default search action
Google
Google Scholar
Semantic Scholar
Internet Archive Scholar
CiteSeerX
ORCIDDong Xiang
- > Home > Persons > Dong Xiang
Publications
- 2018
[j51]Dong Xiang, Krishnendu Chakrabarty
, Hideo Fujiwara:
Fault-Tolerant Unicast-Based Multicast for Reliable Network-on-Chip Testing. ACM Trans. Design Autom. Electr. Syst. 23(6): 73:1-73:23 (2018)- 2016
- [j48]Dong Xiang, Krishnendu Chakrabarty, Hideo Fujiwara:
Multicast-Based Testing and Thermal-Aware Test Scheduling for 3D ICs with a Stacked Network-on-Chip. IEEE Trans. Computers 65(9): 2767-2779 (2016) - [c71]Dong Xiang, Krishnendu Chakrabarty, Hideo Fujiwara:
A unified test and fault-tolerant multicast solution for network-on-chip designs. ITC 2016: 1-9 - 2013
- [c58]Dong Xiang, Gang Liu, Krishnendu Chakrabarty, Hideo Fujiwara:
Thermal-aware test scheduling for NOC-based 3D integrated circuits. VLSI-SoC 2013: 96-101 - 2008
- [j22]Dong Xiang, Yang Zhao, Krishnendu Chakrabarty, Hideo Fujiwara:
A Reconfigurable Scan Architecture With Weighted Scan-Enable Signals for Deterministic BIST. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 27(6): 999-1012 (2008) - 2007
- [j20]Dong Xiang, Kaiwei Li, Jiaguang Sun, Hideo Fujiwara:
Reconfigured Scan Forest for Test Application Cost, Test Data Volume, and Test Power Reduction. IEEE Trans. Computers 56(4): 557-562 (2007) - [j19]Dong Xiang, Mingjing Chen, Hideo Fujiwara:
Using Weighted Scan Enable Signals to Improve Test Effectiveness of Scan-Based BIST. IEEE Trans. Computers 56(12): 1619-1628 (2007) - [j18]Dong Xiang, Kaiwei Li, Hideo Fujiwara, Krishnaiyan Thulasiraman, Jiaguang Sun:
Constraining Transition Propagation for Low-Power Scan Testing Using a Two-Stage Scan Architecture. IEEE Trans. Circuits Syst. II Express Briefs 54-II(5): 450-454 (2007) - [c29]Dong Xiang, Krishnendu Chakrabarty, Dianwei Hu, Hideo Fujiwara:
Scan Testing for Complete Coverage of Path Delay Faults with Reduced Test Data Volume, Test Application Time, and Hardware Cost. ATS 2007: 329-334 - [c27]Dong Xiang, Yang Zhao, Kaiwei Li, Hideo Fujiwara:
Fast and effective fault simulation for path delay faults based on selected testable paths. ITC 2007: 1-10 - 2006
- [c25]Hideo Fujiwara, Jiaguang Sun, Krishnendu Chakrabarty, Yang Zhao, Dong Xiang:
Compressing Test Data for Deterministic BIST Using a Reconfigurable Scan Arhcitecture. ATS 2006: 299-306 - [c24]Dong Xiang, Kaiwei Li, Hideo Fujiwara, Jiaguang Sun:
Generating Compact Robust and Non-Robust Tests for Complete Coverage of Path Delay Faults Based on Stuck-at Tests. ICCD 2006: 446-451 - 2005
- [j13]Dong Xiang, Ming-Jing Chen, Jia-Guang Sun, Hideo Fujiwara:
Improving test effectiveness of scan-based BIST by scan chain partitioning. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 24(6): 916-927 (2005) - [c22]Dong Xiang, Ming-Jing Chen, Hideo Fujiwara:
Using Weighted Scan Enable Signals to Improve the Effectiveness of Scan-Based BIST. Asian Test Symposium 2005: 126-131 - [c21]Dong Xiang, Kaiwei Li, Hideo Fujiwara:
Design for Cost Effective Scan Testing by Reconfiguring Scan Flip-Flops. Asian Test Symposium 2005: 318-323 - 2003
- [j9]Dong Xiang, Yi Xu, Hideo Fujiwara:
Nonscan Design for Testability for Synchronous Sequential Circuits Based on Conflict Resolution. IEEE Trans. Computers 52(8): 1063-1075 (2003) - [c17]Dong Xiang, Ming-Jing Chen, Jia-Guang Sun, Hideo Fujiwara:
Improving Test Quality of Scan-Based BIST by Scan Chain Partitioning. Asian Test Symposium 2003: 12-17 - [c16]Dong Xiang, Shan Gu, Hideo Fujiwara:
Non-Scan Design for Testability for Mixed RTL Circuits with Both Data Paths and Controller via Conflict Analysis. Asian Test Symposium 2003: 300-305 - 2002
- [j7]Dong Xiang, Hideo Fujiwara:
Handling the pin overhead problem of DFTs for high-quality and at-speed tests. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 21(9): 1105-1113 (2002) - [c13]Dong Xiang, Shan Gu, Hideo Fujiwara:
Non-Scan Design for Testability Based on Fault Oriented Conflict Analysis. Asian Test Symposium 2002: 86- - 2000
- [c6]Dong Xiang, Yi Xu, Hideo Fujiwara:
Non-scan design for testability for synchronous sequential circuits based on conflict analysis. ITC 2000: 520-529
manage site settings
To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.
Unpaywalled article links
Add open access links from 
to the list of external document links (if available).
Privacy notice: By enabling the option above, your browser will contact the API of unpaywall.org to load hyperlinks to open access articles. Although we do not have any reason to believe that your call will be tracked, we do not have any control over how the remote server uses your data. So please proceed with care and consider checking the Unpaywall privacy policy.
Archived links via Wayback Machine
For web page which are no longer available, try to retrieve content from the 
of the Internet Archive (if available).
Privacy notice: By enabling the option above, your browser will contact the API of archive.org to check for archived content of web pages that are no longer available. Although we do not have any reason to believe that your call will be tracked, we do not have any control over how the remote server uses your data. So please proceed with care and consider checking the Internet Archive privacy policy.
Reference lists
Add a list of references from 
, 
, and 
to record detail pages.
load references from crossref.org and opencitations.net
Privacy notice: By enabling the option above, your browser will contact the APIs of crossref.org, opencitations.net, and semanticscholar.org to load article reference information. Although we do not have any reason to believe that your call will be tracked, we do not have any control over how the remote server uses your data. So please proceed with care and consider checking the Crossref privacy policy and the OpenCitations privacy policy, as well as the AI2 Privacy Policy covering Semantic Scholar.
Citation data
Add a list of citing articles from and to record detail pages.
load citations from opencitations.net
Privacy notice: By enabling the option above, your browser will contact the API of opencitations.net and semanticscholar.org to load citation information. Although we do not have any reason to believe that your call will be tracked, we do not have any control over how the remote server uses your data. So please proceed with care and consider checking the OpenCitations privacy policy as well as the AI2 Privacy Policy covering Semantic Scholar.
OpenAlex data
Load additional information about publications from 
.
Privacy notice: By enabling the option above, your browser will contact the API of openalex.org to load additional information. Although we do not have any reason to believe that your call will be tracked, we do not have any control over how the remote server uses your data. So please proceed with care and consider checking the information given by OpenAlex.
last updated on 2024-09-21 23:39 CEST by the dblp team
all metadata released as open data under CC0 1.0 license
see also: Terms of Use | Privacy Policy | Imprint
dblp was originally created in 1993 at:
since 2018, dblp has been operated and maintained by:
the dblp computer science bibliography is funded and supported by:
