, 14 Oct 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/vts/ChengMRTT19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tcad/ChenMMRTZ18,
author = {Michael Chen and
Elham K. Moghaddam and
Nilanjan Mukherjee and
Janusz Rajski and
Jerzy Tyszer and
Justyna Zawada},
title = {Hardware Protection via Logic Locking Test Points},
journal = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.},
volume = {37},
number = {12},
pages = {3020--3030},
year = {2018},
url = {https://doi.org/10.1109/TCAD.2018.2801240},
doi = {10.1109/TCAD.2018.2801240},
timestamp = {Thu, 24 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tcad/ChenMMRTZ18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/0005MRT018,
author = {Yu Huang and
Sylwester Milewski and
Janusz Rajski and
Jerzy Tyszer and
Chen Wang},
title = {Hypercompression of Test Patterns},
booktitle = {{IEEE} International Test Conference, {ITC} 2018, Phoenix, AZ, USA,
October 29 - Nov. 1, 2018},
pages = {1--9},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/TEST.2018.8624868},
doi = {10.1109/TEST.2018.8624868},
timestamp = {Wed, 16 Oct 2019 14:14:52 +0200},
biburl = {https://dblp.org/rec/conf/itc/0005MRT018.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/HowellHBVDGRSFR18,
author = {Will Howell and
Friedrich Hapke and
Edward Brazil and
Srikanth Venkataraman and
R. Datta and
Andreas Glowatz and
Wilfried Redemund and
J. Schmerberg and
Anja Fast and
Janusz Rajski},
title = {{DPPM} Reduction Methods and New Defect Oriented Test Methods Applied
to Advanced FinFET Technologies},
booktitle = {{IEEE} International Test Conference, {ITC} 2018, Phoenix, AZ, USA,
October 29 - Nov. 1, 2018},
pages = {1--10},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/TEST.2018.8624906},
doi = {10.1109/TEST.2018.8624906},
timestamp = {Mon, 01 Mar 2021 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/HowellHBVDGRSFR18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Liu0RRT18,
author = {Yingdi Liu and
Nilanjan Mukherjee and
Janusz Rajski and
Sudhakar M. Reddy and
Jerzy Tyszer},
title = {Deterministic Stellar {BIST} for In-System Automotive Test},
booktitle = {{IEEE} International Test Conference, {ITC} 2018, Phoenix, AZ, USA,
October 29 - Nov. 1, 2018},
pages = {1--9},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/TEST.2018.8624872},
doi = {10.1109/TEST.2018.8624872},
timestamp = {Sat, 26 Jan 2019 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Liu0RRT18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/RajskiTZ18,
author = {Janusz Rajski and
Jerzy Tyszer and
Justyna Zawada},
title = {On New Class of Test Points and Their Applications},
booktitle = {{IEEE} International Test Conference, {ITC} 2018, Phoenix, AZ, USA,
October 29 - Nov. 1, 2018},
pages = {1--9},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/TEST.2018.8624900},
doi = {10.1109/TEST.2018.8624900},
timestamp = {Sat, 26 Jan 2019 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/RajskiTZ18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/LiuRRST18,
author = {Yingdi Liu and
Janusz Rajski and
Sudhakar M. Reddy and
Jedrzej Solecki and
Jerzy Tyszer},
title = {Staggered {ATPG} with capture-per-cycle observation test points},
booktitle = {36th {IEEE} {VLSI} Test Symposium, {VTS} 2018, San Francisco, CA,
USA, April 22-25, 2018},
pages = {1--6},
publisher = {{IEEE} Computer Society},
year = {2018},
url = {https://doi.org/10.1109/VTS.2018.8368647},
doi = {10.1109/VTS.2018.8368647},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/LiuRRST18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tcad/MrugalskiRRST17,
author = {Grzegorz Mrugalski and
Janusz Rajski and
Lukasz Rybak and
Jedrzej Solecki and
Jerzy Tyszer},
title = {Star-EDT: Deterministic On-Chip Scheme Using Compressed Test Patterns},
journal = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.},
volume = {36},
number = {4},
pages = {683--693},
year = {2017},
url = {https://doi.org/10.1109/TCAD.2016.2597214},
doi = {10.1109/TCAD.2016.2597214},
timestamp = {Wed, 22 Jun 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tcad/MrugalskiRRST17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tvlsi/MrugalskiRSTW17,
author = {Grzegorz Mrugalski and
Janusz Rajski and
Jedrzej Solecki and
Jerzy Tyszer and
Chen Wang},
title = {Trimodal Scan-Based Test Paradigm},
journal = {{IEEE} Trans. Very Large Scale Integr. Syst.},
volume = {25},
number = {3},
pages = {1112--1125},
year = {2017},
url = {https://doi.org/10.1109/TVLSI.2016.2608984},
doi = {10.1109/TVLSI.2016.2608984},
timestamp = {Wed, 11 Mar 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/tvlsi/MrugalskiRSTW17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tvlsi/AceroFLMMPRRTZ17,
author = {Cesar Acero and
Derek Feltham and
Yingdi Liu and
Elham K. Moghaddam and
Nilanjan Mukherjee and
Marek Patyra and
Janusz Rajski and
Sudhakar M. Reddy and
Jerzy Tyszer and
Justyna Zawada},
title = {Embedded Deterministic Test Points},
journal = {{IEEE} Trans. Very Large Scale Integr. Syst.},
volume = {25},
number = {10},
pages = {2949--2961},
year = {2017},
url = {https://doi.org/10.1109/TVLSI.2017.2717844},
doi = {10.1109/TVLSI.2017.2717844},
timestamp = {Wed, 11 Mar 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/tvlsi/AceroFLMMPRRTZ17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ets/PogielRT17,
author = {Artur Pogiel and
Janusz Rajski and
Jerzy Tyszer},
title = {{ROM} fault diagnosis for O(n\({}^{\mbox{2}}\)) test algorithms},
booktitle = {22nd {IEEE} European Test Symposium, {ETS} 2017, Limassol, Cyprus,
May 22-26, 2017},
pages = {1--6},
publisher = {{IEEE}},
year = {2017},
url = {https://doi.org/10.1109/ETS.2017.7968229},
doi = {10.1109/ETS.2017.7968229},
timestamp = {Wed, 16 Oct 2019 14:14:53 +0200},
biburl = {https://dblp.org/rec/conf/ets/PogielRT17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/MilewskiMRSTZ17,
author = {Sylwester Milewski and
Nilanjan Mukherjee and
Janusz Rajski and
Jedrzej Solecki and
Jerzy Tyszer and
Justyna Zawada},
title = {Full-scan {LBIST} with capture-per-cycle hybrid test points},
booktitle = {{IEEE} International Test Conference, {ITC} 2017, Fort Worth, TX,
USA, October 31 - Nov. 2, 2017},
pages = {1--9},
publisher = {{IEEE}},
year = {2017},
url = {https://doi.org/10.1109/TEST.2017.8242036},
doi = {10.1109/TEST.2017.8242036},
timestamp = {Wed, 16 Oct 2019 14:14:52 +0200},
biburl = {https://dblp.org/rec/conf/itc/MilewskiMRSTZ17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/AceroFPHMMNRTZ16,
author = {Cesar Acero and
Derek Feltham and
Marek Patyra and
Friedrich Hapke and
Elham K. Moghaddam and
Nilanjan Mukherjee and
Vidya Neerkundar and
Janusz Rajski and
Jerzy Tyszer and
Justyna Zawada},
title = {On New Test Points for Compact Cell-Aware Tests},
journal = {{IEEE} Des. Test},
volume = {33},
number = {6},
pages = {7--14},
year = {2016},
url = {https://doi.org/10.1109/MDAT.2016.2590980},
doi = {10.1109/MDAT.2016.2590980},
timestamp = {Fri, 13 Mar 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/dt/AceroFPHMMNRTZ16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/MoghaddamMRTZ16,
author = {Elham K. Moghaddam and
Nilanjan Mukherjee and
Janusz Rajski and
Jerzy Tyszer and
Justyna Zawada},
title = {On Test Points Enhancing Hardware Security},
booktitle = {25th {IEEE} Asian Test Symposium, {ATS} 2016, Hiroshima, Japan, November
21-24, 2016},
pages = {61--66},
publisher = {{IEEE} Computer Society},
year = {2016},
url = {https://doi.org/10.1109/ATS.2016.24},
doi = {10.1109/ATS.2016.24},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/MoghaddamMRTZ16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ets/LinRR16,
author = {Xijiang Lin and
Sudhakar M. Reddy and
Janusz Rajski},
title = {Transistor stuck-on fault detection tests for digital {CMOS} circuits},
booktitle = {21th {IEEE} European Test Symposium, {ETS} 2016, Amsterdam, Netherlands,
May 23-27, 2016},
pages = {1--6},
publisher = {{IEEE}},
year = {2016},
url = {https://doi.org/10.1109/ETS.2016.7519329},
doi = {10.1109/ETS.2016.7519329},
timestamp = {Wed, 16 Oct 2019 14:14:53 +0200},
biburl = {https://dblp.org/rec/conf/ets/LinRR16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/LiuMMRRT16,
author = {Yingdi Liu and
Elham K. Moghaddam and
Nilanjan Mukherjee and
Sudhakar M. Reddy and
Janusz Rajski and
Jerzy Tyszer},
title = {Minimal area test points for deterministic patterns},
booktitle = {2016 {IEEE} International Test Conference, {ITC} 2016, Fort Worth,
TX, USA, November 15-17, 2016},
pages = {1--7},
publisher = {{IEEE}},
year = {2016},
url = {https://doi.org/10.1109/TEST.2016.7805825},
doi = {10.1109/TEST.2016.7805825},
timestamp = {Wed, 16 Oct 2019 14:14:52 +0200},
biburl = {https://dblp.org/rec/conf/itc/LiuMMRRT16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/MoghaddamMRTZ16,
author = {Elham K. Moghaddam and
Nilanjan Mukherjee and
Janusz Rajski and
Jerzy Tyszer and
Justyna Zawada},
title = {Test point insertion in hybrid test compression/LBIST architectures},
booktitle = {2016 {IEEE} International Test Conference, {ITC} 2016, Fort Worth,
TX, USA, November 15-17, 2016},
pages = {1--10},
publisher = {{IEEE}},
year = {2016},
url = {https://doi.org/10.1109/TEST.2016.7805826},
doi = {10.1109/TEST.2016.7805826},
timestamp = {Fri, 02 Mar 2018 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/MoghaddamMRTZ16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vlsid/MukherjeeR16,
author = {Nilanjan Mukherjee and
Janusz Rajski},
title = {Digital Testing of ICs for Automotive Applications},
booktitle = {29th International Conference on {VLSI} Design and 15th International
Conference on Embedded Systems, {VLSID} 2016, Kolkata, India, January
4-8, 2016},
pages = {14--16},
publisher = {{IEEE} Computer Society},
year = {2016},
url = {https://doi.org/10.1109/VLSID.2016.134},
doi = {10.1109/VLSID.2016.134},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vlsid/MukherjeeR16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tcad/0004KMMRRTW15,
author = {Amit Kumar and
Mark Kassab and
Elham K. Moghaddam and
Nilanjan Mukherjee and
Janusz Rajski and
Sudhakar M. Reddy and
Jerzy Tyszer and
Chen Wang},
title = {Isometric Test Data Compression},
journal = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.},
volume = {34},
number = {11},
pages = {1847--1859},
year = {2015},
url = {https://doi.org/10.1109/TCAD.2015.2432133},
doi = {10.1109/TCAD.2015.2432133},
timestamp = {Thu, 24 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tcad/0004KMMRRTW15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tvlsi/ChengDGHJKMMRT15,
author = {Wu{-}Tung Cheng and
Yan Dong and
Grady Giles and
Yu Huang and
Jakub Janicki and
Mark Kassab and
Grzegorz Mrugalski and
Nilanjan Mukherjee and
Janusz Rajski and
Jerzy Tyszer},
title = {Scan Test Bandwidth Management for Ultralarge-Scale System-on-Chip
Architectures},
journal = {{IEEE} Trans. Very Large Scale Integr. Syst.},
volume = {23},
number = {6},
pages = {1050--1062},
year = {2015},
url = {https://doi.org/10.1109/TVLSI.2014.2332469},
doi = {10.1109/TVLSI.2014.2332469},
timestamp = {Wed, 11 Mar 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/tvlsi/ChengDGHJKMMRT15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tvlsi/FilipekMMNRST15,
author = {Michal Filipek and
Grzegorz Mrugalski and
Nilanjan Mukherjee and
Benoit Nadeau{-}Dostie and
Janusz Rajski and
Jedrzej Solecki and
Jerzy Tyszer},
title = {Low-Power Programmable {PRPG} With Test Compression Capabilities},
journal = {{IEEE} Trans. Very Large Scale Integr. Syst.},
volume = {23},
number = {6},
pages = {1063--1076},
year = {2015},
url = {https://doi.org/10.1109/TVLSI.2014.2332465},
doi = {10.1109/TVLSI.2014.2332465},
timestamp = {Wed, 11 Mar 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/tvlsi/FilipekMMNRST15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/MrugalskiRSTW15,
author = {Grzegorz Mrugalski and
Janusz Rajski and
Jedrzej Solecki and
Jerzy Tyszer and
Chen Wang},
title = {TestExpress - New Time-Effective Scan-Based Deterministic Test Paradigm},
booktitle = {24th {IEEE} Asian Test Symposium, {ATS} 2015, Mumbai, India, November
22-25, 2015},
pages = {19--24},
publisher = {{IEEE} Computer Society},
year = {2015},
url = {https://doi.org/10.1109/ATS.2015.11},
doi = {10.1109/ATS.2015.11},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/MrugalskiRSTW15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/LinCR15,
author = {Xijiang Lin and
Wu{-}Tung Cheng and
Janusz Rajski},
title = {On Improving Transition Test Set Quality to Detect {CMOS} Transistor
Stuck-Open Faults},
booktitle = {24th {IEEE} Asian Test Symposium, {ATS} 2015, Mumbai, India, November
22-25, 2015},
pages = {97--102},
publisher = {{IEEE} Computer Society},
year = {2015},
url = {https://doi.org/10.1109/ATS.2015.24},
doi = {10.1109/ATS.2015.24},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/LinCR15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dac/KonukMMRSTZ15,
author = {Haluk Konuk and
Elham K. Moghaddam and
Nilanjan Mukherjee and
Janusz Rajski and
Deepak Solanki and
Jerzy Tyszer and
Justyna Zawada},
title = {Design for low test pattern counts},
booktitle = {Proceedings of the 52nd Annual Design Automation Conference, San Francisco,
CA, USA, June 7-11, 2015},
pages = {136:1--136:6},
publisher = {{ACM}},
year = {2015},
url = {https://doi.org/10.1145/2744769.2744817},
doi = {10.1145/2744769.2744817},
timestamp = {Tue, 06 Nov 2018 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dac/KonukMMRSTZ15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/AceroFHMMNPRTZ15,
author = {Cesar Acero and
Derek Feltham and
Friedrich Hapke and
Elham K. Moghaddam and
Nilanjan Mukherjee and
Vidya Neerkundar and
Marek Patyra and
Janusz Rajski and
Jerzy Tyszer and
Justyna Zawada},
title = {Embedded deterministic test points for compact cell-aware tests},
booktitle = {2015 {IEEE} International Test Conference, {ITC} 2015, Anaheim, CA,
USA, October 6-8, 2015},
pages = {1--8},
publisher = {{IEEE}},
year = {2015},
url = {https://doi.org/10.1109/TEST.2015.7342383},
doi = {10.1109/TEST.2015.7342383},
timestamp = {Wed, 16 Oct 2019 14:14:52 +0200},
biburl = {https://dblp.org/rec/conf/itc/AceroFHMMNPRTZ15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/MrugalskiRRST15,
author = {Grzegorz Mrugalski and
Janusz Rajski and
Lukasz Rybak and
Jedrzej Solecki and
Jerzy Tyszer},
title = {A deterministic {BIST} scheme based on EDT-compressed test patterns},
booktitle = {2015 {IEEE} International Test Conference, {ITC} 2015, Anaheim, CA,
USA, October 6-8, 2015},
pages = {1--8},
publisher = {{IEEE}},
year = {2015},
url = {https://doi.org/10.1109/TEST.2015.7342398},
doi = {10.1109/TEST.2015.7342398},
timestamp = {Wed, 22 Jun 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/MrugalskiRRST15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/natw/LiQYZLHKR15,
author = {Guoliang Li and
Jun Qian and
Qinfu Yang and
Yuan Zuo and
Rui Li and
Yu Huang and
Mark Kassab and
Janusz Rajski},
title = {Hybrid Hierarchical and Modular Tests for SoC Designs},
booktitle = {24th {IEEE} North Atlantic Test Workshop, {NATW} 2015, Johnson City,
NY, USA, May 11-13, 2015},
pages = {11--16},
publisher = {{IEEE}},
year = {2015},
url = {https://doi.org/10.1109/NATW.2015.9},
doi = {10.1109/NATW.2015.9},
timestamp = {Wed, 20 Oct 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/natw/LiQYZLHKR15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vlsi-dat/TsaiR15,
author = {Kun{-}Han Tsai and
Janusz Rajski},
title = {Clock-domain-aware test for improving pattern compression},
booktitle = {{VLSI} Design, Automation and Test, {VLSI-DAT} 2015, Hsinchu, Taiwan,
April 27-29, 2015},
pages = {1--4},
publisher = {{IEEE}},
year = {2015},
url = {https://doi.org/10.1109/VLSI-DAT.2015.7114506},
doi = {10.1109/VLSI-DAT.2015.7114506},
timestamp = {Wed, 16 Oct 2019 14:14:54 +0200},
biburl = {https://dblp.org/rec/conf/vlsi-dat/TsaiR15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vlsid/LinRR15,
author = {Xijiang Lin and
Sudhakar M. Reddy and
Janusz Rajski},
title = {Using Boolean Tests to Improve Detection of Transistor Stuck-Open
Faults in {CMOS} Digital Logic Circuits},
booktitle = {28th International Conference on {VLSI} Design, {VLSID} 2015, Bangalore,
India, January 3-7, 2015},
pages = {399--404},
publisher = {{IEEE} Computer Society},
year = {2015},
url = {https://doi.org/10.1109/VLSID.2015.73},
doi = {10.1109/VLSID.2015.73},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vlsid/LinRR15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/RajskiM15,
author = {Janusz Rajski and
Nilanjan Mukherjee},
title = {Innovative practices session 11C: Advanced scan methodologies {[3}
presentations]},
booktitle = {33rd {IEEE} {VLSI} Test Symposium, {VTS} 2015, Napa, CA, USA, April
27-29, 2015},
pages = {1},
publisher = {{IEEE} Computer Society},
year = {2015},
url = {https://doi.org/10.1109/VTS.2015.7116300},
doi = {10.1109/VTS.2015.7116300},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/RajskiM15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tcad/JanickiKMMRT14,
author = {Jakub Janicki and
Mark Kassab and
Grzegorz Mrugalski and
Nilanjan Mukherjee and
Janusz Rajski and
Jerzy Tyszer},
title = {Erratum to "Test Time Reduction in {EDT} Bandwidth Management
for SoC Designs"},
journal = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.},
volume = {33},
number = {1},
pages = {167},
year = {2014},
url = {https://doi.org/10.1109/TCAD.2013.2292631},
doi = {10.1109/TCAD.2013.2292631},
timestamp = {Thu, 24 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tcad/JanickiKMMRT14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tcad/HapkeRGRRHKSF14,
author = {Friedrich Hapke and
Wilfried Redemund and
Andreas Glowatz and
Janusz Rajski and
Michael Reese and
Marek Hustava and
Martin Keim and
Juergen Schloeffel and
Anja Fast},
title = {Cell-Aware Test},
journal = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.},
volume = {33},
number = {9},
pages = {1396--1409},
year = {2014},
url = {https://doi.org/10.1109/TCAD.2014.2323216},
doi = {10.1109/TCAD.2014.2323216},
timestamp = {Thu, 24 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tcad/HapkeRGRRHKSF14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/TrawkaMMPRJT14,
