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Mark Malinoski

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Conference and Workshop Papers

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2001
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Mark Malinoski, Burnell G. West:
Rapid-response temperature control provides new defect screening opportunities. ITC 2001: 903-907
1998
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Mark Malinoski, James Maveety, Steve Knostman, Tom Jones:
A test site thermal control system for at-speed manufacturing testing. ITC 1998: 119-128

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