BibTeX records: Sheng-Tsaing Tseng

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@article{DBLP:journals/ress/KhakifiroozFLT23,
  author       = {Marzieh Khakifirooz and
                  Mahdi Fathi and
                  I{-}Chen Lee and
                  Sheng{-}Tsaing Tseng},
  title        = {Neural ordinary differential equation for sequential optimal design
                  of fatigue test under accelerated life test analysis},
  journal      = {Reliab. Eng. Syst. Saf.},
  volume       = {235},
  pages        = {109242},
  year         = {2023},
  url          = {https://doi.org/10.1016/j.ress.2023.109242},
  doi          = {10.1016/J.RESS.2023.109242},
  timestamp    = {Thu, 07 Mar 2024 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/ress/KhakifiroozFLT23.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/technometrics/KhakifiroozTF20,
  author       = {Marzieh Khakifirooz and
                  Sheng{-}Tsaing Tseng and
                  Mahdi Fathi},
  title        = {Model Misspecification of Generalized Gamma Distribution for Accelerated
                  Lifetime-Censored Data},
  journal      = {Technometrics},
  volume       = {62},
  number       = {3},
  pages        = {357--370},
  year         = {2020},
  url          = {https://doi.org/10.1080/00401706.2019.1647880},
  doi          = {10.1080/00401706.2019.1647880},
  timestamp    = {Mon, 17 Apr 2023 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/technometrics/KhakifiroozTF20.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/iiset/TsengTW19,
  author       = {Sheng{-}Tsaing Tseng and
                  Fugee Tsung and
                  Jo{-}Hua Wu},
  title        = {Stability conditions and robustness analysis of a general {MMSE} run-to-run
                  controller},
  journal      = {{IISE} Trans.},
  volume       = {51},
  number       = {11},
  pages        = {1279--1287},
  year         = {2019},
  url          = {https://doi.org/10.1080/24725854.2018.1554288},
  doi          = {10.1080/24725854.2018.1554288},
  timestamp    = {Thu, 14 Oct 2021 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/iiset/TsengTW19.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/technometrics/LeeHTD18,
  author       = {I{-}Chen Lee and
                  Yili Hong and
                  Sheng{-}Tsaing Tseng and
                  Tirthankar Dasgupta},
  title        = {Sequential Bayesian Design for Accelerated Life Tests},
  journal      = {Technometrics},
  volume       = {60},
  number       = {4},
  pages        = {472--483},
  year         = {2018},
  url          = {https://doi.org/10.1080/00401706.2018.1437475},
  doi          = {10.1080/00401706.2018.1437475},
  timestamp    = {Thu, 22 Nov 2018 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/technometrics/LeeHTD18.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/technometrics/TsengC17,
  author       = {Sheng{-}Tsaing Tseng and
                  Pei{-}Yu Chen},
  title        = {A Generalized Quasi-MMSE Controller for Run-to-Run Dynamic Models},
  journal      = {Technometrics},
  volume       = {59},
  number       = {3},
  pages        = {381--390},
  year         = {2017},
  url          = {https://doi.org/10.1080/00401706.2016.1228547},
  doi          = {10.1080/00401706.2016.1228547},
  timestamp    = {Fri, 28 Jul 2017 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/technometrics/TsengC17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/technometrics/TsengML16,
  author       = {Sheng{-}Tsaing Tseng and
                  Hsin{-}Chao Mi and
                  I{-}Chen Lee},
  title        = {A Multivariate {EWMA} Controller for Linear Dynamic Processes},
  journal      = {Technometrics},
  volume       = {58},
  number       = {1},
  pages        = {104--115},
  year         = {2016},
  url          = {https://doi.org/10.1080/00401706.2015.1006795},
  doi          = {10.1080/00401706.2015.1006795},
  timestamp    = {Sat, 27 May 2017 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/technometrics/TsengML16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/technometrics/TsengL16,
  author       = {Sheng{-}Tsaing Tseng and
                  I{-}Chen Lee},
  title        = {Optimum Allocation Rule for Accelerated Degradation Tests With a Class
                  of Exponential-Dispersion Degradation Models},