author = {Maciej Trawka and
Grzegorz Mrugalski and
Nilanjan Mukherjee and
Artur Pogiel and
Janusz Rajski and
Jakub Janicki and
Jerzy Tyszer},
title = {High-Speed Serial Embedded Deterministic Test for System-on-Chip Designs},
booktitle = {23rd {IEEE} Asian Test Symposium, {ATS} 2014, Hangzhou, China, November
16-19, 2014},
pages = {74--80},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/ATS.2014.25},
doi = {10.1109/ATS.2014.25},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/TrawkaMMPRJT14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/MilewskiMRT14,
author = {Sylwester Milewski and
Grzegorz Mrugalski and
Janusz Rajski and
Jerzy Tyszer},
title = {Low Power Test Compression with Programmable Broadcast-Based Control},
booktitle = {23rd {IEEE} Asian Test Symposium, {ATS} 2014, Hangzhou, China, November
16-19, 2014},
pages = {174--179},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/ATS.2014.35},
doi = {10.1109/ATS.2014.35},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/MilewskiMRT14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dac/GebalaMMRT14,
author = {Marcin Gebala and
Grzegorz Mrugalski and
Nilanjan Mukherjee and
Janusz Rajski and
Jerzy Tyszer},
title = {On Using Implied Values in EDT-based Test Compression},
booktitle = {The 51st Annual Design Automation Conference 2014, {DAC} '14, San
Francisco, CA, USA, June 1-5, 2014},
pages = {11:1--11:6},
publisher = {{ACM}},
year = {2014},
url = {https://doi.org/10.1145/2593069.2593173},
doi = {10.1145/2593069.2593173},
timestamp = {Tue, 06 Nov 2018 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dac/GebalaMMRT14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ddecs/AuPRSTZ14,
author = {Albert Au and
Artur Pogiel and
Janusz Rajski and
Piotr Sydow and
Jerzy Tyszer and
Justyna Zawada},
title = {Quality assurance in memory built-in self-test tools},
booktitle = {17th International Symposium on Design and Diagnostics of Electronic
Circuits {\&} Systems, {DDECS} 2014, Warsaw, Poland, 23-25 April,
2014},
pages = {39--44},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/DDECS.2014.6868760},
doi = {10.1109/DDECS.2014.6868760},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ddecs/AuPRSTZ14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ets/HapkeABBSGPBMPSRGFR14,
author = {Friedrich Hapke and
Ralf Arnold and
Matthias Beck and
M. Baby and
S. Straehle and
J. F. Goncalves and
A. Panait and
R. Behr and
Gwenol{\'{e}} Maugard and
A. Prashanthi and
Juergen Schloeffel and
Wilfried Redemund and
Andreas Glowatz and
Anja Fast and
Janusz Rajski},
editor = {Giorgio Di Natale},
title = {Cell-aware experiences in a high-quality automotive test suite},
booktitle = {19th {IEEE} European Test Symposium, {ETS} 2014, Paderborn, Germany,
May 26-30, 2014},
pages = {1--6},
publisher = {{IEEE}},
year = {2014},
url = {https://doi.org/10.1109/ETS.2014.6847814},
doi = {10.1109/ETS.2014.6847814},
timestamp = {Wed, 21 Apr 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ets/HapkeABBSGPBMPSRGFR14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ets/LinKR14,
author = {Xijiang Lin and
Mark Kassab and
Janusz Rajski},
editor = {Giorgio Di Natale},
title = {Using dynamic shift to reduce test data volume in high-compression
designs},
booktitle = {19th {IEEE} European Test Symposium, {ETS} 2014, Paderborn, Germany,
May 26-30, 2014},
pages = {1--6},
publisher = {{IEEE}},
year = {2014},
url = {https://doi.org/10.1109/ETS.2014.6847822},
doi = {10.1109/ETS.2014.6847822},
timestamp = {Mon, 22 May 2017 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ets/LinKR14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/KumarKMMRRTW14,
author = {Amit Kumar and
Mark Kassab and
Elham K. Moghaddam and
Nilanjan Mukherjee and
Janusz Rajski and
Sudhakar M. Reddy and
Jerzy Tyszer and
Chen Wang},
title = {Isometric test compression with low toggling activity},
booktitle = {2014 International Test Conference, {ITC} 2014, Seattle, WA, USA,
October 20-23, 2014},
pages = {1--7},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/TEST.2014.7035293},
doi = {10.1109/TEST.2014.7035293},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/KumarKMMRRTW14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/natw/HuangKJRCHKC14,
author = {Yu Huang and
Mark Kassab and
Jay Jahangiri and
Janusz Rajski and
Wu{-}Tung Cheng and
Dongkwan Han and
Jihye Kim and
Kun Young Chung},
title = {Test Compression Improvement with {EDT} Channel Sharing in SoC Designs},
booktitle = {{IEEE} 23rd North Atlantic Test Workshop, {NATW} 2014, Johnson City,
NY, USA, May 14-16, 2014},
pages = {22--31},
publisher = {{IEEE}},
year = {2014},
url = {https://doi.org/10.1109/NATW.2014.14},
doi = {10.1109/NATW.2014.14},
timestamp = {Thu, 14 Nov 2019 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/natw/HuangKJRCHKC14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/AbrahamGMRRGR14,
author = {Jacob A. Abraham and
Xinli Gu and
Teresa MacLaurin and
Janusz Rajski and
Paul G. Ryan and
Dimitris Gizopoulos and
Matteo Sonza Reorda},
title = {Special session 8B - Panel: In-field testing of SoC devices: Which
solutions by which players?},
booktitle = {32nd {IEEE} {VLSI} Test Symposium, {VTS} 2014, Napa, CA, USA, April
13-17, 2014},
pages = {1--2},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/VTS.2014.6818780},
doi = {10.1109/VTS.2014.6818780},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/AbrahamGMRRGR14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/CzyszMMRT13,
author = {Dariusz Czysz and
Grzegorz Mrugalski and
Nilanjan Mukherjee and
Janusz Rajski and
Jerzy Tyszer},
title = {On Deploying Scan Chains for Data Storage in Test Compression Environment},
journal = {{IEEE} Des. Test},
volume = {30},
number = {1},
pages = {68--76},
year = {2013},
url = {https://doi.org/10.1109/MDT.2012.2184072},
doi = {10.1109/MDT.2012.2184072},
timestamp = {Fri, 13 Mar 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/dt/CzyszMMRT13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tcad/JanickiKMMRT13,
author = {Jakub Janicki and
Mark Kassab and
Grzegorz Mrugalski and
Nilanjan Mukherjee and
Janusz Rajski and
Jerzy Tyszer},
title = {Test Time Reduction in {EDT} Bandwidth Management for SoC Designs},
journal = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.},
volume = {32},
number = {11},
pages = {1776--1786},
year = {2013},
url = {https://doi.org/10.1109/TCAD.2013.2263038},
doi = {10.1109/TCAD.2013.2263038},
timestamp = {Thu, 24 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tcad/JanickiKMMRT13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/KumarRRR13,
author = {Amit Kumar and
Janusz Rajski and
Sudhakar M. Reddy and
Thomas Rinderknecht},
title = {On the Generation of Compact Deterministic Test Sets for {BIST} Ready
Designs},
booktitle = {22nd Asian Test Symposium, {ATS} 2013, Yilan County, Taiwan, November
18-21, 2013},
pages = {201--206},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/ATS.2013.45},
doi = {10.1109/ATS.2013.45},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/KumarRRR13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ets/TyszerFMMR13,
author = {Jerzy Tyszer and
Michal Filipek and
Grzegorz Mrugalski and
Nilanjan Mukherjee and
Janusz Rajski},
title = {New test compression scheme based on low power {BIST}},
booktitle = {18th {IEEE} European Test Symposium, {ETS} 2013, Avignon, France,
May 27-30, 2013},
pages = {1--6},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/ETS.2013.6569374},
doi = {10.1109/ETS.2013.6569374},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ets/TyszerFMMR13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/JanickiTCHKMRDG13,
author = {Jakub Janicki and
Jerzy Tyszer and
Wu{-}Tung Cheng and
Yu Huang and
Mark Kassab and
Nilanjan Mukherjee and
Janusz Rajski and
Yan Dong and
Grady Giles},
title = {{EDT} bandwidth management - Practical scenarios for large SoC designs},
booktitle = {2013 {IEEE} International Test Conference, {ITC} 2013, Anaheim, CA,
USA, September 6-13, 2013},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/TEST.2013.6651898},
doi = {10.1109/TEST.2013.6651898},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/JanickiTCHKMRDG13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/KumarRRW13,
author = {Amit Kumar and
Janusz Rajski and
Sudhakar M. Reddy and
Chen Wang},
title = {On the generation of compact test sets},
booktitle = {2013 {IEEE} International Test Conference, {ITC} 2013, Anaheim, CA,
USA, September 6-13, 2013},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/TEST.2013.6651914},
doi = {10.1109/TEST.2013.6651914},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/KumarRRW13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/RajskiT13,
author = {Janusz Rajski and
Jerzy Tyszer},
title = {Fault diagnosis of TSV-based interconnects in 3-D stacked designs},
booktitle = {2013 {IEEE} International Test Conference, {ITC} 2013, Anaheim, CA,
USA, September 6-13, 2013},
pages = {1--9},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/TEST.2013.6651894},
doi = {10.1109/TEST.2013.6651894},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/RajskiT13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vlsi/RajskiPSCNGG13,
author = {Janusz Rajski and
Miodrag Potkonjak and
Adit D. Singh and
Abhijit Chatterjee and
Zain Navabi and
Matthew R. Guthaus and
Sezer G{\"{o}}ren},
editor = {Martin Margala and
Ricardo Augusto da Luz Reis and
Alex Orailoglu and
Luigi Carro and
Lu{\'{\i}}s Miguel Silveira and
H. Fatih Ugurdag},
title = {Embedded tutorials: Embedded tutorial 1: Cell-aware test-from gates
to transistors},
booktitle = {21st {IEEE/IFIP} International Conference on {VLSI} and System-on-Chip,
VLSI-SoC 2013, Istanbul, Turkey, October 7-9, 2013},
publisher = {{IEEE}},
year = {2013},
url = {https://doi.org/10.1109/VLSI-SoC.2013.6673230},
doi = {10.1109/VLSI-SOC.2013.6673230},
timestamp = {Tue, 16 Nov 2021 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vlsi/RajskiPSCNGG13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tcad/JanickiKMMRT12,
author = {Jakub Janicki and
Mark Kassab and
Grzegorz Mrugalski and
Nilanjan Mukherjee and
Janusz Rajski and
Jerzy Tyszer},
title = {{EDT} Bandwidth Management in SoC Designs},
journal = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.},
volume = {31},
number = {12},
pages = {1894--1907},
year = {2012},
url = {https://doi.org/10.1109/TCAD.2012.2205385},
doi = {10.1109/TCAD.2012.2205385},
timestamp = {Thu, 24 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tcad/JanickiKMMRT12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/LinR12,
author = {Xijiang Lin and
Janusz Rajski},
title = {On Utilizing Test Cube Properties to Reduce Test Data Volume Further},
booktitle = {21st {IEEE} Asian Test Symposium, {ATS} 2012, Niigata, Japan, November
19-22, 2012},
pages = {83--88},
publisher = {{IEEE} Computer Society},
year = {2012},
url = {https://doi.org/10.1109/ATS.2012.41},
doi = {10.1109/ATS.2012.41},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/LinR12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ets/JanickiTMR12,
author = {Jakub Janicki and
Jerzy Tyszer and
Grzegorz Mrugalski and
Janusz Rajski},
title = {Bandwidth-aware test compression logic for SoC designs},
booktitle = {17th {IEEE} European Test Symposium, {ETS} 2012, Annecy, France, May
28 - June 1 2012},
pages = {1--6},
publisher = {{IEEE} Computer Society},
year = {2012},
url = {https://doi.org/10.1109/ETS.2012.6233003},
doi = {10.1109/ETS.2012.6233003},
timestamp = {Tue, 28 Apr 2020 11:43:43 +0200},
biburl = {https://dblp.org/rec/conf/ets/JanickiTMR12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/CzyszRT12,
author = {Dariusz Czysz and
Janusz Rajski and
Jerzy Tyszer},
title = {Low power test application with selective compaction in {VLSI} designs},
booktitle = {2012 {IEEE} International Test Conference, {ITC} 2012, Anaheim, CA,
USA, November 5-8, 2012},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2012},
url = {https://doi.org/10.1109/TEST.2012.6401532},
doi = {10.1109/TEST.2012.6401532},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/CzyszRT12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/HapkeRRORRGSR12,
author = {Friedrich Hapke and
Michael Reese and
Jason Rivers and
A. Over and
V. Ravikumar and
Wilfried Redemund and
Andreas Glowatz and
J{\"{u}}rgen Schl{\"{o}}ffel and
Janusz Rajski},
title = {Cell-aware Production test results from a 32-nm notebook processor},
booktitle = {2012 {IEEE} International Test Conference, {ITC} 2012, Anaheim, CA,
USA, November 5-8, 2012},
pages = {1--9},
publisher = {{IEEE} Computer Society},
year = {2012},
url = {https://doi.org/10.1109/TEST.2012.6401533},
doi = {10.1109/TEST.2012.6401533},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/HapkeRRORRGSR12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/SoleckiTMMR12,
author = {Jedrzej Solecki and
Jerzy Tyszer and
Grzegorz Mrugalski and
Nilanjan Mukherjee and
Janusz Rajski},
title = {Low power programmable {PRPG} with enhanced fault coverage gradient},
booktitle = {2012 {IEEE} International Test Conference, {ITC} 2012, Anaheim, CA,
USA, November 5-8, 2012},
pages = {1--9},
publisher = {{IEEE} Computer Society},
year = {2012},
url = {https://doi.org/10.1109/TEST.2012.6401559},
doi = {10.1109/TEST.2012.6401559},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/SoleckiTMMR12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/RajskiTMN12,
author = {Janusz Rajski and
Jerzy Tyszer and
Grzegorz Mrugalski and
Benoit Nadeau{-}Dostie},
title = {Test generator with preselected toggling for low power built-in self-test},
booktitle = {30th {IEEE} {VLSI} Test Symposium, {VTS} 2012, Maui, Hawaii, USA,
23-26 April 2012},
pages = {1--6},
publisher = {{IEEE} Computer Society},
year = {2012},
url = {https://doi.org/10.1109/VTS.2012.6231071},
doi = {10.1109/VTS.2012.6231071},
timestamp = {Wed, 16 Oct 2019 14:14:54 +0200},
biburl = {https://dblp.org/rec/conf/vts/RajskiTMN12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/computer/MukherjeeRMPT11,
author = {Nilanjan Mukherjee and
Janusz Rajski and
Grzegorz Mrugalski and
Artur Pogiel and
Jerzy Tyszer},
title = {Ring Generator: An Ultimate Linear Feedback Shift Register},
journal = {Computer},
volume = {44},
number = {6},
pages = {64--71},
year = {2011},
url = {https://doi.org/10.1109/MC.2010.334},
doi = {10.1109/MC.2010.334},
timestamp = {Wed, 12 Aug 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/computer/MukherjeeRMPT11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/BenwareMPRST11,
author = {Brady Benware and
Grzegorz Mrugalski and
Artur Pogiel and
Janusz Rajski and
Jedrzej Solecki and
Jerzy Tyszer},
title = {Fault Diagnosis with Orthogonal Compactors in Scan-Based Designs},
journal = {J. Electron. Test.},
volume = {27},
number = {5},
pages = {599--609},
year = {2011},
url = {https://doi.org/10.1007/s10836-011-5243-6},
doi = {10.1007/S10836-011-5243-6},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/BenwareMPRST11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tcad/MukherjeePRT11,
author = {Nilanjan Mukherjee and
Artur Pogiel and
Janusz Rajski and
Jerzy Tyszer},
title = {BIST-Based Fault Diagnosis for Read-Only Memories},
journal = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.},
volume = {30},
number = {7},
pages = {1072--1085},
year = {2011},
url = {https://doi.org/10.1109/TCAD.2011.2127030},
doi = {10.1109/TCAD.2011.2127030},
timestamp = {Thu, 24 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tcad/MukherjeePRT11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tcad/CzyszMMRST11,
author = {Dariusz Czysz and
Grzegorz Mrugalski and
Nilanjan Mukherjee and
Janusz Rajski and
Przemyslaw Szczerbicki and
Jerzy Tyszer},
title = {Deterministic Clustering of Incompatible Test Cubes for Higher Power-Aware
{EDT} Compression},
journal = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.},
volume = {30},
number = {8},
pages = {1225--1238},
year = {2011},
url = {https://doi.org/10.1109/TCAD.2011.2126574},
doi = {10.1109/TCAD.2011.2126574},
timestamp = {Thu, 24 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tcad/CzyszMMRST11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/FilipekFIMRTT11,
author = {Michal Filipek and
Yoshiaki Fukui and
Hiroyuki Iwata and
Grzegorz Mrugalski and
Janusz Rajski and
Masahiro Takakura and
Jerzy Tyszer},
title = {Low Power Decompressor and {PRPG} with Constant Value Broadcast},
booktitle = {Proceedings of the 20th {IEEE} Asian Test Symposium, {ATS} 2011, New
Delhi, India, November 20-23, 2011},
pages = {84--89},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/ATS.2011.47},
doi = {10.1109/ATS.2011.47},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/FilipekFIMRTT11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/MoghaddamRRJ11,
author = {Elham K. Moghaddam and
Janusz Rajski and
Sudhakar M. Reddy and
Jakub Janicki},
title = {Low Test Data Volume Low Power At-Speed Delay Tests Using Clock-Gating},
booktitle = {Proceedings of the 20th {IEEE} Asian Test Symposium, {ATS} 2011, New
Delhi, India, November 20-23, 2011},
pages = {267--272},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/ATS.2011.46},
doi = {10.1109/ATS.2011.46},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/MoghaddamRRJ11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/MrugalskiPMRTU11,
author = {Grzegorz Mrugalski and
Artur Pogiel and
Nilanjan Mukherjee and
Janusz Rajski and
Jerzy Tyszer and
Pawel Urbanek},
title = {Fault Diagnosis in Memory {BIST} Environment with Non-march Tests},
booktitle = {Proceedings of the 20th {IEEE} Asian Test Symposium, {ATS} 2011, New
Delhi, India, November 20-23, 2011},
pages = {419--424},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/ATS.2011.48},
doi = {10.1109/ATS.2011.48},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/MrugalskiPMRTU11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/LinMMNRT11,
author = {Xijiang Lin and
Elham K. Moghaddam and
Nilanjan Mukherjee and
Benoit Nadeau{-}Dostie and
Janusz Rajski and
Jerzy Tyszer},
title = {Power Aware Embedded Test},
