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Hanno Melzner

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2010 – 2019

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2014
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Andreas Kux, Rudolf Ullmann, Thomas Kern, Roland Strunz, Hanno Melzner, Stephan Beuven, Andreas Haase:
Latent defect detection in microcontroller embedded flash test using device stress and wordline outlier screening. ITC 2014: 1-7

2000 – 2009

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2007
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Olivier Rizzo, Hanno Melzner:
Concurrent Wire Spreading, Widening, and Filling. DAC 2007: 350-353

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