Stanislav Tyaginov

◀ ▶ joint publications with Al-Moatasem El-Sayed

> Home > Persons > Stanislav Tyaginov

Publications

2022
[c15]
- view
  authority control:
- export record
  dblp key:
  - conf/irps/TyaginovMECBJVG22
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/irps/TyaginovMECBJVG22
Stanislav Tyaginov, Alexander Makarov, Al-Moatasem Bellah El-Sayed, Adrian Vaisman Chasin, Erik Bury, Markus Jech, Michiel Vandemaele, Alexander Grill, An De Keersgieter, Mikhail I. Vexler, Geert Eneman, Ben Kaczer:
Understanding and Modeling Opposite Impacts of Self-Heating on Hot-Carrier Degradation in n- and p-Channel Transistors. IRPS 2022: 6
2019
[c5]
- view
  authority control:
- export record
  dblp key:
  - conf/essderc/MakarovLTKRCVHE19
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/essderc/MakarovLTKRCVHE19
Alexander Makarov, Dimitri Linten, Stanislav Tyaginov, Ben Kaczer, Philippe Roussel, Adrian Vaisman Chasin, Michiel Vandemaele, Geert Hellings, Al-Moatasem El-Sayed, Markus Jech, Tibor Grasser:
Stochastic Modeling of Hot-Carrier Degradation in nFinFETs Considering the Impact of Random Traps and Random Dopants. ESSDERC 2019: 262-265
[c4]
- view
  authority control:
- export record
  dblp key:
  - conf/irps/MakarovKRCGVHEG19
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/irps/MakarovKRCGVHEG19
Alexander Makarov, Ben Kaczer, Philippe Roussel, Adrian Vaisman Chasin, Alexander Grill, Michiel Vandemaele, Geert Hellings, Al-Moatasem El-Sayed, Tibor Grasser, Dimitri Linten, Stanislav Tyaginov:
Modeling the Effect of Random Dopants on Hot-Carrier Degradation in FinFETs. IRPS 2019: 1-7

a service of

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.