booktitle = {Proceedings of the 20th {IEEE} Asian Test Symposium, {ATS} 2011, New
Delhi, India, November 20-23, 2011},
pages = {511--516},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/ATS.2011.49},
doi = {10.1109/ATS.2011.49},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/LinMMNRT11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ets/BenwareMPRST11,
author = {Brady Benware and
Grzegorz Mrugalski and
Artur Pogiel and
Janusz Rajski and
Jedrzej Solecki and
Jerzy Tyszer},
title = {Diagnosis of Failing Scan Cells through Orthogonal Response Compaction},
booktitle = {16th European Test Symposium, {ETS} 2011, Trondheim, Norway, May 23-27,
2011},
pages = {1--6},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/ETS.2011.56},
doi = {10.1109/ETS.2011.56},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ets/BenwareMPRST11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ets/CzyszMMRT11,
author = {Dariusz Czysz and
Grzegorz Mrugalski and
Nilanjan Mukherjee and
Janusz Rajski and
Jerzy Tyszer},
title = {Reduced {ATE} Interface for High Test Data Compression},
booktitle = {16th European Test Symposium, {ETS} 2011, Trondheim, Norway, May 23-27,
2011},
pages = {99--104},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/ETS.2011.13},
doi = {10.1109/ETS.2011.13},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ets/CzyszMMRT11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/HapkeSRGRRRR11,
author = {Friedrich Hapke and
J{\"{u}}rgen Schl{\"{o}}ffel and
Wilfried Redemund and
Andreas Glowatz and
Janusz Rajski and
Michael Reese and
J. Rearick and
Jason Rivers},
editor = {Bill Eklow and
R. D. (Shawn) Blanton},
title = {Cell-aware analysis for small-delay effects and production test results
from different fault models},
booktitle = {2011 {IEEE} International Test Conference, {ITC} 2011, Anaheim, CA,
USA, September 20-22, 2011},
pages = {1--8},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/TEST.2011.6139151},
doi = {10.1109/TEST.2011.6139151},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/HapkeSRGRRRR11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/JanickiTDKMMR11,
author = {Jakub Janicki and
Jerzy Tyszer and
Avijit Dutta and
Mark Kassab and
Grzegorz Mrugalski and
Nilanjan Mukherjee and
Janusz Rajski},
editor = {Bill Eklow and
R. D. (Shawn) Blanton},
title = {{EDT} channel bandwidth management in SoC designs with pattern-independent
test access mechanism},
booktitle = {2011 {IEEE} International Test Conference, {ITC} 2011, Anaheim, CA,
USA, September 20-22, 2011},
pages = {1--9},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/TEST.2011.6139170},
doi = {10.1109/TEST.2011.6139170},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/JanickiTDKMMR11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/RajskiMR11,
author = {Janusz Rajski and
Elham K. Moghaddam and
Sudhakar M. Reddy},
editor = {Bill Eklow and
R. D. (Shawn) Blanton},
title = {Low power compression utilizing clock-gating},
booktitle = {2011 {IEEE} International Test Conference, {ITC} 2011, Anaheim, CA,
USA, September 20-22, 2011},
pages = {1--8},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/TEST.2011.6139145},
doi = {10.1109/TEST.2011.6139145},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/RajskiMR11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tcad/CzyszMMRT10,
author = {Dariusz Czysz and
Grzegorz Mrugalski and
Nilanjan Mukherjee and
Janusz Rajski and
Jerzy Tyszer},
title = {On Compaction Utilizing Inter and Intra-Correlation of Unknown States},
journal = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.},
volume = {29},
number = {1},
pages = {117--126},
year = {2010},
url = {https://doi.org/10.1109/TCAD.2009.2035550},
doi = {10.1109/TCAD.2009.2035550},
timestamp = {Thu, 24 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tcad/CzyszMMRT10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tcad/MukherjeePRT10,
author = {Nilanjan Mukherjee and
Artur Pogiel and
Janusz Rajski and
Jerzy Tyszer},
title = {High Volume Diagnosis in Memory {BIST} Based on Compressed Failure
Data},
journal = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.},
volume = {29},
number = {3},
pages = {441--453},
year = {2010},
url = {https://doi.org/10.1109/TCAD.2010.2041852},
doi = {10.1109/TCAD.2010.2041852},
timestamp = {Thu, 24 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tcad/MukherjeePRT10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/LinR10,
author = {Xijiang Lin and
Janusz Rajski},
title = {Adaptive Low Shift Power Test Pattern Generator for Logic {BIST}},
booktitle = {Proceedings of the 19th {IEEE} Asian Test Symposium, {ATS} 2010, 1-4
December 2010, Shanghai, China},
pages = {355--360},
publisher = {{IEEE} Computer Society},
year = {2010},
url = {https://doi.org/10.1109/ATS.2010.67},
doi = {10.1109/ATS.2010.67},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/LinR10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ets/BenwareMPRST10,
author = {Brady Benware and
Grzegorz Mrugalski and
Artur Pogiel and
Janusz Rajski and
Jedrzej Solecki and
Jerzy Tyszer},
title = {Diagnosis of failing scan cells through orthogonal response compaction},
booktitle = {15th European Test Symposium, {ETS} 2010, Prague, Czech Republic,
May 24-28, 2010},
pages = {221--226},
publisher = {{IEEE} Computer Society},
year = {2010},
url = {https://doi.org/10.1109/ETSYM.2010.5512754},
doi = {10.1109/ETSYM.2010.5512754},
timestamp = {Tue, 28 Apr 2020 11:43:44 +0200},
biburl = {https://dblp.org/rec/conf/ets/BenwareMPRST10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/KassabMMRJT10,
author = {Mark Kassab and
Grzegorz Mrugalski and
Nilanjan Mukherjee and
Janusz Rajski and
Jakub Janicki and
Jerzy Tyszer},
editor = {Ron Press and
Erik H. Volkerink},
title = {Dynamic channel allocation for higher {EDT} compression in SoC designs},
booktitle = {2011 {IEEE} International Test Conference, {ITC} 2010, Austin, TX,
USA, November 2-4, 2010},
pages = {265--274},
publisher = {{IEEE} Computer Society},
year = {2010},
url = {https://doi.org/10.1109/TEST.2010.5699227},
doi = {10.1109/TEST.2010.5699227},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/KassabMMRJT10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/CzyszMMRST10,
author = {Dariusz Czysz and
Grzegorz Mrugalski and
Nilanjan Mukherjee and
Janusz Rajski and
Przemyslaw Szczerbicki and
Jerzy Tyszer},
editor = {Ron Press and
Erik H. Volkerink},
title = {Low power compression of incompatible test cubes},
booktitle = {2011 {IEEE} International Test Conference, {ITC} 2010, Austin, TX,
USA, November 2-4, 2010},
pages = {704--713},
publisher = {{IEEE} Computer Society},
year = {2010},
url = {https://doi.org/10.1109/TEST.2010.5699274},
doi = {10.1109/TEST.2010.5699274},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/CzyszMMRST10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/MoghaddamRRLMK10,
author = {Elham K. Moghaddam and
Janusz Rajski and
Sudhakar M. Reddy and
Xijiang Lin and
Nilanjan Mukherjee and
Mark Kassab},
editor = {Ron Press and
Erik H. Volkerink},
title = {Low capture power at-speed test in {EDT} environment},
booktitle = {2011 {IEEE} International Test Conference, {ITC} 2010, Austin, TX,
USA, November 2-4, 2010},
pages = {714--723},
publisher = {{IEEE} Computer Society},
year = {2010},
url = {https://doi.org/10.1109/TEST.2010.5699275},
doi = {10.1109/TEST.2010.5699275},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/MoghaddamRRLMK10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/MoghaddamRRK10,
author = {Elham K. Moghaddam and
Janusz Rajski and
Sudhakar M. Reddy and
Mark Kassab},
title = {At-speed scan test with low switching activity},
booktitle = {28th {IEEE} {VLSI} Test Symposium, {VTS} 2010, April 19-22, 2010,
Santa Cruz, California, {USA}},
pages = {177--182},
publisher = {{IEEE} Computer Society},
year = {2010},
url = {https://doi.org/10.1109/VTS.2010.5469580},
doi = {10.1109/VTS.2010.5469580},
timestamp = {Wed, 16 Oct 2019 14:14:54 +0200},
biburl = {https://dblp.org/rec/conf/vts/MoghaddamRRK10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tcad/MehtaMTR09,
author = {Vishal J. Mehta and
Malgorzata Marek{-}Sadowska and
Kun{-}Han Tsai and
Janusz Rajski},
title = {Timing-Aware Multiple-Delay-Fault Diagnosis},
journal = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.},
volume = {28},
number = {2},
pages = {245--258},
year = {2009},
url = {https://doi.org/10.1109/TCAD.2008.2009164},
doi = {10.1109/TCAD.2008.2009164},
timestamp = {Thu, 24 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tcad/MehtaMTR09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tcad/CzyszKLMRT09,
author = {Dariusz Czysz and
Mark Kassab and
Xijiang Lin and
Grzegorz Mrugalski and
Janusz Rajski and
Jerzy Tyszer},
title = {Low-Power Scan Operation in Test Compression Environment},
journal = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.},
volume = {28},
number = {11},
pages = {1742--1755},
year = {2009},
url = {https://doi.org/10.1109/TCAD.2009.2030445},
doi = {10.1109/TCAD.2009.2030445},
timestamp = {Thu, 24 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tcad/CzyszKLMRT09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/ChenRRP09,
author = {Gang Chen and
Janusz Rajski and
Sudhakar M. Reddy and
Irith Pomeranz},
title = {N-distinguishing Tests for Enhanced Defect Diagnosis},
booktitle = {Proceedings of the Eighteentgh Asian Test Symposium, {ATS} 2009, 23-26
November 2009, Taichung, Taiwan},
pages = {183--186},
publisher = {{IEEE} Computer Society},
year = {2009},
url = {https://doi.org/10.1109/ATS.2009.47},
doi = {10.1109/ATS.2009.47},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/ChenRRP09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/date/RemersaroRRP09,
author = {Santiago Remersaro and
Janusz Rajski and
Sudhakar M. Reddy and
Irith Pomeranz},
editor = {Luca Benini and
Giovanni De Micheli and
Bashir M. Al{-}Hashimi and
Wolfgang M{\"{u}}ller},
title = {A scalable method for the generation of small test sets},
booktitle = {Design, Automation and Test in Europe, {DATE} 2009, Nice, France,
April 20-24, 2009},
pages = {1136--1141},
publisher = {{IEEE}},
year = {2009},
url = {https://doi.org/10.1109/DATE.2009.5090834},
doi = {10.1109/DATE.2009.5090834},
timestamp = {Wed, 16 Oct 2019 14:14:53 +0200},
biburl = {https://dblp.org/rec/conf/date/RemersaroRRP09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ets/Rajski09,
author = {Janusz Rajski},
title = {We Have Got Compression, What Next?},
booktitle = {14th {IEEE} European Test Symposium, {ETS} 2009, Sevilla, Spain, May
25-29, 2009},
publisher = {{IEEE} Computer Society},
year = {2009},
url = {https://doi.org/10.1109/ETS.2009.27},
doi = {10.1109/ETS.2009.27},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ets/Rajski09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/MrugalskiMRCT09,
author = {Grzegorz Mrugalski and
Nilanjan Mukherjee and
Janusz Rajski and
Dariusz Czysz and
Jerzy Tyszer},
editor = {Gordon W. Roberts and
Bill Eklow},
title = {Compression based on deterministic vector clustering of incompatible
test cubes},
booktitle = {2009 {IEEE} International Test Conference, {ITC} 2009, Austin, TX,
USA, November 1-6, 2009},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2009},
url = {https://doi.org/10.1109/TEST.2009.5355555},
doi = {10.1109/TEST.2009.5355555},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/MrugalskiMRCT09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/MukherjeePRT09,
author = {Nilanjan Mukherjee and
Artur Pogiel and
Janusz Rajski and
Jerzy Tyszer},
editor = {Gordon W. Roberts and
Bill Eklow},
title = {Fault diagnosis for embedded read-only memories},
booktitle = {2009 {IEEE} International Test Conference, {ITC} 2009, Austin, TX,
USA, November 1-6, 2009},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2009},
url = {https://doi.org/10.1109/TEST.2009.5355530},
doi = {10.1109/TEST.2009.5355530},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/MukherjeePRT09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vlsid/MukherjeeRT09,
author = {Nilanjan Mukherjee and
Janusz Rajski and
Jerzy Tyszer},
title = {Defect Aware to Power Conscious Tests - The New {DFT} Landscape},
booktitle = {{VLSI} Design 2009: Improving Productivity through Higher Abstraction,
The 22nd International Conference on {VLSI} Design, New Delhi, India,
5-9 January 2009},
pages = {23--25},
publisher = {{IEEE} Computer Society},
year = {2009},
url = {https://doi.org/10.1109/VLSI.Design.2009.111},
doi = {10.1109/VLSI.DESIGN.2009.111},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vlsid/MukherjeeRT09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vlsid/MukherjeePRT09,
author = {Nilanjan Mukherjee and
Artur Pogiel and
Janusz Rajski and
Jerzy Tyszer},
title = {High-Speed On-Chip Event Counters for Embedded Systems},
booktitle = {{VLSI} Design 2009: Improving Productivity through Higher Abstraction,
The 22nd International Conference on {VLSI} Design, New Delhi, India,
5-9 January 2009},
pages = {275--280},
publisher = {{IEEE} Computer Society},
year = {2009},
url = {https://doi.org/10.1109/VLSI.Design.2009.15},
doi = {10.1109/VLSI.DESIGN.2009.15},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vlsid/MukherjeePRT09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/MrugalskiMRCT09,
author = {Grzegorz Mrugalski and
Nilanjan Mukherjee and
Janusz Rajski and
Dariusz Czysz and
Jerzy Tyszer},
title = {Highly X-Tolerant Selective Compaction of Test Responses},
booktitle = {27th {IEEE} {VLSI} Test Symposium, {VTS} 2009, May 3-7, 2009, Santa
Cruz, California, {USA}},
pages = {245--250},
publisher = {{IEEE} Computer Society},
year = {2009},
url = {https://doi.org/10.1109/VTS.2009.11},
doi = {10.1109/VTS.2009.11},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/MrugalskiMRCT09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tcad/RajskiTMCMK08,
author = {Janusz Rajski and
Jerzy Tyszer and
Grzegorz Mrugalski and
Wu{-}Tung Cheng and
Nilanjan Mukherjee and
Mark Kassab},
title = {X-Press: Two-Stage X-Tolerant Compactor With Programmable Selector},
journal = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.},
volume = {27},
number = {1},
pages = {147--159},
year = {2008},
url = {https://doi.org/10.1109/TCAD.2007.907276},
doi = {10.1109/TCAD.2007.907276},
timestamp = {Thu, 24 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tcad/RajskiTMCMK08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tcad/MehtaMTR08,
author = {Vishal J. Mehta and
Malgorzata Marek{-}Sadowska and
Kun{-}Han Tsai and
Janusz Rajski},
title = {Improving the Resolution of Single-Delay-Fault Diagnosis},
journal = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.},
volume = {27},
number = {5},
pages = {932--945},
year = {2008},
url = {https://doi.org/10.1109/TCAD.2008.917588},
doi = {10.1109/TCAD.2008.917588},
timestamp = {Thu, 24 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tcad/MehtaMTR08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tcad/CzyszMRT08,
author = {Dariusz Czysz and
Grzegorz Mrugalski and
Janusz Rajski and
Jerzy Tyszer},
title = {Low-Power Test Data Application in {EDT} Environment Through Decompressor
Freeze},
journal = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.},
volume = {27},
number = {7},
pages = {1278--1290},
year = {2008},
url = {https://doi.org/10.1109/TCAD.2008.923111},
doi = {10.1109/TCAD.2008.923111},
timestamp = {Thu, 24 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tcad/CzyszMRT08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/LinR08,
author = {Xijiang Lin and
Janusz Rajski},
title = {Test Power Reduction by Blocking Scan Cell Outputs},
booktitle = {17th {IEEE} Asian Test Symposium, {ATS} 2008, Sapporo, Japan, November
24-27, 2008},
pages = {329--336},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/ATS.2008.33},
doi = {10.1109/ATS.2008.33},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/LinR08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/RemersaroRRRP08,
author = {Santiago Remersaro and
Janusz Rajski and
Thomas Rinderknecht and
Sudhakar M. Reddy and
Irith Pomeranz},
editor = {Cristiana Bolchini and
Yong{-}Bin Kim and
Dimitris Gizopoulos and
Mohammad Tehranipoor},
title = {{ATPG} Heuristics Dependant Observation Point Insertion for Enhanced
Compaction and Data Volume Reduction},
booktitle = {23rd {IEEE} International Symposium on Defect and Fault-Tolerance
in {VLSI} Systems {(DFT} 2008), 1-3 October 2008, Boston, MA, {USA}},
pages = {385--393},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/DFT.2008.39},
doi = {10.1109/DFT.2008.39},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dft/RemersaroRRRP08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/isqed/MehtaMTR08,
author = {Vishal J. Mehta and
Malgorzata Marek{-}Sadowska and
Kun{-}Han Tsai and
Janusz Rajski},
title = {Timing-Aware Multiple-Delay-Fault Diagnosis},
booktitle = {9th International Symposium on Quality of Electronic Design {(ISQED}
2008), 17-19 March 2008, San Jose, CA, {USA}},
pages = {246--253},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/ISQED.2008.4479734},
doi = {10.1109/ISQED.2008.4479734},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/isqed/MehtaMTR08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/CzyszKLMRT08,
author = {Dariusz Czysz and
Mark Kassab and
Xijiang Lin and
Grzegorz Mrugalski and
Janusz Rajski and
Jerzy Tyszer},
editor = {Douglas Young and
Nur A. Touba},
title = {Low Power Scan Shift and Capture in the {EDT} Environment},
booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara,
California, USA, October 26-31, 2008},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/TEST.2008.4700585},
doi = {10.1109/TEST.2008.4700585},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/CzyszKLMRT08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/LinR08,
author = {Xijiang Lin and
Janusz Rajski},
editor = {Douglas Young and
Nur A. Touba},
title = {Test Generation for Interconnect Opens},
booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara,
California, USA, October 26-31, 2008},
pages = {1--7},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/TEST.2008.4700640},
