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Marie-Lise Flottes
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Publications
- 2019
- [j28]Emanuele Valea, Mathieu Da Silva, Giorgio Di Natale, Marie-Lise Flottes, Bruno Rouzeyre:
A Survey on Security Threats and Countermeasures in IEEE Test Standards. IEEE Des. Test 36(3): 95-116 (2019) - [j26]Emanuele Valea, Mathieu Da Silva, Marie-Lise Flottes, Giorgio Di Natale, Bruno Rouzeyre:
Stream vs block ciphers for scan encryption. Microelectron. J. 86: 65-76 (2019) - [j25]Mathieu Da Silva, Marie-Lise Flottes, Giorgio Di Natale, Bruno Rouzeyre:
Preventing Scan Attacks on Secure Circuits Through Scan Chain Encryption. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 38(3): 538-550 (2019) - [c91]Emanuele Valea, Mathieu Da Silva, Marie-Lise Flottes, Giorgio Di Natale, Bruno Rouzeyre:
Encryption-Based Secure JTAG. DDECS 2019: 1-6 - [c90]Emanuele Valea, Mathieu Da Silva, Marie-Lise Flottes, Giorgio Di Natale, Sophie Dupuis, Bruno Rouzeyre:
Providing Confidentiality and Integrity in Ultra Low Power IoT Devices. DTIS 2019: 1-6 - [c89]Marc Merandat, Vincent Reynaud, Emanuele Valea, Jérôme Quévremont, Nicolas Valette, Paolo Maistri, Régis Leveugle, Marie-Lise Flottes, Sophie Dupuis, Bruno Rouzeyre, Giorgio Di Natale:
A Comprehensive Approach to a Trusted Test Infrastructure. IVSW 2019: 43-48 - [i2]Emanuele Valea, Mathieu Da Silva, Giorgio Di Natale, Marie-Lise Flottes, Sophie Dupuis, Bruno Rouzeyre:
SECCS: SECure Context Saving for IoT Devices. CoRR abs/1903.04314 (2019) - 2018
- [j24]Sophie Dupuis, Marie-Lise Flottes, Giorgio Di Natale, Bruno Rouzeyre:
Protection Against Hardware Trojans With Logic Testing: Proposed Solutions and Challenges Ahead. IEEE Des. Test 35(2): 73-90 (2018) - [j23]Raphael Andreoni Camponogara Viera, Jean-Max Dutertre, Marie-Lise Flottes, Olivier Potin, Giorgio Di Natale, Bruno Rouzeyre, Rodrigo Possamai Bastos:
Assessing body built-in current sensors for detection of multiple transient faults. Microelectron. Reliab. 88-90: 128-134 (2018) - [c88]Emanuele Valea, Mathieu Da Silva, Giorgio Di Natale, Marie-Lise Flottes, Sophie Dupuis, Bruno Rouzeyre:
SI ECCS: SECure context saving for IoT devices. DTIS 2018: 1-2 - [c87]Jean-Max Dutertre, Vincent Beroulle, Philippe Candelier, Stephan De Castro, Louis-Barthelemy Faber, Marie-Lise Flottes, Philippe Gendrier, David Hély, Régis Leveugle, Paolo Maistri, Giorgio Di Natale, Athanasios Papadimitriou, Bruno Rouzeyre:
Laser Fault Injection at the CMOS 28 nm Technology Node: an Analysis of the Fault Model. FDTC 2018: 1-6 - [c86]Jean-Max Dutertre, Vincent Beroulle, Philippe Candelier, Louis-Barthelemy Faber, Marie-Lise Flottes, Philippe Gendrier, David Hély, Régis Leveugle, Paolo Maistri, Giorgio Di Natale, Athanasios Papadimitriou, Bruno Rouzeyre:
The case of using CMOS FD-SOI rather than CMOS bulk to harden ICs against laser attacks. IOLTS 2018: 214-219 - [c85]Mathieu Da Silva, Emanuele Valea, Marie-Lise Flottes, Sophie Dupuis, Giorgio Di Natale, Bruno Rouzeyre:
A New Secure Stream Cipher for Scan Chain Encryption. IVSW 2018: 68-73 - [c84]Mathieu Da Silva, Emanuele Valea, Marie-Lise Flottes, Sophie Dupuis, Giorgio Di Natale, Bruno Rouzeyre:
Encryption of test data: which cipher is better? PRIME 2018: 85-88 - 2017
- [c83]Mathieu Da Silva, Marie-Lise Flottes, Giorgio Di Natale, Bruno Rouzeyre, Paolo Prinetto, Marco Restifo:
Scan chain encryption for the test, diagnosis and debug of secure circuits. ETS 2017: 1-6 - [c82]Mathieu Da Silva, Marie-Lise Flottes, Giorgio Di Natale, Bruno Rouzeyre:
Experimentations on scan chain encryption with PRESENT. IVSW 2017: 45-50 - [c81]Giorgio Di Natale, Marie-Lise Flottes, Sophie Dupuis, Bruno Rouzeyre:
Hacking the Control Flow error detection mechanism. IVSW 2017: 51-56 - 2016
- [j22]Stephan De Castro, Jean-Max Dutertre, Bruno Rouzeyre, Giorgio Di Natale, Marie-Lise Flottes:
Frontside Versus Backside Laser Injection: A Comparative Study. ACM J. Emerg. Technol. Comput. Syst. 13(1): 6:1-6:15 (2016) - [c80]Papa-Sidi Ba, Sophie Dupuis, Palanichamy Manikandan, Marie-Lise Flottes, Giorgio Di Natale, Bruno Rouzeyre:
Hardware Trust through Layout Filling: A Hardware Trojan Prevention Technique. ISVLSI 2016: 254-259 - [c79]Papa-Sidy Ba, Sophie Dupuis, Marie-Lise Flottes, Giorgio Di Natale, Bruno Rouzeyre:
Using outliers to detect stealthy hardware trojan triggering? IVSW 2016: 1-6 - 2015
- [c78]Sophie Dupuis, Papa-Sidi Ba, Marie-Lise Flottes, Giorgio Di Natale, Bruno Rouzeyre:
New testing procedure for finding insertion sites of stealthy hardware trojans. DATE 2015: 776-781 - [c76]Papa-Sidi Ba, Palanichamy Manikandan, Sophie Dupuis, Marie-Lise Flottes, Giorgio Di Natale, Bruno Rouzeyre:
Hardware Trojan prevention using layout-level design approach. ECCTD 2015: 1-4 - [c75]Marie-Lise Flottes, Joao Azevedo, Giorgio Di Natale, Bruno Rouzeyre:
Session-less based thermal-aware 3D-SIC test scheduling. ETS 2015: 1-2 - [c74]Stephan De Castro, Giorgio Di Natale, Marie-Lise Flottes, Bruno Rouzeyre, Jean-Max Dutertre:
Figure of Merits of 28nm Si Technologies for Implementing Laser Attack Resistant Security Dedicated Circuits. ISVLSI 2015: 362-367 - [c73]Yassine Fkih, Pascal Vivet, Marie-Lise Flottes, Bruno Rouzeyre, Giorgio Di Natale, Juergen Schloeffel:
3D DFT Challenges and Solutions. ISVLSI 2015: 603-608 - 2014
- [j21]Jean-Max Dutertre, Rodrigo Possamai Bastos, Olivier Potin, Marie-Lise Flottes, Bruno Rouzeyre, Giorgio Di Natale, Alexandre Sarafianos:
Improving the ability of Bulk Built-In Current Sensors to detect Single Event Effects by using triple-well CMOS. Microelectron. Reliab. 54(9-10): 2289-2294 (2014) - [j20]Jean DaRolt, Amitabh Das, Giorgio Di Natale, Marie-Lise Flottes, Bruno Rouzeyre, Ingrid Verbauwhede:
Test Versus Security: Past and Present. IEEE Trans. Emerg. Top. Comput. 2(1): 50-62 (2014) - [j19]Jean DaRolt, Giorgio Di Natale, Marie-Lise Flottes, Bruno Rouzeyre:
Thwarting Scan-Based Attacks on Secure-ICs With On-Chip Comparison. IEEE Trans. Very Large Scale Integr. Syst. 22(4): 947-951 (2014) - [c72]Jean-Max Dutertre, Stephan De Castro, Alexandre Sarafianos, Noemie Boher, Bruno Rouzeyre, Mathieu Lisart, Joel Damiens, Philippe Candelier, Marie-Lise Flottes, Giorgio Di Natale:
Laser attacks on integrated circuits: From CMOS to FD-SOI. DTIS 2014: 1-6 - [c71]Feng Lu, Giorgio Di Natale, Marie-Lise Flottes, Bruno Rouzeyre, Guillaume Hubert:
Layout-aware laser fault injection simulation and modeling: From physical level to gate level. DTIS 2014: 1-6 - [c70]Feng Lu, Giorgio Di Natale, Marie-Lise Flottes, Bruno Rouzeyre:
Customized cell detector for laser-induced-fault detection. IOLTS 2014: 37-42 - [c69]Sophie Dupuis, Papa-Sidi Ba, Giorgio Di Natale, Marie-Lise Flottes, Bruno Rouzeyre:
A novel hardware logic encryption technique for thwarting illegal overproduction and Hardware Trojans. IOLTS 2014: 49-54 - [c68]Yassine Fkih, Pascal Vivet, Bruno Rouzeyre, Marie-Lise Flottes, Giorgio Di Natale, Juergen Schloeffel:
2D to 3D Test Pattern Retargeting Using IEEE P1687 Based 3D DFT Architectures. ISVLSI 2014: 386-391 - [c67]Régis Leveugle, Paolo Maistri, Pierre Vanhauwaert, Feng Lu, Giorgio Di Natale, Marie-Lise Flottes, Bruno Rouzeyre, Athanasios Papadimitriou, David Hély, Vincent Beroulle, Guillaume Hubert, Stephan De Castro, Jean-Max Dutertre, Alexandre Sarafianos, Noemie Boher, Mathieu Lisart, Joel Damiens, Philippe Candelier, Clément Tavernier:
Laser-induced fault effects in security-dedicated circuits. VLSI-SoC 2014: 1-6 - [c66]Vincent Beroulle, Philippe Candelier, Stephan De Castro, Giorgio Di Natale, Jean-Max Dutertre, Marie-Lise Flottes, David Hély, Guillaume Hubert, Régis Leveugle, Feng Lu, Paolo Maistri, Athanasios Papadimitriou, Bruno Rouzeyre, Clément Tavernier, Pierre Vanhauwaert:
Laser-Induced Fault Effects in Security-Dedicated Circuits. VLSI-SoC (Selected Papers) 2014: 220-240 - [c65]Giorgio Di Natale, Marie-Lise Flottes, Bruno Rouzeyre, Hakim Zimouche:
Built-in self-test for manufacturing TSV defects before bonding. VTS 2014: 1-6 - 2013
- [j18]Amitabh Das, Jean DaRolt, Santosh Ghosh, Stefaan Seys, Sophie Dupuis, Giorgio Di Natale, Marie-Lise Flottes, Bruno Rouzeyre, Ingrid Verbauwhede:
Secure JTAG Implementation Using Schnorr Protocol. J. Electron. Test. 29(2): 193-209 (2013) - [j17]Rodrigo Possamai Bastos, Giorgio Di Natale, Marie-Lise Flottes, Feng Lu, Bruno Rouzeyre:
A New Recovery Scheme Against Short-to-Long Duration Transient Faults in Combinational Logic. J. Electron. Test. 29(3): 331-340 (2013) - [j16]Sophie Dupuis, Giorgio Di Natale, Marie-Lise Flottes, Bruno Rouzeyre:
On the Effectiveness of Hardware Trojan Horse Detection via Side-Channel Analysis. Inf. Secur. J. A Glob. Perspect. 22(5-6): 226-236 (2013) - [j15]Feng Lu, Giorgio Di Natale, Marie-Lise Flottes, Bruno Rouzeyre:
Multilevel Ionizing-Induced Transient Fault Simulator. Inf. Secur. J. A Glob. Perspect. 22(5-6): 251-264 (2013) - [j14]Jean-Max Dutertre, Rodrigo Possamai Bastos, Olivier Potin, Marie-Lise Flottes, Bruno Rouzeyre, Giorgio Di Natale:
Sensitivity tuning of a bulk built-in current sensor for optimal transient-fault detection. Microelectron. Reliab. 53(9-11): 1320-1324 (2013) - [j13]Jean DaRolt, Giorgio Di Natale, Marie-Lise Flottes, Bruno Rouzeyre:
A novel differential scan attack on advanced DFT structures. ACM Trans. Design Autom. Electr. Syst. 18(4): 58:1-58:22 (2013) - [c64]Feng Lu, Giorgio Di Natale, Marie-Lise Flottes, Bruno Rouzeyre:
Laser-Induced Fault Simulation. DSD 2013: 609-614 - [c63]Rodrigo Possamai Bastos, Frank Sill Torres, Jean-Max Dutertre, Marie-Lise Flottes, Giorgio Di Natale, Bruno Rouzeyre:
A bulk built-in sensor for detection of fault attacks. HOST 2013: 51-54 - [c62]Hakim Zimouche, Giorgio Di Natale, Marie-Lise Flottes, Bruno Rouzeyre:
A BIST method for TSVs pre-bond test. IDT 2013: 1-6 - [c61]Jean DaRolt, Giorgio Di Natale, Marie-Lise Flottes, Bruno Rouzeyre:
A smart test controller for scan chains in secure circuits. IOLTS 2013: 228-229 - [c60]Yassine Fkih, Pascal Vivet, Bruno Rouzeyre, Marie-Lise Flottes, Giorgio Di Natale:
A 3D IC BIST for pre-bond test of TSVs using ring oscillators. NEWCAS 2013: 1-4 - [c59]Rodrigo Possamai Bastos, Frank Sill Torres, Jean-Max Dutertre, Marie-Lise Flottes, Giorgio Di Natale, Bruno Rouzeyre:
A single built-in sensor to check pull-up and pull-down CMOS networks against transient faults. PATMOS 2013: 157-163 - 2012
- [j12]Jean DaRolt, Amitabh Das, Santosh Ghosh, Giorgio Di Natale, Marie-Lise Flottes, Bruno Rouzeyre, Ingrid Verbauwhede:
Scan attacks on side-channel and fault attack resistant public-key implementations. J. Cryptogr. Eng. 2(4): 207-219 (2012) - [j11]Rodrigo Possamai Bastos, Frank Sill Torres, Giorgio Di Natale, Marie-Lise Flottes, Bruno Rouzeyre:
Novel transient-fault detection circuit featuring enhanced bulk built-in current sensor with low-power sleep-mode. Microelectron. Reliab. 52(9-10): 1781-1786 (2012) - [c58]Jean DaRolt, Amitabh Das, Giorgio Di Natale, Marie-Lise Flottes, Bruno Rouzeyre, Ingrid Verbauwhede:
A New Scan Attack on RSA in Presence of Industrial Countermeasures. COSADE 2012: 89-104 - [c57]Jean DaRolt, Amitabh Das, Giorgio Di Natale, Marie-Lise Flottes, Bruno Rouzeyre, Ingrid Verbauwhede:
A scan-based attack on Elliptic Curve Cryptosystems in presence of industrial Design-for-Testability structures. DFT 2012: 43-48 - [c56]Jean DaRolt, Giorgio Di Natale, Marie-Lise Flottes, Bruno Rouzeyre:
On-chip test comparison for protecting confidential data in secure ICs. ETS 2012: 1 - [c55]Jean DaRolt, Giorgio Di Natale, Marie-Lise Flottes, Bruno Rouzeyre:
Are advanced DfT structures sufficient for preventing scan-attacks? VTS 2012: 246-251 - [p1]Kaouthar Bousselam, Giorgio Di Natale, Marie-Lise Flottes, Bruno Rouzeyre:
On Countermeasures Against Fault Attacks on the Advanced Encryption Standard. Fault Analysis in Cryptography 2012: 89-108 - 2011