  journal      = {Technometrics},
  volume       = {58},
  number       = {2},
  pages        = {244--254},
  year         = {2016},
  url          = {https://doi.org/10.1080/00401706.2015.1033109},
  doi          = {10.1080/00401706.2015.1033109},
  timestamp    = {Sat, 27 May 2017 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/technometrics/TsengL16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tr/HsuTC15,
  author       = {Nan{-}Jung Hsu and
                  Sheng{-}Tsaing Tseng and
                  Ming{-}Wei Chen},
  title        = {Adaptive Warranty Prediction for Highly Reliable Products},
  journal      = {{IEEE} Trans. Reliab.},
  volume       = {64},
  number       = {3},
  pages        = {1057--1067},
  year         = {2015},
  url          = {https://doi.org/10.1109/TR.2015.2427153},
  doi          = {10.1109/TR.2015.2427153},
  timestamp    = {Thu, 09 Jul 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/tr/HsuTC15.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tr/PengT13,
  author       = {Chien{-}Yu Peng and
                  Sheng{-}Tsaing Tseng},
  title        = {Statistical Lifetime Inference With Skew-Wiener Linear Degradation
                  Models},
  journal      = {{IEEE} Trans. Reliab.},
  volume       = {62},
  number       = {2},
  pages        = {338--350},
  year         = {2013},
  url          = {https://doi.org/10.1109/TR.2013.2257055},
  doi          = {10.1109/TR.2013.2257055},
  timestamp    = {Thu, 14 Oct 2021 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/tr/PengT13.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tr/TsaiTB12,
  author       = {Chih{-}Chun Tsai and
                  Sheng{-}Tsaing Tseng and
                  Narayanaswamy Balakrishnan},
  title        = {Optimal Design for Degradation Tests Based on Gamma Processes With
                  Random Effects},
  journal      = {{IEEE} Trans. Reliab.},
  volume       = {61},
  number       = {2},
  pages        = {604--613},
  year         = {2012},
  url          = {https://doi.org/10.1109/TR.2012.2194351},
  doi          = {10.1109/TR.2012.2194351},
  timestamp    = {Thu, 09 Jul 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/tr/TsaiTB12.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tr/TsaiTB11,
  author       = {Chih{-}Chun Tsai and
                  Sheng{-}Tsaing Tseng and
                  Narayanaswamy Balakrishnan},
  title        = {Optimal Burn-In Policy for Highly Reliable Products Using Gamma Degradation
                  Process},
  journal      = {{IEEE} Trans. Reliab.},
  volume       = {60},
  number       = {1},
  pages        = {234--245},
  year         = {2011},
  url          = {https://doi.org/10.1109/TR.2010.2087430},
  doi          = {10.1109/TR.2010.2087430},
  timestamp    = {Thu, 09 Jul 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/tr/TsaiTB11.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tii/MaWJT10,
  author       = {Ming{-}Da Ma and
                  David Shan{-}Hill Wong and
                  Shi{-}Shang Jang and
                  Sheng{-}Tsaing Tseng},
  title        = {Fault Detection based on Statistical Multivariate Analysis and Microarray-type
                  Visualization},
  journal      = {{IEEE} Trans. Ind. Informatics},
  volume       = {6},
  number       = {1},
  pages        = {18--24},
  year         = {2010},
  url          = {https://doi.org/10.1109/TII.2009.2030793},
  doi          = {10.1109/TII.2009.2030793},
  timestamp    = {Thu, 21 May 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/tii/MaWJT10.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tr/PengT10,
  author       = {Chien{-}Yu Peng and
                  Sheng{-}Tsaing Tseng},
  title        = {Progressive-Stress Accelerated Degradation Test for Highly-Reliable
                  Products},
  journal      = {{IEEE} Trans. Reliab.},
  volume       = {59},
  number       = {1},
  pages        = {30--37},
  year         = {2010},
  url          = {https://doi.org/10.1109/TR.2010.2040769},
  doi          = {10.1109/TR.2010.2040769},
  timestamp    = {Thu, 14 Oct 2021 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/tr/PengT10.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/technometrics/TsengJ09,
  author       = {Sheng{-}Tsaing Tseng and
                  Bo{-}Yan Jou},
  title        = {A Technical Note on "Sample Size Determination for Achieving
                  Stability of Double Multivariate Exponentially Weighted Moving Average
                  Controller"},
  journal      = {Technometrics},
  volume       = {51},
  number       = {3},
  pages        = {335--338},
  year         = {2009},
  url          = {https://doi.org/10.1198/tech.2009.09017},
  doi          = {10.1198/TECH.2009.09017},
  timestamp    = {Sat, 27 May 2017 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/technometrics/TsengJ09.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tr/PengT09,
  author       = {Chien{-}Yu Peng and
                  Sheng{-}Tsaing Tseng},
  title        = {Mis-Specification Analysis of Linear Degradation Models},
  journal      = {{IEEE} Trans. Reliab.},
  volume       = {58},
  number       = {3},
  pages        = {444--455},
  year         = {2009},
  url          = {https://doi.org/10.1109/TR.2009.2026784},
  doi          = {10.1109/TR.2009.2026784},
  timestamp    = {Thu, 14 Oct 2021 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/tr/PengT09.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tr/TsengBT09,
  author       = {Sheng{-}Tsaing Tseng and
                  Narayanaswamy Balakrishnan and
                  Chih{-}Chun Tsai},
  title        = {Optimal Step-Stress Accelerated Degradation Test Plan for Gamma Degradation
                  Processes},
  journal      = {{IEEE} Trans. Reliab.},
  volume       = {58},
  number       = {4},
  pages        = {611--618},
  year         = {2009},
  url          = {https://doi.org/10.1109/TR.2009.2033734},
  doi          = {10.1109/TR.2009.2033734},
  timestamp    = {Thu, 09 Jul 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/tr/TsengBT09.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/technometrics/TsengTL07,
  author       = {Sheng{-}Tsaing Tseng and
                  Jen Tang and
                  Chien{-}Hua Lin},
  title        = {Sample Size Determination for Achieving Stability of Double Multivariate
                  Exponentially Weighted Moving Average Controller},
  journal      = {Technometrics},
  volume       = {49},
  number       = {4},
  pages        = {409--419},
  year         = {2007},
  url          = {https://doi.org/10.1198/004017007000000326},
  doi          = {10.1198/004017007000000326},
  timestamp    = {Sat, 27 May 2017 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/technometrics/TsengTL07.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tr/LiaoT06,
  author       = {Chen{-}Mao Liao and
                  Sheng{-}Tsaing Tseng},
  title        = {Optimal design for step-stress accelerated degradation tests},
  journal      = {{IEEE} Trans. Reliab.},
  volume       = {55},
  number       = {1},
  pages        = {59--66},
  year         = {2006},
  url          = {https://doi.org/10.1109/TR.2005.863811},
  doi          = {10.1109/TR.2005.863811},
  timestamp    = {Thu, 09 Jul 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/tr/LiaoT06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/eor/YehHT00,
  author       = {Ruey{-}Huei Yeh and
                  Wen{-}Tsung Ho and
                  Sheng{-}Tsaing Tseng},
  title        = {Optimal production run length for products sold with warranty},
  journal      = {Eur. J. Oper. Res.},
  volume       = {120},
  number       = {3},
  pages        = {575--582},
  year         = {2000},
  url          = {https://doi.org/10.1016/S0377-2217(99)00004-1},
  doi          = {10.1016/S0377-2217(99)00004-1},
  timestamp    = {Tue, 21 Nov 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/eor/YehHT00.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/cor/LiaoHT92,
  author       = {Ching{-}Jong Liao and
                  Rong{-}Hwa Huang and
                  Sheng{-}Tsaing Tseng},
  title        = {Use of variable range in solving multiple criteria scheduling problems},
  journal      = {Comput. Oper. Res.},
  volume       = {19},
  number       = {5},
  pages        = {453--460},
  year         = {1992},
  url          = {https://doi.org/10.1016/0305-0548(92)90074-F},
  doi          = {10.1016/0305-0548(92)90074-F},
  timestamp    = {Tue, 18 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/cor/LiaoHT92.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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