BibTeX records: Pia N. Sanda

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@inproceedings{DBLP:conf/date/MitraBS10,
  author       = {Subhasish Mitra and
                  Kevin Brelsford and
                  Pia N. Sanda},
  editor       = {Giovanni De Micheli and
                  Bashir M. Al{-}Hashimi and
                  Wolfgang M{\"{u}}ller and
                  Enrico Macii},
  title        = {Cross-layer resilience challenges: Metrics and optimization},
  booktitle    = {Design, Automation and Test in Europe, {DATE} 2010, Dresden, Germany,
                  March 8-12, 2010},
  pages        = {1029--1034},
  publisher    = {{IEEE} Computer Society},
  year         = {2010},
  url          = {https://doi.org/10.1109/DATE.2010.5456961},
  doi          = {10.1109/DATE.2010.5456961},
  timestamp    = {Wed, 16 Oct 2019 14:14:53 +0200},
  biburl       = {https://dblp.org/rec/conf/date/MitraBS10.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/ibmrd/SandaKKKMALSJ08,
  author       = {Pia N. Sanda and
                  Jeffrey W. Kellington and
                  Prabhakar Kudva and
                  Ronald N. Kalla and
                  Ryan B. McBeth and
                  Jerry Ackaret and
                  Ryan Lockwood and
                  John Schumann and
                  Christopher R. Jones},
  title        = {Soft-error resilience of the {IBM} {POWER6} processor},
  journal      = {{IBM} J. Res. Dev.},
  volume       = {52},
  number       = {3},
  pages        = {275--284},
  year         = {2008},
  url          = {https://doi.org/10.1147/rd.523.0275},
  doi          = {10.1147/RD.523.0275},
  timestamp    = {Fri, 13 Mar 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/ibmrd/SandaKKKMALSJ08.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/ibmrd/BenderSKMPHS08,
  author       = {Carl A. Bender and
                  Pia N. Sanda and
                  Prabhakar Kudva and
                  Ricardo Mata and
                  Vikas Pokala and
                  Ryan Haraden and
                  Matthew Schallhorn},
  title        = {Soft-error resilience of the {IBM} {POWER6} processor input/output
                  subsystem},
  journal      = {{IBM} J. Res. Dev.},
  volume       = {52},
  number       = {3},
  pages        = {285--292},
  year         = {2008},
  url          = {https://doi.org/10.1147/rd.523.0285},
  doi          = {10.1147/RD.523.0285},
  timestamp    = {Fri, 13 Mar 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/ibmrd/BenderSKMPHS08.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/ibmrd/RiversBKWSCA08,
  author       = {Jude A. Rivers and
                  Pradip Bose and
                  Prabhakar Kudva and
                  John{-}David Wellman and
                  Pia N. Sanda and
                  Ethan H. Cannon and
                  Luiz C. Alves},
  title        = {Phaser: Phased methodology for modeling the system-level effects of
                  soft errors},
  journal      = {{IBM} J. Res. Dev.},
  volume       = {52},
  number       = {3},
  pages        = {293--306},
  year         = {2008},
  url          = {https://doi.org/10.1147/rd.523.0293},
  doi          = {10.1147/RD.523.0293},
  timestamp    = {Fri, 13 Mar 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/ibmrd/RiversBKWSCA08.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/micro/ReickSSKMFH08,
  author       = {Kevin Reick and
                  Pia N. Sanda and
                  Scott B. Swaney and
                  Jeffrey W. Kellington and
                  Michael J. Mack and
                  Michael S. Floyd and
                  Daniel Henderson},
  title        = {Fault-Tolerant Design of the {IBM} Power6 Microprocessor},
  journal      = {{IEEE} Micro},
  volume       = {28},
  number       = {2},
  pages        = {30--38},
  year         = {2008},
  url          = {https://doi.org/10.1109/MM.2008.22},
  doi          = {10.1109/MM.2008.22},
  timestamp    = {Sat, 20 May 2017 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/micro/ReickSSKMFH08.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/date/GizopoulosRMS08,
  author       = {Dimitris Gizopoulos and
                  Kaushik Roy and
                  Subhasish Mitra and
                  Pia N. Sanda},
  editor       = {Donatella Sciuto},
  title        = {Soft Errors: System Effects, Protection Techniques and Case Studies},
  booktitle    = {Design, Automation and Test in Europe, {DATE} 2008, Munich, Germany,
                  March 10-14, 2008},
  publisher    = {{ACM}},
  year         = {2008},
  url          = {https://doi.org/10.1109/DATE.2008.4484646},
