Stop the war!

Остановите войну!

for scientists:

default search action

combined dblp search
author search
venue search
publication search

ask others

J. K. Efavi

> Home > Persons

Person information

Refine list

refinements active!

zoomed in on ?? of ?? records

view refined list in

export refined list as

showing all ?? records

2000 – 2009

see FAQ

What is the meaning of the colors in the publication lists?

2007
[j2]
- view
  authority control:
- export record
  dblp key:
  - journals/mr/AbermannESLOB07
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/mr/AbermannESLOB07
Stephan Abermann, J. K. Efavi, G. Sjöblom, Max C. Lemme, Jörgen Olsson, Emmerich Bertagnolli:
Impact of Al-, Ni-, TiN-, and Mo-metal gates on MOCVD-grown HfO₂ and ZrO₂ high-kappa dielectrics. Microelectron. Reliab. 47(4-5): 536-539 (2007)
2005
[j1]
- view
  authority control:
- export record
  dblp key:
  - journals/mr/LemmeEGMWK05
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/mr/LemmeEGMWK05
Max C. Lemme, J. K. Efavi, H. D. B. Gottlob, Thomas Mollenhauer, Thorsten Wahlbrink, Heinrich Kurz:
Comparison of metal gate electrodes on MOCVD HfO₂. Microelectron. Reliab. 45(5-6): 953-956 (2005)

a service of

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.