Eino-Ville Talvala

Name: dblp XML data dump
Creator: Schloss Dagstuhl - Leibniz Center for Informatics
Published: 1993
License: https://creativecommons.org/publicdomain/zero/1.0/
Keywords: dblp, XML, computer science, scholarly publications, metadata

◀ ▶ joint publications with Sung Hee Park

> Home > Persons > Eino-Ville Talvala

Publications

2012
[j4]
- view
  authority control:
- export record
  dblp key:
  - journals/cacm/AdamsJDTPTAVLHPGBML12
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/cacm/AdamsJDTPTAVLHPGBML12
Andrew Adams, David E. Jacobs, Jennifer Dolson, Marius Tico, Kari Pulli, Eino-Ville Talvala, Boris Ajdin, Daniel A. Vaquero, Hendrik P. A. Lensch, Mark Horowitz, Sung Hee Park, Natasha Gelfand, Jongmin Baek, Wojciech Matusik, Marc Levoy:
The Frankencamera: an experimental platform for computational photography. Commun. ACM 55(11): 90-98 (2012)
2011
[c4]
- view
  authority control:
- export record
  dblp key:
  - conf/mm/ParkAT11
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/mm/ParkAT11
Sung Hee Park, Andrew Adams, Eino-Ville Talvala:
The FCam API for programmable cameras. ACM Multimedia 2011: 707-710
2010
[j3]
- view
  authority control:
- export record
  dblp key:
  - journals/tog/AdamsJDTPTAVLHPGBML10
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/tog/AdamsJDTPTAVLHPGBML10
Andrew Adams, David E. Jacobs, Jennifer Dolson, Marius Tico, Kari Pulli, Eino-Ville Talvala, Boris Ajdin, Daniel A. Vaquero, Hendrik P. A. Lensch, Mark Horowitz, Sung Hee Park, Natasha Gelfand, Jongmin Baek, Wojciech Matusik, Marc Levoy:
The Frankencamera: an experimental platform for computational photography. ACM Trans. Graph. 29(4): 29:1-29:12 (2010)

a service of

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.