  doi          = {10.1109/DATE.2008.4484646},
  timestamp    = {Thu, 06 Jul 2023 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/date/GizopoulosRMS08.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/dsn/RamachandranKKSS08,
  author       = {Pradeep Ramachandran and
                  Prabhakar Kudva and
                  Jeffrey W. Kellington and
                  John Schumann and
                  Pia N. Sanda},
  title        = {Statistical Fault Injection},
  booktitle    = {The 38th Annual {IEEE/IFIP} International Conference on Dependable
                  Systems and Networks, {DSN} 2008, June 24-27, 2008, Anchorage, Alaska,
                  USA, Proceedings},
  pages        = {122--127},
  publisher    = {{IEEE} Computer Society},
  year         = {2008},
  url          = {https://doi.org/10.1109/DSN.2008.4630080},
  doi          = {10.1109/DSN.2008.4630080},
  timestamp    = {Thu, 06 Jul 2023 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/dsn/RamachandranKKSS08.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/iolts/MitraSS07,
  author       = {Subhasish Mitra and
                  Pia N. Sanda and
                  Norbert Seifert},
  title        = {Soft Errors: Technology Trends, System Effects, and Protection Techniques},
  booktitle    = {13th {IEEE} International On-Line Testing Symposium {(IOLTS} 2007),
                  8-11 July 2007, Heraklion, Crete, Greece},
  pages        = {4},
  publisher    = {{IEEE} Computer Society},
  year         = {2007},
  url          = {https://doi.org/10.1109/IOLTS.2007.61},
  doi          = {10.1109/IOLTS.2007.61},
  timestamp    = {Thu, 06 Jul 2023 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/iolts/MitraSS07.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/micro/AdveS05,
  author       = {Sarita V. Adve and
                  Pia N. Sanda},
  title        = {Guest Editors' Introduction: Reliability-Aware Microarchitecture},
  journal      = {{IEEE} Micro},
  volume       = {25},
  number       = {6},
  pages        = {8--9},
  year         = {2005},
  url          = {https://doi.org/10.1109/MM.2005.112},
  doi          = {10.1109/MM.2005.112},
  timestamp    = {Thu, 06 Jul 2023 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/micro/AdveS05.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/itc/Sanda05,
  author       = {Pia N. Sanda},
  title        = {The concern for soft errors is not overblown},
  booktitle    = {Proceedings 2005 {IEEE} International Test Conference, {ITC} 2005,
                  Austin, TX, USA, November 8-10, 2005},
  pages        = {2},
  publisher    = {{IEEE} Computer Society},
  year         = {2005},
  url          = {https://doi.org/10.1109/TEST.2005.1584104},
  doi          = {10.1109/TEST.2005.1584104},
  timestamp    = {Thu, 23 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/Sanda05.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/mr/StellariSMWGCMSWW03,
  author       = {Franco Stellari and
                  Peilin Song and
                  Moyra K. McManus and
                  Alan J. Weger and
                  Robert Gauthier and
                  Kiran V. Chatty and
                  Mujahid Muhammad and
                  Pia N. Sanda and
                  Philip Wu and
                  Steve Wilson},
  title        = {Latchup Analysis Using Emission Microscopy},
  journal      = {Microelectron. Reliab.},
  volume       = {43},
  number       = {9-11},
  pages        = {1603--1608},
  year         = {2003},
  url          = {https://doi.org/10.1016/S0026-2714(03)00281-6},
  doi          = {10.1016/S0026-2714(03)00281-6},
  timestamp    = {Thu, 06 Jul 2023 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/StellariSMWGCMSWW03.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/itc/StellariSMGWCMS03,
  author       = {Franco Stellari and
                  Peilin Song and
                  Moyra K. McManus and
                  Robert Gauthier and
                  Alan J. Weger and
                  Kiran V. Chatty and
                  Mujahid Muhammad and
                  Pia N. Sanda},
  title        = {Optical and Electrical Testing of Latchup in {I/O} Interface Circuits},
  booktitle    = {Proceedings 2003 International Test Conference {(ITC} 2003), Breaking
                  Test Interface Bottlenecks, 28 September - 3 October 2003, Charlotte,
                  NC, {USA}},
  pages        = {236--245},
  publisher    = {{IEEE} Computer Society},
  year         = {2003},
  url          = {https://doi.org/10.1109/TEST.2003.1270845},
  doi          = {10.1109/TEST.2003.1270845},