doi = {10.1109/TEST.2008.4700640},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/LinR08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/MukherjeePRT08,
author = {Nilanjan Mukherjee and
Artur Pogiel and
Janusz Rajski and
Jerzy Tyszer},
editor = {Douglas Young and
Nur A. Touba},
title = {High Throughput Diagnosis via Compression of Failure Data in Embedded
Memory {BIST}},
booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara,
California, USA, October 26-31, 2008},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/TEST.2008.4700554},
doi = {10.1109/TEST.2008.4700554},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/MukherjeePRT08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/RemersaroLRPR07,
author = {Santiago Remersaro and
Xijiang Lin and
Sudhakar M. Reddy and
Irith Pomeranz and
Janusz Rajski},
title = {Scan-Based Tests with Low Switching Activity},
journal = {{IEEE} Des. Test Comput.},
volume = {24},
number = {3},
pages = {268--275},
year = {2007},
url = {https://doi.org/10.1109/MDT.2007.80},
doi = {10.1109/MDT.2007.80},
timestamp = {Sun, 17 May 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/dt/RemersaroLRPR07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/TyszerRMMKCSL07,
author = {Jerzy Tyszer and
Janusz Rajski and
Grzegorz Mrugalski and
Nilanjan Mukherjee and
Mark Kassab and
Wu{-}Tung Cheng and
Manish Sharma and
Liyang Lai},
title = {X-Tolerant Compactor with On-Chip Registration and Signature-Based
Diagnosis},
journal = {{IEEE} Des. Test Comput.},
volume = {24},
number = {5},
pages = {476--485},
year = {2007},
url = {https://doi.org/10.1109/MDT.2007.177},
doi = {10.1109/MDT.2007.177},
timestamp = {Sun, 17 May 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/dt/TyszerRMMKCSL07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/MrugalskiRWPT07,
author = {Grzegorz Mrugalski and
Janusz Rajski and
Chen Wang and
Artur Pogiel and
Jerzy Tyszer},
title = {Isolation of Failing Scan Cells through Convolutional Test Response
Compaction},
journal = {J. Electron. Test.},
volume = {23},
number = {1},
pages = {35--45},
year = {2007},
url = {https://doi.org/10.1007/s10836-006-9524-4},
doi = {10.1007/S10836-006-9524-4},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/MrugalskiRWPT07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/iet-cdt/ZhangRPRA07,
author = {Zhuo Zhang and
Sudhakar M. Reddy and
Irith Pomeranz and
Janusz Rajski and
Bashir M. Al{-}Hashimi},
title = {Enhancing delay fault coverage through low-power segmented scan},
journal = {{IET} Comput. Digit. Tech.},
volume = {1},
number = {3},
pages = {220--229},
year = {2007},
url = {https://doi.org/10.1049/iet-cdt:20060135},
doi = {10.1049/IET-CDT:20060135},
timestamp = {Tue, 14 Jul 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/iet-cdt/ZhangRPRA07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tcad/MrugalskiPRT07,
author = {Grzegorz Mrugalski and
Artur Pogiel and
Janusz Rajski and
Jerzy Tyszer},
title = {Fault Diagnosis With Convolutional Compactors},
journal = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.},
volume = {26},
number = {8},
pages = {1478--1494},
year = {2007},
url = {https://doi.org/10.1109/TCAD.2007.891361},
doi = {10.1109/TCAD.2007.891361},
timestamp = {Thu, 24 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tcad/MrugalskiPRT07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/LinKR07,
author = {Xijiang Lin and
Mark Kassab and
Janusz Rajski},
title = {Test Generation for Timing-Critical Transition Faults},
booktitle = {16th Asian Test Symposium, {ATS} 2007, Beijing, China, October 8-11,
2007},
pages = {493--500},
publisher = {{IEEE}},
year = {2007},
url = {https://doi.org/10.1109/ATS.2007.120},
doi = {10.1109/ATS.2007.120},
timestamp = {Wed, 09 Nov 2022 21:30:34 +0100},
biburl = {https://dblp.org/rec/conf/ats/LinKR07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dac/MrugalskiRCT07,
author = {Grzegorz Mrugalski and
Janusz Rajski and
Dariusz Czysz and
Jerzy Tyszer},
title = {New Test Data Decompressor for Low Power Applications},
booktitle = {Proceedings of the 44th Design Automation Conference, {DAC} 2007,
San Diego, CA, USA, June 4-8, 2007},
pages = {539--544},
publisher = {{IEEE}},
year = {2007},
url = {https://doi.org/10.1145/1278480.1278617},
doi = {10.1145/1278480.1278617},
timestamp = {Tue, 06 Nov 2018 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dac/MrugalskiRCT07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dac/GoswamiTKR07,
author = {Dhiraj Goswami and
Kun{-}Han Tsai and
Mark Kassab and
Janusz Rajski},
title = {Test Generation in the Presence of Timing Exceptions and Constraints},
booktitle = {Proceedings of the 44th Design Automation Conference, {DAC} 2007,
San Diego, CA, USA, June 4-8, 2007},
pages = {688--693},
publisher = {{IEEE}},
year = {2007},
url = {https://doi.org/10.1145/1278480.1278653},
doi = {10.1145/1278480.1278653},
timestamp = {Tue, 06 Nov 2018 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dac/GoswamiTKR07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ddecs/Rajski07,
author = {Janusz Rajski},
editor = {Patrick Girard and
Andrzej Krasniewski and
Elena Gramatov{\'{a}} and
Adam Pawlak and
Tomasz Garbolino},
title = {Logic Diagnosis and Yield Learning},
booktitle = {Proceedings of the 10th {IEEE} Workshop on Design {\&} Diagnostics
of Electronic Circuits {\&} Systems {(DDECS} 2007), Krak{\'{o}}w,
Poland, April 11-13, 2007},
pages = {19},
publisher = {{IEEE} Computer Society},
year = {2007},
url = {https://doi.org/10.1109/DDECS.2007.4295248},
doi = {10.1109/DDECS.2007.4295248},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ddecs/Rajski07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ets/TangMRKB07,
author = {Huaxing Tang and
Manish Sharma and
Janusz Rajski and
Martin Keim and
Brady Benware},
title = {Analyzing Volume Diagnosis Results with Statistical Learning for Yield
Improvement},
booktitle = {12th European Test Symposium, {ETS} 2007, Freiburg, Germany, May 20,
2007},
pages = {145--150},
publisher = {{IEEE} Computer Society},
year = {2007},
url = {https://doi.org/10.1109/ETS.2007.11},
doi = {10.1109/ETS.2007.11},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ets/TangMRKB07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vlsid/RemersaroLRPR07,
author = {Santiago Remersaro and
Xijiang Lin and
Sudhakar M. Reddy and
Irith Pomeranz and
Janusz Rajski},
title = {Low Shift and Capture Power Scan Tests},
booktitle = {20th International Conference on {VLSI} Design {(VLSI} Design 2007),
Sixth International Conference on Embedded Systems {(ICES} 2007),
6-10 January 2007, Bangalore, India},
pages = {793--798},
publisher = {{IEEE} Computer Society},
year = {2007},
url = {https://doi.org/10.1109/VLSID.2007.101},
doi = {10.1109/VLSID.2007.101},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vlsid/RemersaroLRPR07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/CzyszMRT07,
author = {Dariusz Czysz and
Grzegorz Mrugalski and
Janusz Rajski and
Jerzy Tyszer},
title = {Low Power Embedded Deterministic Test},
booktitle = {25th {IEEE} {VLSI} Test Symposium {(VTS} 2007), 6-10 May 2007, Berkeley,
California, {USA}},
pages = {75--83},
publisher = {{IEEE} Computer Society},
year = {2007},
url = {https://doi.org/10.1109/VTS.2007.37},
doi = {10.1109/VTS.2007.37},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/CzyszMRT07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/SchuermyerPJKRB07,
author = {Chris Schuermyer and
Jewel Pangilinan and
Jay Jahangiri and
Martin Keim and
Janusz Rajski and
Brady Benware},
title = {Silicon Evaluation of Static Alternative Fault Models},
booktitle = {25th {IEEE} {VLSI} Test Symposium {(VTS} 2007), 6-10 May 2007, Berkeley,
California, {USA}},
pages = {265--270},
publisher = {{IEEE} Computer Society},
year = {2007},
url = {https://doi.org/10.1109/VTS.2007.74},
doi = {10.1109/VTS.2007.74},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/SchuermyerPJKRB07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/itc/2007,
editor = {Jill Sibert and
Janusz Rajski},
title = {2007 {IEEE} International Test Conference, {ITC} 2007, Santa Clara,
California, USA, October 21-26, 2007},
publisher = {{IEEE} Computer Society},
year = {2007},
url = {https://ieeexplore.ieee.org/xpl/conhome/4437545/proceeding},
isbn = {1-4244-1128-9},
timestamp = {Wed, 16 Oct 2019 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/2007.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tc/MrugalskiMRT06,
author = {Grzegorz Mrugalski and
Nilanjan Mukherjee and
Janusz Rajski and
Jerzy Tyszer},
title = {High Performance Dense Ring Generators},
journal = {{IEEE} Trans. Computers},
volume = {55},
number = {1},
pages = {83--87},
year = {2006},
url = {https://doi.org/10.1109/TC.2006.11},
doi = {10.1109/TC.2006.11},
timestamp = {Fri, 02 Mar 2018 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/tc/MrugalskiMRT06.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tcad/WangMTR06,
author = {Zhiyuan Wang and
Malgorzata Marek{-}Sadowska and
Kun{-}Han Tsai and
Janusz Rajski},
title = {Analysis and methodology for multiple-fault diagnosis},
journal = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.},
volume = {25},
number = {3},
pages = {558--575},
year = {2006},
url = {https://doi.org/10.1109/TCAD.2005.854624},
doi = {10.1109/TCAD.2005.854624},
timestamp = {Thu, 24 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tcad/WangMTR06.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/LinTWKRKKSHA06,
author = {Xijiang Lin and
Kun{-}Han Tsai and
Chen Wang and
Mark Kassab and
Janusz Rajski and
Takeo Kobayashi and
Randy Klingenberg and
Yasuo Sato and
Shuji Hamada and
Takashi Aikyo},
title = {Timing-Aware {ATPG} for High Quality At-speed Testing of Small Delay
Defects},
booktitle = {15th Asian Test Symposium, {ATS} 2006, Fukuoka, Japan, November 20-23,
2006},
pages = {139--146},
publisher = {{IEEE}},
year = {2006},
url = {https://doi.org/10.1109/ATS.2006.261012},
doi = {10.1109/ATS.2006.261012},
timestamp = {Mon, 07 Nov 2022 17:39:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/LinTWKRKKSHA06.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/GoswamiTKKRSWSA06,
author = {Dhiraj Goswami and
Kun{-}Han Tsai and
Mark Kassab and
Takeo Kobayashi and
Janusz Rajski and
Bruce Swanson and
Darryl Walters and
Yasuo Sato and
Toshiharu Asaka and
Takashi Aikyo},
title = {At-Speed Testing with Timing Exceptions and Constraints-Case Studies},
booktitle = {15th Asian Test Symposium, {ATS} 2006, Fukuoka, Japan, November 20-23,
2006},
pages = {153--162},
publisher = {{IEEE}},
year = {2006},
url = {https://doi.org/10.1109/ATS.2006.261014},
doi = {10.1109/ATS.2006.261014},
timestamp = {Mon, 07 Nov 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/GoswamiTKKRSWSA06.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dac/ChenRPR06,
author = {Gang Chen and
Sudhakar M. Reddy and
Irith Pomeranz and
Janusz Rajski},
editor = {Ellen Sentovich},
title = {A test pattern ordering algorithm for diagnosis with truncated fail
data},
booktitle = {Proceedings of the 43rd Design Automation Conference, {DAC} 2006,
San Francisco, CA, USA, July 24-28, 2006},
pages = {399--404},
publisher = {{ACM}},
year = {2006},
url = {https://doi.org/10.1145/1146909.1147015},
doi = {10.1145/1146909.1147015},
timestamp = {Tue, 06 Nov 2018 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dac/ChenRPR06.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dac/MrugalskiRT06,
author = {Grzegorz Mrugalski and
Janusz Rajski and
Jerzy Tyszer},
editor = {Ellen Sentovich},
title = {Test response compactor with programmable selector},
booktitle = {Proceedings of the 43rd Design Automation Conference, {DAC} 2006,
San Francisco, CA, USA, July 24-28, 2006},
pages = {1089--1094},
publisher = {{ACM}},
year = {2006},
url = {https://doi.org/10.1145/1146909.1147184},
doi = {10.1145/1146909.1147184},
timestamp = {Tue, 06 Nov 2018 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dac/MrugalskiRT06.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ets/ZhangRPRA06,
author = {Zhuo Zhang and
Sudhakar M. Reddy and
Irith Pomeranz and
Janusz Rajski and
Bashir M. Al{-}Hashimi},
title = {Enhancing Delay Fault Coverage through Low Power Segmented Scan},
booktitle = {11th European Test Symposium, {ETS} 2006, Southhampton, UK, May 21-24,
2006},
pages = {21--28},
publisher = {{IEEE} Computer Society},
year = {2006},
url = {https://doi.org/10.1109/ETS.2006.18},
doi = {10.1109/ETS.2006.18},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ets/ZhangRPRA06.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ets/PogielRT06,
author = {Artur Pogiel and
Janusz Rajski and
Jerzy Tyszer},
title = {Convolutional Compactors with Variable Polynomials},
booktitle = {11th European Test Symposium, {ETS} 2006, Southhampton, UK, May 21-24,
2006},
pages = {117--122},
publisher = {{IEEE} Computer Society},
year = {2006},
url = {https://doi.org/10.1109/ETS.2006.11},
doi = {10.1109/ETS.2006.11},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ets/PogielRT06.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/isqed/MehtaMWTR06,
author = {Vishal J. Mehta and
Malgorzata Marek{-}Sadowska and
Zhiyuan Wang and
Kun{-}Han Tsai and
Janusz Rajski},
title = {Delay Fault Diagnosis for Non-Robust Test},
booktitle = {7th International Symposium on Quality of Electronic Design {(ISQED}
2006), 27-29 March 2006, San Jose, CA, {USA}},
pages = {463--472},
publisher = {{IEEE} Computer Society},
year = {2006},
url = {https://doi.org/10.1109/ISQED.2006.45},
doi = {10.1109/ISQED.2006.45},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/isqed/MehtaMWTR06.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/HuangCTRKHC06,
author = {Yu Huang and
Wu{-}Tung Cheng and
Nagesh Tamarapalli and
Janusz Rajski and
Randy Klingenberg and
Will Hsu and
Yuan{-}Shih Chen},
editor = {Scott Davidson and
Anne Gattiker},
title = {Diagnosis with Limited Failure Information},
booktitle = {2006 {IEEE} International Test Conference, {ITC} 2006, Santa Clara,
CA, USA, October 22-27, 2006},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2006},
url = {https://doi.org/10.1109/TEST.2006.297660},
doi = {10.1109/TEST.2006.297660},
timestamp = {Tue, 12 Dec 2023 09:46:27 +0100},
biburl = {https://dblp.org/rec/conf/itc/HuangCTRKHC06.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/KeimTTSRSB06,
author = {Martin Keim and
Nagesh Tamarapalli and
Huaxing Tang and
Manish Sharma and
Janusz Rajski and
Chris Schuermyer and
Brady Benware},
editor = {Scott Davidson and
Anne Gattiker},
title = {A Rapid Yield Learning Flow Based on Production Integrated Layout-Aware
Diagnosis},
booktitle = {2006 {IEEE} International Test Conference, {ITC} 2006, Santa Clara,
CA, USA, October 22-27, 2006},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2006},
url = {https://doi.org/10.1109/TEST.2006.297715},
doi = {10.1109/TEST.2006.297715},
timestamp = {Wed, 24 May 2017 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/KeimTTSRSB06.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/MehtaMTR06,
author = {Vishal J. Mehta and
Malgorzata Marek{-}Sadowska and
Kun{-}Han Tsai and
Janusz Rajski},
editor = {Scott Davidson and
Anne Gattiker},
title = {Timing Defect Diagnosis in Presence of Crosstalk for Nanometer Technology},
booktitle = {2006 {IEEE} International Test Conference, {ITC} 2006, Santa Clara,
CA, USA, October 22-27, 2006},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2006},
url = {https://doi.org/10.1109/TEST.2006.297626},
doi = {10.1109/TEST.2006.297626},
timestamp = {Wed, 24 May 2017 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/MehtaMTR06.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/RajskiTMCMK06,
author = {Janusz Rajski and
Jerzy Tyszer and
Grzegorz Mrugalski and
Wu{-}Tung Cheng and
Nilanjan Mukherjee and
Mark Kassab},
editor = {Scott Davidson and
Anne Gattiker},
title = {X-Press Compactor for 1000x Reduction of Test Data},
booktitle = {2006 {IEEE} International Test Conference, {ITC} 2006, Santa Clara,
CA, USA, October 22-27, 2006},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2006},
url = {https://doi.org/10.1109/TEST.2006.297643},
doi = {10.1109/TEST.2006.297643},
timestamp = {Fri, 02 Mar 2018 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/RajskiTMCMK06.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/RemersaroLZRPR06,
author = {Santiago Remersaro and
Xijiang Lin and
Zhuo Zhang and
Sudhakar M. Reddy and
Irith Pomeranz and
Janusz Rajski},
editor = {Scott Davidson and
Anne Gattiker},
title = {Preferred Fill: {A} Scalable Method to Reduce Capture Power for Scan
Based Designs},
booktitle = {2006 {IEEE} International Test Conference, {ITC} 2006, Santa Clara,
CA, USA, October 22-27, 2006},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2006},
url = {https://doi.org/10.1109/TEST.2006.297694},
doi = {10.1109/TEST.2006.297694},
timestamp = {Wed, 25 Mar 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/RemersaroLZRPR06.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vlsid/ChenRPR06,
author = {Gang Chen and
Sudhakar M. Reddy and
Irith Pomeranz and
Janusz Rajski},
title = {New Procedures to Identify Redundant Stuck-At Faults and Removal of
Redundant Logic},
booktitle = {19th International Conference on {VLSI} Design {(VLSI} Design 2006),
3-7 January 2006, Hyderabad, India},
pages = {419--424},
publisher = {{IEEE} Computer Society},
year = {2006},
url = {https://doi.org/10.1109/VLSID.2006.120},
doi = {10.1109/VLSID.2006.120},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vlsid/ChenRPR06.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/LinR06,
author = {Xijiang Lin and
Janusz Rajski},
title = {The Impacts of Untestable Defects on Transition Fault Testing},
booktitle = {24th {IEEE} {VLSI} Test Symposium {(VTS} 2006), 30 April - 4 May 2006,
Berkeley, California, {USA}},
pages = {2--7},
publisher = {{IEEE} Computer Society},
year = {2006},
url = {https://doi.org/10.1109/VTS.2006.87},
doi = {10.1109/VTS.2006.87},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/LinR06.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/RajskiR06,
author = {Wojciech Rajski and
Janusz Rajski},
title = {Modular Compactor of Test Responses},
booktitle = {24th {IEEE} {VLSI} Test Symposium {(VTS} 2006), 30 April - 4 May 2006,
Berkeley, California, {USA}},
pages = {242--251},
publisher = {{IEEE} Computer Society},
year = {2006},
url = {https://doi.org/10.1109/VTS.2006.48},
doi = {10.1109/VTS.2006.48},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/RajskiR06.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/ZhangRPLR06,
author = {Zhuo Zhang and
Sudhakar M. Reddy and
Irith Pomeranz and
Xijiang Lin and
Janusz Rajski},
title = {Scan Tests with Multiple Fault Activation Cycles for Delay Faults},
booktitle = {24th {IEEE} {VLSI} Test Symposium {(VTS} 2006), 30 April - 4 May 2006,
Berkeley, California, {USA}},
pages = {343--348},
publisher = {{IEEE} Computer Society},
year = {2006},
url = {https://doi.org/10.1109/VTS.2006.91},
doi = {10.1109/VTS.2006.91},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/ZhangRPLR06.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tcad/RajskiTWR05,
author = {Janusz Rajski and
Jerzy Tyszer and
Chen Wang and
Sudhakar M. Reddy},
title = {Finite memory test response compactors for embedded test applications},
journal = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.},
volume = {24},
number = {4},
pages = {622--634},
year = {2005},
url = {https://doi.org/10.1109/TCAD.2005.844111},
doi = {10.1109/TCAD.2005.844111},
timestamp = {Thu, 24 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tcad/RajskiTWR05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tcad/WangMTR05,
author = {Zhiyuan Wang and
Malgorzata Marek{-}Sadowska and
Kun{-}Han Tsai and
Janusz Rajski},
title = {Delay-fault diagnosis using timing information},
journal = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.},
volume = {24},
number = {9},
pages = {1315--1325},
year = {2005},
url = {https://doi.org/10.1109/TCAD.2005.852062},
doi = {10.1109/TCAD.2005.852062},
timestamp = {Thu, 24 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tcad/WangMTR05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/aspdac/LinR05,
author = {Xijiang Lin and
Janusz Rajski},
editor = {Tingao Tang},
title = {Propagation delay fault: a new fault model to test delay faults},
booktitle = {Proceedings of the 2005 Conference on Asia South Pacific Design Automation,
{ASP-DAC} 2005, Shanghai, China, January 18-21, 2005},
pages = {178--183},
publisher = {{ACM} Press},
year = {2005},
url = {https://doi.org/10.1145/1120725.1120799},
doi = {10.1145/1120725.1120799},
timestamp = {Wed, 16 Oct 2019 14:14:52 +0200},
biburl = {https://dblp.org/rec/conf/aspdac/LinR05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/Rajski05,
author = {Janusz Rajski},
title = {Embedded Test Technology - Brief History, Current Status, and Future
Directions},
booktitle = {14th Asian Test Symposium {(ATS} 2005), 18-21 December 2005, Calcutta,
India},
publisher = {{IEEE} Computer Society},
year = {2005},
url = {https://doi.org/10.1109/ATS.2005.56},
doi = {10.1109/ATS.2005.56},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/Rajski05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/date/TangCRWRP05,
author = {Huaxing Tang and
Gang Chen and
Sudhakar M. Reddy and
Chen Wang and
Janusz Rajski and
Irith Pomeranz},
title = {Defect Aware Test Patterns},
booktitle = {2005 Design, Automation and Test in Europe Conference and Exposition
{(DATE} 2005), 7-11 March 2005, Munich, Germany},
pages = {450--455},
publisher = {{IEEE} Computer Society},
year = {2005},
url = {https://doi.org/10.1109/DATE.2005.110},
doi = {10.1109/DATE.2005.110},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/date/TangCRWRP05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ets/0011RPREB05,
author = {Gang Chen and
Sudhakar M. Reddy and
Irith Pomeranz and
Janusz Rajski and
Piet Engelke and
Bernd Becker},
title = {A unified fault model and test generation procedure for interconnect
opens and bridges},
booktitle = {10th European Test Symposium, {ETS} 2005, Tallinn, Estonia, May 22-25,
2005},
pages = {22--27},
publisher = {{IEEE} Computer Society},
year = {2005},
url = {https://doi.org/10.1109/ETS.2005.6},
doi = {10.1109/ETS.2005.6},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ets/0011RPREB05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ets/MrugalskiPRTW05,
author = {Grzegorz Mrugalski and
Artur Pogiel and
Janusz Rajski and
Jerzy Tyszer and
Chen Wang},
title = {Convolutional compaction-driven diagnosis of scan failures},
booktitle = {10th European Test Symposium, {ETS} 2005, Tallinn, Estonia, May 22-25,
2005},
pages = {176--181},
publisher = {{IEEE} Computer Society},
year = {2005},
url = {https://doi.org/10.1109/ETS.2005.11},
doi = {10.1109/ETS.2005.11},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ets/MrugalskiPRTW05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Rajski05,
author = {Janusz Rajski},
title = {Test compression - real issues and matching solutions},
booktitle = {Proceedings 2005 {IEEE} International Test Conference, {ITC} 2005,
Austin, TX, USA, November 8-10, 2005},
pages = {2},
publisher = {{IEEE} Computer Society},
year = {2005},
url = {https://doi.org/10.1109/TEST.2005.1584114},
doi = {10.1109/TEST.2005.1584114},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Rajski05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/HuangCR05,
author = {Yu Huang and
Wu{-}Tung Cheng and
Janusz Rajski},
title = {Compressed pattern diagnosis for scan chain failures},
booktitle = {Proceedings 2005 {IEEE} International Test Conference, {ITC} 2005,
Austin, TX, USA, November 8-10, 2005},
pages = {8},
publisher = {{IEEE} Computer Society},
year = {2005},
url = {https://doi.org/10.1109/TEST.2005.1584037},
doi = {10.1109/TEST.2005.1584037},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/HuangCR05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/MrugalskiPRT05,
author = {Grzegorz Mrugalski and
Artur Pogiel and
Janusz Rajski and
Jerzy Tyszer},
title = {Diagnosis with convolutional compactors in presence of unknown states},
booktitle = {Proceedings 2005 {IEEE} International Test Conference, {ITC} 2005,
Austin, TX, USA, November 8-10, 2005},
pages = {10},
publisher = {{IEEE} Computer Society},
year = {2005},
url = {https://doi.org/10.1109/TEST.2005.1583998},
doi = {10.1109/TEST.2005.1583998},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/MrugalskiPRT05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vlsid/TangWRRTP05,
author = {Huaxing Tang and
Chen Wang and
Janusz Rajski and
Sudhakar M. Reddy and
Jerzy Tyszer and
Irith Pomeranz},
title = {On Efficient X-Handling Using a Selective Compaction Scheme to Achieve
High Test Response Compaction Ratios},
booktitle = {18th International Conference on {VLSI} Design {(VLSI} Design 2005),
with the 4th International Conference on Embedded Systems Design,
3-7 January 2005, Kolkata, India},
pages = {59--64},
publisher = {{IEEE} Computer Society},
year = {2005},
url = {https://doi.org/10.1109/ICVD.2005.127},
doi = {10.1109/ICVD.2005.127},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vlsid/TangWRRTP05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/RajskiT05,
author = {Janusz Rajski and
Jerzy Tyszer},
title = {Synthesis of X-Tolerant Convolutional Compactors},
booktitle = {23rd {IEEE} {VLSI} Test Symposium {(VTS} 2005), 1-5 May 2005, Palm
Springs, CA, {USA}},
pages = {114--119},
publisher = {{IEEE} Computer Society},
year = {2005},
url = {https://doi.org/10.1109/VTS.2005.81},
doi = {10.1109/VTS.2005.81},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/RajskiT05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tcad/RajskiTKM04,
author = {Janusz Rajski and
Jerzy Tyszer and
Mark Kassab and
Nilanjan Mukherjee},
title = {Embedded deterministic test},
journal = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.},
volume = {23},
number = {5},
pages = {776--792},
year = {2004},
url = {https://doi.org/10.1109/TCAD.2004.826558},
doi = {10.1109/TCAD.2004.826558},
timestamp = {Thu, 24 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tcad/RajskiTKM04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tcad/MrugalskiRT04,
author = {Grzegorz Mrugalski and
Janusz Rajski and
Jerzy Tyszer},
title = {Ring generators - new devices for embedded test applications},
journal = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.},
volume = {23},
number = {9},
pages = {1306--1320},
year = {2004},
url = {https://doi.org/10.1109/TCAD.2004.831584},
doi = {10.1109/TCAD.2004.831584},
timestamp = {Thu, 24 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tcad/MrugalskiRT04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/ChengTHTR04,
author = {Wu{-}Tung Cheng and
Kun{-}Han Tsai and
Yu Huang and
Nagesh Tamarapalli and
Janusz Rajski},
title = {Compactor Independent Direct Diagnosis},
booktitle = {13th Asian Test Symposium {(ATS} 2004), 15-17 November 2004, Kenting,
Taiwan},
pages = {204--209},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/ATS.2004.32},
doi = {10.1109/ATS.2004.32},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/ChengTHTR04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/date/RajskiT04,
author = {Janusz Rajski and
Kan Thapar},
title = {Nanometer Design: What are the Requirements for Manufacturing Test?},
booktitle = {2004 Design, Automation and Test in Europe Conference and Exposition
{(DATE} 2004), 16-20 February 2004, Paris, France},
pages = {930--937},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/DATE.2004.1269010},
doi = {10.1109/DATE.2004.1269010},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/date/RajskiT04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iccd/WangMTR04,
author = {Zhiyuan Wang and
Malgorzata Marek{-}Sadowska and
Kun{-}Han Tsai and
Janusz Rajski},
title = {Diagnosis of Hold Time Defects},
booktitle = {22nd {IEEE} International Conference on Computer Design: {VLSI} in
Computers {\&} Processors {(ICCD} 2004), 11-13 October 2004, San
Jose, CA, USA, Proceedings},
pages = {192--199},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/ICCD.2004.1347921},
doi = {10.1109/ICCD.2004.1347921},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/iccd/WangMTR04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/isqed/WangMTR04,
author = {Zhiyuan Wang and
Malgorzata Marek{-}Sadowska and
Kun{-}Han Tsai and
Janusz Rajski},
title = {Delay Fault Diagnosis Using Timing Information},
booktitle = {5th International Symposium on Quality of Electronic Design {(ISQED}
2004), 22-24 March 2004, San Jose, CA, {USA}},
pages = {485--490},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/ISQED.2004.1283720},
doi = {10.1109/ISQED.2004.1283720},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/isqed/WangMTR04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/MrugalskiWPTR04,
author = {Grzegorz Mrugalski and
Chen Wang and
Artur Pogiel and
Jerzy Tyszer and
Janusz Rajski},
title = {Fault Diagnosis in Designs with Convolutional Compactors},
booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October
26-28, 2004, Charlotte, NC, {USA}},
pages = {498--507},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/TEST.2004.1386986},
doi = {10.1109/TEST.2004.1386986},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/MrugalskiWPTR04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/GuWLETTKR04,
author = {Xinli Gu and
Cyndee Wang and
Abby Lee and
Bill Eklow and
Kun{-}Han Tsai and
Jan Arild Tofte and
Mark Kassab and
Janusz Rajski},
title = {Realizing High Test Quality Goals with Smart Test Resource Usage},
booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October
26-28, 2004, Charlotte, NC, {USA}},
pages = {525--533},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/TEST.2004.1386989},
doi = {10.1109/TEST.2004.1386989},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/GuWLETTKR04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/BenwareLSKMKKR04,
author = {Brady Benware and
Cam Lu and
John Van Slyke and
Prabhu Krishnamurthy and
Robert Madge and
Martin Keim and
Mark Kassab and
Janusz Rajski},
title = {Affordable and Effective Screening of Delay Defects in ASICs using
the Inline Resistance Fault Model},
booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October
26-28, 2004, Charlotte, NC, {USA}},
pages = {1285--1294},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/TEST.2004.1387403},
doi = {10.1109/TEST.2004.1387403},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/BenwareLSKMKKR04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vlsid/RajskiMTR04,
author = {Janusz Rajski and
Nilanjan Mukherjee and
Jerzy Tyszer and
Thomas Rinderknecht},
title = {Embedded Test for Low Cost Manufacturing},
booktitle = {17th International Conference on {VLSI} Design {(VLSI} Design 2004),
with the 3rd International Conference on Embedded Systems Design,
5-9 January 2004, Mumbai, India},
pages = {21--23},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/ICVD.2004.1260896},
doi = {10.1109/ICVD.2004.1260896},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vlsid/RajskiMTR04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/MrugalskiMRT04,
author = {Grzegorz Mrugalski and
Nilanjan Mukherjee and
Janusz Rajski and
Jerzy Tyszer},
title = {Planar High Performance Ring Generators},
booktitle = {22nd {IEEE} {VLSI} Test Symposium {(VTS} 2004), 25-29 April 2004,
Napa Valley, CA, {USA}},
pages = {193--198},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/VTEST.2004.1299243},
doi = {10.1109/VTEST.2004.1299243},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/MrugalskiMRT04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/MrugalskiTR03,
author = {Grzegorz Mrugalski and
Jerzy Tyszer and
Janusz Rajski},
title = {2D Test Sequence Generators},
journal = {{IEEE} Des. Test Comput.},
volume = {20},
number = {1},
pages = {51--59},
year = {2003},
url = {https://doi.org/10.1109/MDT.2003.1173053},
doi = {10.1109/MDT.2003.1173053},
timestamp = {Sun, 17 May 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/dt/MrugalskiTR03.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/LinPRRRST03,
author = {Xijiang Lin and
Ron Press and
Janusz Rajski and
Paul Reuter and
Thomas Rinderknecht and
Bruce Swanson and
Nagesh Tamarapalli},
title = {High-Frequency, At-Speed Scan Testing},
journal = {{IEEE} Des. Test Comput.},
volume = {20},
number = {5},
pages = {17--25},
year = {2003},
url = {https://doi.org/10.1109/MDT.2003.1232252},
doi = {10.1109/MDT.2003.1232252},
timestamp = {Sun, 17 May 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/dt/LinPRRRST03.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/RajskiKMTTQ03,
author = {Janusz Rajski and
Mark Kassab and
Nilanjan Mukherjee and
Nagesh Tamarapalli and
Jerzy Tyszer and
Jun Qian},
title = {Embedded Deterministic Test for Low-Cost Manufacturing},
journal = {{IEEE} Des. Test Comput.},
volume = {20},
number = {5},
pages = {58--66},
year = {2003},
url = {https://doi.org/10.1109/MDT.2003.1232257},
doi = {10.1109/MDT.2003.1232257},
timestamp = {Sun, 17 May 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/dt/RajskiKMTTQ03.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/RajskiT03,
author = {Janusz Rajski and
Jerzy Tyszer},
title = {Primitive Polynomials Over {GF(2)} of Degree up to 660 with Uniformly
Distributed Coefficients},
journal = {J. Electron. Test.},
volume = {19},
number = {6},
pages = {645--657},
year = {2003},
url = {https://doi.org/10.1023/A:1027422805851},
doi = {10.1023/A:1027422805851},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/RajskiT03.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iccad/WangRPRT03,
author = {Chen Wang and
Sudhakar M. Reddy and
Irith Pomeranz and
Janusz Rajski and
Jerzy Tyszer},
title = {On Compacting Test Response Data Containing Unknown Values},
booktitle = {2003 International Conference on Computer-Aided Design, {ICCAD} 2003,
San Jose, CA, USA, November 9-13, 2003},
pages = {855--862},
publisher = {{IEEE} Computer Society / {ACM}},
year = {2003},
url = {https://doi.ieeecomputersociety.org/10.1109/ICCAD.2003.1257908},
doi = {10.1109/ICCAD.2003.1257908},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/iccad/WangRPRT03.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iccd/WangMTR03,
author = {Zhiyuan Wang and
Malgorzata Marek{-}Sadowska and
Kun{-}Han Tsai and
Janusz Rajski},
title = {Multiple Fault Diagnosis Using n-Detection Tests},
booktitle = {21st International Conference on Computer Design {(ICCD} 2003),VLSI
in Computers and Processors, 13-15 October 2003, San Jose, CA, USA,
Proceedings},
pages = {198},
publisher = {{IEEE} Computer Society},
year = {2003},
url = {https://doi.org/10.1109/ICCD.2003.1240895},
doi = {10.1109/ICCD.2003.1240895},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/iccd/WangMTR03.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iccd/RajskiT03,
author = {Janusz Rajski and
Jerzy Tyszer},
title = {Test Data Compression and Compaction for Embedded Test of Nanometer
Technology Designs},
booktitle = {21st International Conference on Computer Design {(ICCD} 2003),VLSI
in Computers and Processors, 13-15 October 2003, San Jose, CA, USA,
Proceedings},
pages = {331},
publisher = {{IEEE} Computer Society},
year = {2003},
url = {https://doi.org/10.1109/ICCD.2003.1240915},
doi = {10.1109/ICCD.2003.1240915},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/iccd/RajskiT03.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Rajski03,
author = {Janusz Rajski},
title = {Test Challenges of Nanometer Technology},
booktitle = {Proceedings 2003 International Test Conference {(ITC} 2003), Breaking
Test Interface Bottlenecks, 28 September - 3 October 2003, Charlotte,
NC, {USA}},
pages = {13--22},
publisher = {{IEEE} Computer Society},
year = {2003},
url = {https://doi.ieeecomputersociety.org/10.1109/ITC.2003.10004},
doi = {10.1109/ITC.2003.10004},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Rajski03.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/WangTMR03,
author = {Zhiyuan Wang and
Kun{-}Han Tsai and
Malgorzata Marek{-}Sadowska and
Janusz Rajski},
title = {An Efficient and Effective Methodology on the Multiple Fault Diagnosis},
booktitle = {Proceedings 2003 International Test Conference {(ITC} 2003), Breaking
