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2010 – today

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2018
[c35]
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Yunho Kim, Yunja Choi, Moonzoo Kim:
Precise concolic unit testing of C programs using extended units and symbolic alarm filtering. ICSE 2018: 315-326
[c34]
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Duy Loc Phan, Yunho Kim, Moonzoo Kim:
MUSIC: Mutation Analysis Tool with High Configurability and Extensibility. ICST Workshops 2018: 40-46
[c33]
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Yunho Kim, Shin Hong, Bongseok Ko, Duy Loc Phan, Moonzoo Kim:
Invasive Software Testing: Mutating Target Programs to Diversify Test Exploration for High Test Coverage. ICST 2018: 239-249
2017
[j12]
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Shin Hong, Taehoon Kwak, Byeongcheol Lee, Yiru Jeon, Bongseok Ko, Yunho Kim, Moonzoo Kim:
MUSEUM: Debugging real-world multilingual programs using mutation analysis. Information & Software Technology 82: 80-95 (2017)
2015
[j11]
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Zhihong Xu, Yunho Kim, Moonzoo Kim, Myra B. Cohen, Gregg Rothermel:
Directed test suite augmentation: an empirical investigation. Softw. Test., Verif. Reliab. 25(2): 77-114 (2015)
[j10]
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Shin Hong, Moonzoo Kim:
A survey of race bug detection techniques for multithreaded programmes. Softw. Test., Verif. Reliab. 25(3): 191-217 (2015)
[j9]
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Shin Hong, Matt Staats, Jaemin Ahn, Moonzoo Kim, Gregg Rothermel:
Are concurrency coverage metrics effective for testing: a comprehensive empirical investigation. Softw. Test., Verif. Reliab. 25(4): 334-370 (2015)
[c32]
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Yongbae Park, Shin Hong, Moonzoo Kim, Dongju Lee, Junhee Cho:
Systematic Testing of Reactive Software with Non-Deterministic Events: A Case Study on LG Electric Oven. ICSE (2) 2015: 29-38
[c31]
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Shin Hong, Byeongcheol Lee, Taehoon Kwak, Yiru Jeon, Bongsuk Ko, Yunho Kim, Moonzoo Kim:
Mutation-Based Fault Localization for Real-World Multilingual Programs (T). ASE 2015: 464-475
2014
[c30]
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Yunho Kim, Moonzoo Kim:
SAT-Based Bounded Software Model Checking for Embedded Software: A Case Study. APSEC (1) 2014: 55-62
[c29]
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Shin Hong, Yongbae Park, Moonzoo Kim:
Detecting Concurrency Errors in Client-Side Java Script Web Applications. ICST 2014: 61-70
[c28]
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Seokhyeon Moon, Yunho Kim, Moonzoo Kim, Shin Yoo:
Ask the Mutants: Mutating Faulty Programs for Fault Localization. ICST 2014: 153-162
[c27]
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Yunho Kim, Zhihong Xu, Moonzoo Kim, Myra B. Cohen, Gregg Rothermel:
Hybrid Directed Test Suite Augmentation: An Interleaving Framework. ICST 2014: 263-272
2013
[j8]
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Shin Hong, Moonzoo Kim:
Effective pattern-driven concurrency bug detection for operating systems. Journal of Systems and Software 86(2): 377-388 (2013)
[j7]
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Young Joo Kim, Okjoo Choi, Moonzoo Kim, Jongmoon Baik, Tai-Hyo Kim:
Validating Software Reliability Early through Statistical Model Checking. IEEE Software 30(3): 35-41 (2013)
[c26]
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Shin Hong, Matt Staats, Jaemin Ahn, Moonzoo Kim, Gregg Rothermel:
The Impact of Concurrent Coverage Metrics on Testing Effectiveness. ICST 2013: 232-241
[c25]
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Yunho Kim, Youil Kim, Taeksu Kim, Gunwoo Lee, Yoonkyu Jang, Moonzoo Kim:
Automated unit testing of large industrial embedded software using concolic testing. ASE 2013: 519-528
2012
[j6]
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Moonzoo Kim, Yunho Kim, Yunja Choi:
Concolic testing of the multi-sector read operation for flash storage platform software. Formal Asp. Comput. 24(3): 355-374 (2012)
[j5]
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Yunja Choi, Moonzoo Kim:
Controlled composition and abstraction for bottom-up integration and verification of abstract components. Information & Software Technology 54(1): 119-136 (2012)
[c24]
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Young Joo Kim, Moonzoo Kim, Tai-Hyo Kim:
Statistical Model Checking for Safety Critical Hybrid Systems: An Empirical Evaluation. Haifa Verification Conference 2012: 162-177
[c23]
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Yunho Kim, Moonzoo Kim, Young Joo Kim, Yoonkyu Jang:
Industrial application of concolic testing approach: A case study on libexif by using CREST-BV and KLEE. ICSE 2012: 1143-1152
[c22]
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Moonzoo Kim, Yunho Kim, Gregg Rothermel:
A Scalable Distributed Concolic Testing Approach: An Empirical Evaluation. ICST 2012: 340-349
[c21]
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Moonzoo Kim, Yunho Kim, Yoonkyu Jang:
Industrial Application of Concolic Testing on Embedded Software: Case Studies. ICST 2012: 390-399
[c20]
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Young Joo Kim, Moonzoo Kim:
Hybrid Statistical Model Checking Technique for Reliable Safety Critical Systems. ISSRE 2012: 51-60
[c19]
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  - conf/issta/StaatsHKR12
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Matt Staats, Shin Hong, Moonzoo Kim, Gregg Rothermel:
Understanding user understanding: determining correctness of generated program invariants. ISSTA 2012: 188-198
[c18]
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Shin Hong, Jaemin Ahn, Sangmin Park, Moonzoo Kim, Mary Jean Harrold:
Testing concurrent programs to achieve high synchronization coverage. ISSTA 2012: 210-220
2011
[j4]
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Moonzoo Kim, Yunho Kim, Hotae Kim:
A Comparative Study of Software Model Checkers as Unit Testing Tools: An Industrial Case Study. IEEE Trans. Software Eng. 37(2): 146-160 (2011)
[c17]
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Moonzoo Kim, Yunho Kim:
Automated Analysis of Industrial Embedded Software. ATVA 2011: 51-59
[c16]
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Zhihong Xu, Yunho Kim, Moonzoo Kim, Gregg Rothermel:
A Hybrid Directed Test Suite Augmentation Technique. ISSRE 2011: 150-159
[c15]
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Yunho Kim, Moonzoo Kim:
SCORE: a scalable concolic testing tool for reliable embedded software. SIGSOFT FSE 2011: 420-423
2010
[c14]
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  - conf/ictac/KimKD10
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Yunho Kim, Moonzoo Kim, Nam Dang:
Scalable Distributed Concolic Testing: A Case Study on a Flash Storage Platform. ICTAC 2010: 199-213
[c13]
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Zhihong Xu, Yunho Kim, Moonzoo Kim, Gregg Rothermel, Myra B. Cohen:
Directed test suite augmentation: techniques and tradeoffs. SIGSOFT FSE 2010: 257-266

