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Yuri Sneyders

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2000 – 2009

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2001
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Zhenqiu Ning, Yuri Sneyders, Wim Vanderbauwhede, Renaud Gillon, Marnix Tack, Paul Raes:
A compact test structure for characterisation of leakage currents in sub-micron CMOS technologies. Microelectron. Reliab. 41(12): 1939-1945 (2001)

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