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Lothar Frey

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2010 – today

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2017
[j8]
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  dblp key:
  - journals/sensors/GirschikofskyRF17
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  - https://dblp.org/rec/journals/sensors/GirschikofskyRF17
Maiko Girschikofsky, Manuel Rosenberger, Michael Förthner, Mathias Rommel, Lothar Frey, Ralf Hellmann:
Waveguide Bragg Gratings in Ormocer^®s for Temperature Sensing. Sensors 17(11): 2459 (2017)
[c2]
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  dblp key:
  - conf/biostec/ZornerOSLJF17
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  - https://dblp.org/rec/conf/biostec/ZornerOSLJF17
Alicia Zörner, Susanne Oertel, Björn Schmitz, Nadine Lang, Michael P. M. Jank, Lothar Frey:
Determination of the Selectivity of Printed Wearable Sweat Sensors. BIODEVICES 2017: 81-87
2016
[c1]
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  - conf/biostec/OertelJFHLS16
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Susanne Oertel, Michael P. M. Jank, Lothar Frey, Christian Hofmann, Nadine Lang, Matthias Struck:
Screen-printed Biochemical Sensors for Detection of Ammonia Levels in Sweat - Towards Integration with Vital Parameter Monitoring Sports Gear. BIODEVICES 2016: 160-165
2015
[j7]
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  - journals/mr/RouagORMF15
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  - https://dblp.org/rec/journals/mr/RouagORMF15
N. Rouag, Z. Ouennoughi, Mathias Rommel, K. Murakami, Lothar Frey:
Current conduction mechanism of MIS devices using multidimensional minimization system program. Microelectronics Reliability 55(7): 1028-1034 (2015)
2013
[j6]
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  - journals/mr/OuennoughiSBHRF13
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  - https://dblp.org/rec/journals/mr/OuennoughiSBHRF13
Z. Ouennoughi, C. Strenger, F. Bourouba, V. Haeublein, Heiner Ryssel, Lothar Frey:
Conduction mechanisms in thermal nitride and dry gate oxides grown on 4H-SiC. Microelectronics Reliability 53(12): 1841-1847 (2013)
2011
[j5]
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  - journals/mr/Le-HuuSNGSBFR11
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Martin Le-Huu, Holger Schmitt, Stefan Noll, Michael Grieb, Frederik F. Schrey, Anton J. Bauer, Lothar Frey, Heiner Ryssel:
Investigation of the reliability of 4H-SiC MOS devices for high temperature applications. Microelectronics Reliability 51(8): 1346-1350 (2011)
[j4]
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  - journals/mr/RollGF11
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Guntrade Roll, Matthias Goldbach, Lothar Frey:
Leakage current and defect characterization of p⁺n-source/drain diodes. Microelectronics Reliability 51(12): 2081-2085 (2011)

2000 – 2009

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2005
[j3]
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  - journals/mr/LembergerPZBFR05
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  - https://dblp.org/rec/journals/mr/LembergerPZBFR05
Martin Lemberger, Albena Paskaleva, Stefan Zürcher, Anton J. Bauer, Lothar Frey, Heiner Ryssel:
Electrical properties of hafnium silicate films obtained from a single-source MOCVD precursor. Microelectronics Reliability 45(5-6): 819-822 (2005)
2003
[j2]
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  - journals/mr/PaskalevaLZBFR03
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  - https://dblp.org/rec/journals/mr/PaskalevaLZBFR03
Albena Paskaleva, Martin Lemberger, Stefan Zürcher, Anton J. Bauer, Lothar Frey, Heiner Ryssel:
Electrical characterization of zirconium silicate films obtained from novel MOCVD precursors. Microelectronics Reliability 43(8): 1253-1257 (2003)
2001
[j1]
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  - journals/mr/JankLBFR01
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Michael P. M. Jank, Martin Lemberger, Anton J. Bauer, Lothar Frey, Heiner Ryssel:
Electrical reliability aspects of through the gate implanted MOS structures with thin oxides. Microelectronics Reliability 41(7): 987-990 (2001)

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