  timestamp    = {Thu, 06 Jul 2023 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/itc/StellariSMGWCMS03.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/ats/PolonskyMKSS00,
  author       = {Stanislav Polonsky and
                  Moyra K. McManus and
                  Daniel R. Knebel and
                  Steve Steen and
                  Pia N. Sanda},
  title        = {Non-invasive timing analysis of {IBM} {G6} microprocessor {L1} cache
                  using picosecond imaging circuit analysis},
  booktitle    = {9th Asian Test Symposium {(ATS} 2000), 4-6 December 2000, Taipei,
                  Taiwan},
  pages        = {125},
  publisher    = {{IEEE} Computer Society},
  year         = {2000},
  url          = {https://doi.org/10.1109/ATS.2000.893614},
  doi          = {10.1109/ATS.2000.893614},
  timestamp    = {Thu, 06 Jul 2023 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/ats/PolonskyMKSS00.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/jssc/HwangGSWH99,
  author       = {Wei Hwang and
                  George Diedrich Gristede and
                  Pia N. Sanda and
                  Shao Y. Wang and
                  David F. Heidel},
  title        = {Implementation of a self-resetting {CMOS} 64-bit parallel adder with
                  enhanced testability},
  journal      = {{IEEE} J. Solid State Circuits},
  volume       = {34},
  number       = {8},
  pages        = {1108--1117},
  year         = {1999},
  url          = {https://doi.org/10.1109/4.777109},
  doi          = {10.1109/4.777109},
  timestamp    = {Thu, 06 Jul 2023 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/jssc/HwangGSWH99.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/itc/HuottMKSMSWCPP99,
  author       = {William V. Huott and
                  Moyra K. McManus and
                  Daniel R. Knebel and
                  Steve Steen and
                  Dennis Manzer and
                  Pia N. Sanda and
                  Steve Wilson and
                  Yuen H. Chan and
                  Antonio Pelella and
                  Stanislav Polonsky},
  title        = {The attack of the "Holey Shmoos": a case study of advanced
                  {DFD} and picosecond imaging circuit analysis {(PICA)}},
  booktitle    = {Proceedings {IEEE} International Test Conference 1999, Atlantic City,
                  NJ, USA, 27-30 September 1999},
  pages        = {883--891},
  publisher    = {{IEEE} Computer Society},
  year         = {1999},
  url          = {https://doi.org/10.1109/TEST.1999.805820},
  doi          = {10.1109/TEST.1999.805820},
  timestamp    = {Thu, 06 Jul 2023 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/itc/HuottMKSMSWCPP99.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/cicc/HwangGSWH98,
  author       = {Wei Hwang and
                  George Diedrich Gristede and
                  Pia N. Sanda and
                  Shao Y. Wang and
                  David F. Heidel},
  title        = {Design and implementation of high performance dynamic 64-bit parallel
                  adder with enhanced testability},
  booktitle    = {Proceedings of the {IEEE} 1998 Custom Integrated Circuits Conference,
                  {CICC} 1998, Santa Clara, CA, USA, May 11-14, 1998},
  pages        = {519--522},
  publisher    = {{IEEE}},
  year         = {1998},
  url          = {https://doi.org/10.1109/CICC.1998.695032},
  doi          = {10.1109/CICC.1998.695032},
  timestamp    = {Fri, 07 Jul 2023 11:00:51 +0200},
  biburl       = {https://dblp.org/rec/conf/cicc/HwangGSWH98.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/itc/KnebelSMKTVHNRSM98,
  author       = {Daniel R. Knebel and
                  Pia N. Sanda and
                  Moyra K. McManus and
                  Jeffrey A. Kash and
                  James C. Tsang and
                  David P. Vallett and
                  Leendert M. Huisman and
                  Phil Nigh and
                  Rick Rizzolo and
                  Peilin Song and
                  Franco Motika},
  title        = {Diagnosis and characterization of timing-related defects by time-dependent
                  light emission},
  booktitle    = {Proceedings {IEEE} International Test Conference 1998, Washington,
                  DC, USA, October 18-22, 1998},
  pages        = {733--739},
  publisher    = {{IEEE} Computer Society},
  year         = {1998},
  url          = {https://doi.org/10.1109/TEST.1998.743254},
  doi          = {10.1109/TEST.1998.743254},
  timestamp    = {Thu, 06 Jul 2023 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/itc/KnebelSMKTVHNRSM98.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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