- [c54]Giorgio Di Natale, Marie-Lise Flottes, Bruno Rouzeyre, Miroslav Valka, Denis Réal:
Power consumption traces realignment to improve differential power analysis. DDECS 2011: 201-206 - [c53]Rodrigo Possamai Bastos, Giorgio Di Natale, Marie-Lise Flottes, Bruno Rouzeyre:
A New Bulk Built-In Current Sensor-Based Strategy for Dealing with Long-Duration Transient Faults in Deep-Submicron Technologies. DFT 2011: 302-308 - [c52]Jean DaRolt, Giorgio Di Natale, Marie-Lise Flottes, Bruno Rouzeyre:
Scan Attacks and Countermeasures in Presence of Scan Response Compactors. ETS 2011: 19-24 - [c51]Jean DaRolt, Giorgio Di Natale, Marie-Lise Flottes, Bruno Rouzeyre:
New security threats against chips containing scan chain structures. HOST 2011: 110 - [c50]Rodrigo Possamai Bastos, Giorgio Di Natale, Marie-Lise Flottes, Bruno Rouzeyre:
Timing issues for an efficient use of concurrent error detection codes. LATW 2011: 1-6 - 2010
- [j10]Giorgio Di Natale, M. Doulcier, Marie-Lise Flottes, Bruno Rouzeyre:
Self-Test Techniques for Crypto-Devices. IEEE Trans. Very Large Scale Integr. Syst. 18(2): 329-333 (2010) - [c49]Giorgio Di Natale, Marie-Lise Flottes, Bruno Rouzeyre:
Ensuring high testability without degrading security: Embedded tutorial on "test and security". DDECS 2010: 6 - [c48]Giorgio Di Natale, Marie-Lise Flottes, Bruno Rouzeyre:
Evaluation of Resistance to Differential Power Analysis: Execution Time Optimizations for Designers. DELTA 2010: 256-261 - [c47]Kaouthar Bousselam, Giorgio Di Natale, Marie-Lise Flottes, Bruno Rouzeyre:
Evaluation of concurrent error detection techniques on the Advanced Encryption Standard. ETS 2010: 252 - [c46]Kaouthar Bousselam, Giorgio Di Natale, Marie-Lise Flottes, Bruno Rouzeyre:
Evaluation of concurrent error detection techniques on the advanced encryption standard. IOLTS 2010: 223-228 - 2009
- [j9]Giorgio Di Natale, M. Doulcier, Marie-Lise Flottes, Bruno Rouzeyre:
A Reliable Architecture for Parallel Implementations of the Advanced Encryption Standard. J. Electron. Test. 25(4-5): 269-278 (2009) - [c45]Giorgio Di Natale, Marie-Lise Flottes, Bruno Rouzeyre:
Execution time reduction of Differential Power Analysis experiments. LATW 2009: 1-5 - 2008
- [c43]Giorgio Di Natale, Marie-Lise Flottes, Bruno Rouzeyre:
An Integrated Validation Environment for Differential Power Analysis. DELTA 2008: 527-532 - [c42]Giorgio Di Natale, M. Doulcier, Marie-Lise Flottes, Bruno Rouzeyre:
A Reliable Architecture for the Advanced Encryption Standard. ETS 2008: 13-18 - 2007
- [c39]Giorgio Di Natale, Marie-Lise Flottes, Bruno Rouzeyre:
A Novel Parity Bit Scheme for SBox in AES Circuits. DDECS 2007: 267-271 - [c38]Giorgio Di Natale, Marie-Lise Flottes, Bruno Rouzeyre:
An On-Line Fault Detection Scheme for SBoxes in Secure Circuits. IOLTS 2007: 57-62 - [c37]Giorgio Di Natale, Marie-Lise Flottes, Bruno Rouzeyre:
A Dependable Parallel Architecture for SBoxes. ReCoSoC 2007: 132-137
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