Test Interface Bottlenecks, 28 September - 3 October 2003, Charlotte,
NC, {USA}},
pages = {329--338},
publisher = {{IEEE} Computer Society},
year = {2003},
url = {https://doi.org/10.1109/TEST.2003.1270855},
doi = {10.1109/TEST.2003.1270855},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/WangTMR03.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/RajskiTWR03,
author = {Janusz Rajski and
Jerzy Tyszer and
Chen Wang and
Sudhakar M. Reddy},
title = {Convolutional Compaction of Test Responses},
booktitle = {Proceedings 2003 International Test Conference {(ITC} 2003), Breaking
Test Interface Bottlenecks, 28 September - 3 October 2003, Charlotte,
NC, {USA}},
pages = {745--754},
publisher = {{IEEE} Computer Society},
year = {2003},
url = {https://doi.org/10.1109/TEST.2003.1270904},
doi = {10.1109/TEST.2003.1270904},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/RajskiTWR03.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/BenwareSRMKTTR03,
author = {Brady Benware and
Chris Schuermyer and
Sreenevasan Ranganathan and
Robert Madge and
Prabhu Krishnamurthy and
Nagesh Tamarapalli and
Kun{-}Han Tsai and
Janusz Rajski},
title = {Impact of Multiple-Detect Test Patterns on Product Quality},
booktitle = {Proceedings 2003 International Test Conference {(ITC} 2003), Breaking
Test Interface Bottlenecks, 28 September - 3 October 2003, Charlotte,
NC, {USA}},
pages = {1031--1040},
publisher = {{IEEE} Computer Society},
year = {2003},
url = {https://doi.org/10.1109/TEST.2003.1271091},
doi = {10.1109/TEST.2003.1271091},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/BenwareSRMKTTR03.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/PoehlBAMTKMR03,
author = {Frank Poehl and
Matthias Beck and
Ralf Arnold and
Peter Muhmenthaler and
Nagesh Tamarapalli and
Mark Kassab and
Nilanjan Mukherjee and
Janusz Rajski},
title = {Industrial Experience with Adoption of {EDT} for Low-Cost Test without
Concessions},
booktitle = {Proceedings 2003 International Test Conference {(ITC} 2003), Breaking
Test Interface Bottlenecks, 28 September - 3 October 2003, Charlotte,
NC, {USA}},
pages = {1211--1220},
publisher = {{IEEE} Computer Society},
year = {2003},
url = {https://doi.org/10.1109/TEST.2003.1271110},
doi = {10.1109/TEST.2003.1271110},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/PoehlBAMTKMR03.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/MrugalskiRT03,
author = {Grzegorz Mrugalski and
Janusz Rajski and
Jerzy Tyszer},
title = {High Speed Ring Generators and Compactors of Test Data},
booktitle = {21st {IEEE} {VLSI} Test Symposium {(VTS} 2003), 27 April - 1 May 2003,
Napa Valley, CA, {USA}},
pages = {57--62},
publisher = {{IEEE} Computer Society},
year = {2003},
url = {https://doi.org/10.1109/VTEST.2003.1197633},
doi = {10.1109/VTEST.2003.1197633},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/MrugalskiRT03.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/date/PomeranzRR02,
author = {Irith Pomeranz and
Janusz Rajski and
Sudhakar M. Reddy},
title = {Finding a Common Fault Response for Diagnosis during Silicon Debug},
booktitle = {2002 Design, Automation and Test in Europe Conference and Exposition
{(DATE} 2002), 4-8 March 2002, Paris, France},
pages = {1116},
publisher = {{IEEE} Computer Society},
year = {2002},
url = {https://doi.org/10.1109/DATE.2002.998471},
doi = {10.1109/DATE.2002.998471},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/date/PomeranzRR02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iccad/WangRPLR02,
author = {Chen Wang and
Sudhakar M. Reddy and
Irith Pomeranz and
Xijiang Lin and
Janusz Rajski},
editor = {Lawrence T. Pileggi and
Andreas Kuehlmann},
title = {Conflict driven techniques for improving deterministic test pattern
generation},
booktitle = {Proceedings of the 2002 {IEEE/ACM} International Conference on Computer-aided
Design, {ICCAD} 2002, San Jose, California, USA, November 10-14, 2002},
pages = {87--93},
publisher = {{ACM} / {IEEE} Computer Society},
year = {2002},
url = {https://doi.org/10.1145/774572.774585},
doi = {10.1145/774572.774585},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/iccad/WangRPLR02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/RajkiTKMTTHTMEQ02,
author = {Janusz Rajski and
Jerzy Tyszer and
Mark Kassab and
Nilanjan Mukherjee and
Rob Thompson and
Kun{-}Han Tsai and
Andre Hertwig and
Nagesh Tamarapalli and
Grzegorz Mrugalski and
Geir Eide and
Jun Qian},
title = {Embedded Deterministic Test for Low-Cost Manufacturing Test},
booktitle = {Proceedings {IEEE} International Test Conference 2002, Baltimore,
MD, USA, October 7-10, 2002},
pages = {301--310},
publisher = {{IEEE} Computer Society},
year = {2002},
url = {https://doi.org/10.1109/TEST.2002.1041773},
doi = {10.1109/TEST.2002.1041773},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/RajkiTKMTTHTMEQ02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vlsid/BasturkmenRR02,
author = {Nadir Z. Basturkmen and
Sudhakar M. Reddy and
Janusz Rajski},
title = {Improved Algorithms for Constructive Multi-Phase Test Point Insertion
for Scan Based {BIST}},
booktitle = {Proceedings of the 7th Asia and South Pacific Design Automation Conference
{(ASP-DAC} 2002), and the 15th International Conference on {VLSI}
Design {(VLSI} Design 2002), Bangalore, India, January 7-11, 2002},
pages = {604},
publisher = {{IEEE} Computer Society},
year = {2002},
url = {https://doi.org/10.1109/ASPDAC.2002.995003},
doi = {10.1109/ASPDAC.2002.995003},
timestamp = {Mon, 14 Nov 2022 15:28:09 +0100},
biburl = {https://dblp.org/rec/conf/vlsid/BasturkmenRR02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/BorelRSHR02,
author = {J. Borel and
Anand Raghunathan and
Jim Sproch and
Michael Howells and
Janusz Rajski},
title = {Innovations in Test Automation},
booktitle = {20th {IEEE} {VLSI} Test Symposium {(VTS} 2002), Without Testing It's
a Gamble, 28 April - 2 May 2002, Monterey, CA, {USA}},
pages = {43--46},
publisher = {{IEEE} Computer Society},
year = {2002},
url = {https://doi.org/10.1109/VTS.2002.1011109},
doi = {10.1109/VTS.2002.1011109},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/BorelRSHR02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tc/MukherjeeRT01,
author = {Nilanjan Mukherjee and
Janusz Rajski and
Jerzy Tyszer},
title = {Testing Schemes for {FIR} Filter Structures},
journal = {{IEEE} Trans. Computers},
volume = {50},
number = {7},
pages = {674--688},
year = {2001},
url = {https://doi.org/10.1109/12.936234},
doi = {10.1109/12.936234},
timestamp = {Fri, 02 Mar 2018 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/tc/MukherjeeRT01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/Rajski01,
author = {Janusz Rajski},
title = {{DFT} for High-Quality Low Cost Manufacturing Test},
booktitle = {10th Asian Test Symposium {(ATS} 2001), 19-21 November 2001, Kyoto,
Japan},
pages = {3},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.org/10.1109/ATS.2001.990250},
doi = {10.1109/ATS.2001.990250},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/Rajski01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ChenKWSRM01,
author = {John T. Chen and
Jitendra Khare and
Ken Walker and
Saghir A. Shaikh and
Janusz Rajski and
Wojciech Maly},
title = {Test response compression and bitmap encoding for embedded memories
in manufacturing process monitoring},
booktitle = {Proceedings {IEEE} International Test Conference 2001, Baltimore,
MD, USA, 30 October - 1 November 2001},
pages = {258--267},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.org/10.1109/TEST.2001.966641},
doi = {10.1109/TEST.2001.966641},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/ChenKWSRM01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/LinRPR01,
author = {Xijiang Lin and
Janusz Rajski and
Irith Pomeranz and
Sudhakar M. Reddy},
title = {On static test compaction and test pattern ordering for scan designs},
booktitle = {Proceedings {IEEE} International Test Conference 2001, Baltimore,
MD, USA, 30 October - 1 November 2001},
pages = {1088--1097},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.org/10.1109/TEST.2001.966735},
doi = {10.1109/TEST.2001.966735},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/LinRPR01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/ChenMRKK01,
author = {John T. Chen and
Wojciech Maly and
Janusz Rajski and
Omar Kebichi and
Jitendra Khare},
title = {Enabling Embedded Memory Diagnosis via Test Response Compression},
booktitle = {19th {IEEE} {VLSI} Test Symposium {(VTS} 2001), Test and Diagnosis
in a Nanometric World, 29 April - 3 May 2001, Marina Del Rey, CA,
{USA}},
pages = {292--298},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.org/10.1109/VTS.2001.923452},
doi = {10.1109/VTS.2001.923452},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/ChenMRKK01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tcad/MrugalskiRT00,
author = {Grzegorz Mrugalski and
Janusz Rajski and
Jerzy Tyszer},
title = {Cellular automata-based test pattern generators with phase shifters},
journal = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.},
volume = {19},
number = {8},
pages = {878--893},
year = {2000},
url = {https://doi.org/10.1109/43.856975},
doi = {10.1109/43.856975},
timestamp = {Thu, 24 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tcad/MrugalskiRT00.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tcad/TsaiRM00,
author = {Kun{-}Han Tsai and
Janusz Rajski and
Malgorzata Marek{-}Sadowska},
title = {Star test: the theory and its applications},
journal = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.},
volume = {19},
number = {9},
pages = {1052--1064},
year = {2000},
url = {https://doi.org/10.1109/43.863645},
doi = {10.1109/43.863645},
timestamp = {Thu, 24 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tcad/TsaiRM00.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tcad/RajskiTT00,
author = {Janusz Rajski and
Nagesh Tamarapalli and
Jerzy Tyszer},
title = {Automated synthesis of phase shifters for built-in self-testapplications},
journal = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.},
volume = {19},
number = {10},
pages = {1175--1188},
year = {2000},
url = {https://doi.org/10.1109/43.875312},
doi = {10.1109/43.875312},
timestamp = {Thu, 24 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tcad/RajskiTT00.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dac/BaiDR00,
author = {Xiaoliang Bai and
Sujit Dey and
Janusz Rajski},
editor = {Giovanni De Micheli},
title = {Self-test methodology for at-speed test of crosstalk in chip interconnects},
booktitle = {Proceedings of the 37th Conference on Design Automation, Los Angeles,
CA, USA, June 5-9, 2000},
pages = {619--624},
publisher = {{ACM}},
year = {2000},
url = {https://doi.org/10.1145/337292.337597},
doi = {10.1145/337292.337597},
timestamp = {Tue, 06 Nov 2018 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dac/BaiDR00.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iccad/HuangPRR00,
author = {Yu Huang and
Irith Pomeranz and
Sudhakar M. Reddy and
Janusz Rajski},
editor = {Ellen Sentovich},
title = {Improving the Proportion of At-Speed Tests in Scan {BIST}},
booktitle = {Proceedings of the 2000 {IEEE/ACM} International Conference on Computer-Aided
Design, 2000, San Jose, California, USA, November 5-9, 2000},
pages = {459--463},
publisher = {{IEEE} Computer Society},
year = {2000},
url = {https://doi.org/10.1109/ICCAD.2000.896514},
doi = {10.1109/ICCAD.2000.896514},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/iccad/HuangPRR00.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/MrugalskiTR00,
author = {Grzegorz Mrugalski and
Jerzy Tyszer and
Janusz Rajski},
title = {Linear Independence as Evaluation Criterion for Two-Dimensional Test
Pattern Generators},
booktitle = {18th {IEEE} {VLSI} Test Symposium {(VTS} 2000), 30 April - 4 May 2000,
Montreal, Canada},
pages = {377--388},
publisher = {{IEEE} Computer Society},
year = {2000},
url = {https://doi.org/10.1109/VTEST.2000.843868},
doi = {10.1109/VTEST.2000.843868},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/MrugalskiTR00.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/cm/RajskiT99,
author = {Janusz Rajski and
Jerzy Tyszer},
title = {Testing of telecommunications hardware [Guest Editorial]},
journal = {{IEEE} Commun. Mag.},
volume = {37},
number = {6},
pages = {60--62},
year = {1999},
url = {https://doi.org/10.1109/MCOM.1999.769275},
doi = {10.1109/MCOM.1999.769275},
timestamp = {Tue, 25 Aug 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/cm/RajskiT99.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tc/RajskiT99,
author = {Janusz Rajski and
Jerzy Tyszer},
title = {Diagnosis of Scan Cells in {BIST} Environment},
journal = {{IEEE} Trans. Computers},
volume = {48},
number = {7},
pages = {724--731},
year = {1999},
url = {https://doi.org/10.1109/12.780879},
doi = {10.1109/12.780879},
timestamp = {Sat, 20 May 2017 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tc/RajskiT99.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/HetheringtonFTKHR99,
author = {Graham Hetherington and
Tony Fryars and
Nagesh Tamarapalli and
Mark Kassab and
Abu S. M. Hassan and
Janusz Rajski},
title = {Logic {BIST} for large industrial designs: real issues and case studies},
booktitle = {Proceedings {IEEE} International Test Conference 1999, Atlantic City,
NJ, USA, 27-30 September 1999},
pages = {358--367},
publisher = {{IEEE} Computer Society},
year = {1999},
url = {https://doi.org/10.1109/TEST.1999.805650},
doi = {10.1109/TEST.1999.805650},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/HetheringtonFTKHR99.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/MrugalskiTR99,
author = {Grzegorz Mrugalski and
Jerzy Tyszer and
Janusz Rajski},
title = {Synthesis of pattern generators based on cellular automata with phase
shifters},
booktitle = {Proceedings {IEEE} International Test Conference 1999, Atlantic City,
NJ, USA, 27-30 September 1999},
pages = {368--377},
publisher = {{IEEE} Computer Society},
year = {1999},
url = {https://doi.org/10.1109/TEST.1999.805651},
doi = {10.1109/TEST.1999.805651},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/MrugalskiTR99.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/TsaiTRM99,
author = {Kuo{-}Hui Tsai and
Tompson and
Janusz Rajski and
Malgorzata Marek{-}Sadowska},
title = {{STAR-ATPG:} a high speed test pattern generator for large scan designs},
booktitle = {Proceedings {IEEE} International Test Conference 1999, Atlantic City,
NJ, USA, 27-30 September 1999},
pages = {1021--1030},
publisher = {{IEEE} Computer Society},
year = {1999},
url = {https://doi.org/10.1109/TEST.1999.805835},
doi = {10.1109/TEST.1999.805835},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/TsaiTRM99.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vlsid/RajskiTP99,
author = {Janusz Rajski and
Jerzy Tyszer and
Sanjay Patel},
title = {Built-In Self-Test for Systems on Silicon},
booktitle = {12th International Conference on {VLSI} Design {(VLSI} Design 1999),
10-13 January 1999, Goa, India},
pages = {609--610},
publisher = {{IEEE} Computer Society},
year = {1999},
url = {http://www.computer.org/csdl/proceedings/vlsid/1999/0013/00/00130609.pdf},
timestamp = {Wed, 16 Oct 2019 14:14:54 +0200},
biburl = {https://dblp.org/rec/conf/vlsid/RajskiTP99.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/RajskiMT99,
author = {Janusz Rajski and
Grzegorz Mrugalski and
Jerzy Tyszer},
title = {Comparative Study of CA-based PRPGs and LFSRs with Phase Shifters},
booktitle = {17th {IEEE} {VLSI} Test Symposium {(VTS} '99), 25-30 April 1999, San
Diego, CA, {USA}},
pages = {236--245},
publisher = {{IEEE} Computer Society},
year = {1999},
url = {https://doi.org/10.1109/VTEST.1999.766671},
doi = {10.1109/VTEST.1999.766671},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/RajskiMT99.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tc/RajskiTZ98,
author = {Janusz Rajski and
Jerzy Tyszer and
Nadime Zacharia},
title = {Test Data Decompression for Multiple Scan Designs with Boundary Scan},
journal = {{IEEE} Trans. Computers},
volume = {47},
number = {11},
pages = {1188--1200},
year = {1998},
url = {https://doi.org/10.1109/12.736428},
doi = {10.1109/12.736428},
timestamp = {Sat, 20 May 2017 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tc/RajskiTZ98.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dac/El-MalehKR98,
author = {Aiman H. El{-}Maleh and
Mark Kassab and
Janusz Rajski},
editor = {Basant R. Chawla and
Randal E. Bryant and
Jan M. Rabaey},
title = {A Fast Sequential Learning Technique for Real Circuits with Application
to Enhancing {ATPG} Performance},
booktitle = {Proceedings of the 35th Conference on Design Automation, Moscone center,
San Francico, California, USA, June 15-19, 1998},
pages = {625--631},
publisher = {{ACM} Press},
year = {1998},
url = {https://doi.org/10.1145/277044.277206},
doi = {10.1145/277044.277206},
timestamp = {Tue, 06 Nov 2018 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dac/El-MalehKR98.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/RajskiT98,
author = {Janusz Rajski and
Jerzy Tyszer},
title = {Modular logic built-in self-test for {IP} cores},
booktitle = {Proceedings {IEEE} International Test Conference 1998, Washington,
DC, USA, October 18-22, 1998},
pages = {313--321},
publisher = {{IEEE} Computer Society},
year = {1998},
url = {https://doi.org/10.1109/TEST.1998.743169},
doi = {10.1109/TEST.1998.743169},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/RajskiT98.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/RajskiTT98,
author = {Janusz Rajski and
Nagesh Tamarapalli and
Jerzy Tyszer},
title = {Automated synthesis of large phase shifters for built-in self-test},
booktitle = {Proceedings {IEEE} International Test Conference 1998, Washington,
DC, USA, October 18-22, 1998},
pages = {1047--1056},
publisher = {{IEEE} Computer Society},
year = {1998},
url = {https://doi.org/10.1109/TEST.1998.743303},
doi = {10.1109/TEST.1998.743303},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/RajskiTT98.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/RajskiT98,
author = {Janusz Rajski and
Jerzy Tyszer},
title = {Design of Phase Shifters for {BIST} Applications},
booktitle = {16th {IEEE} {VLSI} Test Symposium {(VTS} '98), 28 April - 1 May 1998,
Princeton, NJ, {USA}},
pages = {218--224},
publisher = {{IEEE} Computer Society},
year = {1998},
url = {https://doi.org/10.1109/VTEST.1998.670871},
doi = {10.1109/VTEST.1998.670871},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/RajskiT98.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tc/MukherjeeRT97,
author = {Nilanjan Mukherjee and
Janusz Rajski and
Jerzy Tyszer},
title = {Design of Testable Multipliers for Fixed-Width Data Paths},
journal = {{IEEE} Trans. Computers},
volume = {46},
number = {7},
pages = {795--810},
year = {1997},
url = {https://doi.org/10.1109/12.599900},
doi = {10.1109/12.599900},
timestamp = {Fri, 02 Mar 2018 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/tc/MukherjeeRT97.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tcad/El-MalehMRM97,
author = {Aiman H. El{-}Maleh and
Thomas E. Marchok and
Janusz Rajski and
Wojciech Maly},
title = {Behavior and testability preservation under the retiming transformation},
journal = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.},
volume = {16},
number = {5},
pages = {528--543},
year = {1997},
url = {https://doi.org/10.1109/43.631217},
doi = {10.1109/43.631217},
timestamp = {Thu, 14 Oct 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tcad/El-MalehMRM97.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tcad/RadeckaRT97,
author = {Katarzyna Radecka and
Janusz Rajski and
Jerzy Tyszer},
title = {Arithmetic built-in self-test for {DSP} cores},
journal = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.},
volume = {16},
number = {11},
pages = {1358--1369},
year = {1997},
url = {https://doi.org/10.1109/43.663825},
doi = {10.1109/43.663825},
timestamp = {Thu, 24 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tcad/RadeckaRT97.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dac/TsaiHRM97,
author = {Kun{-}Han Tsai and
Sybille Hellebrand and
Janusz Rajski and
Malgorzata Marek{-}Sadowska},
editor = {Ellen J. Yoffa and
Giovanni De Micheli and
Jan M. Rabaey},
title = {{STARBIST:} Scan Autocorrelated Random Pattern Generation},
booktitle = {Proceedings of the 34st Conference on Design Automation, Anaheim,
California, USA, Anaheim Convention Center, June 9-13, 1997},
pages = {472--477},
publisher = {{ACM} Press},
year = {1997},
url = {https://doi.org/10.1145/266021.266203},
doi = {10.1145/266021.266203},
timestamp = {Tue, 06 Nov 2018 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dac/TsaiHRM97.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/TsaiMR97,
author = {Kun{-}Han Tsai and
Malgorzata Marek{-}Sadowska and
Janusz Rajski},
title = {Scan-Encoded Test Pattern Generation for {BIST}},
booktitle = {Proceedings {IEEE} International Test Conference 1997, Washington,
DC, USA, November 3-5, 1997},
pages = {548--556},
publisher = {{IEEE} Computer Society},
year = {1997},
url = {https://doi.org/10.1109/TEST.1997.639663},
doi = {10.1109/TEST.1997.639663},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/TsaiMR97.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/MukherjeeRT97,
author = {Nilanjan Mukherjee and
Janusz Rajski and
Jerzy Tyszer},
title = {Parameterizable Testing Scheme for {FIR} Filters},
booktitle = {Proceedings {IEEE} International Test Conference 1997, Washington,
DC, USA, November 3-5, 1997},
pages = {694--703},
publisher = {{IEEE} Computer Society},
year = {1997},
url = {https://doi.org/10.1109/TEST.1997.639682},
doi = {10.1109/TEST.1997.639682},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/MukherjeeRT97.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/RajskiT97,
author = {Janusz Rajski and
Jerzy Tyszer},
title = {Fault Diagnosis in Scan-Based {BIST}},
booktitle = {Proceedings {IEEE} International Test Conference 1997, Washington,
DC, USA, November 3-5, 1997},
pages = {894--902},
publisher = {{IEEE} Computer Society},
year = {1997},
url = {https://doi.org/10.1109/TEST.1997.639704},
doi = {10.1109/TEST.1997.639704},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/RajskiT97.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/BorelCMRZ97,
author = {J. Borel and
M. Cecchini and
C. Malipeddi and
Janusz Rajski and
Yervant Zorian},
title = {Systems On Silicon: Design and Test Challenges},
booktitle = {15th {IEEE} {VLSI} Test Symposium (VTS'97), April 27-May 1, 1997,
Monterey, California, {USA}},
pages = {184--185},
publisher = {{IEEE} Computer Society},
year = {1997},
url = {https://doi.ieeecomputersociety.org/10.1109/VTS.1997.10017},
doi = {10.1109/VTS.1997.10017},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/BorelCMRZ97.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tc/GuptaRT96,
author = {Sanjay Gupta and
Janusz Rajski and
Jerzy Tyszer},
title = {Arithmetic Additive Generators of Pseudo-Exhaustive Test Patterns},
journal = {{IEEE} Trans. Computers},
volume = {45},
number = {8},
pages = {939--949},
year = {1996},
url = {https://doi.org/10.1109/12.536236},
doi = {10.1109/12.536236},
timestamp = {Sat, 20 May 2017 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tc/GuptaRT96.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tc/RajskiT96,
author = {Janusz Rajski and
Jerzy Tyszer},
title = {On Linear Dependencies in Subspaces of LFSR-Generated Sequences},
journal = {{IEEE} Trans. Computers},
volume = {45},
number = {10},
pages = {1212--1216},
year = {1996},
url = {https://doi.org/10.1109/12.543715},
doi = {10.1109/12.543715},
timestamp = {Sat, 20 May 2017 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tc/RajskiT96.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tcad/MarchokEMR96,
author = {Thomas E. Marchok and
Aiman H. El{-}Maleh and
Wojciech Maly and
Janusz Rajski},
title = {A complexity analysis of sequential {ATPG}},
journal = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.},
volume = {15},
number = {11},
pages = {1409--1423},
year = {1996},
url = {https://doi.org/10.1109/43.543773},
doi = {10.1109/43.543773},
timestamp = {Thu, 14 Oct 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tcad/MarchokEMR96.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/date/RajskiT96,
author = {Janusz Rajski and
Jerzy Tyszer},
title = {Multiplicative Window Generators of Pseudo-random Test Vectors},
booktitle = {1996 European Design and Test Conference, ED{\&}TC 1996, Paris,
France, March 11-14, 1996},
pages = {42--49},
publisher = {{IEEE} Computer Society},
year = {1996},
url = {https://doi.org/10.1109/EDTC.1996.494126},
doi = {10.1109/EDTC.1996.494126},
timestamp = {Fri, 20 May 2022 15:52:30 +0200},
biburl = {https://dblp.org/rec/conf/date/RajskiT96.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ZachariaRTW96,
author = {Nadime Zacharia and
Janusz Rajski and
Jerzy Tyszer and
John A. Waicukauski},
title = {Two-Dimensional Test Data Decompressor for Multiple Scan Designs},
booktitle = {Proceedings {IEEE} International Test Conference 1996, Test and Design
Validity, Washington, DC, USA, October 20-25, 1996},
pages = {186--194},
publisher = {{IEEE} Computer Society},
year = {1996},
url = {https://doi.org/10.1109/TEST.1996.556961},
doi = {10.1109/TEST.1996.556961},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/ZachariaRTW96.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/TamarapalliR96,
author = {Nagesh Tamarapalli and
Janusz Rajski},
title = {Constructive Multi-Phase Test Point Insertion for Scan-Based {BIST}},
booktitle = {Proceedings {IEEE} International Test Conference 1996, Test and Design
Validity, Washington, DC, USA, October 20-25, 1996},
pages = {649--658},
publisher = {{IEEE} Computer Society},
year = {1996},
url = {https://doi.org/10.1109/TEST.1996.557122},
doi = {10.1109/TEST.1996.557122},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/TamarapalliR96.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/MuradaliR96,
author = {Fidel Muradali and
Janusz Rajski},
title = {A self-driven test structure for pseudorandom testing of non-scan
sequential circuits},
booktitle = {14th {IEEE} {VLSI} Test Symposium (VTS'96), April 28 - May 1, 1996,
Princeton, NJ, {USA}},
pages = {17--25},
publisher = {{IEEE} Computer Society},
year = {1996},
url = {https://doi.org/10.1109/VTEST.1996.510830},
doi = {10.1109/VTEST.1996.510830},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/MuradaliR96.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/El-ZiqJJMPRS96,
author = {J. El{-}Ziq and
Najmi T. Jarwala and
Niraj K. Jha and
Peter Marwedel and
Christos A. Papachristou and
Janusz Rajski and
John W. Sheppard},
title = {Hardware-Software Co-Design for Test: It's the Last Straw!},
booktitle = {14th {IEEE} {VLSI} Test Symposium (VTS'96), April 28 - May 1, 1996,
Princeton, NJ, {USA}},
pages = {506--507},
publisher = {{IEEE} Computer Society},
year = {1996},
url = {https://doi.ieeecomputersociety.org/10.1109/VTS.1996.10004},
doi = {10.1109/VTS.1996.10004},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/El-ZiqJJMPRS96.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/MarchokERM95,
author = {Thomas E. Marchok and
Aiman H. El{-}Maleh and
Janusz Rajski and
Wojciech Maly},
title = {Testability Implications of Performance-Driven Logic Synthesis},
journal = {{IEEE} Des. Test Comput.},
volume = {12},
number = {2},
pages = {32--39},
year = {1995},
url = {https://doi.org/10.1109/54.386003},
doi = {10.1109/54.386003},
timestamp = {Thu, 14 Oct 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/dt/MarchokERM95.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tc/HellebrandRTVC95,
author = {Sybille Hellebrand and
Janusz Rajski and
Steffen Tarnick and
Srikanth Venkataraman and
Bernard Courtois},
title = {Built-In Test for Circuits with Scan Based on Reseeding of Multiple-Polynomial
Linear Feedback Shift Registers},
journal = {{IEEE} Trans. Computers},
volume = {44},
number = {2},
pages = {223--233},
year = {1995},
url = {https://doi.org/10.1109/12.364534},
doi = {10.1109/12.364534},
timestamp = {Sat, 20 May 2017 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tc/HellebrandRTVC95.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tcad/El-MalehR95,
author = {Aiman H. El{-}Maleh and
Janusz Rajski},
title = {Delay-fault testability preservation of the concurrent decomposition
and factorization transformations},
journal = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.},
volume = {14},
number = {5},
pages = {582--590},
year = {1995},
url = {https://doi.org/10.1109/43.384420},
doi = {10.1109/43.384420},
timestamp = {Thu, 14 Oct 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tcad/El-MalehR95.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dac/El-MalehMRM95,
author = {Aiman H. El{-}Maleh and
Thomas E. Marchok and
Janusz Rajski and
Wojciech Maly},
editor = {Bryan Preas},
title = {On Test Set Preservation of Retimed Circuits},
booktitle = {Proceedings of the 32st Conference on Design Automation, San Francisco,
California, USA, Moscone Center, June 12-16, 1995},
pages = {176--182},
publisher = {{ACM} Press},
year = {1995},
url = {https://doi.org/10.1145/217474.217526},
doi = {10.1145/217474.217526},
timestamp = {Thu, 14 Oct 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/dac/El-MalehMRM95.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dac/KassabMRT95,
author = {Mark Kassab and
Nilanjan Mukherjee and
Janusz Rajski and
Jerzy Tyszer},
editor = {Bryan Preas},
title = {Software Accelerated Functional Fault Simulation for Data-Path Architectures},
booktitle = {Proceedings of the 32st Conference on Design Automation, San Francisco,
California, USA, Moscone Center, June 12-16, 1995},
pages = {333--338},
publisher = {{ACM} Press},
year = {1995},
url = {https://doi.org/10.1145/217474.217551},
doi = {10.1145/217474.217551},
timestamp = {Tue, 06 Nov 2018 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dac/KassabMRT95.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/date/MarchokEMR95,
author = {Thomas E. Marchok and
Aiman El{-}Maleh and
Wojciech Maly and
Janusz Rajski},
title = {Complexity of sequential {ATPG}},
booktitle = {1995 European Design and Test Conference, ED{\&}TC 1995, Paris,
France, March 6-9, 1995},
pages = {252--261},
publisher = {{IEEE} Computer Society},
year = {1995},
url = {https://doi.org/10.1109/EDTC.1995.470387},
doi = {10.1109/EDTC.1995.470387},
timestamp = {Fri, 20 May 2022 15:41:46 +0200},
biburl = {https://dblp.org/rec/conf/date/MarchokEMR95.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iccad/MukherjeeRT95,
author = {Nilanjan Mukherjee and
Janusz Rajski and
Jerzy Tyszer},
editor = {Richard L. Rudell},
title = {On testable multipliers for fixed-width data path architectures},
booktitle = {Proceedings of the 1995 {IEEE/ACM} International Conference on Computer-Aided
Design, {ICCAD} 1995, San Jose, California, USA, November 5-9, 1995},
pages = {541--547},
publisher = {{IEEE} Computer Society / {ACM}},
year = {1995},
url = {https://doi.org/10.1109/ICCAD.1995.480169},
doi = {10.1109/ICCAD.1995.480169},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/iccad/MukherjeeRT95.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/KassabRT95,
author = {Mark Kassab and
Janusz Rajski and
Jerzy Tyszer},
title = {Hierarchical Functional-Fault Simulation for High-Level Synthesis},
booktitle = {Proceedings {IEEE} International Test Conference 1995, Driving Down
the Cost of Test, Washington, DC, USA, October 21-25, 1995},
pages = {596--605},
publisher = {{IEEE} Computer Society},
year = {1995},
url = {https://doi.org/10.1109/TEST.1995.529888},
doi = {10.1109/TEST.1995.529888},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/KassabRT95.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/MukherjeeKRT95,
author = {Nilanjan Mukherjee and
H. Kassab and
Janusz Rajski and
Jerzy Tyszer},
title = {Arithmetic built-in self test for high-level synthesis},
booktitle = {13th {IEEE} {VLSI} Test Symposium (VTS'95), April 30 - May 3, 1995,
Princeton, New Jersey, {USA}},
pages = {132--139},
publisher = {{IEEE} Computer Society},
year = {1995},
url = {https://doi.org/10.1109/VTEST.1995.512628},
doi = {10.1109/VTEST.1995.512628},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/MukherjeeKRT95.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/RiedelR95,
author = {Marc D. Riedel and
Janusz Rajski},
title = {Fault coverage analysis of {RAM} test algorithms},
booktitle = {13th {IEEE} {VLSI} Test Symposium (VTS'95), April 30 - May 3, 1995,
Princeton, New Jersey, {USA}},
pages = {227--234},
publisher = {{IEEE} Computer Society},
year = {1995},
url = {https://doi.org/10.1109/VTEST.1995.512642},
doi = {10.1109/VTEST.1995.512642},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/RiedelR95.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/ZachariaRT95,
author = {Nadime Zacharia and
Janusz Rajski and
Jerzy Tyszer},
title = {Decompression of test data using variable-length seed LFSRs},
booktitle = {13th {IEEE} {VLSI} Test Symposium (VTS'95), April 30 - May 3, 1995,
Princeton, New Jersey, {USA}},
pages = {426--433},
publisher = {{IEEE} Computer Society},
year = {1995},
url = {https://doi.org/10.1109/VTEST.1995.512670},
doi = {10.1109/VTEST.1995.512670},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/ZachariaRT95.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tcad/CoxR94,
author = {Henry Cox and
Janusz Rajski},
title = {On necessary and nonconflicting assignments in algorithmic test pattern
generation},
journal = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.},
volume = {13},
number = {4},
pages = {515--530},
year = {1994},
url = {https://doi.org/10.1109/43.275361},
doi = {10.1109/43.275361},
timestamp = {Thu, 24 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tcad/CoxR94.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iccad/GuptaRT94,
author = {Sanjay Gupta and
Janusz Rajski and
Jerzy Tyszer},
editor = {Jochen A. G. Jess and
Richard L. Rudell},
title = {Test pattern generation based on arithmetic operations},
booktitle = {Proceedings of the 1994 {IEEE/ACM} International Conference on Computer-Aided
Design, {ICCAD} 1994, San Jose, California, USA, November 6-10, 1994},
pages = {117--124},
publisher = {{IEEE} Computer Society / {ACM}},
year = {1994},
url = {https://doi.org/10.1109/ICCAD.1994.629753},
doi = {10.1109/ICCAD.1994.629753},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/iccad/GuptaRT94.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/El-MalehR94,
author = {Aiman El{-}Maleh and
Janusz Rajski},
title = {Delay-fault testability preservation of the concurrent decomposition
and factorization transformations},
booktitle = {12th {IEEE} {VLSI} Test Symposium (VTS'94), April 25-28, 1994, Cherry
Hill, New Jersey, {USA}},
pages = {15--21},
publisher = {{IEEE} Computer Society},
year = {1994},
url = {https://doi.org/10.1109/VTEST.1994.292340},
doi = {10.1109/VTEST.1994.292340},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/El-MalehR94.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tc/RajskiT93,
author = {Janusz Rajski and
Jerzy Tyszer},
title = {Accumulator-Based Compaction of Test Responses},
journal = {{IEEE} Trans. Computers},
volume = {42},
number = {6},
pages = {643--650},
year = {1993},
url = {https://doi.org/10.1109/12.277285},
doi = {10.1109/12.277285},
timestamp = {Sat, 20 May 2017 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tc/RajskiT93.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tc/RajskiT93a,
author = {Janusz Rajski and
Jerzy Tyszer},
title = {Recursive Pseudoexhaustive Test Pattern Generation},
journal = {{IEEE} Trans. Computers},
volume = {42},
number = {12},
pages = {1517--1521},
year = {1993},
url = {https://doi.org/10.1109/12.260644},
doi = {10.1109/12.260644},
timestamp = {Sat, 20 May 2017 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tc/RajskiT93a.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tcad/MaamariR93,
author = {Fadi Maamari and
Janusz Rajski},
title = {The dynamic reduction of fault simulation},
journal = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.},
volume = {12},
number = {1},
pages = {137--148},
year = {1993},
url = {https://doi.org/10.1109/43.184850},
doi = {10.1109/43.184850},