2000 – 2009

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2009
[j3]
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Moonzoo Kim, Shin Hong, Changki Hong, Taeho Kim:
Model-based Kernel Testing for Concurrency Bugs through Counter Example Replay. Electr. Notes Theor. Comput. Sci. 253(2): 21-36 (2009)
[c12]
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Moonzoo Kim, Yunho Kim:
Concolic Testing of the Multi-sector Read Operation for Flash Memory File System. SBMF 2009: 251-265
2008
[c11]
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Moonzoo Kim, Yunja Choi, Yunho Kim, Hotae Kim:
Pre-testing Flash Device Driver through Model Checking Techniques. ICST 2008: 475-484
[c10]
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Moonzoo Kim, Yunho Kim, Hotae Kim:
Unit Testing of Flash Memory Device Driver through a SAT-Based Model Checker. ASE 2008: 198-207
[c9]
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Moonzoo Kim, Yunja Choi, Yunho Kim, Hotae Kim:
Formal Verification of a Flash Memory Device Driver - An Experience Report. SPIN 2008: 144-159
[e1]
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Sung Deok Cha, Jin-Young Choi, Moonzoo Kim, Insup Lee, Mahesh Viswanathan:
Automated Technology for Verification and Analysis, 6th International Symposium, ATVA 2008, Seoul, Korea, October 20-23, 2008. Proceedings. Lecture Notes in Computer Science 5311, Springer 2008, ISBN 978-3-540-88386-9 [contents]
2007
[j2]
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Joel M. Esposito, Moonzoo Kim:
Using Formal Modeling With an Automated Analysis Tool to Design and Parametrically Analyze a Multirobot Coordination Protocol: A Case Study. IEEE Trans. Systems, Man, and Cybernetics, Part A 37(3): 285-297 (2007)
[c8]
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Moonzoo Kim:
Formal Modeling and Verification of High-Availability Protocol for Network Security Appliances. ATVA 2007: 489-500
2006
[c7]
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  - conf/icsr/KangLKKSY06
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Kyo Chul Kang, Jaejoon Lee, Byungkil Kim, Moonzoo Kim, Chang-woo Seo, Seung-lyeol Yu:
Re-engineering a Credit Card Authorization System for Maintainability and Reusability of Components - A Case Study. ICSR 2006: 156-169
2005
[c6]
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Moonzoo Kim, Kyo Chul Kang:
Formal Construction and Verification of Home Service Robots: A Case Study. ATVA 2005: 429-443
[c5]
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Kyo Chul Kang, Moonzoo Kim, Jaejoon Lee, Byungkil Kim, Youngjin Hong, Hyoungki Lee, Seokwon Bang:
3D Virtual Prototyping of Home Service Robots Using ASADAL/OBJ. ICRA 2005: 2903-2908
[c4]
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Moonzoo Kim, Kyo Chul Kang, Hyoungki Lee:
Formal Verification of Robot Movements - a Case Study on Home Service Robot SHR100. ICRA 2005: 4739-4744
[c3]
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Moonzoo Kim, Jaejoon Lee, Kyo Chul Kang, Youngjin Hong, Seokwon Bang:
Re-engineering software architecture of home service robots: a case study. ICSE 2005: 505-513
[c2]
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Kyo Chul Kang, Moonzoo Kim, Jaejoon Lee, Byungkil Kim:
Feature-Oriented Re-engineering of Legacy Systems into Product Line Assets - a Case Study. SPLC 2005: 45-56
2004
[j1]
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Moonzoo Kim, Mahesh Viswanathan, Sampath Kannan, Insup Lee, Oleg Sokolsky:
Java-MaC: A Run-Time Assurance Approach for Java Programs. Formal Methods in System Design 24(2): 129-155 (2004)
[c1]
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Mahesh Viswanathan, Moonzoo Kim:
Foundations for the Run-Time Monitoring of Reactive Systems - Fundamentals of the MaC Language. ICTAC 2004: 543-556

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