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Jochen Rivoir
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2020 – today
- 2022
- [c17]Hussam Amrouch, Jens Anders, Steffen Becker, Maik Betka, Gerd Bleher, Peter Domanski, Nourhan Elhamawy, Thomas Ertl, Athanasios Gatzastras, Paul R. Genssler, Sebastian Hasler, Martin Heinrich, André van Hoorn, Hanieh Jafarzadeh, Ingmar Kallfass, Florian Klemme, Steffen Koch, Ralf Küsters, Andrés Lalama, Raphaël Latty, Yiwen Liao, Natalia Lylina, Zahra Paria Najafi-Haghi, Dirk Pflüger, Ilia Polian, Jochen Rivoir, Matthias Sauer, Denis Schwachhofer
, Steffen Templin, Christian Volmer, Stefan Wagner
, Daniel Weiskopf, Hans-Joachim Wunderlich, Bin Yang, Martin Zimmermann:
Intelligent Methods for Test and Reliability. DATE 2022: 969-974 - [i4]Yiwen Liao, Bin Yang, Raphaël Latty, Jochen Rivoir:
A Deep-Learning-Aided Pipeline for Efficient Post-Silicon Tuning. CoRR abs/2207.00336 (2022) - [i3]Yiwen Liao, Jochen Rivoir, Raphaël Latty, Bin Yang:
Deep Feature Selection Using a Novel Complementary Feature Mask. CoRR abs/2209.12282 (2022) - 2021
- [c16]Peter Domanski, Dirk Pflüger, Raphaël Latty, Jochen Rivoir:
ORSA: Outlier Robust Stacked Aggregation for Best- and Worst-Case Approximations of Ensemble Systems. ICMLA 2021: 1357-1364 - [i2]Peter Domanski, Dirk Pflüger, Jochen Rivoir, Raphaël Latty:
Self-Learning Tuning for Post-Silicon Validation. CoRR abs/2111.08995 (2021) - [i1]Peter Domanski, Dirk Pflüger, Jochen Rivoir, Raphaël Latty:
ORSA: Outlier Robust Stacked Aggregation for Best- and Worst-Case Approximations of Ensemble Systems\. CoRR abs/2111.09043 (2021)
2010 – 2019
- 2019
- [c15]Ghada Sokar, Yassin Zakaria
, Asmaa Rabie, Kareem Madkour, Ira Leventhal, Jochen Rivoir, Xinli Gu, Haralampos-G. D. Stratigopoulos:
IP Session on Machine Learning Applications in IC Test-Related Tasks. VTS 2019: 1 - 2018
- [c14]Felix Neubauer, Jan Burchard, Pascal Raiola, Jochen Rivoir, Bernd Becker
, Matthias Sauer:
Efficient generation of parametric test conditions for AMS chips with an interval constraint solver. VTS 2018: 1-6 - 2011
- [j2]Nicolas Pous, Florence Azaïs, Laurent Latorre, Jochen Rivoir:
A Level-Crossing Approach for the Analysis of RF Modulated Signals Using Only Digital Test Resources. J. Electron. Test. 27(3): 289-303 (2011) - 2010
- [c13]Nicolas Pous, Florence Azaïs, Laurent Latorre, Jochen Rivoir:
On the use of standard digital ATE for the analysis of RF signals. ETS 2010: 43-48 - [c12]Nicolas Pous, Florence Azaïs, Laurent Latorre, Pascal Nouet, Jochen Rivoir:
Experiments on the analysis of phase/frequency-modulated RF signals using digital tester channels. LATW 2010: 1-7
2000 – 2009
- 2009
- [c11]Nicolas Pous, Florence Azaïs, Laurent Latorre, Pascal Nouet
, Jochen Rivoir:
Exploiting Zero-Crossing for the Analysis of FM Modulated Analog/RF Signals Using Digital ATE. Asian Test Symposium 2009: 261-266 - 2007
- [c10]Jochen Rivoir:
Fast and Low Cost HW Bit Map for Memory Test Based on Residue Polynomial System over GF(2). ATS 2007: 361-366 - [c9]Fidel Muradali, Jochen Rivoir:
Special Session: Analog Production Test. ATS 2007: 523 - 2006
- [c8]Jochen Rivoir:
Statistical Linearity Calibration of Time-To-Digital Converters Using a Free-Running Ring Oscillator. ATS 2006: 45-50 - [c7]Jochen Rivoir:
Fully-Digital Time-To-Digital Converter for ATE with Autonomous Calibration. ITC 2006: 1-10 - 2004
- [c6]Jochen Rivoir:
Low-Cost Analog Signal Generation Using a Pulse-Density Modulated Digital ATE Channel. Asian Test Symposium 2004: 290-295 - 2003
- [j1]Erik H. Volkerink, Ajay Khoche, Jochen Rivoir, Klaus-Dieter Hilliges:
Modern Test Techniques: Tradeoffs, Synergies, and Scalable Benefits. J. Electron. Test. 19(2): 125-135 (2003) - [c5]Jochen Rivoir:
Lowering Cost of Test: Parallel Test or Low-Cost ATE? Asian Test Symposium 2003: 360-365 - 2002
- [c4]Ajay Khoche, Erik H. Volkerink, Jochen Rivoir, Subhasish Mitra:
Test Vector Compression Using EDA-ATE Synergies. VTS 2002: 97-102 - [c3]Erik H. Volkerink, Ajay Khoche, Jochen Rivoir, Klaus-Dieter Hilliges:
Test Economics for Multi-site Test with Modern Cost Reduction Techniques. VTS 2002: 411-416 - 2001
- [c2]Ajay Khoche, Rohit Kapur, David Armstrong, Thomas W. Williams, Mick Tegethoff, Jochen Rivoir:
A new methodology for improved tester utilization. ITC 2001: 916-923 - [c1]Erik H. Volkerink, Ajay Khoche, Linda A. Kamas, Jochen Rivoir, Hans G. Kerkhoff:
Tackling test trade-offs from design, manufacturing to market using economic modeling. ITC 2001: 1098-1107
Coauthor Index
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