Paula Diaz Reigosa

Name: dblp XML data dump
Creator: Schloss Dagstuhl - Leibniz Center for Informatics
Published: 1993
License: https://creativecommons.org/publicdomain/zero/1.0/
Keywords: dblp, XML, computer science, scholarly publications, metadata

◀ ▶ joint publications with Francesco Iannuzzo

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Publications

2018
[j10]
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Haoze Luo, Paula Diaz Reigosa, Francesco Iannuzzo, Frede Blaabjerg:
On-line solder layer degradation measurement for SiC-MOSFET modules under accelerated power cycling condition. Microelectron. Reliab. 88-90: 563-567 (2018)
[j9]
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  - journals/mr/ReigosaIC18
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Paula Diaz Reigosa, Francesco Iannuzzo, Lorenzo Ceccarelli:
Effect of short-circuit stress on the degradation of the SiO₂ dielectric in SiC power MOSFETs. Microelectron. Reliab. 88-90: 577-583 (2018)
[j8]
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  - journals/mr/DuRIC18
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H. Du, Paula Diaz Reigosa, Francesco Iannuzzo, Lorenzo Ceccarelli:
Investigation on the degradation indicators of short-circuit tests in 1.2 kV SiC MOSFET power modules. Microelectron. Reliab. 88-90: 661-665 (2018)
[j6]
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  - journals/mr/AkbariBRIB18
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Mohsen Akbari, Amir Sajjad Bahman, Paula Diaz Reigosa, Francesco Iannuzzo, Mohammad Tavakoli Bina:
Thermal modeling of wire-bonded power modules considering non-uniform temperature and electric current interactions. Microelectron. Reliab. 88-90: 1135-1140 (2018)
2017
[j5]
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  - journals/mr/CeccarelliRIB17
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Lorenzo Ceccarelli, Paula Diaz Reigosa, Francesco Iannuzzo, Frede Blaabjerg:
A survey of SiC power MOSFETs short-circuit robustness and failure mode analysis. Microelectron. Reliab. 76-77: 272-276 (2017)
[j4]
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  - journals/mr/ReigosaIRB17
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Paula Diaz Reigosa, Francesco Iannuzzo, Munaf Rahimo, Frede Blaabjerg:
Capacitive effects in IGBTs limiting their reliability under short circuit. Microelectron. Reliab. 76-77: 485-489 (2017)
[c1]
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  - conf/iecon/CeccarelliRBIB17
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Lorenzo Ceccarelli, Paula Diaz Reigosa, Amir Sajjad Bahman, Francesco Iannuzzo, Frede Blaabjerg:
Compact electro-thermal modeling of a SiC MOSFET power module under short-circuit conditions. IECON 2017: 4879-4884
2016
[j3]
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  - journals/mr/LuoIRBLH16
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Haoze Luo, Francesco Iannuzzo, Paula Diaz Reigosa, Frede Blaabjerg, Wuhua Li, Xiangning He:
Modern IGBT gate driving methods for enhancing reliability of high-power converters - An overview. Microelectron. Reliab. 58: 141-150 (2016)
[j2]
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  - journals/mr/ReigosaPPGIKR16
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Paula Diaz Reigosa, Daniel Prindle, Gontran Pâques, Silvan Geissmann, Francesco Iannuzzo, Arnost Kopta, Munaf Rahimo:
Comparison of thermal runaway limits under different test conditions based on a 4.5 kV IGBT. Microelectron. Reliab. 64: 524-529 (2016)
2015
[j1]
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  - journals/mr/ReigosaWIB15
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Paula Diaz Reigosa, Rui Wu, Francesco Iannuzzo, Frede Blaabjerg:
Robustness of MW-Level IGBT modules against gate oscillations under short circuit events. Microelectron. Reliab. 55(9-10): 1950-1955 (2015)

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