timestamp = {Thu, 24 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tcad/MaamariR93.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tcad/RajskiT93,
author = {Janusz Rajski and
Jerzy Tyszer},
title = {Test responses compaction in accumulators with rotate carry adders},
journal = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.},
volume = {12},
number = {4},
pages = {531--539},
year = {1993},
url = {https://doi.org/10.1109/43.229736},
doi = {10.1109/43.229736},
timestamp = {Thu, 24 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tcad/RajskiT93.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/PancholyRM92,
author = {Ashish Pancholy and
Janusz Rajski and
Larry J. McNaughton},
title = {Empirical Failure Analysis and Validation of Fault Models in {CMOS}
{VLSI} Circuits},
journal = {{IEEE} Des. Test Comput.},
volume = {9},
number = {1},
pages = {72--83},
year = {1992},
url = {https://doi.org/10.1109/54.124519},
doi = {10.1109/54.124519},
timestamp = {Sun, 17 May 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/dt/PancholyRM92.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tcad/RajskiV92,
author = {Janusz Rajski and
Jagadeesh Vasudevamurthy},
title = {The testability-preserving concurrent decomposition and factorization
of Boolean expressions},
journal = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.},
volume = {11},
number = {6},
pages = {778--793},
year = {1992},
url = {https://doi.org/10.1109/43.137523},
doi = {10.1109/43.137523},
timestamp = {Thu, 24 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tcad/RajskiV92.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tcad/HassanANR92,
author = {Abu S. M. Hassan and
Vinod K. Agarwal and
Benoit Nadeau{-}Dostie and
Janusz Rajski},
title = {{BIST} of {PCB} interconnects using boundary-scan architecture},
journal = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.},
volume = {11},
number = {10},
pages = {1278--1288},
year = {1992},
url = {https://doi.org/10.1109/43.170990},
doi = {10.1109/43.170990},
timestamp = {Thu, 24 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tcad/HassanANR92.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/HellebrandTCR92,
author = {Sybille Hellebrand and
Steffen Tarnick and
Bernard Courtois and
Janusz Rajski},
title = {Generation of Vector Patterns Through Reseeding of Multipe-Polynominal
Linear Feedback Shift Registers},
booktitle = {Proceedings {IEEE} International Test Conference 1992, Discover the
New World of Test and Design, Baltimore, Maryland, USA, September
20-24, 1992},
pages = {120--129},
publisher = {{IEEE} Computer Society},
year = {1992},
url = {https://doi.org/10.1109/TEST.1992.527812},
doi = {10.1109/TEST.1992.527812},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/HellebrandTCR92.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/RajskiVE92,
author = {Janusz Rajski and
Jagadeesh Vasudevamurthy and
Aiman El{-}Maleh},
title = {Recent advances in logic synthesis with testability},
booktitle = {10th {IEEE} {VLSI} Test Symposium (VTS'92), 7-9 Apr 1992, Atlantic
City, NJ, {USA}},
pages = {254--256},
publisher = {{IEEE} Computer Society},
year = {1992},
url = {https://doi.org/10.1109/VTEST.1992.232761},
doi = {10.1109/VTEST.1992.232761},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/RajskiVE92.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tcad/RajskiT91,
author = {Janusz Rajski and
Jerzy Tyszer},
title = {On the diagnostic properties of linear feedback shift registers},
journal = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.},
volume = {10},
number = {10},
pages = {1316--1322},
year = {1991},
url = {https://doi.org/10.1109/43.88927},
doi = {10.1109/43.88927},
timestamp = {Thu, 24 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tcad/RajskiT91.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dac/PaterasR91,
author = {Stephen Pateras and
Janusz Rajski},
editor = {A. Richard Newton},
title = {Generation of Correlated Random Patterns for the Complete Testing
of Synthesized Multi-level Circuits},
booktitle = {Proceedings of the 28th Design Automation Conference, San Francisco,
California, USA, June 17-21, 1991},
pages = {347--352},
publisher = {{ACM}},
year = {1991},
url = {https://doi.org/10.1145/127601.127692},
doi = {10.1145/127601.127692},
timestamp = {Tue, 06 Nov 2018 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dac/PaterasR91.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/PaterasR91,
author = {Stephen Pateras and
Janusz Rajski},
title = {Cube-Contained Random Patterns and Their Applications to the Complete
Testing of Synthesized Multi-Level Circuits},
booktitle = {Proceedings {IEEE} International Test Conference 1991, Test: Faster,
Better, Sooner, Nashville, TN, USA, October 26-30, 1991},
pages = {473--482},
publisher = {{IEEE} Computer Society},
year = {1991},
url = {https://doi.org/10.1109/TEST.1991.519709},
doi = {10.1109/TEST.1991.519709},
timestamp = {Wed, 16 Oct 2019 14:14:52 +0200},
biburl = {https://dblp.org/rec/conf/itc/PaterasR91.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tcad/MaamariR90,
author = {Fadi Maamari and
Janusz Rajski},
title = {A method of fault simulation based on stem regions},
journal = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.},
volume = {9},
number = {2},
pages = {212--220},
year = {1990},
url = {https://doi.org/10.1109/43.46788},
doi = {10.1109/43.46788},
timestamp = {Thu, 24 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tcad/MaamariR90.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iccad/RajskiTS90,
author = {Janusz Rajski and
Jerzy Tyszer and
Babak Salimi},
title = {On the Diagnostic Resolution of Signature Analysis},
booktitle = {{IEEE/ACM} International Conference on Computer-Aided Design, {ICCAD}
1990, Santa Clara, CA, USA, November 11-15, 1990. Digest of Technical
Papers},
pages = {364--367},
publisher = {{IEEE} Computer Society},
year = {1990},
url = {https://doi.org/10.1109/ICCAD.1990.129926},
doi = {10.1109/ICCAD.1990.129926},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/iccad/RajskiTS90.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iccad/VasudevamurthyR90,
author = {Jagadeesh Vasudevamurthy and
Janusz Rajski},
title = {A Method for Concurrent Decomposition and Factorization of Boolean
Expressions},
booktitle = {{IEEE/ACM} International Conference on Computer-Aided Design, {ICCAD}
1990, Santa Clara, CA, USA, November 11-15, 1990. Digest of Technical
Papers},
pages = {510--513},
publisher = {{IEEE} Computer Society},
year = {1990},
url = {https://doi.org/10.1109/ICCAD.1990.129967},
doi = {10.1109/ICCAD.1990.129967},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/iccad/VasudevamurthyR90.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/RajskiC90,
author = {Janusz Rajski and
Henry Cox},
title = {A method to calculate necessary assignments in algorithmic test pattern
generation},
booktitle = {Proceedings {IEEE} International Test Conference 1990, Washington,
D.C., USA, September 10-14, 1990},
pages = {25--34},
publisher = {{IEEE} Computer Society},
year = {1990},
url = {https://doi.org/10.1109/TEST.1990.113997},
doi = {10.1109/TEST.1990.113997},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/RajskiC90.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/RajskiV90,
author = {Janusz Rajski and
Jagadeesh Vasudevamurthy},
title = {Testability preserving transformations in multi-level logic synthesis},
booktitle = {Proceedings {IEEE} International Test Conference 1990, Washington,
D.C., USA, September 10-14, 1990},
pages = {265--273},
publisher = {{IEEE} Computer Society},
year = {1990},
url = {https://doi.org/10.1109/TEST.1990.114032},
doi = {10.1109/TEST.1990.114032},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/RajskiV90.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/MaamariR90,
author = {Fadi Maamari and
Janusz Rajski},
title = {The dynamic reduction of fault simulation},
booktitle = {Proceedings {IEEE} International Test Conference 1990, Washington,
D.C., USA, September 10-14, 1990},
pages = {801--808},
publisher = {{IEEE} Computer Society},
year = {1990},
url = {https://doi.org/10.1109/TEST.1990.114097},
doi = {10.1109/TEST.1990.114097},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/MaamariR90.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/PancholyRM90,
author = {Ashish Pancholy and
Janusz Rajski and
Larry J. McNaughton},
title = {Empirical failure analysis and validation of fault models in {CMOS}
{VLSI}},
booktitle = {Proceedings {IEEE} International Test Conference 1990, Washington,
D.C., USA, September 10-14, 1990},
pages = {938--947},
publisher = {{IEEE} Computer Society},
year = {1990},
url = {https://doi.org/10.1109/TEST.1990.114114},
doi = {10.1109/TEST.1990.114114},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/PancholyRM90.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/HassanARN89,
author = {Abu S. M. Hassan and
Vinod K. Agarwal and
Janusz Rajski and
Benoit Nadeau{-}Dostie},
title = {Testing of Glue Logic Interconnects Using Boundary Scan Architecture},
booktitle = {Proceedings International Test Conference 1989, Washington, D.C.,
USA, August 1989},
pages = {700--711},
publisher = {{IEEE} Computer Society},
year = {1989},
url = {https://doi.org/10.1109/TEST.1989.82358},
doi = {10.1109/TEST.1989.82358},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/HassanARN89.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tcad/CoxR88,
author = {Henry Cox and
Janusz Rajski},
title = {A method of fault analysis for test generation and fault diagnosis},
journal = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.},
volume = {7},
number = {7},
pages = {813--833},
year = {1988},
url = {https://doi.org/10.1109/43.3952},
doi = {10.1109/43.3952},
timestamp = {Thu, 24 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tcad/CoxR88.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ftcs/MaamariR88,
author = {Fadi Maamari and
Janusz Rajski},
title = {A reconvergent fanout analysis for efficient exact fault simulation
of combinational circuits},
booktitle = {Proceedings of the Eighteenth International Symposium on Fault-Tolerant
Computing, {FTCS} 1988, Tokyo, Japan, 27-30 June, 1988},
pages = {122--127},
publisher = {{IEEE} Computer Society},
year = {1988},
url = {https://doi.org/10.1109/FTCS.1988.5309},
doi = {10.1109/FTCS.1988.5309},
timestamp = {Wed, 16 Oct 2019 14:14:57 +0200},
biburl = {https://dblp.org/rec/conf/ftcs/MaamariR88.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ftcs/Rajski88,
author = {Janusz Rajski},
title = {GEMINI-a logic system for fault diagnosis based on set functions},
booktitle = {Proceedings of the Eighteenth International Symposium on Fault-Tolerant
Computing, {FTCS} 1988, Tokyo, Japan, 27-30 June, 1988},
pages = {292--297},
publisher = {{IEEE} Computer Society},
year = {1988},
url = {https://doi.org/10.1109/FTCS.1988.5334},
doi = {10.1109/FTCS.1988.5334},
timestamp = {Tue, 23 May 2017 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ftcs/Rajski88.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iccad/MaamariR88,
author = {Fadi Maamari and
Janusz Rajski},
title = {A fault simulation method based on stem regions},
booktitle = {1988 {IEEE} International Conference on Computer-Aided Design, {ICCAD}
1988, Santa Clara, CA, USA, November 7-10, 1988. Digest of Technical
Papers},
pages = {170--173},
publisher = {{IEEE} Computer Society},
year = {1988},
url = {https://doi.org/10.1109/ICCAD.1988.122487},
doi = {10.1109/ICCAD.1988.122487},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/iccad/MaamariR88.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iccad/ChiproutRR88,
author = {Eli Chiprout and
Janusz Rajski and
Markus Robinson},
title = {Parallel {PLA} fault simulation based on Boolean vector operations},
booktitle = {1988 {IEEE} International Conference on Computer-Aided Design, {ICCAD}
1988, Santa Clara, CA, USA, November 7-10, 1988. Digest of Technical
Papers},
pages = {194--197},
publisher = {{IEEE} Computer Society},
year = {1988},
url = {https://doi.org/10.1109/ICCAD.1988.122492},
doi = {10.1109/ICCAD.1988.122492},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/iccad/ChiproutRR88.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iccd/PaterasR88,
author = {Stephen Pateras and
Janusz Rajski},
title = {A self-reconfiguration scheme for fault-tolerant {VLSI} processor
arrays},
booktitle = {Computer Design: {VLSI} in Computers and Processors, {ICCD} 1988.,
Proceedings of the 1988 {IEEE} International Conference on, Rye Brook,
NY, USA, October 3-5, 1988},
pages = {560--563},
publisher = {{IEEE}},
year = {1988},
url = {https://doi.org/10.1109/ICCD.1988.25762},
doi = {10.1109/ICCD.1988.25762},
timestamp = {Mon, 09 Aug 2021 14:54:02 +0200},
biburl = {https://dblp.org/rec/conf/iccd/PaterasR88.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/HassanAR88,
author = {Abu S. M. Hassan and
Vinod K. Agarwal and
Janusz Rajski},
title = {Testing and Diagnosis of Interconnects Using Boundary Scan Architecture},
booktitle = {Proceedings International Test Conference 1988, Washington, D.C.,
USA, September 1988},
pages = {126--137},
publisher = {{IEEE} Computer Society},
year = {1988},
url = {https://doi.org/10.1109/TEST.1988.207790},
doi = {10.1109/TEST.1988.207790},
timestamp = {Wed, 16 Oct 2019 14:14:52 +0200},
biburl = {https://dblp.org/rec/conf/itc/HassanAR88.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/CoxIAR88,
author = {Henry Cox and
Andr{\'{e}} Ivanov and
Vinod K. Agarwal and
Janusz Rajski},
title = {On Multiple Fault Coverage and Aliasing Probability Measures},
booktitle = {Proceedings International Test Conference 1988, Washington, D.C.,
USA, September 1988},
pages = {314--321},
publisher = {{IEEE} Computer Society},
year = {1988},
url = {https://doi.org/10.1109/TEST.1988.207817},
doi = {10.1109/TEST.1988.207817},
timestamp = {Wed, 24 May 2017 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/CoxIAR88.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/CoxR88,
author = {Henry Cox and
Janusz Rajski},
title = {Stuck-Open and Transition Fault Testing in {CMOS} Complex Gates},
booktitle = {Proceedings International Test Conference 1988, Washington, D.C.,
USA, September 1988},
pages = {688--694},
publisher = {{IEEE} Computer Society},
year = {1988},
url = {https://doi.org/10.1109/TEST.1988.207853},
doi = {10.1109/TEST.1988.207853},
timestamp = {Wed, 24 May 2017 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/CoxR88.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/RobinsonR88,
author = {Markus Robinson and
Janusz Rajski},
title = {An Algorithmic Branch and Bound Method for {PLA} Test Pattern Generation},
booktitle = {Proceedings International Test Conference 1988, Washington, D.C.,
USA, September 1988},
pages = {784--795},
publisher = {{IEEE} Computer Society},
year = {1988},
url = {https://doi.org/10.1109/TEST.1988.207865},
doi = {10.1109/TEST.1988.207865},
timestamp = {Wed, 24 May 2017 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/RobinsonR88.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/RajskiA87,
author = {Janusz Rajski and
Vinod K. Agarwal},
title = {Testing and Applications of Inverter-Free PLAs},
journal = {{IEEE} Des. Test},
volume = {4},
number = {6},
pages = {30--40},
year = {1987},
url = {https://doi.org/10.1109/MDT.1987.295215},
doi = {10.1109/MDT.1987.295215},
timestamp = {Tue, 02 Mar 2021 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/dt/RajskiA87.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tc/RajskiT86,
author = {Janusz Rajski and
Jerzy Tyszer},
title = {The Influence of Masking Phenomenon on Coverage Capability of Single
Fault Test Sets in PLA's},
journal = {{IEEE} Trans. Computers},
volume = {35},
number = {1},
pages = {81--85},
year = {1986},
url = {https://doi.org/10.1109/TC.1986.1676665},
doi = {10.1109/TC.1986.1676665},
timestamp = {Sat, 20 May 2017 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tc/RajskiT86.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tc/RajskiT85,
author = {Janusz Rajski and
Jerzy Tyszer},
title = {Combinatorial Approach to Multiple Contact Faults Coverage in Programmable
Logic Arrays},
journal = {{IEEE} Trans. Computers},
volume = {34},
number = {6},
pages = {549--553},
year = {1985},
url = {https://doi.org/10.1109/TC.1985.5009407},
doi = {10.1109/TC.1985.5009407},
timestamp = {Sat, 20 May 2017 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tc/RajskiT85.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/AgarwalR85,
author = {Vinod K. Agarwal and
Janusz Rajski},
title = {Testing Properties and Applications of Inverter-Free PLA's},
booktitle = {Proceedings International Test Conference 1985, Philadelphia, PA,
USA, November 1985},
pages = {500--507},
publisher = {{IEEE} Computer Society},
year = {1985},
timestamp = {Mon, 11 Nov 2002 15:59:32 +0100},
biburl = {https://dblp.org/rec/conf/itc/AgarwalR85.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/icftcs/RajskiT84,
author = {Janusz Rajski and
Jerzy Tyszer},
editor = {Karl{-}Erwin Gro{\ss}pietsch and
Mario Dal Cin},
title = {The detection of small size multiple faults by single fault test sets
n programmable logic arrays},
booktitle = {Fehlertolerierende Rechensysteme, 2. GI/NTG/GMR-Fachtagung, Bonn,
19.-21. September 1984, Proceedings},
series = {Informatik-Fachberichte},
volume = {84},
pages = {417--425},
publisher = {Springer},
year = {1984},
url = {https://doi.org/10.1007/978-3-642-69698-5\_34},
doi = {10.1007/978-3-642-69698-5\_34},
timestamp = {Wed, 17 May 2017 14:24:33 +0200},
biburl = {https://dblp.org/rec/conf/icftcs/RajskiT84.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tcom/JajszczykR80,
author = {Andrzej Jajszczyk and
Janusz Rajski},
title = {The Effect of Choosing the Switches for Rearrangements in Switching
Networks},
journal = {{IEEE} Trans. Commun.},
volume = {28},
number = {10},
pages = {1832--1834},
year = {1980},
url = {https://doi.org/10.1109/TCOM.1980.1094600},
doi = {10.1109/TCOM.1980.1094600},
timestamp = {Sat, 05 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tcom/JajszczykR80.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
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